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Author : Manoj Franklin
Publisher :
ISBN 13 :
Total Pages : 180 pages
Book Rating : 4.:/5 (89 download)
Download or read book Row/column Pattern Sensitive Faults in Random Access Memories written by Manoj Franklin and published by . This book was released on 1990 with total page 180 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : M. Bushnell
Publisher : Springer Science & Business Media
ISBN 13 : 0306470403
Total Pages : 690 pages
Book Rating : 4.3/5 (64 download)
Download or read book Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits written by M. Bushnell and published by Springer Science & Business Media. This book was released on 2006-04-11 with total page 690 pages. Available in PDF, EPUB and Kindle. Book excerpt: The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device techn- ogy, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester course and a teacher will have to select from the topics. We did not restrict such freedom because the selection may depend upon the individual expertise and interests. Besides, there is merit in having a larger book that will retain its usefulness for the owner even after the completion of the course. With equal tenacity, we address the needs of three other groups of readers.
Author : Parag K. Lala
Publisher : Academic Press
ISBN 13 : 9780124343306
Total Pages : 222 pages
Book Rating : 4.3/5 (433 download)
Download or read book Digital Circuit Testing and Testability written by Parag K. Lala and published by Academic Press. This book was released on 1997 with total page 222 pages. Available in PDF, EPUB and Kindle. Book excerpt: An easy to use introduction to the practices and techniques in the field of digital circuit testing. Lala writes in a user-friendly and tutorial style, making the book easy to read, even for the newcomer to fault-tolerant system design. Each informative chapter is self-contained, with little or no previous knowledge of a topic assumed. Extensive references follow each chapter.
Author : Stanley Leonard Hurst
Publisher : IET
ISBN 13 : 9780852969014
Total Pages : 560 pages
Book Rating : 4.9/5 (69 download)
Download or read book VLSI Testing written by Stanley Leonard Hurst and published by IET. This book was released on 1998 with total page 560 pages. Available in PDF, EPUB and Kindle. Book excerpt: Hurst, an editor at the Microelectronics Journal, analyzes common problems that electronics engineers and circuit designers encounter while testing integrated circuits and the systems in which they are used, and explains a variety of solutions available for overcoming them in both digital and mixed circuits. Among his topics are faults in digital circuits, generating a digital test pattern, signatures and self-tests, structured design for testability, testing structured digital circuits and microprocessors, and financial aspects of testing. The self- contained reference is also suitable as a textbook in a formal course on the subject. Annotation copyrighted by Book News, Inc., Portland, OR
Author : A. J. van de Goor
Publisher : John Wiley & Sons
ISBN 13 :
Total Pages : 542 pages
Book Rating : 4.3/5 (91 download)
Download or read book Testing Semiconductor Memories written by A. J. van de Goor and published by John Wiley & Sons. This book was released on 1991 with total page 542 pages. Available in PDF, EPUB and Kindle. Book excerpt: Comprehensive coverage of memory test problems at chip, array and board level is provided in this book. For each of these test levels a class of fault models is introduced along with tests for these models. The author also presents algorithms of relevant fault models, together with proofs of their correctness. Special attention is given to why a fault model belongs to a particular class and why it is of interest. A software package, suitable for use on IBM PCs and compatibles, is also available which consists of a set of memory test programs and a simulation package demonstrating how the algorithms are executed and the relationship of the algorithm with the memory
Author : Kanad Chakraborty
Publisher : Prentice Hall PTR
ISBN 13 :
Total Pages : 456 pages
Book Rating : 4.F/5 ( download)
Download or read book Fault-tolerance and Reliability Techniques for High-density Random-access Memories written by Kanad Chakraborty and published by Prentice Hall PTR. This book was released on 2002 with total page 456 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book deals with primarily with reliable and faul-tolerant circuit design and evaluation techniques for RAMS. It examines both the manufacturing faul-tolerance (e.g. self-repair at the time of manufacturing) and online and field-related fault-tolerance (e.g. error-correction). It talks a lot about important techniques and requirements, and explains what needs to be done and why for each of the techniques.
Author : Manoj Sachdev
Publisher : Springer Science & Business Media
ISBN 13 : 0387465472
Total Pages : 343 pages
Book Rating : 4.3/5 (874 download)
Download or read book Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits written by Manoj Sachdev and published by Springer Science & Business Media. This book was released on 2007-06-04 with total page 343 pages. Available in PDF, EPUB and Kindle. Book excerpt: The 2nd edition of defect oriented testing has been extensively updated. New chapters on Functional, Parametric Defect Models and Inductive fault Analysis and Yield Engineering have been added to provide a link between defect sources and yield. The chapter on RAM testing has been updated with focus on parametric and SRAM stability testing. Similarly, newer material has been incorporated in digital fault modeling and analog testing chapters. The strength of Defect Oriented Testing for nano-Metric CMOS VLSIs lies in its industrial relevance.
Author : R. Dean Adams
Publisher : Springer Science & Business Media
ISBN 13 : 0306479729
Total Pages : 252 pages
Book Rating : 4.3/5 (64 download)
Download or read book High Performance Memory Testing written by R. Dean Adams and published by Springer Science & Business Media. This book was released on 2005-12-29 with total page 252 pages. Available in PDF, EPUB and Kindle. Book excerpt: Are memory applications more critical than they have been in the past? Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and test engineers do not do their jobs very carefully. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is based on the author's 20 years of experience in memory design, memory reliability development and memory self test. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is written for the professional and the researcher to help them understand the memories that are being tested.
Author : Said Hamdioui
Publisher : Springer Science & Business Media
ISBN 13 : 1475767064
Total Pages : 231 pages
Book Rating : 4.4/5 (757 download)
Download or read book Testing Static Random Access Memories written by Said Hamdioui and published by Springer Science & Business Media. This book was released on 2013-06-29 with total page 231 pages. Available in PDF, EPUB and Kindle. Book excerpt: Testing Static Random Access Memories covers testing of one of the important semiconductor memories types; it addresses testing of static random access memories (SRAMs), both single-port and multi-port. It contributes to the technical acknowledge needed by those involved in memory testing, engineers and researchers. The book begins with outlining the most popular SRAMs architectures. Then, the description of realistic fault models, based on defect injection and SPICE simulation, are introduced. Thereafter, high quality and low cost test patterns, as well as test strategies for single-port, two-port and any p-port SRAMs are presented, together with some preliminary test results showing the importance of the new tests in reducing DPM level. The impact of the port restrictions (e.g., read-only ports) on the fault models, tests, and test strategies is also discussed. Features: -Fault primitive based analysis of memory faults, -A complete framework of and classification memory faults, -A systematic way to develop optimal and high quality memory test algorithms, -A systematic way to develop test patterns for any multi-port SRAM, -Challenges and trends in embedded memory testing.
Author : Frank F. Tsui
Publisher : McGraw-Hill Companies
ISBN 13 :
Total Pages : 730 pages
Book Rating : 4.3/5 (91 download)
Download or read book LSI/VLSI Testability Design written by Frank F. Tsui and published by McGraw-Hill Companies. This book was released on 1987 with total page 730 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Allen Kent
Publisher : CRC Press
ISBN 13 : 9780824727130
Total Pages : 430 pages
Book Rating : 4.7/5 (271 download)
Download or read book Encyclopedia of Microcomputers written by Allen Kent and published by CRC Press. This book was released on 1994-10-27 with total page 430 pages. Available in PDF, EPUB and Kindle. Book excerpt: "The Encyclopedia of Microcomputers serves as the ideal companion reference to the popular Encyclopedia of Computer Science and Technology. Now in its 10th year of publication, this timely reference work details the broad spectrum of microcomputer technology, including microcomputer history; explains and illustrates the use of microcomputers throughout academe, business, government, and society in general; and assesses the future impact of this rapidly changing technology."
Author :
Publisher :
ISBN 13 :
Total Pages : 1032 pages
Book Rating : 4.3/5 (91 download)
Download or read book Proceedings written by and published by . This book was released on 1995 with total page 1032 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author :
Publisher :
ISBN 13 :
Total Pages : 1460 pages
Book Rating : 4.:/5 (31 download)
Download or read book Scientific and Technical Aerospace Reports written by and published by . This book was released on 1991 with total page 1460 pages. Available in PDF, EPUB and Kindle. Book excerpt: Lists citations with abstracts for aerospace related reports obtained from world wide sources and announces documents that have recently been entered into the NASA Scientific and Technical Information Database.
Author : Allen Kent
Publisher : CRC Press
ISBN 13 : 9780824722869
Total Pages : 424 pages
Book Rating : 4.7/5 (228 download)
Download or read book Encyclopedia of Computer Science and Technology written by Allen Kent and published by CRC Press. This book was released on 1995-07-26 with total page 424 pages. Available in PDF, EPUB and Kindle. Book excerpt: Case-Based Reasoning to User Interface Software Tools
Author : Hassan K. Reghbati
Publisher :
ISBN 13 :
Total Pages : 630 pages
Book Rating : 4.3/5 (91 download)
Download or read book Tutorial--VLSI Testing & Validation Techniques written by Hassan K. Reghbati and published by . This book was released on 1985 with total page 630 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author :
Publisher :
ISBN 13 :
Total Pages : 542 pages
Book Rating : 4.3/5 (91 download)
Download or read book IEEE VLSI Test Symposium written by and published by . This book was released on 1999 with total page 542 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Mohammed Ismail
Publisher : North Holland
ISBN 13 : 9780444012012
Total Pages : 1032 pages
Book Rating : 4.0/5 (12 download)
Download or read book 29th Midwest Symposium on Circuits and Systems written by Mohammed Ismail and published by North Holland. This book was released on 1987 with total page 1032 pages. Available in PDF, EPUB and Kindle. Book excerpt:
