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Nanoscale Characterization Of Semiconductor Materials And Devices Using Scanning Probe Techniques
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Book Synopsis Nanoscale Characterization of Semiconductor Materials and Devices Using Scanning Probe Techniques by : Edward T. Yu
Download or read book Nanoscale Characterization of Semiconductor Materials and Devices Using Scanning Probe Techniques written by Edward T. Yu and published by . This book was released on 1996 with total page 60 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Nanoscale Characterization of Semiconductor Materials and Devices Using Scanning Probe Technoques by :
Download or read book Nanoscale Characterization of Semiconductor Materials and Devices Using Scanning Probe Technoques written by and published by . This book was released on 1996 with total page 59 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Scanning Probe Microscopy by : Sergei V. Kalinin
Download or read book Scanning Probe Microscopy written by Sergei V. Kalinin and published by Springer Science & Business Media. This book was released on 2007-04-03 with total page 1002 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume will be devoted to the technical aspects of electrical and electromechanical SPM probes and SPM imaging on the limits of resolution, thus providing technical introduction into the field. This volume will also address the fundamental physical phenomena underpinning the imaging mechanism of SPMs.
Book Synopsis Scanning Probe Characterization of Novel Semiconductor Materials and Devices by : Xiaotian Zhou
Download or read book Scanning Probe Characterization of Novel Semiconductor Materials and Devices written by Xiaotian Zhou and published by . This book was released on 2007 with total page 127 pages. Available in PDF, EPUB and Kindle. Book excerpt: As semiconductor devices shrink in size, it becomes more important to characterize and understand electronic properties of the materials and devices at the nanoscale. Scanning probe techniques offers numerous advantages over traditional tools used for semiconductor materials and devices characterization including high spatial resolution, ease of use and multi-functionality for electrical characterization, such as current, potential and capacitance, etc.
Book Synopsis Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials by : Paula M. Vilarinho
Download or read book Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials written by Paula M. Vilarinho and published by Springer Science & Business Media. This book was released on 2006-06-15 with total page 503 pages. Available in PDF, EPUB and Kindle. Book excerpt: As the characteristic dimensions of electronic devices continue to shrink, the ability to characterize their electronic properties at the nanometer scale has come to be of outstanding importance. In this sense, Scanning Probe Microscopy (SPM) is becoming an indispensable tool, playing a key role in nanoscience and nanotechnology. SPM is opening new opportunities to measure semiconductor electronic properties with unprecedented spatial resolution. SPM is being successfully applied for nanoscale characterization of ferroelectric thin films. In the area of functional molecular materials it is being used as a probe to contact molecular structures in order to characterize their electrical properties, as a manipulator to assemble nanoparticles and nanotubes into simple devices, and as a tool to pattern molecular nanostructures. This book provides in-depth information on new and emerging applications of SPM to the field of materials science, namely in the areas of characterisation, device application and nanofabrication of functional materials. Starting with the general properties of functional materials the authors present an updated overview of the fundamentals of Scanning Probe Techniques and the application of SPM techniques to the characterization of specified functional materials such as piezoelectric and ferroelectric and to the fabrication of some nano electronic devices. Its uniqueness is in the combination of the fundamental nanoscale research with the progress in fabrication of realistic nanodevices. By bringing together the contribution of leading researchers from the materials science and SPM communities, relevant information is conveyed that allows researchers to learn more about the actual developments in SPM applied to functional materials. This book will contribute to the continuous education and development in the field of nanotechnology.
Book Synopsis Scanning Probe Microscopy of Functional Materials by : Sergei V Kalinin
Download or read book Scanning Probe Microscopy of Functional Materials written by Sergei V Kalinin and published by Springer. This book was released on 2016-04-01 with total page 576 pages. Available in PDF, EPUB and Kindle. Book excerpt: Here is a much-needed general overview of a rapidly developing field. It covers novel scanning probe microscopy (SPM) techniques that are used to characterize a wide range of functional materials, including complex oxides, biopolymers, and semiconductors.
Book Synopsis Scanning Probe Microscopy by : Vijay Nalladega
Download or read book Scanning Probe Microscopy written by Vijay Nalladega and published by BoD – Books on Demand. This book was released on 2012-04-27 with total page 258 pages. Available in PDF, EPUB and Kindle. Book excerpt: Scanning probe microscopy (SPM) is one of the key enabling tools for the advancement for nanotechnology with applications in many interdisciplinary research areas. This book presents selected original research works on the application of scanning probe microscopy techniques for the characterization of physical properties of different materials at the nanoscale. The topics in the book range from surface morphology analysis of thin film structures, oxide thin layers and superconducting structures, novel scanning probe microscopy techniques for characterization of mechanical and electrical properties, evaluation of mechanical and tribological properties of hybrid coatings and thin films. The variety of topics chosen for the book underlines the strong interdisciplinary nature of the research work in the field of scanning probe microscopy.
Book Synopsis Scanned Probe Characterization of Semiconductor Nanostructures by : James Jeremy MacDonald Law
Download or read book Scanned Probe Characterization of Semiconductor Nanostructures written by James Jeremy MacDonald Law and published by . This book was released on 2009 with total page 121 pages. Available in PDF, EPUB and Kindle. Book excerpt: Advances in the synthesis of materials and device structures have accentuated the need to understand nanoscale electronic structure and its implications. Scanning probe microscopy offers a rich variety of highly spatially accurate techniques that can further our understanding of the interactions that occur in nanoscale semiconductor materials and devices. The promising nitride semiconductor materials system suffers from perturbations in local electronic structure due to crystallographic defects. Understanding the electronic properties and physical origin of these defects can be invaluable in mitigating their impacts or eliminating them all together. In the second chapter of this dissertation, scanning capacitance microscopy (SCM) is used to characterize local electronic structure in a-plane n-type gallium nitride. Analysis reveals the presence of a linear, positively charged feature aligned along the direction which likely corresponds to a partial dislocation at the edge of a stacking fault. In the third chapter, conductive atomic force microscopy is used to determine the effects of Ga/N flux on the conductive behavior of reverse-bias leakage paths in gallium nitride grown by molecular beam epitaxy (MBE). Our data reveal a band of fluxes near Ga/N ~̃ 1 for which these pathways cease to be observable. These observations suggest a method for controlling the primary source of reverse-bias Schottky contact leakage in n-type GaN grown by MBE. A deeper understanding of the interaction between macro-scale objects and nanoscale electronic properties is required to bring the exciting new possibilities that semiconductor nanowires offer to fruition. In the fourth chapter, SCM is used to examine the effects of micron-scale metal contacts on carrier modulation and electrostatic behavior in indium arsenide semiconductor nanowires. We interpret a pronounced dependence of capacitance spectra on distance between the probe tip and nanowire contact as a consequence of electrostatic screening of the tip-nanowire potential difference by the large metal contact. These results provide direct experimental verification of contact screening effects on the electronic behavior of nanowire devices and are indicative of the importance of accounting for the effect of large-scale contact and circuit elements on the characteristics of nanoscale electronic devices.
Book Synopsis Characterization of Semiconductor Heterostructures and Nanostructures by : Chiara Manfredotti
Download or read book Characterization of Semiconductor Heterostructures and Nanostructures written by Chiara Manfredotti and published by Elsevier Inc. Chapters. This book was released on 2013-04-11 with total page 66 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Scanning Probe Microscopy of Functional Materials by : Sergei V. Kalinin
Download or read book Scanning Probe Microscopy of Functional Materials written by Sergei V. Kalinin and published by Springer. This book was released on 2010-12-10 with total page 555 pages. Available in PDF, EPUB and Kindle. Book excerpt: The goal of this book is to provide a general overview of the rapidly developing field of novel scanning probe microscopy (SPM) techniques for characterization of a wide range of functional materials, including complex oxides, biopolymers, and semiconductors. Many recent advances in condensed matter physics and materials science, including transport mechanisms in carbon nanostructures and the role of disorder on high temperature superconductivity, would have been impossible without SPM. The unique aspect of SPM is its potential for imaging functional properties of materials as opposed to structural characterization by electron microscopy. Examples include electrical transport and magnetic, optical, and electromechanical properties. By bringing together critical reviews by leading researchers on the application of SPM to to the nanoscale characterization of functional materials properties, this book provides insight into fundamental and technological advances and future trends in key areas of nanoscience and nanotechnology.
Book Synopsis Handbook of Instrumentation and Techniques for Semiconductor Nanostructure Characterization by : Richard Haight
Download or read book Handbook of Instrumentation and Techniques for Semiconductor Nanostructure Characterization written by Richard Haight and published by World Scientific. This book was released on 2012 with total page 346 pages. Available in PDF, EPUB and Kindle. Book excerpt: As we delve more deeply into the physics and chemistry of functional materials and processes, we are inexorably driven to the nanoscale. And nowhere is the development of instrumentation and associated techniques more important to scientific progress than in the area of nanoscience. The dramatic expansion of efforts to peer into nanoscale materials and processes has made it critical to capture and summarize the cutting-edge instrumentation and techniques that have become indispensable for scientific investigation in this arena. This Handbook is a key resource developed for scientists, engineers and advanced graduate students in which eminent scientists present the forefront of instrumentation and techniques for the study of structural, optical and electronic properties of semiconductor nanostructures.
Book Synopsis Scanning Probe Microscopy in Nanoscience and Nanotechnology 2 by : Bharat Bhushan
Download or read book Scanning Probe Microscopy in Nanoscience and Nanotechnology 2 written by Bharat Bhushan and published by Springer Science & Business Media. This book was released on 2010-12-17 with total page 823 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.
Book Synopsis Scanning Probe Microscopy for Energy Research by : Dawn A. Bonnell
Download or read book Scanning Probe Microscopy for Energy Research written by Dawn A. Bonnell and published by World Scientific. This book was released on 2013 with total page 640 pages. Available in PDF, EPUB and Kindle. Book excerpt: Efficiency and life time of solar cells, energy and power density of the batteries, and costs of the fuel cells alike cannot be improved unless the complex electronic, optoelectronic, and ionic mechanisms underpinning operation of these materials and devices are understood on the nanometer level of individual defects. Only by probing these phenomena locally can we hope to link materials structure and functionality, thus opening pathway for predictive modeling and synthesis. While structures of these materials are now accessible on length scales from macroscopic to atomic, their functionality has remained Terra Incognitae. In this volume, we provide a summary of recent advances in scanning probe microscopy studies of local functionality of energy materials and devices ranging from photovoltaics to batteries, fuel cells, and energy harvesting systems. Recently emergent SPM modes and combined SPM-electron microscopy approaches are also discussed. Contributions by internationally renowned leaders in the field describe the frontiers in this important field.
Book Synopsis Scanning Probe Microscopy in Nanoscience and Nanotechnology 3 by : Bharat Bhushan
Download or read book Scanning Probe Microscopy in Nanoscience and Nanotechnology 3 written by Bharat Bhushan and published by Springer Science & Business Media. This book was released on 2012-10-16 with total page 634 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.
Book Synopsis Scanning Probe Microscopy¿in Industrial Applications by : Dalia G. Yablon
Download or read book Scanning Probe Microscopy¿in Industrial Applications written by Dalia G. Yablon and published by John Wiley & Sons. This book was released on 2013-10-24 with total page 337 pages. Available in PDF, EPUB and Kindle. Book excerpt: Describes new state-of-the-science tools and their contribution to industrial R&D With contributions from leading international experts in the field, this book explains how scanning probe microscopy is used in industry, resulting in improved product formulation, enhanced processes, better quality control and assurance, and new business opportunities. Readers will learn about the use of scanning probe microscopy to support R&D efforts in the semiconductor, chemical, personal care product, biomaterial, pharmaceutical, and food science industries, among others. Scanning Probe Microscopy in Industrial Applications emphasizes nanomechanical characterization using scanning probe microscopy. The first half of the book is dedicated to a general overview of nanomechanical characterization methods, offering a complete practical tutorial for readers who are new to the topic. Several chapters include worked examples of useful calculations such as using Hertz mechanics with and without adhesion to model a contact, step-by-step instructions for simulations to guide cantilever selection for an experiment, and data analysis procedures for dynamic contact experiments. The second half of the book describes applications of nanomechanical characterization in industry, including: New formulation development for pharmaceuticals Measurement of critical dimensions and thin dielectric films in the semiconductor industry Effect of humidity and temperature on biomaterials Characterization of polymer blends to guide product formulation in the chemicals sector Unraveling links between food structure and function in the food industry Contributions are based on the authors' thorough review of the current literature as well as their own firsthand experience applying scanning probe microscopy to solve industrial R&D problems. By explaining the fundamentals before advancing to applications, Scanning Probe Microscopy in Industrial Applications offers a complete treatise that is accessible to both novices and professionals. All readers will discover how to apply scanning probe microscopy to build and enhance their R&D efforts.
Book Synopsis Applied Scanning Probe Methods XII by : Bharat Bhushan
Download or read book Applied Scanning Probe Methods XII written by Bharat Bhushan and published by Springer Science & Business Media. This book was released on 2008-10-24 with total page 271 pages. Available in PDF, EPUB and Kindle. Book excerpt: Crack initiation and growth are key issues when it comes to the mechanical reliab- ity of microelectronic devices and microelectromechanical systems (MEMS). Es- cially in organic electronics where exible substrates will play a major role these issues will become of utmost importance. It is therefore necessary to develop me- ods which in situ allow the experimental investigation of surface deformation and fracture processes in thin layers at a micro and nanometer scale. While scanning electron microscopy (SEM) might be used it is also associated with some major experimental drawbacks. First of all if polymers are investigated they usually have to be coated with a metal layer due to their commonly non-conductive nature. Additi- ally they might be damaged by the electron beam of the microscope or the vacuum might cause outgasing of solvents or evaporation of water and thus change material properties. Furthermore, for all kinds of materials a considerable amount of expe- mental effort is necessary to build a tensile testing machine that ts into the chamber. Therefore, a very promising alternative to SEM is based on the use of an atomic force microscope (AFM) to observe in situ surface deformation processes during straining of a specimen. First steps towards this goal were shown in the 1990s in [1–4] but none of these approaches truly was a microtensile test with sample thicknesses in the range of micrometers. To the authors’ knowledge, this was shown for the rst time by Hild et al. in [5]. 16.
Book Synopsis Progress in Nanoscale Characterization and Manipulation by : Rongming Wang
Download or read book Progress in Nanoscale Characterization and Manipulation written by Rongming Wang and published by Springer. This book was released on 2018-08-30 with total page 511 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book focuses on charged-particle optics and microscopy, as well as their applications in the materials sciences. Presenting a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examining their crucial roles in modern materials research, it offers a unique resource for all researchers who work in ultramicroscopy and/or materials research. The book addresses the growing opportunities in this field and introduces readers to the state of the art in charged-particle microscopy techniques. It showcases recent advances in scanning electron microscopy, transmission electron microscopy and helium ion microscopy, including advanced spectroscopy, spherical-corrected microscopy, focused-ion imaging and in-situ microscopy. Covering these and other essential topics, the book is intended to facilitate the development of microscopy techniques, inspire young researchers, and make a valuable contribution to the field.
