Principles Of Semiconductor Network Testing

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Principles of Semiconductor Network Testing

Author : Amir Afshar
Publisher : Elsevier
ISBN 13 : 0080539564
Total Pages : 229 pages
Book Rating : 4.0/5 (85 download)

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Book Synopsis Principles of Semiconductor Network Testing by : Amir Afshar

Download or read book Principles of Semiconductor Network Testing written by Amir Afshar and published by Elsevier. This book was released on 1996-04-22 with total page 229 pages. Available in PDF, EPUB and Kindle. Book excerpt: Principles of Semiconductor Network Testing gathers together comprehensive information which test and process professionals will find invaluable. The techniques outlined will help ensure that test methods and data collected reflect actual device performance, rather than 'testing the tester' or being lost in the noise floor. This book addresses the fundamental issues underlying the semiconductor test discipline. The test engineer must understand the basic principles of semiconductor fabrication and process and have an in-depth knowledge of circuit functions, instrumentation and noise sources. Introduces a novel component-testing philosophy for semiconductor test, product and design engineers Best new source of information for experienced semiconductor engineers as well as entry-level personnel Eight chapters about semiconductor testing

Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits

Author : M. Bushnell
Publisher : Springer Science & Business Media
ISBN 13 : 0792379918
Total Pages : 712 pages
Book Rating : 4.7/5 (923 download)

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Book Synopsis Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits by : M. Bushnell

Download or read book Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits written by M. Bushnell and published by Springer Science & Business Media. This book was released on 2004-12-15 with total page 712 pages. Available in PDF, EPUB and Kindle. Book excerpt: The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device techn- ogy, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester course and a teacher will have to select from the topics. We did not restrict such freedom because the selection may depend upon the individual expertise and interests. Besides, there is merit in having a larger book that will retain its usefulness for the owner even after the completion of the course. With equal tenacity, we address the needs of three other groups of readers.

CE Marking Handbook

Author : Dave Lohbeck
Publisher : Elsevier
ISBN 13 : 008050082X
Total Pages : 169 pages
Book Rating : 4.0/5 (85 download)

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Book Synopsis CE Marking Handbook by : Dave Lohbeck

Download or read book CE Marking Handbook written by Dave Lohbeck and published by Elsevier. This book was released on 1998-09-30 with total page 169 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book is essential reading for electronic consumer-product manufacturers doing business in the European marketplace. Compliance with directives and procedures can be a complex and confusing process, resulting in wasted money and effort. With the help of the CE Marking Handbook, engineers and managers can more easily identify which rules apply to them and pinpoint what they need to do to comply. Dave Lohbeck was formerly the Manager for Seminars and Training at TUV Rhineland, the largest German testing and certification agency. He has worked for many years as an engineer, including nine years in the field of European safety and EMC compliance.A once complicated topic is made clear as the author addresses the confusion surrounding CE Marking. Lohbeck offers guidance on both legal and design issues. This book includes a step-by-step design guide aimed at both novice and experienced exporters. With its help, engineers and managers can easily identify which rules apply to their products and pinpoint what they need to do to comply. The information presented here is backed up with facts and examples. Many have been misled, unfortunately, but this book presents the real meaning of CE Marking. Shows design engineers how to comply with CE requirements for product conformityExplains legal and technical issues concisely and logicallyPresents and illuminates US and EU differences

Satellite Communication Engineering

Author : Michael Olorunfunmi Kolawole
Publisher : CRC Press
ISBN 13 : 1482210118
Total Pages : 288 pages
Book Rating : 4.4/5 (822 download)

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Book Synopsis Satellite Communication Engineering by : Michael Olorunfunmi Kolawole

Download or read book Satellite Communication Engineering written by Michael Olorunfunmi Kolawole and published by CRC Press. This book was released on 2017-07-12 with total page 288 pages. Available in PDF, EPUB and Kindle. Book excerpt: An undeniably rich and thorough guide to satellite communication engineering, Satellite Communication Engineering, Second Edition presents the fundamentals of information communications systems in a simple and succinct way. This book considers both the engineering aspects of satellite systems as well as the practical issues in the broad field of information transmission. Implementing concepts developed on an intuitive, physical basis and utilizing a combination of applications and performance curves, this book starts off with a progressive foundation in satellite technology, and then moves on to more complex concepts with ease. What’s New in the Second Edition: The second edition covers satellite and Earth station design; global positioning systems; antenna tracking; links and communications systems; error detection and correction; data security; regulations and procedures for system modeling; integration; testing; and reliability and performance evaluation. Provides readers with the systems building blocks of satellite transponders and Earth stations, as well as the systems engineering design procedure Includes the tools needed to calculate basic orbit characteristics such as period, dwell time, coverage area, propagation losses; antenna system features such as size, beamwidth, aperture-frequency product, gain, tracking control; and system requirements such as power, availability, reliability, and performance Presents problem sets and starred sections containing basic mathematical development Details recent developments enabling digital information transmission and delivery via satellite Satellite Communication Engineering, Second Edition serves as a textbook for students and a resource for space agencies and relevant industries.

Principles of Testing Electronic Systems

Author : Samiha Mourad
Publisher : John Wiley & Sons
ISBN 13 : 9780471319313
Total Pages : 444 pages
Book Rating : 4.3/5 (193 download)

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Book Synopsis Principles of Testing Electronic Systems by : Samiha Mourad

Download or read book Principles of Testing Electronic Systems written by Samiha Mourad and published by John Wiley & Sons. This book was released on 2000-07-25 with total page 444 pages. Available in PDF, EPUB and Kindle. Book excerpt: A pragmatic approach to testing electronic systems As we move ahead in the electronic age, rapid changes in technology pose an ever-increasing number of challenges in testing electronic products. Many practicing engineers are involved in this arena, but few have a chance to study the field in a systematic way-learning takes place on the job. By covering the fundamental disciplines in detail, Principles of Testing Electronic Systems provides design engineers with the much-needed knowledge base. Divided into five major parts, this highly useful reference relates design and tests to the development of reliable electronic products; shows the main vehicles for design verification; examines designs that facilitate testing; and investigates how testing is applied to random logic, memories, FPGAs, and microprocessors. Finally, the last part offers coverage of advanced test solutions for today's very deep submicron designs. The authors take a phenomenological approach to the subject matter while providing readers with plenty of opportunities to explore the foundation in detail. Special features include: * An explanation of where a test belongs in the design flow * Detailed discussion of scan-path and ordering of scan-chains * BIST solutions for embedded logic and memory blocks * Test methodologies for FPGAs * A chapter on testing system on a chip * Numerous references

Handbook of Research on Developments and Trends in Wireless Sensor Networks: From Principle to Practice

Author : Jin, Hai
Publisher : IGI Global
ISBN 13 : 1615207023
Total Pages : 556 pages
Book Rating : 4.6/5 (152 download)

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Book Synopsis Handbook of Research on Developments and Trends in Wireless Sensor Networks: From Principle to Practice by : Jin, Hai

Download or read book Handbook of Research on Developments and Trends in Wireless Sensor Networks: From Principle to Practice written by Jin, Hai and published by IGI Global. This book was released on 2010-02-28 with total page 556 pages. Available in PDF, EPUB and Kindle. Book excerpt: "This book showcases the work many devoted wireless sensor network researchers all over world, and exhibits the up-to-date developments of WSNs from various perspectives"--Provided by publisher.

VLSI Test Principles and Architectures

Author : Laung-Terng Wang
Publisher : Elsevier
ISBN 13 : 0080474799
Total Pages : 809 pages
Book Rating : 4.0/5 (84 download)

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Book Synopsis VLSI Test Principles and Architectures by : Laung-Terng Wang

Download or read book VLSI Test Principles and Architectures written by Laung-Terng Wang and published by Elsevier. This book was released on 2006-08-14 with total page 809 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. Most up-to-date coverage of design for testability. Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.

High-Speed Digital System Design

Author : Anatoly Belous
Publisher : Springer Nature
ISBN 13 : 3030254097
Total Pages : 933 pages
Book Rating : 4.0/5 (32 download)

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Book Synopsis High-Speed Digital System Design by : Anatoly Belous

Download or read book High-Speed Digital System Design written by Anatoly Belous and published by Springer Nature. This book was released on 2019-11-13 with total page 933 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book describes for readers the entire, interconnected complex of theoretical and practical aspects of designing and organizing the production of various electronic devices, the general and main distinguishing feature of which is the high speed of processing and transmitting of digital signals. The authors discuss all the main stages of design - from the upper system level of the hierarchy (telecommunications system, 5G mobile communications) to the lower level of basic semiconductor elements, printed circuit boards. Since the developers of these devices in practice deal with distorted digital signals that are transmitted against a background of interference, the authors not only explain the physical nature of such effects, but also offer specific solutions as to how to avoid such parasitic effects, even at the design stage of high-speed devices.

System-on-Chip Test Architectures

Author : Laung-Terng Wang
Publisher :
ISBN 13 :
Total Pages : 896 pages
Book Rating : 4.:/5 (11 download)

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Book Synopsis System-on-Chip Test Architectures by : Laung-Terng Wang

Download or read book System-on-Chip Test Architectures written by Laung-Terng Wang and published by . This book was released on 2010 with total page 896 pages. Available in PDF, EPUB and Kindle. Book excerpt: Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today's overall product cost. This book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers, DFT practitioners, and VLSI designers to master quickly System-on-Chip Test architectures, for test debug and diagnosis of digital, memory, and analog/mixed-signal designs. KEY FEATURES * Emphasizes VLSI Test principles and Design for Testability architectures, with numerous illustrations/examples. * Most up-to-date coverage available, including Fault Tolerance, Low-Power Testing, Defect and Error Tolerance, Network-on-Chip (NOC) Testing, Software-Based Self-Testing, FPGA Testing, MEMS Testing, and System-In-Package (SIP) Testing, which are not yet available in any testing book. * Covers the entire spectrum of VLSI testing and DFT architectures, from digital and analog, to memory circuits, and fault diagnosis and self-repair from digital to memory circuits. * Discusses future nanotechnology test trends and challenges facing the nanometer design era; promising nanotechnology test techniques, including Quantum-Dots, Cellular Automata, Carbon-Nanotubes, and Hybrid Semiconductor/Nanowire/Molecular Computing. * Practical problems at the end of each chapter for students.

Bibliographic Index

Author :
Publisher :
ISBN 13 :
Total Pages : 1128 pages
Book Rating : 4.3/5 (91 download)

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Book Synopsis Bibliographic Index by :

Download or read book Bibliographic Index written by and published by . This book was released on 1995 with total page 1128 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Semiconductor Testing Technology

Author : Charles Eric Jowett
Publisher :
ISBN 13 :
Total Pages : 264 pages
Book Rating : 4.:/5 (318 download)

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Book Synopsis Semiconductor Testing Technology by : Charles Eric Jowett

Download or read book Semiconductor Testing Technology written by Charles Eric Jowett and published by . This book was released on 1982 with total page 264 pages. Available in PDF, EPUB and Kindle. Book excerpt:

The Cumulative Book Index

Author :
Publisher :
ISBN 13 :
Total Pages : 2166 pages
Book Rating : 4.F/5 ( download)

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Book Synopsis The Cumulative Book Index by :

Download or read book The Cumulative Book Index written by and published by . This book was released on 1996 with total page 2166 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Fundamentals of Semiconductor Manufacturing and Process Control

Author : Gary S. May
Publisher : John Wiley & Sons
ISBN 13 : 0471790273
Total Pages : 428 pages
Book Rating : 4.4/5 (717 download)

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Book Synopsis Fundamentals of Semiconductor Manufacturing and Process Control by : Gary S. May

Download or read book Fundamentals of Semiconductor Manufacturing and Process Control written by Gary S. May and published by John Wiley & Sons. This book was released on 2006-05-26 with total page 428 pages. Available in PDF, EPUB and Kindle. Book excerpt: A practical guide to semiconductor manufacturing from processcontrol to yield modeling and experimental design Fundamentals of Semiconductor Manufacturing and Process Controlcovers all issues involved in manufacturing microelectronic devicesand circuits, including fabrication sequences, process control,experimental design, process modeling, yield modeling, and CIM/CAMsystems. Readers are introduced to both the theory and practice ofall basic manufacturing concepts. Following an overview of manufacturing and technology, the textexplores process monitoring methods, including those that focus onproduct wafers and those that focus on the equipment used toproduce wafers. Next, the text sets forth some fundamentals ofstatistics and yield modeling, which set the foundation for adetailed discussion of how statistical process control is used toanalyze quality and improve yields. The discussion of statistical experimental design offers readers apowerful approach for systematically varying controllable processconditions and determining their impact on output parameters thatmeasure quality. The authors introduce process modeling concepts,including several advanced process control topics such asrun-by-run, supervisory control, and process and equipmentdiagnosis. Critical coverage includes the following: * Combines process control and semiconductor manufacturing * Unique treatment of system and software technology and managementof overall manufacturing systems * Chapters include case studies, sample problems, and suggestedexercises * Instructor support includes electronic copies of the figures andan instructor's manual Graduate-level students and industrial practitioners will benefitfrom the detailed exami?nation of how electronic materials andsupplies are converted into finished integrated circuits andelectronic products in a high-volume manufacturingenvironment. An Instructor's Manual presenting detailed solutions to all theproblems in the book is available from the Wiley editorialdepartment. An Instructor Support FTP site is also available.

The Fundamentals of Digital Semiconductor Testing

Author : Guy Perry
Publisher :
ISBN 13 :
Total Pages : pages
Book Rating : 4.:/5 (86 download)

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Book Synopsis The Fundamentals of Digital Semiconductor Testing by : Guy Perry

Download or read book The Fundamentals of Digital Semiconductor Testing written by Guy Perry and published by . This book was released on 1996 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

System-on-Chip Test Architectures

Author : Laung-Terng Wang
Publisher : Morgan Kaufmann
ISBN 13 : 0080556809
Total Pages : 893 pages
Book Rating : 4.0/5 (85 download)

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Book Synopsis System-on-Chip Test Architectures by : Laung-Terng Wang

Download or read book System-on-Chip Test Architectures written by Laung-Terng Wang and published by Morgan Kaufmann. This book was released on 2010-07-28 with total page 893 pages. Available in PDF, EPUB and Kindle. Book excerpt: Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today's overall product cost. This book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers, DFT practitioners, and VLSI designers to master quickly System-on-Chip Test architectures, for test debug and diagnosis of digital, memory, and analog/mixed-signal designs. Emphasizes VLSI Test principles and Design for Testability architectures, with numerous illustrations/examples. Most up-to-date coverage available, including Fault Tolerance, Low-Power Testing, Defect and Error Tolerance, Network-on-Chip (NOC) Testing, Software-Based Self-Testing, FPGA Testing, MEMS Testing, and System-In-Package (SIP) Testing, which are not yet available in any testing book. Covers the entire spectrum of VLSI testing and DFT architectures, from digital and analog, to memory circuits, and fault diagnosis and self-repair from digital to memory circuits. Discusses future nanotechnology test trends and challenges facing the nanometer design era; promising nanotechnology test techniques, including Quantum-Dots, Cellular Automata, Carbon-Nanotubes, and Hybrid Semiconductor/Nanowire/Molecular Computing. Practical problems at the end of each chapter for students.

Microwave Devices, Circuits and Subsystems for Communications Engineering

Author : Ian A. Glover
Publisher : John Wiley & Sons
ISBN 13 : 0470012749
Total Pages : 550 pages
Book Rating : 4.4/5 (7 download)

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Book Synopsis Microwave Devices, Circuits and Subsystems for Communications Engineering by : Ian A. Glover

Download or read book Microwave Devices, Circuits and Subsystems for Communications Engineering written by Ian A. Glover and published by John Wiley & Sons. This book was released on 2006-05-01 with total page 550 pages. Available in PDF, EPUB and Kindle. Book excerpt: Microwave Devices, Circuits and Subsystems for Communications Engineering provides a detailed treatment of the common microwave elements found in modern microwave communications systems. The treatment is thorough without being unnecessarily mathematical. The emphasis is on acquiring a conceptual understanding of the techniques and technologies discussed and the practical design criteria required to apply these in real engineering situations. Key topics addressed include: Microwave diode and transistor equivalent circuits Microwave transmission line technologies and microstrip design Network methods and s-parameter measurements Smith chart and related design techniques Broadband and low-noise amplifier design Mixer theory and design Microwave filter design Oscillators, synthesisers and phase locked loops Each chapter is written by specialists in their field and the whole is edited by experience authors whose expertise spans the fields of communications systems engineering and microwave circuit design. Microwave Devices, Circuits and Subsystems for Communications Engineering is suitable for senior electrical, electronic or telecommunications engineering undergraduate students, first year postgraduate students and experienced engineers seeking a conversion or refresher text. Includes a companion website featuring: Solutions to selected problems Electronic versions of the figures Sample chapter

Semiconductor Material and Device Characterization

Author : Dieter K. Schroder
Publisher : John Wiley & Sons
ISBN 13 : 0471739065
Total Pages : 800 pages
Book Rating : 4.4/5 (717 download)

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Book Synopsis Semiconductor Material and Device Characterization by : Dieter K. Schroder

Download or read book Semiconductor Material and Device Characterization written by Dieter K. Schroder and published by John Wiley & Sons. This book was released on 2015-06-29 with total page 800 pages. Available in PDF, EPUB and Kindle. Book excerpt: This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also examines new interpretations and new applications of existing techniques. Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring semiconductor materials and devices. Coverage includes the full range of electrical and optical characterization methods, including the more specialized chemical and physical techniques. Readers familiar with the previous two editions will discover a thoroughly revised and updated Third Edition, including: Updated and revised figures and examples reflecting the most current data and information 260 new references offering access to the latest research and discussions in specialized topics New problems and review questions at the end of each chapter to test readers' understanding of the material In addition, readers will find fully updated and revised sections in each chapter. Plus, two new chapters have been added: Charge-Based and Probe Characterization introduces charge-based measurement and Kelvin probes. This chapter also examines probe-based measurements, including scanning capacitance, scanning Kelvin force, scanning spreading resistance, and ballistic electron emission microscopy. Reliability and Failure Analysis examines failure times and distribution functions, and discusses electromigration, hot carriers, gate oxide integrity, negative bias temperature instability, stress-induced leakage current, and electrostatic discharge. Written by an internationally recognized authority in the field, Semiconductor Material and Device Characterization remains essential reading for graduate students as well as for professionals working in the field of semiconductor devices and materials. An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department.