Recent Developments in Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization

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Publisher : BoD – Books on Demand
ISBN 13 : 1839682299
Total Pages : 275 pages
Book Rating : 4.8/5 (396 download)

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Book Synopsis Recent Developments in Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization by : Chandra Shakher Pathak

Download or read book Recent Developments in Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization written by Chandra Shakher Pathak and published by BoD – Books on Demand. This book was released on 2022-01-07 with total page 275 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book contains chapters that describe advanced atomic force microscopy (AFM) modes and Raman spectroscopy. It also provides an in-depth understanding of advanced AFM modes and Raman spectroscopy for characterizing various materials. This volume is a useful resource for a wide range of readers, including scientists, engineers, graduate students, postdoctoral fellows, and scientific professionals working in specialized fields such as AFM, photovoltaics, 2D materials, carbon nanotubes, nanomaterials, and Raman spectroscopy.

Atomic-force Microscopy and Its Applications

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Publisher : BoD – Books on Demand
ISBN 13 : 1789851696
Total Pages : 116 pages
Book Rating : 4.7/5 (898 download)

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Book Synopsis Atomic-force Microscopy and Its Applications by : Tomasz Tański

Download or read book Atomic-force Microscopy and Its Applications written by Tomasz Tański and published by BoD – Books on Demand. This book was released on 2019-01-30 with total page 116 pages. Available in PDF, EPUB and Kindle. Book excerpt: Atomic force microscopy is a surface analytical technique used in air, liquids or a vacuum to generate very high-resolution topographic images of a surface, down to atomic resolution. This book is not only for students but also for professional engineers who are working in the industry as well as specialists. This book aims to provide the reader with a comprehensive overview of the new trends, research results and development of atomic force microscopy. The chapters for this book have been written by respected and well-known researchers and specialists from different countries. We hope that after studying this book, you will have objective knowledge about the possible uses of atomic force microscopy in many scientific aspects of our civilisation.

Concise Encyclopedia of Materials Characterization

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Publisher : Elsevier
ISBN 13 : 1483287513
Total Pages : 670 pages
Book Rating : 4.4/5 (832 download)

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Book Synopsis Concise Encyclopedia of Materials Characterization by : R.W. Cahn

Download or read book Concise Encyclopedia of Materials Characterization written by R.W. Cahn and published by Elsevier. This book was released on 2016-01-22 with total page 670 pages. Available in PDF, EPUB and Kindle. Book excerpt: To use materials effectively, their composition, degree of perfection, physical and mechanical characteristics, and microstructure must be accurately determined. This concise encyclopledia covers the wide range of characterization techniques necessary to achieve this. Articles included are not only concerned with the characterization techniques of specific materials such as polymers, metals, ceramics and semiconductors but also techniques which can be applied to materials in general. The techniques described cover bulk methods, and also a number of specific methods to study the topography and composition of surface and near-surface regions. These techniques range from the well-established and traditional to the very latest including: atomic force microscopy; confocal optical microscopy; gamma ray diffractometry; thermal wave imaging; x-ray diffraction and time-resolved techniques. This unique concise encyclopedia comprises 116 articles by leading experts in the field from around the world to create the ideal guide for materials scientists, chemists and engineers involved with any aspect of materials characterization. With over 540 illustrations, extensive cross-referencing, approximately 900 references, and a detailed index, this concise encyclopedia will be a valuable asset to any materials science collection.

Advanced Materials Characterization

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Publisher : CRC Press
ISBN 13 : 1000872297
Total Pages : 145 pages
Book Rating : 4.0/5 (8 download)

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Book Synopsis Advanced Materials Characterization by : Ch Sateesh Kumar

Download or read book Advanced Materials Characterization written by Ch Sateesh Kumar and published by CRC Press. This book was released on 2023-05-04 with total page 145 pages. Available in PDF, EPUB and Kindle. Book excerpt: The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. It explores the techniques implemented for advanced materials like superalloys, thin films, powders, nanocomposites, polymers, shape memory alloys, high entropy alloys, and so on. Major instruments covered include X-ray diffraction, near-field scanning optical microscopy Raman, X-ray photospectroscopy, ultraviolet-visible-near-infrared spectrosphotometer, Fourier-transform infrared spectroscopy, differential scanning calorimeter, profilometer, and thermogravimetric analysis. Features: Covers material characterization techniques and the development of advanced characterization technology Includes multiple length scale characterization approaches for a large variety of materials, from nano- to micron-scale, as well as their constraints Discusses advanced material characterization technology in the microstructural and property characterization fields Reviews both practical and theoretical explanations of approaches for characterizing microstructure and properties Offers fundamentals, basic instrumentation details, experimental approaches, analyses, and applications with case studies This book is aimed at graduate students and researchers in materials science and engineering.

Engineered Ferrites and Their Applications

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Publisher : Springer Nature
ISBN 13 : 9819925835
Total Pages : 260 pages
Book Rating : 4.8/5 (199 download)

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Book Synopsis Engineered Ferrites and Their Applications by : Pankaj Sharma

Download or read book Engineered Ferrites and Their Applications written by Pankaj Sharma and published by Springer Nature. This book was released on 2023 with total page 260 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book edited by leading experts focuses on the foundation of ferrite materials since inception to its contemporary scenario including their vast applications. The contents range from the basic physics and chemistry of ferrites to its applications in telecommunication, SAR reduction, EMI shielding, hyperthermia treatment, and water decontamination. It also focuses on ferrite nanoparticles for sensing application, energy-storage applications, antimicrobial applications, corrosion protection applications, among others. This book is a useful reference to those in academia and industry.

Visualizing Chemistry

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Publisher : National Academies Press
ISBN 13 : 030916463X
Total Pages : 222 pages
Book Rating : 4.3/5 (91 download)

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Book Synopsis Visualizing Chemistry by : National Research Council

Download or read book Visualizing Chemistry written by National Research Council and published by National Academies Press. This book was released on 2006-06-01 with total page 222 pages. Available in PDF, EPUB and Kindle. Book excerpt: Scientists and engineers have long relied on the power of imaging techniques to help see objects invisible to the naked eye, and thus, to advance scientific knowledge. These experts are constantly pushing the limits of technology in pursuit of chemical imagingâ€"the ability to visualize molecular structures and chemical composition in time and space as actual events unfoldâ€"from the smallest dimension of a biological system to the widest expanse of a distant galaxy. Chemical imaging has a variety of applications for almost every facet of our daily lives, ranging from medical diagnosis and treatment to the study and design of material properties in new products. In addition to highlighting advances in chemical imaging that could have the greatest impact on critical problems in science and technology, Visualizing Chemistry reviews the current state of chemical imaging technology, identifies promising future developments and their applications, and suggests a research and educational agenda to enable breakthrough improvements.

Atomic Force Microscopy

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Publisher : Oxford University Press
ISBN 13 : 0199570450
Total Pages : 257 pages
Book Rating : 4.1/5 (995 download)

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Book Synopsis Atomic Force Microscopy by : Peter Eaton

Download or read book Atomic Force Microscopy written by Peter Eaton and published by Oxford University Press. This book was released on 2010-03-25 with total page 257 pages. Available in PDF, EPUB and Kindle. Book excerpt: Atomic force microscopes are very important tools for the advancement of science and technology. This book provides an introduction to the microscopes so that scientists and engineers can learn both how to use them, and what they can do.

Noncontact Atomic Force Microscopy

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Publisher : Springer Science & Business Media
ISBN 13 : 364201495X
Total Pages : 410 pages
Book Rating : 4.6/5 (42 download)

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Book Synopsis Noncontact Atomic Force Microscopy by : Seizo Morita

Download or read book Noncontact Atomic Force Microscopy written by Seizo Morita and published by Springer Science & Business Media. This book was released on 2009-09-18 with total page 410 pages. Available in PDF, EPUB and Kindle. Book excerpt: Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since then: force spectroscopy and mapping with atomic resolution; tuning fork; atomic manipulation; magnetic exchange force microscopy; atomic and molecular imaging in liquids; and other new technologies. These results and technologies are now helping evolve NC-AFM toward practical tools for characterization and manipulation of individual atoms/molecules and nanostructures with atomic/subatomic resolution. Therefore, the book exemplifies how NC-AFM has become a crucial tool for the expanding fields of nanoscience and nanotechnology.

Non-Destructive Material Characterization Methods

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Publisher : Elsevier
ISBN 13 : 0323984789
Total Pages : 842 pages
Book Rating : 4.3/5 (239 download)

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Book Synopsis Non-Destructive Material Characterization Methods by : Akira Otsuki

Download or read book Non-Destructive Material Characterization Methods written by Akira Otsuki and published by Elsevier. This book was released on 2023-09-01 with total page 842 pages. Available in PDF, EPUB and Kindle. Book excerpt: Non-Destructive Material Characterization Methods provides readers with a trove of theoretical and practical insight into how to implement different non-destructive testing methods for effective material characterization. The book starts with an introduction to the field before moving right into a discussion of a wide range of techniques that can be immediately implemented. Various imaging and microscopy techniques are first covered, with step-by-step insights on characterization using a polarized microscope, an atomic force microscope, computed tomography, ultrasonography, magnetic resonance imaging, infrared tomography, and more. Each chapter includes case studies, applications, and recent developments. From there, elemental assay and mapping techniques are discussed, including Raman spectroscopy, UV spectroscopy, atomic absorption spectroscopy, neutron activation analysis, and various others. The book concludes with sections covering displacement measurement techniques, large-scale facility techniques, and methods involving multiscale analysis and advanced analysis. Provides an overview of a wide-range of NDT material characterization methods, strengths and weaknesses of these methods, when to apply them, and more Includes eddy current sensing and imaging, ultrasonic sensing and imaging, RF and THz imaging, internet and cloud-based methods, among many others Presents case studies, applications and other insights on putting these methods into practice

Engineering Materials Characterization

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Publisher : Walter de Gruyter GmbH & Co KG
ISBN 13 : 3110997592
Total Pages : 270 pages
Book Rating : 4.1/5 (19 download)

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Book Synopsis Engineering Materials Characterization by : Kaushik Kumar

Download or read book Engineering Materials Characterization written by Kaushik Kumar and published by Walter de Gruyter GmbH & Co KG. This book was released on 2023-11-20 with total page 270 pages. Available in PDF, EPUB and Kindle. Book excerpt: Materials Science today is the base for all technological and industrial developments. The book provides the understanding of the advanced spectroscopic and microscopic instruments used for material characterization. The main issues addressed are 1) a detailed understanding of the instrument, including working and handling, 2) sample preparation, and 3) data analysis and interpretation. The book is divided in two parts i.e., Part A discusses microscopic instruments, consisting of Optical Microscope, Scanning Electron Microscopy, Atomic Force Microscopy, Field Emission Scanning Electron Microscope and X-Ray Diffraction. Part B is on spectroscopic instruments and covers FTIR Spectrometer, Raman Spectrometer, X-ray Photoelectron Spectroscopy, Ultraviolet Photoelectron Spectroscopy, Fluorescence Spectroscopy, and Nuclear Magnetic Resonance Spectroscopy.

Stimulated Raman Scattering Microscopy

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Publisher : Elsevier
ISBN 13 : 0323903371
Total Pages : 612 pages
Book Rating : 4.3/5 (239 download)

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Book Synopsis Stimulated Raman Scattering Microscopy by : Ji-Xin Cheng

Download or read book Stimulated Raman Scattering Microscopy written by Ji-Xin Cheng and published by Elsevier. This book was released on 2021-12-04 with total page 612 pages. Available in PDF, EPUB and Kindle. Book excerpt: Stimulated Raman Scattering Microscopy: Techniques and Applications describes innovations in instrumentation, data science, chemical probe development, and various applications enabled by a state-of-the-art stimulated Raman scattering (SRS) microscope. Beginning by introducing the history of SRS, this book is composed of seven parts in depth including instrumentation strategies that have pushed the physical limits of SRS microscopy, vibrational probes (which increased the SRS imaging functionality), data science methods, and recent efforts in miniaturization. This rapidly growing field needs a comprehensive resource that brings together the current knowledge on the topic, and this book does just that. Researchers who need to know the requirements for all aspects of the instrumentation as well as the requirements of different imaging applications (such as different types of biological tissue) will benefit enormously from the examples of successful demonstrations of SRS imaging in the book. Led by Editor-in-Chief Ji-Xin Cheng, a pioneer in coherent Raman scattering microscopy, the editorial team has brought together various experts on each aspect of SRS imaging from around the world to provide an authoritative guide to this increasingly important imaging technique. This book is a comprehensive reference for researchers, faculty, postdoctoral researchers, and engineers. Includes every aspect from theoretic reviews of SRS spectroscopy to innovations in instrumentation and current applications of SRS microscopy Provides copious visual elements that illustrate key information, such as SRS images of various biological samples and instrument diagrams and schematics Edited by leading experts of SRS microscopy, with each chapter written by experts in their given topics

Material Characterization Techniques and Applications

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Publisher : Springer Nature
ISBN 13 : 9811695695
Total Pages : 314 pages
Book Rating : 4.8/5 (116 download)

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Book Synopsis Material Characterization Techniques and Applications by : Euth Ortiz Ortega

Download or read book Material Characterization Techniques and Applications written by Euth Ortiz Ortega and published by Springer Nature. This book was released on 2022-02-12 with total page 314 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents commonly applied characterization techniques in material science, their brief history and origins, mechanism of operation, advantages and disadvantages, their biosensing applications, and troubleshooting for each technique, while addressing the challenges researchers face when working with these techniques. The book dedicates its focus to identifying physicochemical and electrochemical nature of materials including analyses of morphology, mass spectrometry, and topography, as well as the characterization of elemental, structural, thermal, wettability, electrochemical, and chromatography properties. Additionally, the main features and benefits of using coupled characterization techniques are discussed in this book.

Atomic Force Microscopy/Scanning Tunneling Microscopy 3

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Publisher : Springer Science & Business Media
ISBN 13 : 0306470950
Total Pages : 210 pages
Book Rating : 4.3/5 (64 download)

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Book Synopsis Atomic Force Microscopy/Scanning Tunneling Microscopy 3 by : Samuel H. Cohen

Download or read book Atomic Force Microscopy/Scanning Tunneling Microscopy 3 written by Samuel H. Cohen and published by Springer Science & Business Media. This book was released on 2007-05-08 with total page 210 pages. Available in PDF, EPUB and Kindle. Book excerpt: The Foundation for Advances in Medicine and Science (FAMS), the organizers of SCANNING 98, sponsored its third annual Atomic Force Microscopy/Scanning Tunneling Microscopy Symposium at the Omni Inner Harbor Hotelin Baltimore, Maryland, from May 9 to 12, 1998. This book represents the compilation of papers that were presented at the AFM/STM Symposium as well as a few that were presented at SCANNING 96 and SCANNING 97 meetings that took place in Monterey, California. The purpose of the symposium was to provide an interface between scientists and engineers, representatives of industry, government and academia, all of whom have a common interest in probe microscopies. The meetings offered an ideal forum where ideas could easily be exchanged and where individuals from diverse fields who are on the cutting edge ofprobe microscopy research could communicate with one another. Experts in probe microscopy from around the world representing a wide range of disciplines including physics, biotechnology, nanotechnology, chemistry, material science, etc., were invited to participate. The format of the meeting was structured so as to encourage communication among these individuals. During the first day’s sessions papers were presented on general topics such as application of scanning probe microscopy in materials science; STM and scanning tunneling spectroscopy of organic materials; fractal analysis in AFM; and nanomanipulation. Other papers presented included unexpected ordering of a molecule; synthesis ofpeptides and oligonucleotides; and analysis oflunar soils from Apollo 11.

Fundamentals and Application of Atomic Force Microscopy for Food Research

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Publisher : Academic Press
ISBN 13 : 0128241322
Total Pages : 385 pages
Book Rating : 4.1/5 (282 download)

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Book Synopsis Fundamentals and Application of Atomic Force Microscopy for Food Research by : Jian Zhong

Download or read book Fundamentals and Application of Atomic Force Microscopy for Food Research written by Jian Zhong and published by Academic Press. This book was released on 2022-09-29 with total page 385 pages. Available in PDF, EPUB and Kindle. Book excerpt: Fundamentals and Application of Atomic Force Microscopy for Food Research explains how to get reliable AFM data and current application progress of AFM in different food substances. Sections focus on an Introduction to AFM for food research and Applications of AFM for different types of food substances. Edited by 3 experts in the field of nanotechnology and food science, this book reduces the difficulty of AFM application and shortens the learning time for new hands. Until now, no such book has systematically described the application of Atomic Force Microscopy (AFM) for food research. Many scientists in the field of food science and engineering need to evaluate their developed foods and food contact surfaces at nanoscale. However, there is a steep learning curve for new hands, hence the need for this comprehensive resource. Describes the application of AFM for food research Covers applications of AFM for different types of food substances Addresses future uses and perspectives of AFM for the development of food nanotechnology

Construction Materials and Structures

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Publisher : IOS Press
ISBN 13 : 1614994668
Total Pages : 1562 pages
Book Rating : 4.6/5 (149 download)

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Book Synopsis Construction Materials and Structures by : S.O. Ekolu

Download or read book Construction Materials and Structures written by S.O. Ekolu and published by IOS Press. This book was released on 2014-12-05 with total page 1562 pages. Available in PDF, EPUB and Kindle. Book excerpt: The two volumes of these Proceedings contain about 200 conference papers and 10 keynote papers presented at the First International Conference on Construction Materials and Structures, held in Johannesburg, South Africa from 24 to 26 November 2014. It includes sections on Materials and characterization; Durability of construction materials; Structural implications, performance, service life; Sustainability, waste utilization, the environment; and Building science and construction.

Semiconductor Strain Metrology

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Publisher : Bentham Science Publishers
ISBN 13 : 1608053598
Total Pages : 141 pages
Book Rating : 4.6/5 (8 download)

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Book Synopsis Semiconductor Strain Metrology by : Terence K. S. Wong

Download or read book Semiconductor Strain Metrology written by Terence K. S. Wong and published by Bentham Science Publishers. This book was released on 2012 with total page 141 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book surveys the major and newly developed techniques for semiconductor strain metrology. Semiconductor strain metrology has emerged in recent years as a topic of great interest to researchers involved in thin film and nanoscale device characterizati

Confocal Raman Microscopy

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Publisher : Springer
ISBN 13 : 3319753800
Total Pages : 596 pages
Book Rating : 4.3/5 (197 download)

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Book Synopsis Confocal Raman Microscopy by : Jan Toporski

Download or read book Confocal Raman Microscopy written by Jan Toporski and published by Springer. This book was released on 2018-03-01 with total page 596 pages. Available in PDF, EPUB and Kindle. Book excerpt: This second edition provides a cutting-edge overview of physical, technical and scientific aspects related to the widely used analytical method of confocal Raman microscopy. The book includes expanded background information and adds insights into how confocal Raman microscopy, especially 3D Raman imaging, can be integrated with other methods to produce a variety of correlative microscopy combinations. The benefits are then demonstrated and supported by numerous examples from the fields of materials science, 2D materials, the life sciences, pharmaceutical research and development, as well as the geosciences.