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Author : Martin Kittler
Publisher : Scitec Publications
ISBN 13 :
Total Pages : 634 pages
Book Rating : 4.:/5 (36 download)
Download or read book Gettering and Defect Engineering in Semiconductor Technology '89 written by Martin Kittler and published by Scitec Publications. This book was released on 1989 with total page 634 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author :
Publisher :
ISBN 13 :
Total Pages : 844 pages
Book Rating : 4.3/5 (91 download)
Download or read book Gettering and Defect Engineering in Semiconductor Technology ... written by and published by . This book was released on 2005 with total page 844 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : H. Richter
Publisher :
ISBN 13 :
Total Pages : 718 pages
Book Rating : 4.3/5 (91 download)
Download or read book Gettering and Defect Engineering in Semiconductor Technology written by H. Richter and published by . This book was released on 2004 with total page 718 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Sergio Pizzini
Publisher : Scitec Publications
ISBN 13 :
Total Pages : 440 pages
Book Rating : 4.3/5 (91 download)
Download or read book Defect Interaction and Clustering in Semiconductors written by Sergio Pizzini and published by Scitec Publications. This book was released on 2002 with total page 440 pages. Available in PDF, EPUB and Kindle. Book excerpt: Modern semiconductor devices rely upon precise defect engineering. On the one hand: defects are the components needed to generate the electronic architecture of the device. On the other hand: they may - if not carefully controlled- induce failure of that device. During the past fifty years, the electrical and optical properties of defects, their generation, transport, clustering and reactions between them have been investigated intensively. Yet the development of semiconductor technology remains closely connected to the advances made in defect science and engineering. Compared to metals, defect control in silicon is significantly complicated by the open structure of its lattice. As a result, reactions between defects, even at room temperature, have become a central issue in defect engineering.
Author : M. Kittler
Publisher : Trans Tech Publications Ltd
ISBN 13 : 3035706441
Total Pages : 618 pages
Book Rating : 4.0/5 (357 download)
Download or read book Gettering and Defect Engineering in Semiconductor Technology III written by M. Kittler and published by Trans Tech Publications Ltd. This book was released on 1989-01-01 with total page 618 pages. Available in PDF, EPUB and Kindle. Book excerpt: Proceedings of the 3rd International Conference on Gettering and Defect Engineering in Semiconductor Technology (GADEST '89) held at Garzau, GDR, October 1989
Author : Victor A. Perevostchikov
Publisher : Springer Science & Business Media
ISBN 13 : 9783540262442
Total Pages : 412 pages
Book Rating : 4.2/5 (624 download)
Download or read book Gettering Defects in Semiconductors written by Victor A. Perevostchikov and published by Springer Science & Business Media. This book was released on 2005-09-15 with total page 412 pages. Available in PDF, EPUB and Kindle. Book excerpt: Gettering Defects in Semiconductors fulfills three basic purposes: – to systematize the experience and research in exploiting various gettering techniques in microelectronics and nanoelectronics; – to identify new directions in research, particularly to enhance the perspective of professionals and young researchers and specialists; – to fill a gap in the contemporary literature on the underlying semiconductor-material theory. The authors address not only well-established gettering techniques but also describe contemporary trends in gettering technologies from an international perspective. The types and properties of structural defects in semiconductors, their generating and their transforming mechanisms during fabrication are described. The primary emphasis is placed on classifying and describing specific gettering techniques, their specificity arising from both their position in a general technological process and the regimes of their application. This book addresses both engineers and material scientists interested in semiconducting materials theory and also undergraduate and graduate students in solid–state microelectronics and nanoelectronics. A comprehensive list of references provides readers with direction for further reading.
Author : M. Suezawa
Publisher : Trans Tech Publications
ISBN 13 :
Total Pages : 608 pages
Book Rating : 4.X/5 (2 download)
Download or read book Defects in Semiconductors Icds-18 written by M. Suezawa and published by Trans Tech Publications. This book was released on 1996 with total page 608 pages. Available in PDF, EPUB and Kindle. Book excerpt: The study of defects in semiconductors has never been independent of the progress in semiconductor technology. With rapid development in semiconductor device technology, novel types of defects as well as very peculiar behavior of defects in semiconductors have been found one after another. New subjects in the basic study of defects have often been arisen from experiences in the practical field. Great progress has also been achieved in device production technology on the basis of the knowledge clarified in the basic field.
Author :
Publisher :
ISBN 13 :
Total Pages : 838 pages
Book Rating : 4.F/5 ( download)
Download or read book Future Energy Conferences and Symposia written by and published by . This book was released on 1989 with total page 838 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : S. Ashok
Publisher :
ISBN 13 :
Total Pages : 1176 pages
Book Rating : 4.3/5 (91 download)
Download or read book Defect Engineering in Semiconductor Growth, Processing, and Device Technology written by S. Ashok and published by . This book was released on 1992 with total page 1176 pages. Available in PDF, EPUB and Kindle. Book excerpt: Proceedings of the San Francisco meeting of April-May 1992. Papers emphasize deliberate and controlled introduction and manipulation of defects in order to engineer some desired properties in semiconductor materials and devices. Topics include: defects in bulk crystals, and in thin films; defect characterization; hydrogen interaction; processing induction of defects; quantum wells; ion implantation. Annotation copyright by Book News, Inc., Portland, OR
Author : Peter Pichler
Publisher : Springer Science & Business Media
ISBN 13 : 3709105978
Total Pages : 576 pages
Book Rating : 4.7/5 (91 download)
Download or read book Intrinsic Point Defects, Impurities, and Their Diffusion in Silicon written by Peter Pichler and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 576 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book contains the first comprehensive review of intrinsic point defects, impurities and their complexes in silicon. Besides compiling the structures, energetic properties, identified electrical levels and spectroscopic signatures, and the diffusion behaviour from investigations, it gives a comprehensive introduction into the relevant fundamental concepts.
Author :
Publisher :
ISBN 13 :
Total Pages : 1264 pages
Book Rating : 4.E/5 ( download)
Download or read book Diffusion and Defect Data written by and published by . This book was released on 2004 with total page 1264 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Manoj Sachdev
Publisher : Springer Science & Business Media
ISBN 13 : 0387465472
Total Pages : 343 pages
Book Rating : 4.3/5 (874 download)
Download or read book Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits written by Manoj Sachdev and published by Springer Science & Business Media. This book was released on 2007-06-04 with total page 343 pages. Available in PDF, EPUB and Kindle. Book excerpt: The 2nd edition of defect oriented testing has been extensively updated. New chapters on Functional, Parametric Defect Models and Inductive fault Analysis and Yield Engineering have been added to provide a link between defect sources and yield. The chapter on RAM testing has been updated with focus on parametric and SRAM stability testing. Similarly, newer material has been incorporated in digital fault modeling and analog testing chapters. The strength of Defect Oriented Testing for nano-Metric CMOS VLSIs lies in its industrial relevance.
Author :
Publisher :
ISBN 13 :
Total Pages : 318 pages
Book Rating : 4.:/5 (3 download)
Download or read book Scientific and Technical Aerospace Reports written by and published by . This book was released on 1993 with total page 318 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author :
Publisher :
ISBN 13 :
Total Pages : 1144 pages
Book Rating : 4.:/5 (44 download)
Download or read book Semiconductor Silicon written by and published by . This book was released on 1986 with total page 1144 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : U. Gösele
Publisher : The Electrochemical Society
ISBN 13 : 9781566771894
Total Pages : 636 pages
Book Rating : 4.7/5 (718 download)
Download or read book Proceedings of the Fourth International Symposium on Semiconductor Wafer Bonding written by U. Gösele and published by The Electrochemical Society. This book was released on 1998 with total page 636 pages. Available in PDF, EPUB and Kindle. Book excerpt:
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Publisher :
ISBN 13 :
Total Pages : 724 pages
Book Rating : 4.3/5 (91 download)
Download or read book High Purity Silicon written by and published by . This book was released on 2000 with total page 724 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Electrochemical Society. Meeting
Publisher : The Electrochemical Society
ISBN 13 : 9781566772846
Total Pages : 720 pages
Book Rating : 4.7/5 (728 download)
Download or read book High Purity Silicon VI written by Electrochemical Society. Meeting and published by The Electrochemical Society. This book was released on 2000 with total page 720 pages. Available in PDF, EPUB and Kindle. Book excerpt: "... papers that were presented at the Sixth Symposium on High Purity Silicon held in Phoenix, Arizona at the 198th Meeting of the Electrochemical Society, October 22-27, 2000."--Preface.
