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Author : Ichiko Misumi
Publisher :
ISBN 13 : 9780750331906
Total Pages : pages
Book Rating : 4.3/5 (319 download)
Download or read book Nanoscale Standards by Metrological AFM and Other Instruments written by Ichiko Misumi and published by . This book was released on 2021 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Günter Wilkening
Publisher : John Wiley & Sons
ISBN 13 : 3527606874
Total Pages : 541 pages
Book Rating : 4.5/5 (276 download)
Download or read book Nanoscale Calibration Standards and Methods written by Günter Wilkening and published by John Wiley & Sons. This book was released on 2006-05-12 with total page 541 pages. Available in PDF, EPUB and Kindle. Book excerpt: The quantitative determination of the properties of micro- and nanostructures is essential in research and development. It is also a prerequisite in process control and quality assurance in industry. The knowledge of the geometrical dimensions of structures in most cases is the base, to which other physical and chemical properties are linked. Quantitative measurements require reliable and stable instruments, suitable measurement procedures as well as appropriate calibration artefacts and methods. The seminar "NanoScale 2004" (6th Seminar on Quantitative Microscopy and 2nd Seminar on Nanoscale Calibration Standards and Methods) at the National Metrology Institute (Physikalisch-Technische Bundesanstalt PTB), Braunschweig, Germany, continues the series of seminars on Quantitative Microscopy. The series stimulates the exchange of information between manufacturers of relevant hard- and software and the users in science and industry. Topics addressed in these proceedings are a) the application of quantitative measurements and measurement problems in: microelectronics, microsystems technology, nano/quantum/molecular electronics, chemistry, biology, medicine, environmental technology, materials science, surface processing b) calibration & correction methods: calibration methods, calibration standards, calibration procedures, traceable measurements, standardization, uncertainty of measurements c) instrumentation and methods: novel/improved instruments and methods, reproducible probe/sample positioning, position-measuring systems, novel/improved probe/detector systems, linearization methods, image processing
Author : MISUMI
Publisher :
ISBN 13 : 9780750331920
Total Pages : pages
Book Rating : 4.3/5 (319 download)
Download or read book Nanoscale Standards Metrological Afm O written by MISUMI and published by . This book was released on 2021-07-31 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Ichiko Misumi
Publisher :
ISBN 13 : 9780750331913
Total Pages : 0 pages
Book Rating : 4.3/5 (319 download)
Download or read book Nanoscale Standards by Metrological AFM and Other Instruments written by Ichiko Misumi and published by . This book was released on 2021 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: The purpose of this book is to help semiconductor inspection equipment users and manufacturers understand what nano dimensional standards are used to calibrate their equipment and how to employ them effectively. Reviewing trends and developments in nanoscale standards, the book starts with an introductory overview of nanometrological standards before proceeding to detail pitch standard, step height, line width, nano particle size, and surface roughness. This book is essential for users making quantitative nanoscale measurements, be that in a commercial or academic research setting, or involved in engineering nanometrology for quality control in industrial applications. Here the author provides an approachable understanding and application of the nanoscale standards in a practical context across a range of common nanoscale measurement modalities, including 3D, with particular emphasis on applications to AFM, an exceptional and arguably the most common technique used in nanometrology due to the ease of use and versatility of applications.
Author : Richard Leach
Publisher : William Andrew
ISBN 13 : 1437778321
Total Pages : 349 pages
Book Rating : 4.4/5 (377 download)
Download or read book Fundamental Principles of Engineering Nanometrology written by Richard Leach and published by William Andrew. This book was released on 2009-09-03 with total page 349 pages. Available in PDF, EPUB and Kindle. Book excerpt: Fundamental Principles of Engineering Nanometrology provides a comprehensive overview of engineering metrology and how it relates to micro and nanotechnology (MNT) research and manufacturing. By combining established knowledge with the latest advances from the field, it presents a comprehensive single volume that can be used for professional reference and academic study. Provides a basic introduction to measurement and instruments Thoroughly presents numerous measurement techniques, from static length and displacement to surface topography, mass and force Covers multiple optical surface measuring instruments and related topics (interferometry, triangulation, confocal, variable focus, and scattering instruments) Explains, in depth, the calibration of surface topography measuring instruments (traceability; calibration of profile and areal surface texture measuring instruments; uncertainties) Discusses the material in a way that is comprehensible to even those with only a limited mathematical knowledge
Author : David J. Whitehouse
Publisher : CRC Press
ISBN 13 : 1420034197
Total Pages : 982 pages
Book Rating : 4.4/5 (2 download)
Download or read book Handbook of Surface and Nanometrology written by David J. Whitehouse and published by CRC Press. This book was released on 2002-12-01 with total page 982 pages. Available in PDF, EPUB and Kindle. Book excerpt: The Handbook of Surface and Nanometrology explains and challenges current concepts in nanotechnology. It covers in great detail surface metrology and nanometrology and more importantly the areas where they overlap, thereby providing a quantitative means of controlling and predicting processes and performance. Trends and mechanisms are explained wit
Author : Wei Gao
Publisher : Trans Tech Publications Ltd
ISBN 13 : 3038131830
Total Pages : 674 pages
Book Rating : 4.0/5 (381 download)
Download or read book Measurement Technology and Intelligent Instruments VIII written by Wei Gao and published by Trans Tech Publications Ltd. This book was released on 2008-06-12 with total page 674 pages. Available in PDF, EPUB and Kindle. Book excerpt: Volume is indexed by Thomson Reuters BCI (WoS). Measurement, rigorously defined as ascertaining the size, amount or degree of a measurand by instrumental comparison with a standard unit or by indirect calculation based upon theory, is what makes science and technology different to imagination. Measurement is essential in industry, commerce and daily life. In the manufacturing industry in particular, measurement and instrumentation technology play increasingly important roles not only in the traditional field of manufacturing but also in the new fields of micro/nano technology and bioengineering. This book presents recent advances in the use of measurement and instrumentation in the manufacturing industry. A wide range of topics are covered including: micro/nano-metrology,precision measurements,online and in-process measurements,surface metrology,optical metrology and image processing,bio-measurement, sensor technology,intelligent measurement and instrumentation,uncertainty, traceability and calibration and signal-processing algorithms.
Author : Elisabeth Mansfield
Publisher : John Wiley & Sons
ISBN 13 : 3527340394
Total Pages : 626 pages
Book Rating : 4.5/5 (273 download)
Download or read book Metrology and Standardization for Nanotechnology written by Elisabeth Mansfield and published by John Wiley & Sons. This book was released on 2017-04-10 with total page 626 pages. Available in PDF, EPUB and Kindle. Book excerpt: For the promotion of global trading and the reduction of potential risks, the role of international standardization of nanotechnologies has become more and more important. This book gives an overview of the current status of nanotechnology including the importance of metrology and characterization at the nanoscale, international standardization of nanotechnology, and industrial innovation of nano-enabled products. First the field of nanometrology, nanomaterial standardization and nanomaterial innovation is introduced. Second, major concepts in analytical measurements are given in order to provide a basis for the reliable and reproducible characterization of nanomaterials. The role of standards organizations are presented and finally, an overview of risk management and the commercial impact of metrology and standardization for industrial innovations.
Author : British Standards Institute Staff
Publisher :
ISBN 13 : 9780580613180
Total Pages : pages
Book Rating : 4.6/5 (131 download)
Download or read book Terminology for Common Nanoscale Measurement and Instrumentation written by British Standards Institute Staff and published by . This book was released on 2007-12-31 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: Nanotechnology, Nanomaterials, Nanoparticles, Particle size distribution, Particle size measurement, Surface chemistry, Chemical analysis and testing, Instrumental methods of analysis, Spectroscopy, Microscopic analysis, Test equipment
Author : Zhiyong Ma
Publisher : CRC Press
ISBN 13 : 1351733958
Total Pages : 1454 pages
Book Rating : 4.3/5 (517 download)
Download or read book Metrology and Diagnostic Techniques for Nanoelectronics written by Zhiyong Ma and published by CRC Press. This book was released on 2017-03-27 with total page 1454 pages. Available in PDF, EPUB and Kindle. Book excerpt: Nanoelectronics is changing the way the world communicates, and is transforming our daily lives. Continuing Moore’s law and miniaturization of low-power semiconductor chips with ever-increasing functionality have been relentlessly driving R&D of new devices, materials, and process capabilities to meet performance, power, and cost requirements. This book covers up-to-date advances in research and industry practices in nanometrology, critical for continuing technology scaling and product innovation. It holistically approaches the subject matter and addresses emerging and important topics in semiconductor R&D and manufacturing. It is a complete guide for metrology and diagnostic techniques essential for process technology, electronics packaging, and product development and debugging—a unique approach compared to other books. The authors are from academia, government labs, and industry and have vast experience and expertise in the topics presented. The book is intended for all those involved in IC manufacturing and nanoelectronics and for those studying nanoelectronics process and assembly technologies or working in device testing, characterization, and diagnostic techniques.
Author : Wei Gao
Publisher : Elsevier
ISBN 13 : 0128178515
Total Pages : 452 pages
Book Rating : 4.1/5 (281 download)
Download or read book Surface Metrology for Micro- and Nanofabrication written by Wei Gao and published by Elsevier. This book was released on 2020-10-30 with total page 452 pages. Available in PDF, EPUB and Kindle. Book excerpt: Surface Metrology for Micro- and Nanofabrication presents state-of-the-art measurement technologies for surface metrology in fabrication of micro- and nanodevices or components. This includes the newest general-purpose scanning probe microscopes, and both contact and non-contact surface profilers. In addition, the book outlines characterization and calibration techniques, as well as in-situ, on-machine, and in-process measurements for micro- and nanofabrication. Provides materials scientists and engineers with an informed overview of the state-of-the-art in surface metrology Helps readers select and design the optimized surface metrology systems and carry out proper surface metrology practices in the fabrication of micro/nano-devices and components Assesses the best techniques for repairing micro-defects
Author : Samir Mekid
Publisher : John Wiley & Sons
ISBN 13 : 1119721733
Total Pages : 404 pages
Book Rating : 4.1/5 (197 download)
Download or read book Metrology and Instrumentation written by Samir Mekid and published by John Wiley & Sons. This book was released on 2021-12-29 with total page 404 pages. Available in PDF, EPUB and Kindle. Book excerpt: Metrology and Instrumentation: Practical Applications for Engineering and Manufacturing provides students and professionals with an accessible foundation in the metrology techniques, instruments, and governing standards used in mechanical engineering and manufacturing. The book opens with an overview of metrology units and scale, then moves on to explain topics such as sources of error, calibration systems, uncertainty, and dimensional, mechanical, and thermodynamic measurement systems. A chapter on tolerance stack-ups covers GD&T, ASME Y14.5-2018, and the ISO standard for general tolerances, while a chapter on digital measurements connects metrology to newer, Industry 4.0 applications.
Author : David H. Guston
Publisher : SAGE Publications
ISBN 13 : 1452266174
Total Pages : 1025 pages
Book Rating : 4.4/5 (522 download)
Download or read book Encyclopedia of Nanoscience and Society written by David H. Guston and published by SAGE Publications. This book was released on 2010-07-14 with total page 1025 pages. Available in PDF, EPUB and Kindle. Book excerpt: Labeled either as the "next industrial revolution" or as just "hype," nanoscience and nanotechnologies are controversial, touted by some as the likely engines of spectacular transformation of human societies and even human bodies, and by others as conceptually flawed. These challenges make an encyclopedia of nanoscience and society an absolute necessity. Providing a guide to what these understandings and challenges are about, the Encyclopedia of Nanoscience and Society offers accessible descriptions of some of the key technical achievements of nanoscience along with its history and prospects. Rather than a technical primer, this encyclopedia instead focuses on the efforts of governments around the world to fund nanoscience research and to tap its potential for economic development as well as to assess how best to regulate a new technology for the environmental, occupational, and consumer health and safety issues related to the field. Contributions examine and analyze the cultural significance of nanoscience and nanotechnologies and describe some of the organizations, and their products, that promise to make nanotechnologies a critical part of the global economy. Written by noted scholars and practitioners from around the globe, these two volumes offer nearly 500 entries describing the societal aspects of nanoscience and nanotechnology. Key Themes - Art, Design, and Materials - Bionanotechnology Centers - Context - Economics and Business - Engagement and the Public - Environment and Risk - Ethics and Values - Geographies and Distribution - History and Philosophy - Integration and Interdisciplinarity - Nanotechnology Companies - Nanotechnology Organizations
Author : Luigi Cocco
Publisher : BoD – Books on Demand
ISBN 13 : 1789844622
Total Pages : 108 pages
Book Rating : 4.7/5 (898 download)
Download or read book Standards, Methods and Solutions of Metrology written by Luigi Cocco and published by BoD – Books on Demand. This book was released on 2019-10-02 with total page 108 pages. Available in PDF, EPUB and Kindle. Book excerpt: The goal of acceptable quality, cost, and time is a decisive challenge in every engineering development process. To be familiar with metrology requires choosing the best combination of techniques, standards, and tools to control a project from advanced simulations to final performance measurements and periodic inspections. This book contains a cluster of chapters from international academic authors who provide a meticulous way to discover the impacts of metrology in both theoretical and application fields. The approach is to discuss the key aspects of a selection of untraditional metrological topics, covering the analysis procedures and set of solutions obtained from experimental studies.
Download or read book Nanoscale 2004 written by and published by . This book was released on 2004 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Vladimir Murashov
Publisher : Springer Science & Business Media
ISBN 13 : 1441978534
Total Pages : 269 pages
Book Rating : 4.4/5 (419 download)
Download or read book Nanotechnology Standards written by Vladimir Murashov and published by Springer Science & Business Media. This book was released on 2011-02-01 with total page 269 pages. Available in PDF, EPUB and Kindle. Book excerpt: Written by a team of experts, Nanotechnology Standards provides the first comprehensive, state-of-the-art reviews of nanotechnology standards development, both in the field of standards development and in specific areas of nanotechnology. It also describes global standards-developing processes for nanotechnology, which can be extended to other emerging technologies. For topics related to nanotechnology, the reviews summarize active areas of standards development, supporting knowledge and future directions in easy-to-understand language aimed at a broad technical audience. This unique book is also an excellent resource for up-to-date information on the growing base of knowledge supporting the introduction of nanotechnology standards and applications into the market. Praise for this volume: “This book provides a valuable and detailed overview of current activities and issues relevant to the area as well as a useful summary of the short history of standardization for nanotechnologies and the somewhat longer history of standardization in general. I have no hesitation in recommending this book to anyone with an interest in nanotechnologies whether it is from a technical or societal perspective.” --Dr. Peter Hatto, Director of Research, IonBond Limited, Durham, UK
Author : Waldemar Nawrocki
Publisher : Springer
ISBN 13 : 3319156691
Total Pages : 287 pages
Book Rating : 4.3/5 (191 download)
Download or read book Introduction to Quantum Metrology written by Waldemar Nawrocki and published by Springer. This book was released on 2015-03-24 with total page 287 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents the theory of quantum effects used in metrology and results of the author’s own research in the field of quantum electronics. The book provides also quantum measurement standards used in many branches of metrology for electrical quantities, mass, length, time and frequency. This book represents the first comprehensive survey of quantum metrology problems. As a scientific survey, it propagates a new approach to metrology with more emphasis on its connection with physics. This is of importance for the constantly developing technologies and nanotechnologies in particular. Providing a presentation of practical applications of the effects used in quantum metrology for the construction of quantum standards and sensitive electronic components, the book is useful for a wide audience of physicists and metrologists in the broad sense of both terms. In 2014 a new system of units, the so called Quantum SI, is introduced. This book helps to understand and approve the new system to both technology and academic community.
