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On Advancement Of High Speed Atomic Force Microscope Technology
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Book Synopsis On Advancement of High Speed Atomic Force Microscope Technology by : Kimberly E. SooHoo
Download or read book On Advancement of High Speed Atomic Force Microscope Technology written by Kimberly E. SooHoo and published by . This book was released on 2008 with total page 47 pages. Available in PDF, EPUB and Kindle. Book excerpt: High speed atomic force microscopy (AFM) is a developing process in which nanoscale objects, such as crystal structures or strands of DNA, can be imaged at rates fast enough to watch processes as they occur. Although current generation AFM is already pivotal in many fields of research and industry, slow scan rates inhibit the imaging of dynamic samples. Much advancement has been made in high speed AFM thus far, yet many subsystems remain to be developed. This thesis outlines the development of a feedback controller for the AFM scanner, as well as the filters designed to attenuate high frequency noise. A comparison of the scan signals and scanner output signals are compared, with and without the controller and filters. Post-data acquisition image processing techniques are also described and compared with raw data. Finally, these techniques are applied to the high speed imaging of calcite etched with hydrochloric acid.
Book Synopsis Atomic Force Microscopy in Molecular and Cell Biology by : Jiye Cai
Download or read book Atomic Force Microscopy in Molecular and Cell Biology written by Jiye Cai and published by Springer. This book was released on 2018-11-03 with total page 235 pages. Available in PDF, EPUB and Kindle. Book excerpt: The book addresses new achievements in AFM instruments – e.g. higher speed and higher resolution – and how AFM is being combined with other new methods like NSOM, STED, STORM, PALM, and Raman. This book explores the latest advances in atomic force microscopy and related techniques in molecular and cell biology. Atomic force microscopy (AFM) can be used to detect the superstructures of the cell membrane, cell morphology, cell skeletons and their mechanical properties. Opening up new fields of in-situ dynamic study for living cells, enzymatic reactions, fibril growth and biomedical research, these combined techniques will yield valuable new insights into molecule and cell biology. This book offers a valuable resource for students and researchers in the fields of biochemistry, cell research and chemistry etc.
Book Synopsis Roadmap of Scanning Probe Microscopy by : Seizo Morita
Download or read book Roadmap of Scanning Probe Microscopy written by Seizo Morita and published by Springer Science & Business Media. This book was released on 2006-12-30 with total page 207 pages. Available in PDF, EPUB and Kindle. Book excerpt: Scanning tunneling microscopy has achieved remarkable progress and become the key technology for surface science. This book predicts the future development for all of scanning probe microscopy (SPM). Such forecasts may help to determine the course ultimately taken and may accelerate research and development on nanotechnology and nanoscience, as well as all in SPM-related fields in the future.
Book Synopsis High-Speed Atomic Force Microscopy in Biology by : Toshio Ando
Download or read book High-Speed Atomic Force Microscopy in Biology written by Toshio Ando and published by Springer Nature. This book was released on 2022-03-23 with total page 327 pages. Available in PDF, EPUB and Kindle. Book excerpt: This first book on high-speed atomic force microscopy (HS-AFM) is intended for students and biologists who want to use HS-AFM in their research. It provides straightforward explanations of the principle and techniques of AFM and HS-AFM. Numerous examples of HS-AFM studies on proteins demonstrate how to apply this new form of microscopy to specific biological problems. Several precautions for successful imaging and the preparation of cantilever tips and substrate surfaces will greatly benefit first-time users of HS-AFM. In turn, the instrumentation techniques detailed in Chapter 4 can be skipped, but will be useful for engineers and scientists who want to develop the next generation of high-speed scanning probe microscopes for biology. The book is intended to facilitate the first-time use of this new technique, and to inspire students and researchers to tackle their own specific biological problems by directly observing dynamic events occurring in the nanoscopic world. Microscopy in biology has recently entered a new era with the advent of high-speed atomic force microscopy (HS-AFM). Unlike optical microscopy, electron microscopy, and conventional slow AFM, it allows us to directly observe biological molecules in physiological environments. Molecular “movies” created using HS-AFM can directly reveal how molecules behave and operate, without the need for subsequent complex analyses and roundabout interpretations. It also allows us to directly monitor morphological change in live cells, and dynamic molecular events occurring on the surfaces of living bacteria and intracellular organelles. As HS-AFM instruments were recently commercialized, in the near future HS-AFM is expected to become a common tool in biology, and will enhance and accelerate our understanding of biological phenomena.
Book Synopsis A System Dynamics Approach to User Independence in High Speed Atomic Force Microscopy by : Daniel James Burns
Download or read book A System Dynamics Approach to User Independence in High Speed Atomic Force Microscopy written by Daniel James Burns and published by . This book was released on 2010 with total page 146 pages. Available in PDF, EPUB and Kindle. Book excerpt: As progress in molecular biology and nanotechnology continues, demand for rapid and high quality image acquisition has increased to the point where the limitations of atomic force microscopes (AFM) become impediments to further discovery. Many biological processes of interest occur on time scales faster than the observation capability of conventional AFMs, which are typically limited to imaging rates on the order of minutes. Imaging at faster scan rates excite resonances in the mechanical scanner that can distort the image, thereby preventing higher speed imaging. Although traditional robust feedforward controllers and input shaping have proven effective at minimizing the influence of scanner distortions, the lack of direct measurement and use of model-based controllers has required disassembling the microscope to access lateral motion with external sensors in order to perform a full system identification experiment, which places excessive demands on routine microscope operators. This work represents a new way to characterize the lateral scanner dynamics without addition of lateral sensors, and shape the commanded input signals in such a way that disturbing dynamics are not excited in an automatic and user-independent manner. Scanner coupling between the lateral and out-of-plane directions is exploited and used to build a minimal model of the scanner that is also sufficient to describe the source of the disturbances. This model informs the design of an online input shaper used to suppress components of the high speed command signals. The method presented is distinct from alternate approaches in that neither an information-complete system identification experiment, nor microscope modification are required. This approach has enabled an increase in the scan rates of unmodified commercial AFMs from 1-4 lines/second to over 100 lines/second and has been successfully applied to a custom-built high speed AFM, unlocking scan rates of over 1,600 lines/second. Images from this high speed AFM have been taken at more than 10 frames/second. Additionally, bulky optical components for sensing cantilever deflection and low bandwidth actuators constrain the AFM's potential observations, and the increasing instrument complexity requires operators skilled in optical alignment and controller tuning. Recent progress in MEMS fabrication has allowed the development of a new type of AFM cantilever with an integrated sensor and actuator. Such a fully instrumented cantilever enables direct measurement and actuation of the cantilever motion and interaction with the sample, eliminating the need for microscope operators to align the bulky optical components. This technology is expected to not only allow for high speed imaging but also the miniaturization of AFMs and expand their use to new experimental environments. Based on the complexity of these integrated MEMS devices, a thorough understanding of their behavior and a specialized controls approach is needed to guide non-expert users in their operation and extract high performance. The intrinsic properties of such MEMS cantilevers are investigated, and a combined approach is developed for sensing and control, optimized for high speed detection and actuation.
Book Synopsis Atomic Force Microscopy by : Peter Eaton
Download or read book Atomic Force Microscopy written by Peter Eaton and published by Oxford University Press. This book was released on 2010-03-25 with total page 257 pages. Available in PDF, EPUB and Kindle. Book excerpt: Atomic force microscopes are very important tools for the advancement of science and technology. This book provides an introduction to the microscopes so that scientists and engineers can learn both how to use them, and what they can do.
Book Synopsis Noncontact Atomic Force Microscopy by : S. Morita
Download or read book Noncontact Atomic Force Microscopy written by S. Morita and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 448 pages. Available in PDF, EPUB and Kindle. Book excerpt: Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the following characteristics: it has true atomic resolution; it can measure atomic force interactions, i.e. it can be used in so-called atomic force spectroscopy (AFS); it can also be used to study insulators; and it can measure mechanical responses such as elastic deformation. This is the first book that deals with all of the emerging NC-AFM issues.
Book Synopsis Atomic Force Microscopy in Nanobiology by : Kunio Takeyasu
Download or read book Atomic Force Microscopy in Nanobiology written by Kunio Takeyasu and published by CRC Press. This book was released on 2016-04-19 with total page 444 pages. Available in PDF, EPUB and Kindle. Book excerpt: Recent developments in atomic force microscopy (AFM) have been accomplished through various technical and instrumental innovations, including high-resolution and recognition imaging technology under physiological conditions, fast-scanning AFM, and general methods for cantilever modification and force measurement. All these techniques are now highly
Book Synopsis Atomic Force Microscopy in Cell Biology by :
Download or read book Atomic Force Microscopy in Cell Biology written by and published by Academic Press. This book was released on 2002-05-30 with total page 430 pages. Available in PDF, EPUB and Kindle. Book excerpt: This is the first book to cover the history, structure, and application of atomic force microscopy in cell biology. Presented in the clear, well-illustrated style of the Methods in Cell Biology series, it introduces the AFM to its readers and enables them to tap the power and scope of this technology to further their own research. A practical laboratory guide for use of the atomic force and photonic force microscopes, it provides updated technology and methods in force spectroscopy. It is also a comprehensive and easy-to-follow practical laboratory guide for the use of the AFM and PFM in biological research.
Book Synopsis Noncontact Atomic Force Microscopy by : Seizo Morita
Download or read book Noncontact Atomic Force Microscopy written by Seizo Morita and published by Springer Science & Business Media. This book was released on 2009-09-18 with total page 410 pages. Available in PDF, EPUB and Kindle. Book excerpt: Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since then: force spectroscopy and mapping with atomic resolution; tuning fork; atomic manipulation; magnetic exchange force microscopy; atomic and molecular imaging in liquids; and other new technologies. These results and technologies are now helping evolve NC-AFM toward practical tools for characterization and manipulation of individual atoms/molecules and nanostructures with atomic/subatomic resolution. Therefore, the book exemplifies how NC-AFM has become a crucial tool for the expanding fields of nanoscience and nanotechnology.
Book Synopsis Design and Control of High-speed and Large-range Atomic Force Microscope by : Iman Soltani Bozchalooi
Download or read book Design and Control of High-speed and Large-range Atomic Force Microscope written by Iman Soltani Bozchalooi and published by . This book was released on 2015 with total page 227 pages. Available in PDF, EPUB and Kindle. Book excerpt: This thesis presents the design, control and instrumentation of a novel atomic force microscope (AFM). This AFM is capable of high-speed imaging while maintaining large out-of-plane and lateral scan ranges. The primary contributions of this thesis include the design and implementation of a high-speed and large-range AFM; design, implementation and control of a multi-actuated nano-positioner; development of a general direct data-based control design scheme for redundantly actuated nano-positioners; design and implementation of a non-linear amplitude demodulation method for tapping mode imaging; and development of a parameter estimation methodology for piezo actuator hysteresis modeling and compensation. Atomic force microscopes can provide nano-scale resolution images of sample surface topography in air, vacuum or in liquid. This instrument operates by scanning a micro-mechanical probe on a sample. A measurement of the probe-sample interaction is used to control the AFM scanner and also form a 3D image of the sample surface topography. The mechanical nature and the serial-point-collection bases of operation of this instrument significantly limits its speed and constrains its application to the study of static samples. Unlocking the high-speed performance capability of AFM enables study of dynamic nano-scale processes and opens up the possibility of novel scientific discoveries. Improving the speed performance of AFM however, should not compromise imaging range so that the instrument can accommodate imaging experiments with diverse lateral and out-of-plane scan range requirements. In addition to high-speed and large-range performance, instrument flexibility and ease of use are very important. An AFM should allow samples of different sizes, and provide a simple platform for setting up the imaging experiment. In this work all the components of the AFM are designed to meet these specifications. A multi-actuated scanner is designed and built that is composed of five nano-positioners with different range and bandwidth characteristics. Through redundant actuation this nano-positioner is capable of operating at high speeds and over large lateral and out-of-plane scan ranges. A general data-based compensator design methodology for the control of redundantly actuated nano-positioners is developed. In the proposed approach the compensators are obtained directly from the measured scanner actuator response, without any intermediate modeling. This feature makes updating or tuning the associated parameters easier. The flexibility of AFM control is maintained by designing these compensators auxiliary to a PID control unit. It is shown that in this form, a PID controller suffices to meet the needs of high-speed atomic force microscopy. This approach to control design is also used in the thesis to retroactively enhance existing AFMs operating on both flexure-based scanners and piezo-tubes. To improve the positioning accuracy of the scanner we proposed a more accurate parameter estimation scheme for the Maxwell model of hysteresis extended to the full hysteresis loop. Finally, to enable operation of AFMs with probe arrays in tapping mode a non-linear demodulation method based on the Teager Energy Operator is designed and implemented in both analog and digital forms. The main advantage of this technique is simplicity, enabling implementation of hundreds of these operators in digital form on FPGAs (Field Programmable Gate Arrays) or in ASIC (Application-Specific Integrated Circuit) form on AFM probe arrays for parallel sensing. The developments of this thesis form the bases for the design and implementation of a novel AFM. The implemented instrument is capable of high-speed imaging and simultaneously achieves 6 [mu]m out-of-plane and 120 [mu]m lateral scan ranges making it the largest range high-speed AFM reported to this date. This instrument also features a modular design with a laser spot size of 3.5 [mu]m compatible with small cantilevers, an optical view of the sample and probe for site selection and laser adjustment, a conveniently large (15 mm) waterproof sample stage that accommodates samples with various sizes and a data logging and plotting system with 20 MHz throughput for high resolution image acquisition at high imaging speeds. The designed AFM is used to visualize etching of calcite in a solution of sulfuric acid. Layer-by-layer dissolution along the crystalline lines in a low pH environment is observed in real time and the corresponding dissolution rate is estimated. The designed AFM is also used to visualize in real time the nucleation, growth and striping of copper on gold for the first time.
Book Synopsis Noncontact Atomic Force Microscopy by : Seizo Morita
Download or read book Noncontact Atomic Force Microscopy written by Seizo Morita and published by Springer. This book was released on 2015-05-18 with total page 539 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents the latest developments in noncontact atomic force microscopy. It deals with the following outstanding functions and applications that have been obtained with atomic resolution after the publication of volume 2: (1) Pauli repulsive force imaging of molecular structure, (2) Applications of force spectroscopy and force mapping with atomic resolution, (3) Applications of tuning forks, (4) Applications of atomic/molecular manipulation, (5) Applications of magnetic exchange force microscopy, (6) Applications of atomic and molecular imaging in liquids, (7) Applications of combined AFM/STM with atomic resolution, and (8) New technologies in dynamic force microscopy. These results and technologies are now expanding the capacity of the NC-AFM with imaging functions on an atomic scale toward making them characterization and manipulation tools of individual atoms/molecules and nanostructures, with outstanding capability at the level of molecular, atomic, and subatomic resolution. Since the publication of vol. 2 of the book Noncontact Atomic Force Microscopy in 2009 the noncontact atomic force microscope, which can image even insulators with atomic resolution, has achieved remarkable progress. The NC-AFM is now becoming crucial for nanoscience and nanotechnology.
Book Synopsis Atomic Force Microscopy in Liquid by : Arturo M. Baró
Download or read book Atomic Force Microscopy in Liquid written by Arturo M. Baró and published by John Wiley & Sons. This book was released on 2012-08-01 with total page 385 pages. Available in PDF, EPUB and Kindle. Book excerpt: About 40 % of current atomic force microscopy (AFM) research is performed in liquids, making liquid-based AFM a rapidly growing and important tool for the study of biological materials. This book focuses on the underlying principles and experimental aspects of AFM under liquid, with an easy-to-follow organization intended for new AFM scientists. The book also serves as an up-to-date review of new AFM techniques developed especially for biological samples. Aimed at physicists, materials scientists, biologists, analytical chemists, and medicinal chemists. An ideal reference book for libraries. From the contents: Part I: General Atomic Force Microscopy * AFM: Basic Concepts * Carbon Nanotube Tips in Atomic Force Microscopy with * Applications to Imaging in Liquid * Force Spectroscopy * Atomic Force Microscopy in Liquid * Fundamentals of AFM Cantilever Dynamics in Liquid * Environments * Single-Molecule Force Spectroscopy * High-Speed AFM for Observing Dynamic Processes in Liquid * Integration of AFM with Optical Microscopy Techniques Part II: Biological Applications * DNA and Protein-DNA Complexes * Single-Molecule Force Microscopy of Cellular Sensors * AFM-Based Single-Cell Force Spectroscopy * Nano-Surgical Manipulation of Living Cells with the AFM
Book Synopsis Advances in Imaging Technology Research and Application: 2012 Edition by :
Download or read book Advances in Imaging Technology Research and Application: 2012 Edition written by and published by ScholarlyEditions. This book was released on 2012-12-26 with total page 1612 pages. Available in PDF, EPUB and Kindle. Book excerpt: Advances in Imaging Technology Research and Application / 2012 Edition is a ScholarlyEditions™ eBook that delivers timely, authoritative, and comprehensive information about Imaging Technology. The editors have built Advances in Imaging Technology Research and Application / 2012 Edition on the vast information databases of ScholarlyNews.™ You can expect the information about Imaging Technology in this eBook to be deeper than what you can access anywhere else, as well as consistently reliable, authoritative, informed, and relevant. The content of Advances in Imaging Technology Research and Application / 2012 Edition has been produced by the world’s leading scientists, engineers, analysts, research institutions, and companies. All of the content is from peer-reviewed sources, and all of it is written, assembled, and edited by the editors at ScholarlyEditions™ and available exclusively from us. You now have a source you can cite with authority, confidence, and credibility. More information is available at http://www.ScholarlyEditions.com/.
Book Synopsis Atomic Force Microscopy (AFM) by : Hongshun Yang
Download or read book Atomic Force Microscopy (AFM) written by Hongshun Yang and published by Nova Science Publishers. This book was released on 2014-05-14 with total page 362 pages. Available in PDF, EPUB and Kindle. Book excerpt: Technology-based innovations fuel the knowledge-based economy, as it creates new industries, makes existing ones globally competitive, and drives future economic growth. In order to reach technology-based economic growth, it is not only necessary to invest capital, intellect and time in technology-related research and development (R and D), but also to execute processes related to technology development trends, diffusion patterns, and the adoption and implementation of technology-based innovations. Nanotechnology has contributed to remarkable advances in the field of science and technology in the past two decades, which have led to significant prospective applications in various technological domains including advanced materials, biotechnology and pharmacy, electronics, scientific tools and techniques, and industrial manufacturing processes. This ultra-small technology will drive a new technology-driven global economy, with revolutionary advances in almost all industry sectors through high utility and demands.
Book Synopsis Advances in High-Speed Atomic Force Microscopy by : Pascal Nievergelt
Download or read book Advances in High-Speed Atomic Force Microscopy written by Pascal Nievergelt and published by . This book was released on 2018 with total page 209 pages. Available in PDF, EPUB and Kindle. Book excerpt: Mots-clés de l'auteur: Atomic force microscopy (AFM) ; high--speed AFM ; photothermal excitation ; scanner design ; control system design ; off-resonance tapping AFM ; open hardware ; protein--protein dynamics ; live cell imaging.
Book Synopsis Recent Advances in Systems, Control and Information Technology by : Roman Szewczyk
Download or read book Recent Advances in Systems, Control and Information Technology written by Roman Szewczyk and published by Springer. This book was released on 2016-11-29 with total page 836 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents the proceedings of the International Conference on Systems, Control and Information Technologies 2016. It includes research findings from leading experts in the fields connected with INDUSTRY 4.0 and its implementation, especially: intelligent systems, advanced control, information technologies, industrial automation, robotics, intelligent sensors, metrology and new materials. Each chapter offers an analysis of a specific technical problem followed by a numerical analysis and simulation as well as the implementation for the solution of a real-world problem.
