Metrology and Standardization for Nanotechnology

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Publisher : John Wiley & Sons
ISBN 13 : 3527800050
Total Pages : 626 pages
Book Rating : 4.5/5 (278 download)

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Book Synopsis Metrology and Standardization for Nanotechnology by : Elisabeth Mansfield

Download or read book Metrology and Standardization for Nanotechnology written by Elisabeth Mansfield and published by John Wiley & Sons. This book was released on 2017-01-20 with total page 626 pages. Available in PDF, EPUB and Kindle. Book excerpt: For the promotion of global trading and the reduction of potential risks, the role of international standardization of nanotechnologies has become more and more important. This book gives an overview of the current status of nanotechnology including the importance of metrology and characterization at the nanoscale, international standardization of nanotechnology, and industrial innovation of nano-enabled products. First the field of nanometrology, nanomaterial standardization and nanomaterial innovation is introduced. Second, major concepts in analytical measurements are given in order to provide a basis for the reliable and reproducible characterization of nanomaterials. The role of standards organizations are presented and finally, an overview of risk management and the commercial impact of metrology and standardization for industrial innovations.

Metrology and Standardization for Nanotechnology

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Author :
Publisher : John Wiley & Sons
ISBN 13 : 3527800298
Total Pages : 626 pages
Book Rating : 4.5/5 (278 download)

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Book Synopsis Metrology and Standardization for Nanotechnology by : Elisabeth Mansfield

Download or read book Metrology and Standardization for Nanotechnology written by Elisabeth Mansfield and published by John Wiley & Sons. This book was released on 2017-01-20 with total page 626 pages. Available in PDF, EPUB and Kindle. Book excerpt: For the promotion of global trading and the reduction of potential risks, the role of international standardization of nanotechnologies has become more and more important. This book gives an overview of the current status of nanotechnology including the importance of metrology and characterization at the nanoscale, international standardization of nanotechnology, and industrial innovation of nano-enabled products. First the field of nanometrology, nanomaterial standardization and nanomaterial innovation is introduced. Second, major concepts in analytical measurements are given in order to provide a basis for the reliable and reproducible characterization of nanomaterials. The role of standards organizations are presented and finally, an overview of risk management and the commercial impact of metrology and standardization for industrial innovations.

Fundamental Principles of Engineering Nanometrology

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Author :
Publisher : William Andrew
ISBN 13 : 9781437778328
Total Pages : 352 pages
Book Rating : 4.7/5 (783 download)

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Book Synopsis Fundamental Principles of Engineering Nanometrology by : Richard Leach

Download or read book Fundamental Principles of Engineering Nanometrology written by Richard Leach and published by William Andrew. This book was released on 2009-09-03 with total page 352 pages. Available in PDF, EPUB and Kindle. Book excerpt: Fundamental Principles of Engineering Nanometrology provides a comprehensive overview of engineering metrology and how it relates to micro and nanotechnology (MNT) research and manufacturing. By combining established knowledge with the latest advances from the field, it presents a comprehensive single volume that can be used for professional reference and academic study. Provides a basic introduction to measurement and instruments Thoroughly presents numerous measurement techniques, from static length and displacement to surface topography, mass and force Covers multiple optical surface measuring instruments and related topics (interferometry, triangulation, confocal , variable focus, and scattering instruments) Explains, in depth, the calibration of surface topography measuring instruments (traceability; calibration of profile and areal surface texture measuring instruments; uncertainties) Discusses the material in a way that is comprehensible to even those with only a limited mathematical knowledge

Fundamental Principles of Engineering Nanometrology

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Publisher : Elsevier
ISBN 13 : 1455777501
Total Pages : 384 pages
Book Rating : 4.4/5 (557 download)

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Book Synopsis Fundamental Principles of Engineering Nanometrology by : Richard Leach

Download or read book Fundamental Principles of Engineering Nanometrology written by Richard Leach and published by Elsevier. This book was released on 2014-05-17 with total page 384 pages. Available in PDF, EPUB and Kindle. Book excerpt: Working at the nano-scale demands an understanding of the high-precision measurement techniques that make nanotechnology and advanced manufacturing possible. Richard Leach introduces these techniques to a broad audience of engineers and scientists involved in nanotechnology and manufacturing applications and research. He also provides a routemap and toolkit for metrologists engaging with the rigor of measurement and data analysis at the nano-scale. Starting from the fundamentals of precision measurement, the author progresses into different measurement and characterization techniques. The focus on nanometrology in engineering contexts makes this book an essential guide for the emerging nanomanufacturing / nanofabrication sector, where measurement and standardization requirements are paramount both in product specification and quality assurance. This book provides engineers and scientists with the methods and understanding needed to design and produce high-performance, long-lived products while ensuring that compliance and public health requirements are met. Updated to cover new and emerging technologies, and recent developments in standards and regulatory frameworks, this second edition includes many new sections, e.g. new technologies in scanning probe and e-beam microscopy, recent developments in interferometry and advances in co-ordinate metrology. Demystifies nanometrology for a wide audience of engineers, scientists, and students involved in nanotech and advanced manufacturing applications and research Introduces metrologists to the specific techniques and equipment involved in measuring at the nano-scale or to nano-scale uncertainty Fully updated to cover the latest technological developments, standards, and regulations

Nanotechnology Standards

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Publisher : Springer Science & Business Media
ISBN 13 : 1441978534
Total Pages : 262 pages
Book Rating : 4.4/5 (419 download)

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Book Synopsis Nanotechnology Standards by : Vladimir Murashov

Download or read book Nanotechnology Standards written by Vladimir Murashov and published by Springer Science & Business Media. This book was released on 2011-02-01 with total page 262 pages. Available in PDF, EPUB and Kindle. Book excerpt: Written by a team of experts, Nanotechnology Standards provides the first comprehensive, state-of-the-art reviews of nanotechnology standards development, both in the field of standards development and in specific areas of nanotechnology. It also describes global standards-developing processes for nanotechnology, which can be extended to other emerging technologies. For topics related to nanotechnology, the reviews summarize active areas of standards development, supporting knowledge and future directions in easy-to-understand language aimed at a broad technical audience. This unique book is also an excellent resource for up-to-date information on the growing base of knowledge supporting the introduction of nanotechnology standards and applications into the market. Praise for this volume: “This book provides a valuable and detailed overview of current activities and issues relevant to the area as well as a useful summary of the short history of standardization for nanotechnologies and the somewhat longer history of standardization in general. I have no hesitation in recommending this book to anyone with an interest in nanotechnologies whether it is from a technical or societal perspective.” --Dr. Peter Hatto, Director of Research, IonBond Limited, Durham, UK

Handbook of Surface Metrology

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Author :
Publisher : Taylor & Francis
ISBN 13 : 1351442074
Total Pages : 1015 pages
Book Rating : 4.3/5 (514 download)

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Book Synopsis Handbook of Surface Metrology by : David J. Whitehouse

Download or read book Handbook of Surface Metrology written by David J. Whitehouse and published by Taylor & Francis. This book was released on 2023-03-17 with total page 1015 pages. Available in PDF, EPUB and Kindle. Book excerpt: Written by the leading authority in the subject, Handbook of Surface Metrology covers every conceivable aspect of measuring and characterizing a surface. Focusing both on theory and practice, the book provides useful guidelines for the design of precision instruments and presents data on the functional importance of surfaces. It also clearly explains the essential theory relevant to surface metrology. The book defines most terms and parameters according to national and international standards. Many examples and illustrations are drawn from the esteemed author's large fund of groundbreaking research work. This unparalleled, all-encompassing "metrology bible" is beneficial for engineering postgraduate students and researchers involved in tribology, instrumentation, data processing, and metrology.

Metrology and Diagnostic Techniques for Nanoelectronics

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Author :
Publisher : CRC Press
ISBN 13 : 1351733958
Total Pages : 1454 pages
Book Rating : 4.3/5 (517 download)

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Book Synopsis Metrology and Diagnostic Techniques for Nanoelectronics by : Zhiyong Ma

Download or read book Metrology and Diagnostic Techniques for Nanoelectronics written by Zhiyong Ma and published by CRC Press. This book was released on 2017-03-27 with total page 1454 pages. Available in PDF, EPUB and Kindle. Book excerpt: Nanoelectronics is changing the way the world communicates, and is transforming our daily lives. Continuing Moore’s law and miniaturization of low-power semiconductor chips with ever-increasing functionality have been relentlessly driving R&D of new devices, materials, and process capabilities to meet performance, power, and cost requirements. This book covers up-to-date advances in research and industry practices in nanometrology, critical for continuing technology scaling and product innovation. It holistically approaches the subject matter and addresses emerging and important topics in semiconductor R&D and manufacturing. It is a complete guide for metrology and diagnostic techniques essential for process technology, electronics packaging, and product development and debugging—a unique approach compared to other books. The authors are from academia, government labs, and industry and have vast experience and expertise in the topics presented. The book is intended for all those involved in IC manufacturing and nanoelectronics and for those studying nanoelectronics process and assembly technologies or working in device testing, characterization, and diagnostic techniques.

Instrumentation, Metrology, and Standards for Nanomanufacturing

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Author :
Publisher :
ISBN 13 :
Total Pages : pages
Book Rating : 4.:/5 (746 download)

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Book Synopsis Instrumentation, Metrology, and Standards for Nanomanufacturing by :

Download or read book Instrumentation, Metrology, and Standards for Nanomanufacturing written by and published by . This book was released on 2007 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Instrumentation, Metrology, and Standards for Nanomanufacturing II

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Author :
Publisher : Society of Photo Optical
ISBN 13 : 9780819472625
Total Pages : 200 pages
Book Rating : 4.4/5 (726 download)

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Book Synopsis Instrumentation, Metrology, and Standards for Nanomanufacturing II by : Michael T. Postek

Download or read book Instrumentation, Metrology, and Standards for Nanomanufacturing II written by Michael T. Postek and published by Society of Photo Optical. This book was released on 2008 with total page 200 pages. Available in PDF, EPUB and Kindle. Book excerpt: Includes Proceedings Vol. 7821

Instrumentation, Metrology, and Standards for Nanomanufacturing IV

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Author :
Publisher : SPIE-International Society for Optical Engineering
ISBN 13 : 9780819482631
Total Pages : 178 pages
Book Rating : 4.4/5 (826 download)

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Book Synopsis Instrumentation, Metrology, and Standards for Nanomanufacturing IV by : Michael T. Postek

Download or read book Instrumentation, Metrology, and Standards for Nanomanufacturing IV written by Michael T. Postek and published by SPIE-International Society for Optical Engineering. This book was released on 2010 with total page 178 pages. Available in PDF, EPUB and Kindle. Book excerpt: Includes Proceedings Vol. 7821

Nanoscale Calibration Standards and Methods

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Publisher : John Wiley & Sons
ISBN 13 : 3527606874
Total Pages : 541 pages
Book Rating : 4.5/5 (276 download)

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Book Synopsis Nanoscale Calibration Standards and Methods by : Günter Wilkening

Download or read book Nanoscale Calibration Standards and Methods written by Günter Wilkening and published by John Wiley & Sons. This book was released on 2006-05-12 with total page 541 pages. Available in PDF, EPUB and Kindle. Book excerpt: The quantitative determination of the properties of micro- and nanostructures is essential in research and development. It is also a prerequisite in process control and quality assurance in industry. The knowledge of the geometrical dimensions of structures in most cases is the base, to which other physical and chemical properties are linked. Quantitative measurements require reliable and stable instruments, suitable measurement procedures as well as appropriate calibration artefacts and methods. The seminar "NanoScale 2004" (6th Seminar on Quantitative Microscopy and 2nd Seminar on Nanoscale Calibration Standards and Methods) at the National Metrology Institute (Physikalisch-Technische Bundesanstalt PTB), Braunschweig, Germany, continues the series of seminars on Quantitative Microscopy. The series stimulates the exchange of information between manufacturers of relevant hard- and software and the users in science and industry. Topics addressed in these proceedings are a) the application of quantitative measurements and measurement problems in: microelectronics, microsystems technology, nano/quantum/molecular electronics, chemistry, biology, medicine, environmental technology, materials science, surface processing b) calibration & correction methods: calibration methods, calibration standards, calibration procedures, traceable measurements, standardization, uncertainty of measurements c) instrumentation and methods: novel/improved instruments and methods, reproducible probe/sample positioning, position-measuring systems, novel/improved probe/detector systems, linearization methods, image processing

Handbook of Surface and Nanometrology

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Author :
Publisher : Taylor & Francis
ISBN 13 : 9780750305839
Total Pages : 1150 pages
Book Rating : 4.3/5 (58 download)

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Book Synopsis Handbook of Surface and Nanometrology by : David J. Whitehouse

Download or read book Handbook of Surface and Nanometrology written by David J. Whitehouse and published by Taylor & Francis. This book was released on 2002-12-01 with total page 1150 pages. Available in PDF, EPUB and Kindle. Book excerpt: The Handbook of Surface and Nanometrology explains and challenges current concepts in nanotechnology. It covers in great detail surface metrology and nanometrology and more importantly the areas where they overlap, thereby providing a quantitative means of controlling and predicting processes and performance. Trends and mechanisms are explained with numerous practical examples. Bringing engineering and physics together at the nanoscale reveals some astonishing effects: geometric features such as shape change meaning; roughness can disappear altogether; signals from instruments have to be dealt with differently depending on scale. These and other aspects are dealt with for the first time in this book. It is relevant not only for today's technology but also for future advances. Many aspects of nanotechnology and precision engineering are considered in chapters on manufacture, characterization, standardization, performance and instrumentation. There is a special chapter on nanometrology and this subject permeates the whole book. The Handbook of Surface and Nanometrology is the only book that covers these subject areas and is the definitive work in this field. This book is indispensable for firms making, trading, and researching semiconductor devices, MEMS, and micro-optics, as well as tradition precision engineering products. It will also be useful in quality control as well as for research scientists, development engineers, and production managers.

Scanning Microscopy for Nanotechnology

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Publisher : Springer Science & Business Media
ISBN 13 : 0387396209
Total Pages : 533 pages
Book Rating : 4.3/5 (873 download)

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Book Synopsis Scanning Microscopy for Nanotechnology by : Weilie Zhou

Download or read book Scanning Microscopy for Nanotechnology written by Weilie Zhou and published by Springer Science & Business Media. This book was released on 2007-03-09 with total page 533 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents scanning electron microscopy (SEM) fundamentals and applications for nanotechnology. It includes integrated fabrication techniques using the SEM, such as e-beam and FIB, and it covers in-situ nanomanipulation of materials. The book is written by international experts from the top nano-research groups that specialize in nanomaterials characterization. The book will appeal to nanomaterials researchers, and to SEM development specialists.

Triennial Review of the National Nanotechnology Initiative

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Publisher : National Academies Press
ISBN 13 : 0309269334
Total Pages : 186 pages
Book Rating : 4.3/5 (92 download)

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Book Synopsis Triennial Review of the National Nanotechnology Initiative by : National Research Council

Download or read book Triennial Review of the National Nanotechnology Initiative written by National Research Council and published by National Academies Press. This book was released on 2013-12-20 with total page 186 pages. Available in PDF, EPUB and Kindle. Book excerpt: The National Nanotechnology Initiative (NNI) is a multiagency, multidisciplinary federal initiative comprising a collection of research programs and other activities funded by the participating agencies and linked by the vision of "a future in which the ability to understand and control matter at the nanoscale leads to a revolution in technology and industry that benefits society." As first stated in the 2004 NNI strategic plan, the participating agencies intend to make progress in realizing that vision by working toward four goals. Planning, coordination, and management of the NNI are carried out by the interagency Nanoscale Science, Engineering, and Technology (NSET) Subcommittee of the National Science and Technology Council (NSTC) Committee on Technology (CoT) with support from the National Nanotechnology Coordination Office (NNCO). Triennial Review of the National Nanotechnology Initiative is the latest National Research Council review of the NNI, an assessment called for by the 21st Century Nanotechnology Research and Development Act of 2003. The overall objective of the review is to make recommendations to the NSET Subcommittee and the NNCO that will improve the NNI's value for basic and applied research and for development of applications in nanotechnology that will provide economic, societal, and national security benefits to the United States. In its assessment, the committee found it important to understand in some detail-and to describe in its report-the NNI's structure and organization; how the NNI fits within the larger federal research enterprise, as well as how it can and should be organized for management purposes; and the initiative's various stakeholders and their roles with respect to research. Because technology transfer, one of the four NNI goals, is dependent on management and coordination, the committee chose to address the topic of technology transfer last, following its discussion of definitions of success and metrics for assessing progress toward achieving the four goals and management and coordination. Addressing its tasks in this order would, the committee hoped, better reflect the logic of its approach to review of the NNI. Triennial Review of the National Nanotechnology Initiative also provides concluding remarks in the last chapter.

Nanotechnology and Nanoelectronics

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Publisher : Springer Science & Business Media
ISBN 13 : 3540266216
Total Pages : 269 pages
Book Rating : 4.5/5 (42 download)

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Book Synopsis Nanotechnology and Nanoelectronics by : Wolfgang Fahrner

Download or read book Nanotechnology and Nanoelectronics written by Wolfgang Fahrner and published by Springer Science & Business Media. This book was released on 2005-12-05 with total page 269 pages. Available in PDF, EPUB and Kindle. Book excerpt: Split a human hair thirty thousand times, and you have the equivalent of a nanometer. The aim of this work is to provide an introduction into nanotechnology for the s- entifically interested. However, such an enterprise requires a balance between comprehensibility and scientific accuracy. In case of doubt, preference is given to the latter. Much more than in microtechnology – whose fundamentals we assume to be known – a certain range of engineering and natural sciences are interwoven in nanotechnology. For instance, newly developed tools from mechanical engine- ing are essential in the production of nanoelectronic structures. Vice versa, - chanical shifts in the nanometer range demand piezoelectric-operated actuators. Therefore, special attention is given to a comprehensive presentation of the matter. In our time, it is no longer sufficient to simply explain how an electronic device operates; the materials and procedures used for its production and the measuring instruments used for its characterization are equally important. The main chapters as well as several important sections in this book end in an evaluation of future prospects. Unfortunately, this way of separating coherent - scription from reflection and speculation could not be strictly maintained. So- times, the complete description of a device calls for discussion of its inherent - tential; the hasty reader in search of the general perspective is therefore advised to study this work’s technical chapters as well.

Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VII

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Publisher :
ISBN 13 : 9780819496690
Total Pages : 110 pages
Book Rating : 4.4/5 (966 download)

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Book Synopsis Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VII by : Michael T. Postek

Download or read book Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VII written by Michael T. Postek and published by . This book was released on 2013-10-10 with total page 110 pages. Available in PDF, EPUB and Kindle. Book excerpt: Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature.

Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors V

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Publisher : SPIE-International Society for Optical Engineering
ISBN 13 : 9780819487155
Total Pages : 132 pages
Book Rating : 4.4/5 (871 download)

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Book Synopsis Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors V by : Michael T. Postek

Download or read book Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors V written by Michael T. Postek and published by SPIE-International Society for Optical Engineering. This book was released on 2011 with total page 132 pages. Available in PDF, EPUB and Kindle. Book excerpt: Includes Proceedings Vol. 7821