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Image Contrast In Mirror And Low Energy Electron Microscopy
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Book Synopsis Image Contrast in Mirror and Low Energy Electron Microscopy by : Shane Michael Kennedy
Download or read book Image Contrast in Mirror and Low Energy Electron Microscopy written by Shane Michael Kennedy and published by . This book was released on 2010 with total page 153 pages. Available in PDF, EPUB and Kindle. Book excerpt: We develop several approaches to understand and interpret image contrast in mirror electron microscopy (MEM) and low energy electron microscopy (LEEM), with potential applications to photoemission electron microscopy (PEEM). We treat both the forward problem, of how surface features and properties create image contrast, and the inverse problem, of how we may infer quantitative information about surface features and properties from experimental MEM, LEEM and PEEM images. The thesis begins with the development of the Laplacian imaging theory of MEM, whereby image contrast is understood as the second derivative of the surface topography, blurred slightly to account for the interaction of the electron beam with the electric field above the specimen, rather than the specimen surface itself. This intuitive method includes the effects of lens aberrations and can be rapidly inverted to recover the surface topography from experimental MEM images. For specimen surface variations that are outside the regime of the Laplacian imaging theory and other models, we develop a caustic imaging theory for MEM. This involves solving the electric field above the specimen and tracing a family or envelope of rays through the immersion lens. Where initially adjacent rays cross, caustics are created, and these strong image features may be used to recover three dimensional surface topography. Both the Laplacian imaging theory and the caustic imaging theory are successfully applied to experimental MEM data to obtain the surface topography. As a complement to this ray-based treatment, we then develop a wave optical treatment of LEEM image contrast, adopting the complex transfer function methodology from transmission electron microscopy. This method includes spherical and chromatic aberration, and may be extended to include higher order aberrations for use in aberration corrected LEEM instruments. With knowledge of the complex transfer function, we then apply phase retrieval methods to simulated LEEM images, recovering the electron wave function and surface topography for a series of step terraces. Finally, we consider a wave optical treatment of MEM, investigating the behaviour of the electron wave in the vicinity of the turn around region. This is extended to explore the application of MEM beyond specimen surfaces, and the feasibility of imaging very weak potentials, such as the ponderomotive potential experienced by an electron in a light field.
Book Synopsis Surface Microscopy with Low Energy Electrons by : Ernst Bauer
Download or read book Surface Microscopy with Low Energy Electrons written by Ernst Bauer and published by Springer. This book was released on 2014-07-10 with total page 513 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book, written by a pioneer in surface physics and thin film research and the inventor of Low Energy Electron Microscopy (LEEM), Spin-Polarized Low Energy Electron Microscopy (SPLEEM) and Spectroscopic Photo Emission and Low Energy Electron Microscopy (SPELEEM), covers these and other techniques for the imaging of surfaces with low energy (slow) electrons. These techniques also include Photoemission Electron Microscopy (PEEM), X-ray Photoemission Electron Microscopy (XPEEM), and their combination with microdiffraction and microspectroscopy, all of which use cathode lenses and slow electrons. Of particular interest are the fundamentals and applications of LEEM, PEEM, and XPEEM because of their widespread use. Numerous illustrations illuminate the fundamental aspects of the electron optics, the experimental setup, and particularly the application results with these instruments. Surface Microscopy with Low Energy Electrons will give the reader a unified picture of the imaging, diffraction, and spectroscopy methods that are possible using low energy electron microscopes.
Book Synopsis Reflection High-Energy Electron Diffraction and Reflection Electron Imaging of Surfaces by : P.K. Larsen
Download or read book Reflection High-Energy Electron Diffraction and Reflection Electron Imaging of Surfaces written by P.K. Larsen and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 526 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume contains the papers presented at the NATO Advanced Research Workshop in "Reflection High Energy Electron Diffraction and Reflection Electron Imaging of Surfaces" held at the Koningshof conference center, Veldhoven, the Netherlands, June 15-19, 1987. The main topics of the workshop, Reflection High Energy Electron Diffraction (RHEED) and Reflection Electron Microscopy (REM), have a common basis in the diffraction processes which high energy electrons undergo when they interact with solid surfaces at grazing angles. However, while REM is a new technique developed on the basis of recent advances in transmission electron microscopy, RHEED is an old method in surface crystallography going back to the discovery of electron diffraction in 1927 by Davisson and Germer. Until the development of ultra high vacuum techniques in the 1960's made instruments using slow electrons more accessable, RHEED was the dominating electron diffraction technique. Since then and until recently the method of Low Energy Electron Diffraction (LEED) largely surpassed RHEED in popularity in surface studies. The two methods are closely related of course, each with its own specific advantages. The grazing angle geometry of RHEED has now become a very useful feature because this makes it ideally suited for combination with the thin growth technique of Molecular Beam Epitaxy (MBE). This combination allows in-situ studies of freshly grown and even growing surfaces, opening up new areas of research of both fundamental and technological importance.
Book Synopsis Diffraction and Imaging Techniques in Material Science P2 by : S Amelinckx
Download or read book Diffraction and Imaging Techniques in Material Science P2 written by S Amelinckx and published by Elsevier. This book was released on 2012-12-02 with total page 412 pages. Available in PDF, EPUB and Kindle. Book excerpt: Diffraction and Imaging Techniques in Material Science reviews recent developments in diffraction and imaging techniques used in the study of materials. It discusses advances in high-voltage electron microscopy, low-energy electron diffraction (LEED), X-ray and neutron diffraction, X-ray topography, mirror electron microscopy, and field emission microscopy. Organized into five parts encompassing nine chapters, this volume begins with an overview of the dynamical theory of the diffraction of high-energy electrons in crystals and methodically introduces the reader to dynamical diffraction in perfect and imperfect crystals, inelastic scattering of electrons in crystals, and X-ray production. It then explores back scattering effects, the technical features of high-voltage electron microscopes, and surface characterization by LEED. Other chapters focus on the kinematical theory of X-ray diffraction, techniques and interpretation in X-ray topography, and interpretation of the contrast of the images of defects on X-ray topographs. The book also describes theory and applications of mirror electron microscopy, surface studies by field emission of electrons, field ionization and field evaporation, and gas-surface interactions before concluding with a discussion on lattice imperfections. Scientists and students taking courses on diffraction and solid-state electron microscopy will benefit from this book.
Book Synopsis Electron Microscopy by : S. Amelinckx
Download or read book Electron Microscopy written by S. Amelinckx and published by John Wiley & Sons. This book was released on 2008-09-26 with total page 527 pages. Available in PDF, EPUB and Kindle. Book excerpt: Derived from the successful three-volume Handbook of Microscopy, this book provides a broad survey of the physical fundamentals and principles of all modern techniques of electron microscopy. This reference work on the method most often used for the characterization of surfaces offers a competent comparison of the feasibilities of the latest developments in this field of research. Topics include: * Stationary Beam Methods: Transmission Electron Microscopy/ Electron Energy Loss Spectroscopy/ Convergent Electron Beam Diffraction/ Low Energy Electron Microscopy/ Electron Holographic Methods * Scanning Beam Methods: Scanning Transmission Electron Microscopy/ Scanning Auger and XPS Microscopy/ Scanning Microanalysis/ Imaging Secondary Ion Mass Spectrometry * Magnetic Microscopy: Scanning Electron Microscopy with Polarization Analysis/ Spin Polarized Low Energy Electron Microscopy Materials scientists as well as any surface scientist will find this book an invaluable source of information for the principles of electron microscopy.
Book Synopsis Springer Handbook of Microscopy by : Peter W. Hawkes
Download or read book Springer Handbook of Microscopy written by Peter W. Hawkes and published by Springer Nature. This book was released on 2019-11-02 with total page 1561 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book features reviews by leading experts on the methods and applications of modern forms of microscopy. The recent awards of Nobel Prizes awarded for super-resolution optical microscopy and cryo-electron microscopy have demonstrated the rich scientific opportunities for research in novel microscopies. Earlier Nobel Prizes for electron microscopy (the instrument itself and applications to biology), scanning probe microscopy and holography are a reminder of the central role of microscopy in modern science, from the study of nanostructures in materials science, physics and chemistry to structural biology. Separate chapters are devoted to confocal, fluorescent and related novel optical microscopies, coherent diffractive imaging, scanning probe microscopy, transmission electron microscopy in all its modes from aberration corrected and analytical to in-situ and time-resolved, low energy electron microscopy, photoelectron microscopy, cryo-electron microscopy in biology, and also ion microscopy. In addition to serving as an essential reference for researchers and teachers in the fields such as materials science, condensed matter physics, solid-state chemistry, structural biology and the molecular sciences generally, the Springer Handbook of Microscopy is a unified, coherent and pedagogically attractive text for advanced students who need an authoritative yet accessible guide to the science and practice of microscopy.
Book Synopsis Image Formation in Low-voltage Scanning Electron Microscopy by : Ludwig Reimer
Download or read book Image Formation in Low-voltage Scanning Electron Microscopy written by Ludwig Reimer and published by SPIE Press. This book was released on 1993 with total page 162 pages. Available in PDF, EPUB and Kindle. Book excerpt: While most textbooks about scanning electron microscopy (SEM) cover the high-voltage range from 5-50 keV, this volume considers the special problems in low-voltage SEM and summarizes the differences between LVSEM and conventional SEM. Chapters cover the influence of lens aberrations and design on electron-probe formation; the effect of elastic and inelastic scattering processes on electron diffusion and electron range; charging and radiation damage effects; the dependence of SE yield and the backscattering coefficient on electron energy, surface tilt, and material as well as the angular and energy distributions; and types of image contrast and the differences between LVSEM and conventional SEM modes due to the influence of electron-specimen interactions.
Book Synopsis Advances in Imaging and Electron Physics by :
Download or read book Advances in Imaging and Electron Physics written by and published by Academic Press. This book was released on 1995-11-22 with total page 425 pages. Available in PDF, EPUB and Kindle. Book excerpt: Academic Press is pleased to announce the creation of Advances in Imaging and Electron Physics. This serial publication results from the merger of two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical & Electron Microscopy. Advances in Imaging & Electron Physics will feature extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies,microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Book Synopsis Reflection Electron Microscopy and Spectroscopy for Surface Analysis by : Zhong Lin Wang
Download or read book Reflection Electron Microscopy and Spectroscopy for Surface Analysis written by Zhong Lin Wang and published by Cambridge University Press. This book was released on 1996-05-23 with total page 457 pages. Available in PDF, EPUB and Kindle. Book excerpt: A self-contained book on electron microscopy and spectrometry techniques for surface studies.
Book Synopsis In Situ Real-Time Characterization of Thin Films by : Orlando Auciello
Download or read book In Situ Real-Time Characterization of Thin Films written by Orlando Auciello and published by John Wiley & Sons. This book was released on 2001 with total page 282 pages. Available in PDF, EPUB and Kindle. Book excerpt: An in-depth look at the state of the art of in situ real-time monitoring and analysis of thin films With thin film deposition becoming increasingly critical in the production of advanced electronic and optical devices, scientists and engineers working in this area are looking for in situ, real-time, structure-specific analytical tools for characterizing phenomena occurring at surfaces and interfaces during thin film growth. This volume brings together contributed chapters from experts in the field, covering proven methods for in situ real-time analysis of technologically important materials such as multicomponent oxides in different environments. Background information and extensive references to the current literature are also provided. Readers will gain a thorough understanding of the growth processes and become acquainted with both emerging and more established methods that can be adapted for in situ characterization. Methods and their most useful applications include: * Low-energy time-of-flight ion scattering and direct recoil spectroscopy (TOF-ISRAS) for studying multicomponent oxide film growth processes * Reflection high-energy electron diffraction (RHEED) for determining the nature of chemical reactions at film surfaces * Spectrometric ellipsometry (SE) for use in the analysis of semiconductors and other multicomponent materials * Reflectance spectroscopy and transmission electron microscopy for monitoring epitaxial growth processes * X-ray fluorescence spectroscopy for studying surface and interface structures * And other cost-effective techniques for industrial application
Book Synopsis Transmission Electron Microscopy by : Ludwig Reimer
Download or read book Transmission Electron Microscopy written by Ludwig Reimer and published by Springer. This book was released on 2013-11-11 with total page 558 pages. Available in PDF, EPUB and Kindle. Book excerpt: Hier steht der Extremkurztext.
Book Synopsis Principles of Electron Optics, Volume 2 by : Peter W. Hawkes
Download or read book Principles of Electron Optics, Volume 2 written by Peter W. Hawkes and published by Academic Press. This book was released on 2017-12-13 with total page 767 pages. Available in PDF, EPUB and Kindle. Book excerpt: Principles of Electron Optics: Applied Geometrical Optics, Second Edition gives detailed information about the many optical elements that use the theory presented in Volume 1: electrostatic and magnetic lenses, quadrupoles, cathode-lens-based instruments including the new ultrafast microscopes, low-energy-electron microscopes and photoemission electron microscopes and the mirrors found in their systems, Wien filters and deflectors. The chapter on aberration correction is largely new. The long section on electron guns describes recent theories and covers multi-column systems and carbon nanotube emitters. Monochromators are included in the section on curved-axis systems. The lists of references include many articles that will enable the reader to go deeper into the subjects discussed in the text. The book is intended for postgraduate students and teachers in physics and electron optics, as well as researchers and scientists in academia and industry working in the field of electron optics, electron and ion microscopy and nanolithography. Offers a fully revised and expanded new edition based on the latest research developments in electron optics Written by the top experts in the field Covers every significant advance in electron optics since the subject originated Contains exceptionally complete and carefully selected references and notes Serves both as a reference and text
Book Synopsis Chemistry and Physics of Solid Surfaces IV by : R. Vanselow
Download or read book Chemistry and Physics of Solid Surfaces IV written by R. Vanselow and published by Springer Science & Business Media. This book was released on 2013-03-13 with total page 505 pages. Available in PDF, EPUB and Kindle. Book excerpt: At the International Summer Institute in Surface Science (ISISS), which is held bienially on the Campus of the University of Wisconsin-Milwaukee, invited speakers present tutorial review lectures during the course of one week. The majority of the presentations deal with the gas-solid interface, but now and then relevant reviews concerning liquid-solid or solid-solid interfaces are included. The goal of ISISS was outlined in the first ISISS publication: "We recognize that the International Summer Institute in Surface Science should foster mutual understanding and interaction among theorists and experimentalists in the various areas of surface science. Progress can be achieved only when we occasionally peek over the fence into neighboring areas, not so much to amuse ourselves that the grass is greener on the other side as to learn from their progress and, perhaps equally fruitfully, from their limitations and setbacks. In addition, it is an important task in any field of science to assess, take count of what is done and, what is more important, to point in future directions. " Since the foundation of ISISS in 1973, the invited speakers - internation ally recognized experts in their area of specialization - have been asked to write review articles too. We wanted in this way to ensure that the largest possible group of scientists could benefit from the special review concept.
Download or read book Cumulated Index Medicus written by and published by . This book was released on 1991 with total page 1336 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis 21st Century Nanoscience - A Handbook by : Klaus D. Sattler
Download or read book 21st Century Nanoscience - A Handbook written by Klaus D. Sattler and published by CRC Press. This book was released on 2020-04-02 with total page 453 pages. Available in PDF, EPUB and Kindle. Book excerpt: This up-to-date reference is the most comprehensive summary of the field of nanoscience and its applications. It begins with fundamental properties at the nanoscale and then goes well beyond into the practical aspects of the design, synthesis, and use of nanomaterials in various industries. It emphasizes the vast strides made in the field over the past decade – the chapters focus on new, promising directions as well as emerging theoretical and experimental methods. The contents incorporate experimental data and graphs where appropriate, as well as supporting tables and figures with a tutorial approach.
Book Synopsis Encyclopedia of Surface and Colloid Science by : P. Somasundaran
Download or read book Encyclopedia of Surface and Colloid Science written by P. Somasundaran and published by CRC Press. This book was released on 2006 with total page 1084 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Surface and Thin Film Analysis by : Gernot Friedbacher
Download or read book Surface and Thin Film Analysis written by Gernot Friedbacher and published by John Wiley & Sons. This book was released on 2011-03-31 with total page 514 pages. Available in PDF, EPUB and Kindle. Book excerpt: Surveying and comparing all techniques relevant for practical applications in surface and thin film analysis, this second edition of a bestseller is a vital guide to this hot topic in nano- and surface technology. This new book has been revised and updated and is divided into four parts - electron, ion, and photon detection, as well as scanning probe microscopy. New chapters have been added to cover such techniques as SNOM, FIM, atom probe (AP),and sum frequency generation (SFG). Appendices with a summary and comparison of techniques and a list of equipment suppliers make this book a rapid reference for materials scientists, analytical chemists, and those working in the biotechnological industry. From a Review of the First Edition (edited by Bubert and Jenett) "... a useful resource..." (Journal of the American Chemical Society)