Quantitative X-Ray Spectrometry, Second Edition,

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Author :
Publisher : CRC Press
ISBN 13 : 9780824795542
Total Pages : 512 pages
Book Rating : 4.7/5 (955 download)

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Book Synopsis Quantitative X-Ray Spectrometry, Second Edition, by : Ron Jenkins

Download or read book Quantitative X-Ray Spectrometry, Second Edition, written by Ron Jenkins and published by CRC Press. This book was released on 1995-04-26 with total page 512 pages. Available in PDF, EPUB and Kindle. Book excerpt: This work covers important aspects of X-ray spectrometry, from basic principles to the selection of instrument parameters and sample preparation. This edition explicates the use of combined X-ray fluorescence and X-ray diffraction data, and features new applications in environmental studies, forensic science, archeometry and the analysis of metals and alloys, minerals and ore, ceramic materials, catalysts and trace metals.;This work is intended for spectroscopists, analytical chemists, materials scientists, experimental physicists, mineralogists, biologists, geologists and graduate-level students in these disciplines.

X-Ray Fluorescence Spectrometry

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Author :
Publisher : Wiley-Interscience
ISBN 13 : 9780471836759
Total Pages : 192 pages
Book Rating : 4.8/5 (367 download)

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Book Synopsis X-Ray Fluorescence Spectrometry by : Ron Jenkins

Download or read book X-Ray Fluorescence Spectrometry written by Ron Jenkins and published by Wiley-Interscience. This book was released on 1988-10-03 with total page 192 pages. Available in PDF, EPUB and Kindle. Book excerpt: X-Ray Fluorescence Spectrometry, Ron Jenkins Written by the principal scientist for JCPDS, the International Centre for Diffraction Data, Swarthmore, Pennsylvania, this book focuses on the scientific and technological developments achieved in the field during the past decade. It offers comprehensive coverage of all crucial topics, including: the properties and uses of X-ray emission spectrometry in material analysis; its industrial applications; X-ray diffraction; instrumentation for X-ray fluorescence spectrometry; a comparison of wavelength and energy dispersive spectrometers; and use of X-ray spectrometry for qualitative analysis.

Quantitative X-ray Fluorescence Analysis

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Author :
Publisher :
ISBN 13 :
Total Pages : 402 pages
Book Rating : 4.:/5 (875 download)

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Book Synopsis Quantitative X-ray Fluorescence Analysis by : Gerald R. Lachance

Download or read book Quantitative X-ray Fluorescence Analysis written by Gerald R. Lachance and published by . This book was released on 1995 with total page 402 pages. Available in PDF, EPUB and Kindle. Book excerpt:

X-Ray Fluorescence Spectrometry

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Author :
Publisher : John Wiley & Sons
ISBN 13 : 1118521048
Total Pages : 1 pages
Book Rating : 4.1/5 (185 download)

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Book Synopsis X-Ray Fluorescence Spectrometry by : Ron Jenkins

Download or read book X-Ray Fluorescence Spectrometry written by Ron Jenkins and published by John Wiley & Sons. This book was released on 2012-08-29 with total page 1 pages. Available in PDF, EPUB and Kindle. Book excerpt: X-ray fluorescence spectroscopy, one of the most powerful and flexible techniques available for the analysis and characterization of materials today, has gone through major changes during the past decade. Fully revised and expanded by 30%, X-Ray Fluorescence Spectrometry, Second Edition incorporates the latest industrial and scientific trends in all areas. It updates all previous material and adds new chapters on such topics as the history of X-ray fluorescence spectroscopy, the design of X-ray spectrometers, state-of-the-art applications, and X-ray spectra. Ron Jenkins draws on his extensive experience in training and consulting industry professionals for this clear and concise treatment, covering first the basic aspects of X rays, then the methodology of X-ray fluorescence spectroscopy and available instrumentation. He offers a comparison between wavelength and energy dispersive spectrometers as well as step-by-step guidelines to X-ray spectrometric techniques for qualitative and quantitative analysis-from specimen preparation to real-world industrial application. Favored by the American Chemical Society and the International Centre for Diffraction Data, X-Ray Fluorescence Spectrometry, Second Edition is an ideal introduction for newcomers to the field and an invaluable reference for experienced spectroscopists-in chemical analysis, geology, metallurgy, and materials science. An up-to-date review of X-ray spectroscopic techniques. This proven guidebook for industry professionals is thoroughly updated and expanded to reflect advances in X-ray analysis over the last decade. X-Ray Fluorescence Spectrometry, Second Edition includes: The history of X-ray fluorescence spectrometry-new to this edition. A critical review of the most useful X-ray spectrometers. Techniques and procedures for quantitative and qualitative analysis. Modern applications and industrial trends. X-ray spectra-new to this edition.

Principles of Analytical Electron Microscopy

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Author :
Publisher : Springer Science & Business Media
ISBN 13 : 1489920374
Total Pages : 458 pages
Book Rating : 4.4/5 (899 download)

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Book Synopsis Principles of Analytical Electron Microscopy by : Joseph Goldstein

Download or read book Principles of Analytical Electron Microscopy written by Joseph Goldstein and published by Springer Science & Business Media. This book was released on 2013-11-11 with total page 458 pages. Available in PDF, EPUB and Kindle. Book excerpt: Since the publication in 1979 of Introduction to Analytical Electron Microscopy (ed. J. J. Hren, J. I. Goldstein, and D. C. Joy; Plenum Press), analytical electron microscopy has continued to evolve and mature both as a topic for fundamental scientific investigation and as a tool for inorganic and organic materials characterization. Significant strides have been made in our understanding of image formation, electron diffraction, and beam/specimen interactions, both in terms of the "physics of the processes" and their practical implementation in modern instruments. It is the intent of the editors and authors of the current text, Principles of Analytical Electron Microscopy, to bring together, in one concise and readily accessible volume, these recent advances in the subject. The text begins with a thorough discussion of fundamentals to lay a foundation for today's state-of-the-art microscopy. All currently important areas in analytical electron microscopy-including electron optics, electron beam/specimen interactions, image formation, x-ray microanalysis, energy-loss spectroscopy, electron diffraction and specimen effects-have been given thorough attention. To increase the utility of the volume to a broader cross section of the scientific community, the book's approach is, in general, more descriptive than mathematical. In some areas, however, mathematical concepts are dealt with in depth, increasing the appeal to those seeking a more rigorous treatment of the subject.

Handbook of Practical X-Ray Fluorescence Analysis

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Author :
Publisher : Springer Science & Business Media
ISBN 13 : 3540367225
Total Pages : 897 pages
Book Rating : 4.5/5 (43 download)

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Book Synopsis Handbook of Practical X-Ray Fluorescence Analysis by : Burkhard Beckhoff

Download or read book Handbook of Practical X-Ray Fluorescence Analysis written by Burkhard Beckhoff and published by Springer Science & Business Media. This book was released on 2007-05-18 with total page 897 pages. Available in PDF, EPUB and Kindle. Book excerpt: X-Ray fluorescence analysis is an established technique for non-destructive elemental materials analysis. This book gives a user-oriented practical guidance to the application of this method. The book gives a survey of the theoretical fundamentals, analytical instrumentation, software for data processing, various excitation regimes including gracing incidents and microfocus measurements, quantitative analysis, applications in routine and micro analysis, mineralogy, biology, medicine, criminal investigations, archeology, metallurgy, abrasion, microelectronics, environmental air and water analysis. This book is the bible of X-Ray fluorescence analysis. It gives the basic knowledge on this technique, information on analytical equipment and guides the reader to the various applications. It appeals to researchers, analytically active engineers and advanced students.

Introduction to X-Ray Spectrometric Analysis

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Publisher : Springer Science & Business Media
ISBN 13 : 1489922040
Total Pages : 494 pages
Book Rating : 4.4/5 (899 download)

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Book Synopsis Introduction to X-Ray Spectrometric Analysis by : Eugene P. Bertin

Download or read book Introduction to X-Ray Spectrometric Analysis written by Eugene P. Bertin and published by Springer Science & Business Media. This book was released on 2013-06-29 with total page 494 pages. Available in PDF, EPUB and Kindle. Book excerpt: X-ray fluorescence spectrometry has been an established, widely practiced method of instrumental chemical analysis for about 30 years. However, although many colleges and universities offer full-semester courses in optical spectrometric methods of instrumental analysis and in x-ray dif fraction, very few offer full courses in x-ray spectrometric analysis. Those courses that are given are at the graduate level. Consequently, proficiency in this method must still be acquired by: self-instruction; on-the-job training and experience; "workshops" held by the x-ray instrument manu facturers; the one- or two-week summer courses offered by a few uni versities; and certain university courses in analytical and clinical chemistry, metallurgy, mineralogy. geology, ceramics. etc. that devote a small portion of their time to applications of x-ray spectrometry to those respective disciplines. Moreover, with all due respect to the books on x-ray spectrometric analysis now in print, in my opinion none is really suitable as a text or manual for beginners in the discipline. In 1968, when I undertook the writing of the first edition of my previous book, Principles and Practice of X-Ray Spectrometric Analysis,* my objective was to provide a student text. However, when all the material was compiled, I decided to provide a more comprehensive book, which was also lacking at that time. Although that book explains principles, instrumentation, and methods at the begin ner's level, this material is distributed throughout a mass of detail and more advanced material.

X-Ray Fluorescence Spectrometry and Related Techniques

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Author :
Publisher : Momentum Press
ISBN 13 : 1606503936
Total Pages : 160 pages
Book Rating : 4.6/5 (65 download)

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Book Synopsis X-Ray Fluorescence Spectrometry and Related Techniques by : Eva Margui

Download or read book X-Ray Fluorescence Spectrometry and Related Techniques written by Eva Margui and published by Momentum Press. This book was released on 2013-01-25 with total page 160 pages. Available in PDF, EPUB and Kindle. Book excerpt: X-ray fluorescence spectrometry (XRF) is a well-established analytical technique for qualitative and quantitative elemental analysis of a wide variety of routine quality control and research samples. Among its many desirable features, it delivers true multi-element character analysis, acceptable speed and economy, easy of automation, and the capacity to analyze solid samples. This remarkable contribution to this field provides a comprehensive and up-to-date account of basic principles, recent developments, instrumentation, sample preparation procedures, and applications of XRF analysis. If you are a professional in materials science, analytic chemistry, or physics, you will benefit from not only the review of basics, but also the newly developed technologies with XRF. Those recent technological advances, including the design of low-power micro- focus tubes and novel X-ray optics and detectors, have made it possible to extend XRF to the analysis of low-Z elements and to obtain 2D or 3D information on a micrometer-scale. And, the recent development and commercialization of bench top and portable instrumentation, offering extreme simplicity of operation in a low-cost design, have extended the applications of XRF to many more analytical problems.

Principles of Quantitative X-ray Fluorescence Analysis

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Author :
Publisher : John Wiley & Sons
ISBN 13 :
Total Pages : 412 pages
Book Rating : 4.3/5 (91 download)

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Book Synopsis Principles of Quantitative X-ray Fluorescence Analysis by : R. Tertian

Download or read book Principles of Quantitative X-ray Fluorescence Analysis written by R. Tertian and published by John Wiley & Sons. This book was released on 1982 with total page 412 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Principles and Practice of X-Ray Spectrometric Analysis

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Author :
Publisher : Springer Science & Business Media
ISBN 13 : 1461344166
Total Pages : 1098 pages
Book Rating : 4.4/5 (613 download)

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Book Synopsis Principles and Practice of X-Ray Spectrometric Analysis by : E.P. Bertin

Download or read book Principles and Practice of X-Ray Spectrometric Analysis written by E.P. Bertin and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 1098 pages. Available in PDF, EPUB and Kindle. Book excerpt: Since the first edition of this book was published early in 1970, three major developments have occurred in the field of x-ray spectrochemical analysis. First, wavelength-dispersive spectrometry, in 1970 already securely established among instrumental analytical methods, has matured. Highly sophisticated, miniaturized, modular, solid-state circuitry has replaced elec tron-tube circuitry in the readout system. Computers are now widely used to program and control fully automated spectrometers and to store, process, and compute analytical concentrations directly and immediately from ac cumulated count data. Matrix effects have largely yielded to mathematical treatment. The problems associated with the ultralong-wavelength region have been largely surmounted. Indirect (association) methods have extended the applicability of x-ray spectrometry to the entire periodic table and even to certain classes of compounds. Modern commercial, computerized, auto matic, simultaneous x-ray spectrometers can index up to 60 specimens in turn into the measurement position and for each collect count data for up to 30 elements and read out the analytical results in 1--4 min-all corrected for absorption-enhancement and particle-size or surface-texture effects and wholly unattended. Sample preparation has long been the time-limiting step in x-ray spectrochemical analysis. Second, energy-dispersive spectrometry, in 1970 only beginning to assume its place among instrumental analytical methods, has undergone phenomenal development and application and, some believe, may supplant wavelength spectrometry for most applications in the foreseeable future.

Handbook of X-Ray Spectrometry

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Author :
Publisher : CRC Press
ISBN 13 : 9780203908709
Total Pages : 1016 pages
Book Rating : 4.9/5 (87 download)

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Book Synopsis Handbook of X-Ray Spectrometry by : Rene Van Grieken

Download or read book Handbook of X-Ray Spectrometry written by Rene Van Grieken and published by CRC Press. This book was released on 2001-11-27 with total page 1016 pages. Available in PDF, EPUB and Kindle. Book excerpt: "Updates fundamentals and applications of all modes of x-ray spectrometry, including total reflection and polarized beam x-ray fluorescence analysis, and synchrotron radiation induced x-ray emission. Promotes the accurate measurement of samples while reducing the scattered background in the x-ray spectrum."

Scanning Electron Microscopy and X-Ray Microanalysis

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Publisher : Springer Science & Business Media
ISBN 13 : 1461332737
Total Pages : 679 pages
Book Rating : 4.4/5 (613 download)

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Book Synopsis Scanning Electron Microscopy and X-Ray Microanalysis by : Joseph Goldstein

Download or read book Scanning Electron Microscopy and X-Ray Microanalysis written by Joseph Goldstein and published by Springer Science & Business Media. This book was released on 2013-11-11 with total page 679 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book has evolved by processes of selection and expansion from its predecessor, Practical Scanning Electron Microscopy (PSEM), published by Plenum Press in 1975. The interaction of the authors with students at the Short Course on Scanning Electron Microscopy and X-Ray Microanalysis held annually at Lehigh University has helped greatly in developing this textbook. The material has been chosen to provide a student with a general introduction to the techniques of scanning electron microscopy and x-ray microanalysis suitable for application in such fields as biology, geology, solid state physics, and materials science. Following the format of PSEM, this book gives the student a basic knowledge of (1) the user-controlled functions of the electron optics of the scanning electron microscope and electron microprobe, (2) the characteristics of electron-beam-sample inter actions, (3) image formation and interpretation, (4) x-ray spectrometry, and (5) quantitative x-ray microanalysis. Each of these topics has been updated and in most cases expanded over the material presented in PSEM in order to give the reader sufficient coverage to understand these topics and apply the information in the laboratory. Throughout the text, we have attempted to emphasize practical aspects of the techniques, describing those instru ment parameters which the microscopist can and must manipulate to obtain optimum information from the specimen. Certain areas in particular have been expanded in response to their increasing importance in the SEM field. Thus energy-dispersive x-ray spectrometry, which has undergone a tremendous surge in growth, is treated in substantial detail.

X-Ray Spectroscopy for Chemical State Analysis

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Author :
Publisher : Springer Nature
ISBN 13 : 981197361X
Total Pages : 238 pages
Book Rating : 4.8/5 (119 download)

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Book Synopsis X-Ray Spectroscopy for Chemical State Analysis by : Jun Kawai

Download or read book X-Ray Spectroscopy for Chemical State Analysis written by Jun Kawai and published by Springer Nature. This book was released on 2022-12-15 with total page 238 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book focuses on X-ray spectroscopy for chemical state analysis covering X-ray physics, spectroscopic characteristics used for functional and toxic materials, and the author's ideas related to X-ray experiments. This book also provides novel theoretical interpretations of X-ray spectra along with experimental techniques needed for both synchrotron radiation users and laboratory experimentalists. Presenting not only practical information, this book also covers basic knowledge of commercially available spectrometers and the basic physics of optics and electromagnetism related to X-rays. Furthermore, the author introduces the forgotten history of X-ray physics in the beginning of twentieth century. This book is of use for researchers studying catalysts, charge-transfer materials, surface characterization, and toxic trace elements via X-ray spectroscopy for chemical state analysis as well as quantitative analysis.

Introduction to X-Ray Powder Diffractometry

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Author :
Publisher : Wiley-Interscience
ISBN 13 :
Total Pages : 440 pages
Book Rating : 4.4/5 (91 download)

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Book Synopsis Introduction to X-Ray Powder Diffractometry by : Ron Jenkins

Download or read book Introduction to X-Ray Powder Diffractometry written by Ron Jenkins and published by Wiley-Interscience. This book was released on 1996-07-12 with total page 440 pages. Available in PDF, EPUB and Kindle. Book excerpt: When bombarded with X-rays, solid materials produce distinct scattering patterns similar to fingerprints. X-ray powder diffraction is a technique used to fingerprint solid samples, which are then identified and cataloged for future use-much the way the FBI keeps fingerprints on file. The current database of some 70,000 material prints has been put to a broad range of uses, from the analysis of moon rocks to testing drugs for purity. Introduction to X-ray Powder Diffractometry fully updates the achievements in the field over the past fifteen years and provides a much-needed explanation of the state-of-the-art techniques involved in characterizing materials. It covers the latest instruments and methods, with an emphasis on the fundamentals of the diffractometer, its components, alignment, calibration, and automation. The first three chapters outline diffraction theory in clear language, accessible to both students and professionals in chemistry, physics, geology, and materials science. The book's middle chapters describe the instrumentation and procedures used in X-ray diffraction, including X-ray sources, X-ray detection, and production of monochromatic radiation. The chapter devoted to instrument design and calibration is followed by an examination of specimen preparation methods, data collection, and reduction. The final two chapters provide in-depth discussions of qualitative and quantitative analysis. While the material is presented in an orderly progression, beginning with basic concepts and moving on to more complex material, each chapter stands on its own and can be studied independently or used as a professional reference. More than 230 illustrations and tables demonstrate techniques and clarify complex material. Self-contained, timely, and user-friendly, Introduction to X-ray Powder Diffractometry is an enormously useful text and professional reference for analytical chemists, physicists, geologists and materials scientists, and upper-level undergraduate and graduate students in materials science and analytical chemistry. X-ray powder diffraction-a technique that has matured significantly in recent years-is used to identify solid samples and determine their composition by analyzing the so-called "fingerprints" they generate when X-rayed. This unique volume fulfills two major roles: it is the first textbook devoted solely to X-ray powder diffractometry, and the first up-to-date treatment of the subject in 20 years. This timely, authoritative volume features: * Clear, concise descriptions of both theory and practice-including fundamentals of diffraction theory and all aspects of the diffractometer * A treatment that reflects current trends toward automation, covering the newest instrumentation and automation techniques * Coverage of all the most common applications, with special emphasis on qualitative and quantitative analysis * An accessible presentation appropriate for both students and professionals * More than 230 tables and illustrations Introduction to X-ray Powder Diffractometry, a collaboration between two internationally known and respected experts in the field, provides invaluable guidance to anyone using X-ray powder diffractometers and diffractometry in materials science, ceramics, the pharmaceutical industry, and elsewhere.

Materials Characterization

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Publisher : John Wiley & Sons
ISBN 13 : 0470822996
Total Pages : 384 pages
Book Rating : 4.4/5 (78 download)

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Book Synopsis Materials Characterization by : Yang Leng

Download or read book Materials Characterization written by Yang Leng and published by John Wiley & Sons. This book was released on 2009-03-04 with total page 384 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book covers state-of-the-art techniques commonly used in modern materials characterization. Two important aspects of characterization, materials structures and chemical analysis, are included. Widely used techniques, such as metallography (light microscopy), X-ray diffraction, transmission and scanning electron microscopy, are described. In addition, the book introduces advanced techniques, including scanning probe microscopy. The second half of the book accordingly presents techniques such as X-ray energy dispersive spectroscopy (commonly equipped in the scanning electron microscope), fluorescence X-ray spectroscopy, and popular surface analysis techniques (XPS and SIMS). Finally, vibrational spectroscopy (FTIR and Raman) and thermal analysis are also covered.

Quantitative X-Ray Fluorescence Analysis

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Author :
Publisher :
ISBN 13 :
Total Pages : 432 pages
Book Rating : 4.F/5 ( download)

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Book Synopsis Quantitative X-Ray Fluorescence Analysis by : Gerald R. Lachance

Download or read book Quantitative X-Ray Fluorescence Analysis written by Gerald R. Lachance and published by . This book was released on 1995-01-31 with total page 432 pages. Available in PDF, EPUB and Kindle. Book excerpt: A systematic account concerning the basic theory of X-ray physics and spectrometer configurations leading to simple expressions quantifying primary and secondary fluorescence emissions. Discusses the fundamental parameters approach for converting intensities to concentrations in both its classical formalism and by a number of basic influence coefficient algorithms. Examines approximations underlying influence coefficient models and theoretical simulations are used to evaluate global methods. Includes numerous detailed examples as well as extensive tabulations of theoretical data.

Quantitative X-ray Fluorescence Analysis

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Publisher :
ISBN 13 :
Total Pages : 0 pages
Book Rating : 4.:/5 (875 download)

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Book Synopsis Quantitative X-ray Fluorescence Analysis by : Gerald R. Lachance

Download or read book Quantitative X-ray Fluorescence Analysis written by Gerald R. Lachance and published by . This book was released on 1995 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: