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Download or read book Instrumentation, Metrology, and Standards for Nanomanufacturing III written by and published by . This book was released on 2009 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Instrumentation, Metrology, and Standards for Nanomanufacturing III : 3-5 August 2009, San Diego, California, United States written by and published by . This book was released on 2009 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Michael T. Postek
Publisher : Society of Photo Optical
ISBN 13 : 9780819472625
Total Pages : 200 pages
Book Rating : 4.4/5 (726 download)
Download or read book Instrumentation, Metrology, and Standards for Nanomanufacturing II written by Michael T. Postek and published by Society of Photo Optical. This book was released on 2008 with total page 200 pages. Available in PDF, EPUB and Kindle. Book excerpt: Includes Proceedings Vol. 7821
Author : Michael T. Postek
Publisher : SPIE-International Society for Optical Engineering
ISBN 13 : 9780819482631
Total Pages : 178 pages
Book Rating : 4.4/5 (826 download)
Download or read book Instrumentation, Metrology, and Standards for Nanomanufacturing IV written by Michael T. Postek and published by SPIE-International Society for Optical Engineering. This book was released on 2010 with total page 178 pages. Available in PDF, EPUB and Kindle. Book excerpt: Includes Proceedings Vol. 7821
Author : Michael T. Postek
Publisher : SPIE-International Society for Optical Engineering
ISBN 13 : 9780819487155
Total Pages : 132 pages
Book Rating : 4.4/5 (871 download)
Download or read book Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors V written by Michael T. Postek and published by SPIE-International Society for Optical Engineering. This book was released on 2011 with total page 132 pages. Available in PDF, EPUB and Kindle. Book excerpt: Includes Proceedings Vol. 7821
Author : Michael T. Postek
Publisher :
ISBN 13 : 9780819491831
Total Pages : 194 pages
Book Rating : 4.4/5 (918 download)
Download or read book Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VI written by Michael T. Postek and published by . This book was released on 2012-10-19 with total page 194 pages. Available in PDF, EPUB and Kindle. Book excerpt: Includes Proceedings Vol. 7821
Download or read book Instrumentation, Metrology, and Standards for Nanomanufacturing written by and published by . This book was released on 2007 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Michael T. Postek
Publisher :
ISBN 13 : 9780819496690
Total Pages : 110 pages
Book Rating : 4.4/5 (966 download)
Download or read book Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VII written by Michael T. Postek and published by . This book was released on 2013-10-10 with total page 110 pages. Available in PDF, EPUB and Kindle. Book excerpt: Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature.
Author : Michael T. Postek
Publisher :
ISBN 13 : 9781628412000
Total Pages : 277 pages
Book Rating : 4.4/5 (12 download)
Download or read book Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VIII written by Michael T. Postek and published by . This book was released on 2014-10-30 with total page 277 pages. Available in PDF, EPUB and Kindle. Book excerpt: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.
Author : National Science and Technology Council (U.S.). Interagency Working Group on Manufacturing Research and Development
Publisher :
ISBN 13 :
Total Pages : 131 pages
Book Rating : 4.:/5 (289 download)
Download or read book Instrumentation, Metrology, and Standards for Nanotechnology written by National Science and Technology Council (U.S.). Interagency Working Group on Manufacturing Research and Development and published by . This book was released on 2008* with total page 131 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Günter Wilkening
Publisher : John Wiley & Sons
ISBN 13 : 3527606874
Total Pages : 541 pages
Book Rating : 4.5/5 (276 download)
Download or read book Nanoscale Calibration Standards and Methods written by Günter Wilkening and published by John Wiley & Sons. This book was released on 2006-05-12 with total page 541 pages. Available in PDF, EPUB and Kindle. Book excerpt: The quantitative determination of the properties of micro- and nanostructures is essential in research and development. It is also a prerequisite in process control and quality assurance in industry. The knowledge of the geometrical dimensions of structures in most cases is the base, to which other physical and chemical properties are linked. Quantitative measurements require reliable and stable instruments, suitable measurement procedures as well as appropriate calibration artefacts and methods. The seminar "NanoScale 2004" (6th Seminar on Quantitative Microscopy and 2nd Seminar on Nanoscale Calibration Standards and Methods) at the National Metrology Institute (Physikalisch-Technische Bundesanstalt PTB), Braunschweig, Germany, continues the series of seminars on Quantitative Microscopy. The series stimulates the exchange of information between manufacturers of relevant hard- and software and the users in science and industry. Topics addressed in these proceedings are a) the application of quantitative measurements and measurement problems in: microelectronics, microsystems technology, nano/quantum/molecular electronics, chemistry, biology, medicine, environmental technology, materials science, surface processing b) calibration & correction methods: calibration methods, calibration standards, calibration procedures, traceable measurements, standardization, uncertainty of measurements c) instrumentation and methods: novel/improved instruments and methods, reproducible probe/sample positioning, position-measuring systems, novel/improved probe/detector systems, linearization methods, image processing
Author : Ichiko Misumi
Publisher :
ISBN 13 : 9780750331913
Total Pages : 0 pages
Book Rating : 4.3/5 (319 download)
Download or read book Nanoscale Standards by Metrological AFM and Other Instruments written by Ichiko Misumi and published by . This book was released on 2021 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: The purpose of this book is to help semiconductor inspection equipment users and manufacturers understand what nano dimensional standards are used to calibrate their equipment and how to employ them effectively. Reviewing trends and developments in nanoscale standards, the book starts with an introductory overview of nanometrological standards before proceeding to detail pitch standard, step height, line width, nano particle size, and surface roughness. This book is essential for users making quantitative nanoscale measurements, be that in a commercial or academic research setting, or involved in engineering nanometrology for quality control in industrial applications. Here the author provides an approachable understanding and application of the nanoscale standards in a practical context across a range of common nanoscale measurement modalities, including 3D, with particular emphasis on applications to AFM, an exceptional and arguably the most common technique used in nanometrology due to the ease of use and versatility of applications.
Author : Richard Leach
Publisher : William Andrew
ISBN 13 : 1437778321
Total Pages : 349 pages
Book Rating : 4.4/5 (377 download)
Download or read book Fundamental Principles of Engineering Nanometrology written by Richard Leach and published by William Andrew. This book was released on 2009-09-03 with total page 349 pages. Available in PDF, EPUB and Kindle. Book excerpt: Fundamental Principles of Engineering Nanometrology provides a comprehensive overview of engineering metrology and how it relates to micro and nanotechnology (MNT) research and manufacturing. By combining established knowledge with the latest advances from the field, it presents a comprehensive single volume that can be used for professional reference and academic study. - Provides a basic introduction to measurement and instruments - Thoroughly presents numerous measurement techniques, from static length and displacement to surface topography, mass and force - Covers multiple optical surface measuring instruments and related topics (interferometry, triangulation, confocal, variable focus, and scattering instruments) - Explains, in depth, the calibration of surface topography measuring instruments (traceability; calibration of profile and areal surface texture measuring instruments; uncertainties) - Discusses the material in a way that is comprehensible to even those with only a limited mathematical knowledge
Author : Samir Mekid
Publisher : John Wiley & Sons
ISBN 13 : 1119721717
Total Pages : 404 pages
Book Rating : 4.1/5 (197 download)
Download or read book Metrology and Instrumentation written by Samir Mekid and published by John Wiley & Sons. This book was released on 2021-12-02 with total page 404 pages. Available in PDF, EPUB and Kindle. Book excerpt: Metrology and Instrumentation: Practical Applications for Engineering and Manufacturing provides students and professionals with an accessible foundation in the metrology techniques, instruments, and governing standards used in mechanical engineering and manufacturing. The book opens with an overview of metrology units and scale, then moves on to explain topics such as sources of error, calibration systems, uncertainty, and dimensional, mechanical, and thermodynamic measurement systems. A chapter on tolerance stack-ups covers GD&T, ASME Y14.5-2018, and the ISO standard for general tolerances, while a chapter on digital measurements connects metrology to newer, Industry 4.0 applications.
Author : Kevin Harding
Publisher : Taylor & Francis
ISBN 13 : 1439854823
Total Pages : 497 pages
Book Rating : 4.4/5 (398 download)
Download or read book Handbook of Optical Dimensional Metrology written by Kevin Harding and published by Taylor & Francis. This book was released on 2016-04-19 with total page 497 pages. Available in PDF, EPUB and Kindle. Book excerpt: Due to their speed, data density, and versatility, optical metrology tools play important roles in today's high-speed industrial manufacturing applications. Handbook of Optical Dimensional Metrology provides useful background information and practical examples to help readers understand and effectively use state-of-the-art optical metrology methods
Author : Richard Leach
Publisher : Elsevier
ISBN 13 : 1455777501
Total Pages : 384 pages
Book Rating : 4.4/5 (557 download)
Download or read book Fundamental Principles of Engineering Nanometrology written by Richard Leach and published by Elsevier. This book was released on 2014-05-17 with total page 384 pages. Available in PDF, EPUB and Kindle. Book excerpt: Working at the nano-scale demands an understanding of the high-precision measurement techniques that make nanotechnology and advanced manufacturing possible. Richard Leach introduces these techniques to a broad audience of engineers and scientists involved in nanotechnology and manufacturing applications and research. He also provides a routemap and toolkit for metrologists engaging with the rigor of measurement and data analysis at the nano-scale. Starting from the fundamentals of precision measurement, the author progresses into different measurement and characterization techniques. The focus on nanometrology in engineering contexts makes this book an essential guide for the emerging nanomanufacturing / nanofabrication sector, where measurement and standardization requirements are paramount both in product specification and quality assurance. This book provides engineers and scientists with the methods and understanding needed to design and produce high-performance, long-lived products while ensuring that compliance and public health requirements are met. Updated to cover new and emerging technologies, and recent developments in standards and regulatory frameworks, this second edition includes many new sections, e.g. new technologies in scanning probe and e-beam microscopy, recent developments in interferometry and advances in co-ordinate metrology. - Demystifies nanometrology for a wide audience of engineers, scientists, and students involved in nanotech and advanced manufacturing applications and research - Introduces metrologists to the specific techniques and equipment involved in measuring at the nano-scale or to nano-scale uncertainty - Fully updated to cover the latest technological developments, standards, and regulations
Author : Waldemar Nawrocki
Publisher : Springer
ISBN 13 : 3319156691
Total Pages : 287 pages
Book Rating : 4.3/5 (191 download)
Download or read book Introduction to Quantum Metrology written by Waldemar Nawrocki and published by Springer. This book was released on 2015-03-24 with total page 287 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents the theory of quantum effects used in metrology and results of the author’s own research in the field of quantum electronics. The book provides also quantum measurement standards used in many branches of metrology for electrical quantities, mass, length, time and frequency. This book represents the first comprehensive survey of quantum metrology problems. As a scientific survey, it propagates a new approach to metrology with more emphasis on its connection with physics. This is of importance for the constantly developing technologies and nanotechnologies in particular. Providing a presentation of practical applications of the effects used in quantum metrology for the construction of quantum standards and sensitive electronic components, the book is useful for a wide audience of physicists and metrologists in the broad sense of both terms. In 2014 a new system of units, the so called Quantum SI, is introduced. This book helps to understand and approve the new system to both technology and academic community.
