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Author : William P Fisher Jr
Publisher : Walter de Gruyter
ISBN 13 : 9783111036236
Total Pages : 0 pages
Book Rating : 4.0/5 (362 download)
Download or read book Models, Measurement, and Metrology Extending the Si written by William P Fisher Jr and published by Walter de Gruyter. This book was released on 2024-07-26 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : William P Fisher Jr
Publisher : Walter de Gruyter GmbH & Co KG
ISBN 13 : 3111036499
Total Pages : 522 pages
Book Rating : 4.1/5 (11 download)
Download or read book Models, Measurement, and Metrology Extending the Si written by William P Fisher Jr and published by Walter de Gruyter GmbH & Co KG. This book was released on 2024-09-23 with total page 522 pages. Available in PDF, EPUB and Kindle. Book excerpt: The book focuses on the extension of quality-assured measurement and metrology into psychological and social domains. This is not only feasible and achievable, but also a pressing concern. Significant progress in developing a common conceptual system for measurement across the sciences has been made in recent collaborations between metrologists and psychometricians, as reported in the chapters of this book. Modeling, estimation, and interpretation of objectively reproducible unit quantities that support both general comparability and adaptation to unique local circumstances are demonstrated in fields as diverse as artificial intelligence, justice, and beauty perception.
Author : William P. Fisher Jr., Leslie Pendrill
Publisher : Walter de Gruyter GmbH & Co KG
ISBN 13 : 3111037150
Total Pages : 389 pages
Book Rating : 4.1/5 (11 download)
Download or read book Models, Measurement, and Metrology Extending the SI written by William P. Fisher Jr., Leslie Pendrill and published by Walter de Gruyter GmbH & Co KG. This book was released on 2024-05-07 with total page 389 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Numan M. Durakbasa
Publisher : Springer Nature
ISBN 13 : 3031539915
Total Pages : 847 pages
Book Rating : 4.0/5 (315 download)
Download or read book Industrial Engineering in the Industry 4.0 Era written by Numan M. Durakbasa and published by Springer Nature. This book was released on with total page 847 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : S. V. Gupta
Publisher : Springer
ISBN 13 : 9783030439712
Total Pages : 304 pages
Book Rating : 4.4/5 (397 download)
Download or read book Units of Measurement written by S. V. Gupta and published by Springer. This book was released on 2021-06-24 with total page 304 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book delivers a comprehensive overview of units of measurement. Beginning with a historical look at metrology in Ancient India, the book explains fundamental concepts in metrology such as basic, derived and dimensionless quantities, and introduces the concept of quantity calculus. It discusses and critically examines various three and four-dimensional systems of units used both presently and in the past, while explaining why only four base units are needed for a system of measurement. It discusses the Metre Convention as well as the creation of the International Bureau of Weights and Measures, and gives a detailed look at the evolution of the current SI base units of time, length, mass, electric current, temperature, intensity of illumination and substance. This updated second edition is extended with timely new chapters discussing past efforts to redefine the SI base units as well as the most recent 2019 redefinitions based entirely on the speed of light and other fundamental physical constants. Additionally, it provides biographical presentations of many of the historical figures behind commonly used units of measurements, such as Newton, Joule and Ohm, With its accessible and comprehensive treatment of the field, together with its unique presentation of the underlying history, this book is well suited to any student and researcher interested in the practical and historical aspects of the field of metrology.
Author : Agnes Kaposi
Publisher : Springer
ISBN 13 :
Total Pages : 364 pages
Book Rating : 4.3/5 (512 download)
Download or read book Systems, Models, and Measures written by Agnes Kaposi and published by Springer. This book was released on 1994 with total page 364 pages. Available in PDF, EPUB and Kindle. Book excerpt: Systems, Models and Measures seeks to bridge the gap between the 'classical' and the newer technologies by constructing a systematic measurement framework for both. The authors use their experience as consultants in systems, software and quality engineering to take the subject from concept and theory, via strategy and procedure, to tools and applications. The book clarifies the key notions of system, model, measurement, product, process, specification and design. Practical examples demonstrate the 'architecture' of measurement schemes, extending them to object-oriented and subjective measurement. A detailed case study provides a measurement strategy for formal specifications, including Prolog, Z and VDM. The reader will be able to formulate problems in measurable terms, appraise and compare formal specifications, assess and enhance existing measurement practices, and devise measurement schemes for describing objective characteristics and expressing value judgements.
Author : Dieter K. Schroder
Publisher : The Electrochemical Society
ISBN 13 : 1566775698
Total Pages : 406 pages
Book Rating : 4.5/5 (667 download)
Download or read book Analytical and Diagnostic Techniques for Semiconductor Materials, Devices, and Processes 7 written by Dieter K. Schroder and published by The Electrochemical Society. This book was released on 2007 with total page 406 pages. Available in PDF, EPUB and Kindle. Book excerpt: Diagnostic characterization techniques for semiconductor materials, devices and device processing are addressed at this symposium. It will cover new techniques as well as advances in routine analytical technology applied to semiconductor process development and manufacture. The hardcover edition includes a CD-ROM of ECS Transactions, Volume 10, Issue 1, Analytical Techniques for Semiconductor Materials and Process Characterization 5 (ALTECH 2007). The PDF edition also includes the ALTECH 2007 papers.
Author :
Publisher :
ISBN 13 :
Total Pages : 548 pages
Book Rating : 4.3/5 (91 download)
Download or read book Metrology, Inspection, and Process Control for Microlithography written by and published by . This book was released on 1999 with total page 548 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : United States. National Bureau of Standards
Publisher :
ISBN 13 :
Total Pages : 404 pages
Book Rating : 4.3/5 (243 download)
Download or read book Publications of the National Bureau of Standards ... Catalog written by United States. National Bureau of Standards and published by . This book was released on 1987 with total page 404 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : National Institute of Standards and Technology (U.S.)
Publisher :
ISBN 13 :
Total Pages : 406 pages
Book Rating : 4.:/5 (31 download)
Download or read book Publications of the National Institute of Standards and Technology ... Catalog written by National Institute of Standards and Technology (U.S.) and published by . This book was released on 1988 with total page 406 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Electrochemical Society
Publisher :
ISBN 13 :
Total Pages : 1150 pages
Book Rating : 4.:/5 (318 download)
Download or read book Extended Abstracts written by Electrochemical Society and published by . This book was released on 1992 with total page 1150 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : David G. Seiler
Publisher : American Institute of Physics
ISBN 13 :
Total Pages : 714 pages
Book Rating : 4.3/5 (91 download)
Download or read book Characterization and Metrology for ULSI Technology 2005 written by David G. Seiler and published by American Institute of Physics. This book was released on 2005-09-29 with total page 714 pages. Available in PDF, EPUB and Kindle. Book excerpt: The worldwide semiconductor community faces increasingly difficult challenges in the era of silicon nanotechnology and beyond. The magnitude of these challenges demands special attention from the metrology and analytical measurements community. New paradigms must be found. Adequate research and development for new metrology concepts are urgently needed. Characterization and metrology are key enablers for developing new semiconductor technology and in improving manufacturing. This book summarizes major issues and gives critical reviews of important measurement techniques that are crucial to continuing the advances in semiconductor technology. It covers major aspects of process technology and most characterization techniques for silicon research, including development, manufacturing, and diagnostics. The book also covers emerging nano-devices and the corresponding metrology challenges that arise.
Author :
Publisher :
ISBN 13 :
Total Pages : 654 pages
Book Rating : 4.3/5 (91 download)
Download or read book Integrated Circuit Metrology, Inspection, and Process Control written by and published by . This book was released on 1991 with total page 654 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : William H. Arnold
Publisher : SPIE-International Society for Optical Engineering
ISBN 13 :
Total Pages : 648 pages
Book Rating : 4.:/5 (318 download)
Download or read book Integrated Circuit Metrology, Inspection, and Process Control V written by William H. Arnold and published by SPIE-International Society for Optical Engineering. This book was released on 1991 with total page 648 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author :
Publisher :
ISBN 13 :
Total Pages : 1904 pages
Book Rating : 4.3/5 (243 download)
Download or read book Electrical & Electronics Abstracts written by and published by . This book was released on 1997 with total page 1904 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : David G. Seiler
Publisher :
ISBN 13 :
Total Pages : 734 pages
Book Rating : 4.3/5 (91 download)
Download or read book Characterization and Metrology for ULSI Technology, 2000 written by David G. Seiler and published by . This book was released on 2001 with total page 734 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Horst Czichos
Publisher : Springer
ISBN 13 : 3319763857
Total Pages : 214 pages
Book Rating : 4.3/5 (197 download)
Download or read book Measurement, Testing and Sensor Technology written by Horst Czichos and published by Springer. This book was released on 2018-04-12 with total page 214 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents the principles, methods and techniques to characterize materials and technical systems. The book is organized with concise text-graphics compilations in three parts: The first part describes the fundamentals of measurement, testing and sensor technology, including a survey of sensor types for dimensional metrology, kinematics, dynamics, and temperature. It describes also microsensors and embedded sensors. The second part gives an overview of materials and explains the application of measurement, testing and sensor technology to characterize composition, microstructure, properties and performance of materials as well as deterioration mechanisms and reliability. The third part introduces the general systems theory for the characterization of technical systems, exemplified by mechatronic and tribological systems. It describes technical diagnostics for structural health monitoring and performance control.
