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Reliability Physic
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Book Synopsis Reliability Physics and Engineering by : J. W. McPherson
Download or read book Reliability Physics and Engineering written by J. W. McPherson and published by Springer Science & Business Media. This book was released on 2013-06-03 with total page 406 pages. Available in PDF, EPUB and Kindle. Book excerpt: "Reliability Physics and Engineering" provides critically important information for designing and building reliable cost-effective products. The textbook contains numerous example problems with solutions. Included at the end of each chapter are exercise problems and answers. "Reliability Physics and Engineering" is a useful resource for students, engineers, and materials scientists.
Book Synopsis Reliability Physics and Engineering by : J. W. McPherson
Download or read book Reliability Physics and Engineering written by J. W. McPherson and published by Springer Science & Business Media. This book was released on 2010-08-05 with total page 324 pages. Available in PDF, EPUB and Kindle. Book excerpt: All engineers could bene?t from at least one course in reliability physics and engineering. It is very likely that, starting with your very ?rst engineering po- tion, you will be asked — how long is your newly developed device expected to last? This text was designed to help you to answer this fundamentally important question. All materials and devices are expected to degrade with time, so it is very natural to ask — how long will the product last? The evidence for material/device degradation is apparently everywhere in nature. A fresh coating of paint on a house will eventually crack and peel. Doors in a new home can become stuck due to the shifting of the foundation. The new ?nish on an automobile will oxidize with time. The tight tolerances associated with ?nely meshed gears will deteriorate with time. Critical parameters associated with hi- precision semiconductor devices (threshold voltages, drive currents, interconnect resistances, capacitor leakages, etc.) will degrade with time. In order to und- stand the lifetime of the material/device, it is important to understand the reliability physics (kinetics) for each of the potential failure mechanisms and then be able to develop the required reliability engineering methods that can be used to prevent, or at least minimize the occurrence of, device failure.
Author :Calif.) International Reliability Physics Symposium (17th : 1979 : San Francisco Publisher : ISBN 13 : Total Pages :263 pages Book Rating :4.:/5 (79 download)
Book Synopsis Reliability Physics by : Calif.) International Reliability Physics Symposium (17th : 1979 : San Francisco
Download or read book Reliability Physics written by Calif.) International Reliability Physics Symposium (17th : 1979 : San Francisco and published by . This book was released on 1979 with total page 263 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author :Calif.). International Reliability Physics Symposium (16th : 1978 : San Diego Publisher : ISBN 13 : Total Pages : pages Book Rating :4.:/5 (761 download)
Book Synopsis Reliability Physics by : Calif.). International Reliability Physics Symposium (16th : 1978 : San Diego
Download or read book Reliability Physics written by Calif.). International Reliability Physics Symposium (16th : 1978 : San Diego and published by . This book was released on 1978 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Probabilistic Physics of Failure Approach to Reliability by : Mohammad Modarres
Download or read book Probabilistic Physics of Failure Approach to Reliability written by Mohammad Modarres and published by John Wiley & Sons. This book was released on 2017-06-23 with total page 289 pages. Available in PDF, EPUB and Kindle. Book excerpt: The book presents highly technical approaches to the probabilistic physics of failure analysis and applications to accelerated life and degradation testing to reliability prediction and assessment. Beside reviewing a select set of important failure mechanisms, the book covers basic and advanced methods of performing accelerated life test and accelerated degradation tests and analyzing the test data. The book includes a large number of very useful examples to help readers understand complicated methods described. Finally, MATLAB, R and OpenBUGS computer scripts are provided and discussed to support complex computational probabilistic analyses introduced.
Book Synopsis Reliability Physics and Engineering by : J. W. McPherson
Download or read book Reliability Physics and Engineering written by J. W. McPherson and published by Springer. This book was released on 2018-12-20 with total page 469 pages. Available in PDF, EPUB and Kindle. Book excerpt: This third edition textbook provides the basics of reliability physics and engineering that are needed by electrical engineers, mechanical engineers, civil engineers, biomedical engineers, materials scientists, and applied physicists to help them to build better devices/products. The information contained within should help all fields of engineering to develop better methodologies for: more reliable product designs, more reliable materials selections, and more reliable manufacturing processes— all of which should help to improve product reliability. A mathematics level through differential equations is needed. Also, a familiarity with the use of excel spreadsheets is assumed. Any needed statistical training and tools are contained within the text. While device failure is a statistical process (thus making statistics important), the emphasis of this book is clearly on the physics of failure and developing the reliability engineering tools required for product improvements during device-design and device-fabrication phases.
Book Synopsis Influence of Temperature on Microelectronics and System Reliability by : Pradeep Lall
Download or read book Influence of Temperature on Microelectronics and System Reliability written by Pradeep Lall and published by CRC Press. This book was released on 2020-07-09 with total page 332 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book raises the level of understanding of thermal design criteria. It provides the design team with sufficient knowledge to help them evaluate device architecture trade-offs and the effects of operating temperatures. The author provides readers a sound scientific basis for system operation at realistic steady state temperatures without reliability penalties. Higher temperature performance than is commonly recommended is shown to be cost effective in production for life cycle costs. The microelectronic package considered in the book is assumed to consist of a semiconductor device with first-level interconnects that may be wirebonds, flip-chip, or tape automated bonds; die attach; substrate; substrate attach; case; lid; lid seal; and lead seal. The temperature effects on electrical parameters of both bipolar and MOSFET devices are discussed, and models quantifying the temperature effects on package elements are identified. Temperature-related models have been used to derive derating criteria for determining the maximum and minimum allowable temperature stresses for a given microelectronic package architecture. The first chapter outlines problems with some of the current modeling strategies. The next two chapters present microelectronic device failure mechanisms in terms of their dependence on steady state temperature, temperature cycle, temperature gradient, and rate of change of temperature at the chip and package level. Physics-of-failure based models used to characterize these failure mechanisms are identified and the variabilities in temperature dependence of each of the failure mechanisms are characterized. Chapters 4 and 5 describe the effects of temperature on the performance characteristics of MOS and bipolar devices. Chapter 6 discusses using high-temperature stress screens, including burn-in, for high-reliability applications. The burn-in conditions used by some manufacturers are examined and a physics-of-failure approach is described. The
Book Synopsis Reliability Physics (25th Annual Proceedings 1987) San Diego, April 7-9, 1987 by : Reliability Physics
Download or read book Reliability Physics (25th Annual Proceedings 1987) San Diego, April 7-9, 1987 written by Reliability Physics and published by . This book was released on with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Reliability and Physics-of-Healthy in Mechatronics by : Abdelkhalak El Hami
Download or read book Reliability and Physics-of-Healthy in Mechatronics written by Abdelkhalak El Hami and published by John Wiley & Sons. This book was released on 2023-01-12 with total page 324 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book illustrates simply, but with many details, the state of the art of reliability science, exploring clear reliability disciplines and applications through concrete examples from their industries and from real life, based on industrial experiences. Many experts believe that reliability is not only a matter of statistics but is a multidisciplinary scientific topic, involving materials, tests, simulations, quality tools, manufacturing, electronics, mechatronics, environmental engineering and Big Data, among others. For a complex mechatronic system, failure risks have to be identified at an early stage of the design. In the automotive and aeronautic industries, fatigue simulation is used both widely and efficiently. Problems arise from the variability of inputs such as fatigue parameters and life curves. This book aims to discuss probabilistic fatigue and reliability simulation. To do this, Reliability and Physics-of-Healthy in Mechatronics provides a study on some concepts of a predictive reliability model of microelectronics, with examples from the automotive, aeronautic and space industries, based on entropy and Physics-of-Healthy
Book Synopsis Probabilistic Physics of Failure Approach to Reliability by : Mohammad Modarres
Download or read book Probabilistic Physics of Failure Approach to Reliability written by Mohammad Modarres and published by John Wiley & Sons. This book was released on 2017-06-23 with total page 404 pages. Available in PDF, EPUB and Kindle. Book excerpt: The book presents highly technical approaches to the probabilistic physics of failure analysis and applications to accelerated life and degradation testing to reliability prediction and assessment. Beside reviewing a select set of important failure mechanisms, the book covers basic and advanced methods of performing accelerated life test and accelerated degradation tests and analyzing the test data. The book includes a large number of very useful examples to help readers understand complicated methods described. Finally, MATLAB, R and OpenBUGS computer scripts are provided and discussed to support complex computational probabilistic analyses introduced.
Book Synopsis Micro- and Opto-Electronic Materials and Structures: Physics, Mechanics, Design, Reliability, Packaging by : Ephraim Suhir
Download or read book Micro- and Opto-Electronic Materials and Structures: Physics, Mechanics, Design, Reliability, Packaging written by Ephraim Suhir and published by Springer Science & Business Media. This book was released on 2007-05-26 with total page 1471 pages. Available in PDF, EPUB and Kindle. Book excerpt: This handbook provides the most comprehensive, up-to-date and easy-to-apply information on the physics, mechanics, reliability and packaging of micro- and opto-electronic materials. It details their assemblies, structures and systems, and each chapter contains a summary of the state-of-the-art in a particular field. The book provides practical recommendations on how to apply current knowledge and technology to design and manufacture. It further describes how to operate a viable, reliable and cost-effective electronic component or photonic device, and how to make such a device into a successful commercial product.
Book Synopsis Reliable Communications within Cyber-Physical Systems Using the Internet (RC4CPS) by : Mohammad Elattar
Download or read book Reliable Communications within Cyber-Physical Systems Using the Internet (RC4CPS) written by Mohammad Elattar and published by Springer. This book was released on 2019-08-07 with total page 192 pages. Available in PDF, EPUB and Kindle. Book excerpt: This thesis describes the research done regarding communication reliability when using the Internet to realize the communications for cyber-physical systems (CPSs). In a nutshell, the book first presents the obtained results from real-world measurements describing the reliability of today’s Internet in terms of the availability and diversity of a wide set of end-to-end paths in the Internet. After that, the book describes a new approach along with its realization as a transport protocol to improve reliability and enable the utilization of Internet within future CPSs. In the first chapters of the book, the need for reliable communication to realize CPSs and the challenges of using the Internet as a communication network for such systems are described. The existing literature is analyzed after that and the identified research gap is highlighted. The proposed approach along with conducted measurements to evaluate it are described in the remaining chapters of the book.
Book Synopsis American Physical Education Review by :
Download or read book American Physical Education Review written by and published by . This book was released on 1923 with total page 544 pages. Available in PDF, EPUB and Kindle. Book excerpt: Includes abstracts of magazine articles and "Book reviews".
Book Synopsis Reliability Physics (28th Annual Proceedings 1990) by : Reliability Physics
Download or read book Reliability Physics (28th Annual Proceedings 1990) written by Reliability Physics and published by . This book was released on with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Reliability Physics (29th Annual Proceedings 1991) by : Reliability Physics
Download or read book Reliability Physics (29th Annual Proceedings 1991) written by Reliability Physics and published by . This book was released on with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Reliability Physics (15th Annual Proceedings 1977) Las Vegas, April 12-14, 1977 by : Reliability Physics
Download or read book Reliability Physics (15th Annual Proceedings 1977) Las Vegas, April 12-14, 1977 written by Reliability Physics and published by . This book was released on with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Reliability Physics (13th Annual Proceedings 1975) Las Vegas, April 1-3, 1975 by : Reliability Physics
Download or read book Reliability Physics (13th Annual Proceedings 1975) Las Vegas, April 1-3, 1975 written by Reliability Physics and published by . This book was released on with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt:
