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Author : J. Kassabov
Publisher :
ISBN 13 :
Total Pages : 546 pages
Book Rating : 4.:/5 (658 download)
Download or read book Physical Problems in Microelectronics written by J. Kassabov and published by . This book was released on 1987 with total page 546 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : J. Kassabov
Publisher : World Scientific Publishing Company
ISBN 13 :
Total Pages : 566 pages
Book Rating : 4.:/5 (42 download)
Download or read book Physical Problems in Microelectronics written by J. Kassabov and published by World Scientific Publishing Company. This book was released on 1987 with total page 566 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : International School on Physical Problems in Microelectronics
Publisher :
ISBN 13 :
Total Pages : pages
Book Rating : 4.:/5 (632 download)
Download or read book Physical Problems in Microelectronics written by International School on Physical Problems in Microelectronics and published by . This book was released on 1987 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Physical Problems in Microelectronics. Proceedings of the International School ; 5 written by and published by . This book was released on 1987 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Jordan Kassabov
Publisher :
ISBN 13 :
Total Pages : 639 pages
Book Rating : 4.:/5 (247 download)
Download or read book Physical Problems in Microelectronics written by Jordan Kassabov and published by . This book was released on 1985 with total page 639 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Physical problems in microelectronics. Proceedings of the International School ; 4 written by and published by . This book was released on 1985 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Physical problems in microelectronics. Proceedings of the International School ; 6 written by and published by . This book was released on 1989 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : J. Kassabov
Publisher :
ISBN 13 :
Total Pages : 528 pages
Book Rating : 4.:/5 (658 download)
Download or read book International School on Physical Problems in Microelectronics written by J. Kassabov and published by . This book was released on 1989 with total page 528 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Pradeep Lall
Publisher : CRC Press
ISBN 13 : 0429605595
Total Pages : 332 pages
Book Rating : 4.4/5 (296 download)
Download or read book Influence of Temperature on Microelectronics and System Reliability written by Pradeep Lall and published by CRC Press. This book was released on 2020-07-09 with total page 332 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book raises the level of understanding of thermal design criteria. It provides the design team with sufficient knowledge to help them evaluate device architecture trade-offs and the effects of operating temperatures. The author provides readers a sound scientific basis for system operation at realistic steady state temperatures without reliability penalties. Higher temperature performance than is commonly recommended is shown to be cost effective in production for life cycle costs. The microelectronic package considered in the book is assumed to consist of a semiconductor device with first-level interconnects that may be wirebonds, flip-chip, or tape automated bonds; die attach; substrate; substrate attach; case; lid; lid seal; and lead seal. The temperature effects on electrical parameters of both bipolar and MOSFET devices are discussed, and models quantifying the temperature effects on package elements are identified. Temperature-related models have been used to derive derating criteria for determining the maximum and minimum allowable temperature stresses for a given microelectronic package architecture. The first chapter outlines problems with some of the current modeling strategies. The next two chapters present microelectronic device failure mechanisms in terms of their dependence on steady state temperature, temperature cycle, temperature gradient, and rate of change of temperature at the chip and package level. Physics-of-failure based models used to characterize these failure mechanisms are identified and the variabilities in temperature dependence of each of the failure mechanisms are characterized. Chapters 4 and 5 describe the effects of temperature on the performance characteristics of MOS and bipolar devices. Chapter 6 discusses using high-temperature stress screens, including burn-in, for high-reliability applications. The burn-in conditions used by some manufacturers are examined and a physics-of-failure approach is described. The
Author : Jordan Kassabov
Publisher :
ISBN 13 :
Total Pages : 639 pages
Book Rating : 4.:/5 (631 download)
Download or read book Physical problems in microelectronics written by Jordan Kassabov and published by . This book was released on 1985 with total page 639 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : J. Kassabov
Publisher :
ISBN 13 :
Total Pages : 660 pages
Book Rating : 4.:/5 (42 download)
Download or read book Physical Problems in Microelectronics written by J. Kassabov and published by . This book was released on 1985 with total page 660 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Shahrzad Salemi
Publisher : RIAC
ISBN 13 : 1933904291
Total Pages : 271 pages
Book Rating : 4.9/5 (339 download)
Download or read book Physics-of-Failure Based Handbook of Microelectronic Systems written by Shahrzad Salemi and published by RIAC. This book was released on 2008 with total page 271 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Vladislav A. Vashchenko
Publisher : Springer Science & Business Media
ISBN 13 : 0387745149
Total Pages : 337 pages
Book Rating : 4.3/5 (877 download)
Download or read book Physical Limitations of Semiconductor Devices written by Vladislav A. Vashchenko and published by Springer Science & Business Media. This book was released on 2008-03-22 with total page 337 pages. Available in PDF, EPUB and Kindle. Book excerpt: Providing an important link between the theoretical knowledge in the field of non-linier physics and practical application problems in microelectronics, the purpose of the book is popularization of the physical approach for reliability assurance. Another unique aspect of the book is the coverage given to the role of local structural defects, their mathematical description, and their impact on the reliability of the semiconductor devices.
Author : J. Greer
Publisher : Elsevier
ISBN 13 : 0080537219
Total Pages : 264 pages
Book Rating : 4.0/5 (85 download)
Download or read book Nano and Giga Challenges in Microelectronics written by J. Greer and published by Elsevier. This book was released on 2003-10-24 with total page 264 pages. Available in PDF, EPUB and Kindle. Book excerpt: The book is designed as an introduction for engineers and researchers wishing to obtain a fundamental knowledge and a snapshot in time of the cutting edge in technology research. As a natural consequence, Nano and Giga Challenges is also an essential reference for the "gurus" wishing to keep abreast of the latest directions and challenges in microelectronic technology development and future trends. The combination of viewpoints presented within the book can help to foster further research and cross-disciplinary interaction needed to surmount the barriers facing future generations of technology design. Key Features: • Quickly becoming the hottest topic of the new millennium (2.4 billion dollars funding in US alone • Current status and future trends of micro and nanoelectronics research • Written by leading experts in the corresponding research areas • Excellent tutorial for graduate students and reference for "gurus"
Author : Jesús A. del Alamo
Publisher :
ISBN 13 : 9780134670904
Total Pages : 0 pages
Book Rating : 4.6/5 (79 download)
Download or read book Integrated Microelectronic Devices written by Jesús A. del Alamo and published by . This book was released on 2018 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: "The central goal of this book is to present the fundamentals of semiconductor device operation with relevance to modern integrated microelectronics (as opposed to, say, photonics, energy conversion devices, or power electronics). This means that no optical devices nor power devices of any kind are described. In contrast, emphasis is devoted to frequency response, layout, geometrical effects, parasitic issues and modeling in integrated microelectronics devices (transistors and diodes). In spite of this focus, the concepts learned here are highly applicable in other device contexts. This book should be a great resource for a broad range of students with a diverse set of interests."--
Author :
Publisher :
ISBN 13 :
Total Pages : 536 pages
Book Rating : 4.3/5 (91 download)
Download or read book 6th International School on Physical Problems in Microelectronics, 23-28 May 1989, Varna, Bulgaria written by and published by . This book was released on 1989 with total page 536 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author :
Publisher : Elsevier
ISBN 13 : 0080542921
Total Pages : 434 pages
Book Rating : 4.0/5 (85 download)
Download or read book PVD for Microelectronics: Sputter Desposition to Semiconductor Manufacturing written by and published by Elsevier. This book was released on 1998-10-29 with total page 434 pages. Available in PDF, EPUB and Kindle. Book excerpt: Physics of Thin Films is one of the longest running continuing series in thin film science, consisting of 25 volumes since 1963. The series contains quality studies of the properties of various thin films materials and systems.In order to be able to reflect the development of today's science and to cover all modern aspects of thin films, the series, starting with Volume 20, has moved beyond the basic physics of thin films. It now addresses the most important aspects of both inorganic and organic thin films, in both their theoretical as well as technological aspects. Therefore, in order to reflect the modern technology-oriented problems, the title has been slightly modified from Physics of Thin Films to Thin Films.This volume, part of the Thin Films Series, has been wholly written by two authors instead of showcasing several edited manuscripts.
