Growth And Characterization Of In Subscript 1 X Ga Subscript X As Subscript Y P Subscript 1 Y Andgaas Using Molecular Beam Epitaxy

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Fundamentals of Semiconductors

Author : Peter YU
Publisher : Springer Science & Business Media
ISBN 13 : 3540264752
Total Pages : 651 pages
Book Rating : 4.5/5 (42 download)

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Book Synopsis Fundamentals of Semiconductors by : Peter YU

Download or read book Fundamentals of Semiconductors written by Peter YU and published by Springer Science & Business Media. This book was released on 2007-05-08 with total page 651 pages. Available in PDF, EPUB and Kindle. Book excerpt: Excellent bridge between general solid-state physics textbook and research articles packed with providing detailed explanations of the electronic, vibrational, transport, and optical properties of semiconductors "The most striking feature of the book is its modern outlook ... provides a wonderful foundation. The most wonderful feature is its efficient style of exposition ... an excellent book." Physics Today "Presents the theoretical derivations carefully and in detail and gives thorough discussions of the experimental results it presents. This makes it an excellent textbook both for learners and for more experienced researchers wishing to check facts. I have enjoyed reading it and strongly recommend it as a text for anyone working with semiconductors ... I know of no better text ... I am sure most semiconductor physicists will find this book useful and I recommend it to them." Contemporary Physics Offers much new material: an extensive appendix about the important and by now well-established, deep center known as the DX center, additional problems and the solutions to over fifty of the problems at the end of the various chapters.

Semiconductor Material and Device Characterization

Author : Dieter K. Schroder
Publisher : John Wiley & Sons
ISBN 13 : 0471739065
Total Pages : 800 pages
Book Rating : 4.4/5 (717 download)

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Book Synopsis Semiconductor Material and Device Characterization by : Dieter K. Schroder

Download or read book Semiconductor Material and Device Characterization written by Dieter K. Schroder and published by John Wiley & Sons. This book was released on 2015-06-29 with total page 800 pages. Available in PDF, EPUB and Kindle. Book excerpt: This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also examines new interpretations and new applications of existing techniques. Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring semiconductor materials and devices. Coverage includes the full range of electrical and optical characterization methods, including the more specialized chemical and physical techniques. Readers familiar with the previous two editions will discover a thoroughly revised and updated Third Edition, including: Updated and revised figures and examples reflecting the most current data and information 260 new references offering access to the latest research and discussions in specialized topics New problems and review questions at the end of each chapter to test readers' understanding of the material In addition, readers will find fully updated and revised sections in each chapter. Plus, two new chapters have been added: Charge-Based and Probe Characterization introduces charge-based measurement and Kelvin probes. This chapter also examines probe-based measurements, including scanning capacitance, scanning Kelvin force, scanning spreading resistance, and ballistic electron emission microscopy. Reliability and Failure Analysis examines failure times and distribution functions, and discusses electromigration, hot carriers, gate oxide integrity, negative bias temperature instability, stress-induced leakage current, and electrostatic discharge. Written by an internationally recognized authority in the field, Semiconductor Material and Device Characterization remains essential reading for graduate students as well as for professionals working in the field of semiconductor devices and materials. An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department.

Solid State Properties

Author : Mildred Dresselhaus
Publisher : Springer
ISBN 13 : 3662559226
Total Pages : 521 pages
Book Rating : 4.6/5 (625 download)

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Book Synopsis Solid State Properties by : Mildred Dresselhaus

Download or read book Solid State Properties written by Mildred Dresselhaus and published by Springer. This book was released on 2018-01-17 with total page 521 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book fills a gap between many of the basic solid state physics and materials sciencebooks that are currently available. It is written for a mixed audience of electricalengineering and applied physics students who have some knowledge of elementaryundergraduate quantum mechanics and statistical mechanics. This book, based on asuccessful course taught at MIT, is divided pedagogically into three parts: (I) ElectronicStructure, (II) Transport Properties, and (III) Optical Properties. Each topic is explainedin the context of bulk materials and then extended to low-dimensional materials whereapplicable. Problem sets review the content of each chapter to help students to understandthe material described in each of the chapters more deeply and to prepare them to masterthe next chapters.

Surface and Thin Film Analysis

Author : Gernot Friedbacher
Publisher : Wiley-VCH
ISBN 13 : 9783527320479
Total Pages : 0 pages
Book Rating : 4.3/5 (24 download)

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Book Synopsis Surface and Thin Film Analysis by : Gernot Friedbacher

Download or read book Surface and Thin Film Analysis written by Gernot Friedbacher and published by Wiley-VCH. This book was released on 2011-06-07 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: Surveying and comparing all techniques relevant for practical applications in surface and thin film analysis, this second edition of a bestseller is a vital guide to this hot topic in nano- and surface technology. This new book has been revised and updated and is divided into four parts - electron, ion, and photon detection, as well as scanning probe microscopy. New chapters have been added to cover such techniques as SNOM, FIM, atom probe (AP),and sum frequency generation (SFG). Appendices with a summary and comparison of techniques and a list of equipment suppliers make this book a rapid reference for materials scientists, analytical chemists, and those working in the biotechnological industry. From a Review of the First Edition (edited by Bubert and Jenett) "... a useful resource..." (Journal of the American Chemical Society)

Nondestructive Characterization of Materials IV

Author : J.F. Bussière
Publisher : Springer Science & Business Media
ISBN 13 : 9780306440472
Total Pages : 536 pages
Book Rating : 4.4/5 (44 download)

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Book Synopsis Nondestructive Characterization of Materials IV by : J.F. Bussière

Download or read book Nondestructive Characterization of Materials IV written by J.F. Bussière and published by Springer Science & Business Media. This book was released on 1992-02-29 with total page 536 pages. Available in PDF, EPUB and Kindle. Book excerpt: There is a great deal of interest in extending nondestructive technologies beyond the location and identification of cracks and voids. Specifically there is growing interest in the application of nondestructive evaluation (NOEl to the measurement of physical and mechanical properties of materials. The measurement of materials properties is often referred to as materials characterization; thus nondestructive techniques applied to characterization become nondestructive characterization (NDCl. There are a number of meetings, proceedings and journals focused upon nondestructive technologies and the detection and identification of cracks and voids. However, the series of symposia, of which these proceedings represent the fourth, are the only meetings uniquely focused upon nondestructive characterization. Moreover, these symposia are especially concerned with stimulating communication between the materials, mechanical and manufacturing engineer and the NDE technology oriented engineer and scientist. These symposia recognize that it is the welding of these areas of expertise that is necessary for practical development and application of NDC technology to measurements of components for in service life time and sensor technology for intelligent processing of materials. These proceedings are from the fourth international symposia and are edited by c.o. Ruud, J. F. Bussiere and R.E. Green, Jr. . The dates, places, etc of the symposia held to date area as follows: Symposia on Nondestructive Methods for TITLE: Material Property Determination DATES: April 6-8, 1983 PLACE: Hershey, PA, USA CHAIRPERSONS: C.O. Ruud and R.E. Green, Jr.

Fundamentals of Solid State Engineering

Author : Manijeh Razeghi
Publisher : Springer Science & Business Media
ISBN 13 : 0387287515
Total Pages : 894 pages
Book Rating : 4.3/5 (872 download)

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Book Synopsis Fundamentals of Solid State Engineering by : Manijeh Razeghi

Download or read book Fundamentals of Solid State Engineering written by Manijeh Razeghi and published by Springer Science & Business Media. This book was released on 2006-06-12 with total page 894 pages. Available in PDF, EPUB and Kindle. Book excerpt: Provides a multidisciplinary introduction to quantum mechanics, solid state physics, advanced devices, and fabrication Covers wide range of topics in the same style and in the same notation Most up to date developments in semiconductor physics and nano-engineering Mathematical derivations are carried through in detail with emphasis on clarity Timely application areas such as biophotonics , bioelectronics

Ohmic Contacts to Semiconductors

Author : Electrochemical Society
Publisher :
ISBN 13 :
Total Pages : 372 pages
Book Rating : 4.F/5 ( download)

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Book Synopsis Ohmic Contacts to Semiconductors by : Electrochemical Society

Download or read book Ohmic Contacts to Semiconductors written by Electrochemical Society and published by . This book was released on 1969 with total page 372 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Phosphor Handbook

Author : Shigeo Shionoya
Publisher : CRC Press
ISBN 13 : 1420005235
Total Pages : 1078 pages
Book Rating : 4.4/5 (2 download)

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Book Synopsis Phosphor Handbook by : Shigeo Shionoya

Download or read book Phosphor Handbook written by Shigeo Shionoya and published by CRC Press. This book was released on 2018-10-03 with total page 1078 pages. Available in PDF, EPUB and Kindle. Book excerpt: A benchmark publication, the first edition of the Phosphor Handbook set the standard for references in this field. Completely revised and updated, this second edition explores new and emerging fields such as nanophosphors, nanomaterials, UV phosphors, quantum cutters, plasma display phosphors, sol-gel and other wet phosphor preparation techniques, preparation through combustion, bioluminescence phosphors and devices, and new laser materials such as OLED. It also contains new chapters on the applications of phosphors in solid state lighting, photoionization of luminescent centers in insulating phosphors, and recent developments in halide-based scintillators. The handbook provides a comprehensive description of phosphors with an emphasis on practical phosphors and their uses in various kinds of technological applications. It covers the fundamentals, namely the basic principles of luminescence, the principle phosphor materials, and their optical properties. The authors describe phosphors used in lamps, cathode-ray tubes, x-ray, and ionizing radiation detection. They cover common measurement methodology used to characterize phosphor properties, discuss a number of related items, and conclude with the history of phosphor technology and industry.

Properties of Gallium Arsenide

Author : M. R. Brozel
Publisher : Inst of Engineering & Technology
ISBN 13 : 9780852968857
Total Pages : 981 pages
Book Rating : 4.9/5 (688 download)

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Book Synopsis Properties of Gallium Arsenide by : M. R. Brozel

Download or read book Properties of Gallium Arsenide written by M. R. Brozel and published by Inst of Engineering & Technology. This book was released on 1996 with total page 981 pages. Available in PDF, EPUB and Kindle. Book excerpt: It was in 1986 that INSPEC (The Information Division of the Institution of Electrical Engineers) published the book Properties of Gallium Arsenide. Since then, major developments have taken place. This third edition is comprised of 150 specially commissioned articles contributed by experts from the USA, Europe and Japan.

Wafer Bonding

Author : Marin Alexe
Publisher : Springer Science & Business Media
ISBN 13 : 9783540210498
Total Pages : 524 pages
Book Rating : 4.2/5 (14 download)

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Book Synopsis Wafer Bonding by : Marin Alexe

Download or read book Wafer Bonding written by Marin Alexe and published by Springer Science & Business Media. This book was released on 2004-05-14 with total page 524 pages. Available in PDF, EPUB and Kindle. Book excerpt: During the past decade direct wafer bonding has developed into a mature materials integration technology. This book presents state-of-the-art reviews of the most important applications of wafer bonding written by experts from industry and academia. The topics include bonding-based fabrication methods of silicon-on-insulator, photonic crystals, VCSELs, SiGe-based FETs, MEMS together with hybrid integration and laser lift-off. The non-specialist will learn about the basics of wafer bonding and its various application areas, while the researcher in the field will find up-to-date information about this fast-moving area, including relevant patent information.

X-Ray and Neutron Dynamical Diffraction

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Author : André Authier
Publisher : Springer Science & Business Media
ISBN 13 : 1461558794
Total Pages : 419 pages
Book Rating : 4.4/5 (615 download)

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Book Synopsis X-Ray and Neutron Dynamical Diffraction by : André Authier

Download or read book X-Ray and Neutron Dynamical Diffraction written by André Authier and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 419 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume collects the proceedings of the 23rd International Course of Crystallography, entitled "X-ray and Neutron Dynamical Diffraction, Theory and Applications," which took place in the fascinating setting of Erice in Sicily, Italy. It was run as a NATO Advanced Studies Institute with A. Authier (France) and S. Lagomarsino (Italy) as codirectors, and L. Riva di Sanseverino and P. Spadon (Italy) as local organizers, R. Colella (USA) and B. K. Tanner (UK) being the two other members of the organizing committee. It was attended by about one hundred participants from twenty four different countries. Two basic theories may be used to describe the diffraction of radiation by crystalline matter. The first one, the so-called geometrical, or kinematical theory, is approximate and is applicable to small, highly imperfect crystals. It is used for the determination of crystal structures and describes the diffraction of powders and polycrystalline materials. The other one, the so-called dynamical theory, is applicable to perfect or nearly perfect crystals. For that reason, dynamical diffraction of X-rays and neutrons constitutes the theoretical basis of a great variety of applications such as: • the techniques used for the characterization of nearly perfect high technology materials, semiconductors, piezoelectric, electrooptic, ferroelectric, magnetic crystals, • the X-ray optical devices used in all modem applications of Synchrotron Radiation (EXAFS, High Resolution X-ray Diffractometry, magnetic and nuclear resonant scattering, topography, etc. ), and • X-ray and neutron interferometry.

Self-Assembled Quantum Dots

Author : Zhiming M Wang
Publisher : Springer Science & Business Media
ISBN 13 : 0387741917
Total Pages : 470 pages
Book Rating : 4.3/5 (877 download)

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Book Synopsis Self-Assembled Quantum Dots by : Zhiming M Wang

Download or read book Self-Assembled Quantum Dots written by Zhiming M Wang and published by Springer Science & Business Media. This book was released on 2007-11-29 with total page 470 pages. Available in PDF, EPUB and Kindle. Book excerpt: This multidisciplinary book provides up-to-date coverage of carrier and spin dynamics and energy transfer and structural interaction among nanostructures. Coverage also includes current device applications such as quantum dot lasers and detectors, as well as future applications to quantum information processing. The book will serve as a reference for anyone working with or planning to work with quantum dots.

Microwave Devices, Circuits and Subsystems for Communications Engineering

Author : Ian A. Glover
Publisher : John Wiley & Sons
ISBN 13 : 0470012749
Total Pages : 550 pages
Book Rating : 4.4/5 (7 download)

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Book Synopsis Microwave Devices, Circuits and Subsystems for Communications Engineering by : Ian A. Glover

Download or read book Microwave Devices, Circuits and Subsystems for Communications Engineering written by Ian A. Glover and published by John Wiley & Sons. This book was released on 2006-05-01 with total page 550 pages. Available in PDF, EPUB and Kindle. Book excerpt: Microwave Devices, Circuits and Subsystems for Communications Engineering provides a detailed treatment of the common microwave elements found in modern microwave communications systems. The treatment is thorough without being unnecessarily mathematical. The emphasis is on acquiring a conceptual understanding of the techniques and technologies discussed and the practical design criteria required to apply these in real engineering situations. Key topics addressed include: Microwave diode and transistor equivalent circuits Microwave transmission line technologies and microstrip design Network methods and s-parameter measurements Smith chart and related design techniques Broadband and low-noise amplifier design Mixer theory and design Microwave filter design Oscillators, synthesisers and phase locked loops Each chapter is written by specialists in their field and the whole is edited by experience authors whose expertise spans the fields of communications systems engineering and microwave circuit design. Microwave Devices, Circuits and Subsystems for Communications Engineering is suitable for senior electrical, electronic or telecommunications engineering undergraduate students, first year postgraduate students and experienced engineers seeking a conversion or refresher text. Includes a companion website featuring: Solutions to selected problems Electronic versions of the figures Sample chapter

Frontiers in Materials Modelling and Design

Author : Vijay Kumar
Publisher : Springer Science & Business Media
ISBN 13 : 3642804780
Total Pages : 448 pages
Book Rating : 4.6/5 (428 download)

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Book Synopsis Frontiers in Materials Modelling and Design by : Vijay Kumar

Download or read book Frontiers in Materials Modelling and Design written by Vijay Kumar and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 448 pages. Available in PDF, EPUB and Kindle. Book excerpt: It is about fifteen years since we started hearing about Computational Ma terials Science and Materials Modelling and Design. Fifteen years is a long time and all of us realise that the use of computational methods in the design of materials has not been rapid enough. We also know the reasons for this. Mate rials properties are not dependent on a single phenomenon. The properties of materials cover a wide range from electronic, thermal, mechanical to chemical and electro-chemical. Each of these class of properties depend on specific phe nomenon that takes place at different scales or levels of length from sub atomic to visible length levels. The energies controlling the phenomena also varies widely from a fraction of an electron volt to many joules. The complexity of materials are such that while models and methods for treating individual phenomenon have been perfected, incorporating them into a single programme taking into account the synergism is a formidable task. Two specific areas where the progress has been very rapid and substantive are prediction of phase stability and phase diagrams and embrittlement of steels by metalloids. The first three sections of the book contain papers which review the theoreti cal principles underlying materials modeling and simulations and show how they can be applied to the problems just mentioned. There is now a strong interest in designing new materials starting from nanoparticles and clusters.

Thin-Film Deposition: Principles and Practice

Author : Donald L. Smith
Publisher : McGraw Hill Professional
ISBN 13 : 9780070585027
Total Pages : 648 pages
Book Rating : 4.5/5 (85 download)

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Book Synopsis Thin-Film Deposition: Principles and Practice by : Donald L. Smith

Download or read book Thin-Film Deposition: Principles and Practice written by Donald L. Smith and published by McGraw Hill Professional. This book was released on 1995-03-22 with total page 648 pages. Available in PDF, EPUB and Kindle. Book excerpt: Publisher's Note: Products purchased from Third Party sellers are not guaranteed by the publisher for quality, authenticity, or access to any online entitlements included with the product.

Introduction to Solid State Physics

Author : Charles Kittel
Publisher : Wiley
ISBN 13 : 9780471415268
Total Pages : 704 pages
Book Rating : 4.4/5 (152 download)

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Book Synopsis Introduction to Solid State Physics by : Charles Kittel

Download or read book Introduction to Solid State Physics written by Charles Kittel and published by Wiley. This book was released on 2004-11-11 with total page 704 pages. Available in PDF, EPUB and Kindle. Book excerpt: Since the publication of the first edition over 50 years ago, Introduction to Solid State Physics has been the standard solid state physics text for physics students. The author's goal from the beginning has been to write a book that is accessible to undergraduates and consistently teachable. The emphasis in the book has always been on physics rather than formal mathematics. With each new edition, the author has attempted to add important new developments in the field without sacrificing the book's accessibility and teachability. * A very important chapter on nanophysics has been written by an active worker in the field. This field is the liveliest addition to solid state science during the past ten years * The text uses the simplifications made possible by the wide availability of computer technology. Searches using keywords on a search engine (such as Google) easily generate many fresh and useful references

Spectroscopy of Complex Oxide Interfaces

Author : Claudia Cancellieri
Publisher : Springer
ISBN 13 : 3319749897
Total Pages : 326 pages
Book Rating : 4.3/5 (197 download)

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Book Synopsis Spectroscopy of Complex Oxide Interfaces by : Claudia Cancellieri

Download or read book Spectroscopy of Complex Oxide Interfaces written by Claudia Cancellieri and published by Springer. This book was released on 2018-04-09 with total page 326 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book summarizes the most recent and compelling experimental results for complex oxide interfaces. The results of this book were obtained with the cutting-edge photoemission technique at highest energy resolution. Due to their fascinating properties for new-generation electronic devices and the challenge of investigating buried regions, the book chiefly focuses on complex oxide interfaces. The crucial feature of exploring buried interfaces is the use of soft X-ray angle-resolved photoemission spectroscopy (ARPES) operating on the energy range of a few hundred eV to increase the photoelectron mean free path, enabling the photons to penetrate through the top layers – in contrast to conventional ultraviolet (UV)-ARPES techniques. The results presented here, achieved by different research groups around the world, are summarized in a clearly structured way and discussed in comparison with other photoemission spectroscopy techniques and other oxide materials. They are complemented and supported by the most recent theoretical calculations as well as results of complementary experimental techniques including electron transport and inelastic resonant X-ray scattering.