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Flat Panel Display Materials Ii Volume 424
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Book Synopsis Flat Panel Display Materials II: Volume 424 by : Miltiadis K. Hatalis
Download or read book Flat Panel Display Materials II: Volume 424 written by Miltiadis K. Hatalis and published by . This book was released on 1997-02-12 with total page 544 pages. Available in PDF, EPUB and Kindle. Book excerpt: The proceedings of a symposium held April 1996, in San Francisco, California. The field is experiencing a rapid growth which currently is expanding from portable computer applications to include display applications for desktop computers and a wide array of consumer and industrial products. Seventy-six contributions are divided into six sections covering amorphous silicon thin-film transistor materials, polycrystalline silicon thin-film transistor materials, liquid crystal display materials, transparent conducting oxides, field emission display materials, and other emissive display materials. Annotation copyrighted by Book News, Inc., Portland, OR
Download or read book Flat Panel Display Materials written by and published by . This book was released on 1998 with total page 372 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Low-Dielectric Constant Materials II: Volume 443 by : André Lagendijk
Download or read book Low-Dielectric Constant Materials II: Volume 443 written by André Lagendijk and published by . This book was released on 1997-08-19 with total page 224 pages. Available in PDF, EPUB and Kindle. Book excerpt: Low-dielectric constant materials are needed to improve the performance and speed of future integrated circuits. In fact, the diversity of contributors to this book is testimony to the global significance of the topic to the future of semiconductor manufacturing. Presentations include those by semiconductor equipment manufacturers and chemical source suppliers, academia from six countries, four government laboratories and five major device manufacturers. Approaches to designing and implementing reduction in dielectric constant for intermetal dielectric materials are featured and range from the evolution of silicon dioxide to fluorinated silicate glass, to the use of inorganic/organic polymers and spin-on-material, to fluorinated diamond-like carbon and nanoporous silica. The book also addresses the practical aspects of the use of low-dielectric constant materials such as chemical mechanical polishing of these materials and optimization of wiring delays in devices utilizing low-k material.
Book Synopsis Defects in Electronic Materials II: Volume 442 by : Jürgen Michel
Download or read book Defects in Electronic Materials II: Volume 442 written by Jürgen Michel and published by . This book was released on 1997-05-02 with total page 744 pages. Available in PDF, EPUB and Kindle. Book excerpt: The pervasive role of defects in determining the thermal, mechanical, electrical, optical and magnetic properties of materials is significant as is the knowledge and operation of generation and control of defects in electronic materials. Developing novel semiconductor materials, however, requires new insights into the role of defects to achieve new properties. New experimental techniques must be developed to study defects in small structures. Research groups come together in this book from MRS to provide a vivid picture of the current problems, progress and methods in defect studies in electronic materials. Topics include new techniques in defect studies; processing induced defects, plasma-induced point defects; processing induced defects -defects and gate-oxide integrity; point defects and reaction; point defects and interactions in Si; impurity diffusion and hydrogen in Si; dislocations in group IV semiconductors; point defects and defect interactions in SiGe; point defects in III-V compounds; compensation and structural defects in III-V compounds and layers and structures.
Book Synopsis Rapid Thermal and Integrated Processing by :
Download or read book Rapid Thermal and Integrated Processing written by and published by . This book was released on 1998 with total page 914 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book Silicon written by Paul Siffert and published by Springer Science & Business Media. This book was released on 2013-03-09 with total page 552 pages. Available in PDF, EPUB and Kindle. Book excerpt: With topics ranging from epitaxy through lattice defects and doping to quantum computation, this book provides a personalized survey of the development and use of silicon, the basis for the revolutionary changes in our lives sometimes called "The Silicon Age." Beginning with the very first developments more than 50 years ago, this reports on all aspects of silicon and silicon technology up to its use in exciting new technologies, including a glance at possible future developments.
Book Synopsis Thermoelastic Generation of Ultrasound for High Frequency Phased Arrays by : Takashi Buma
Download or read book Thermoelastic Generation of Ultrasound for High Frequency Phased Arrays written by Takashi Buma and published by . This book was released on 2002 with total page 346 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Electron-Emissive Materials, Vacuum Microelectronics and Flat-Panel Displays: Volume 621 by : Kevin L. Jensen
Download or read book Electron-Emissive Materials, Vacuum Microelectronics and Flat-Panel Displays: Volume 621 written by Kevin L. Jensen and published by . This book was released on 2001-04-16 with total page 584 pages. Available in PDF, EPUB and Kindle. Book excerpt: The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
Book Synopsis Interfacial Engineering for Optimized Properties: Volume 458 by : Clyde L. Briant
Download or read book Interfacial Engineering for Optimized Properties: Volume 458 written by Clyde L. Briant and published by . This book was released on 1997-07-08 with total page 546 pages. Available in PDF, EPUB and Kindle. Book excerpt: The study of interfaces is one of the oldest areas of research in materials science. The presence of grain boundaries in materials has long been recognized, as has its crucial role in determining mechanical properties. Another long-recognized concept is that the properties of a surface are quite different from those of the bulk. In recent years, researchers have been able to study these interfaces, both internal and external, with a detail not before possible. These advances have stemmed from the ability to obtain atomic resolution images of interfaces, to measure accurate chemical compositions of interfaces, and to model these interfaces and their properties. This volume goes a step further, beyond structural and chemical studies, to explore how all of this information can be used to engineer interfaces for improved properties and overall improved material performance. Significant attention is given to the crystallographic nature of grain boundaries and interfaces, and the relationship between this nature and the performance of a material. The versatility of electron back-scattering pattern analysis (EBSP) in solving a number of interface-related problems is also featured.
Book Synopsis Low-dielectric Constant Materials by :
Download or read book Low-dielectric Constant Materials written by and published by . This book was released on 1998 with total page 408 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Luminescence and Display Phosphors by : Arunachalam Lakshmanan
Download or read book Luminescence and Display Phosphors written by Arunachalam Lakshmanan and published by Nova Publishers. This book was released on 2008 with total page 326 pages. Available in PDF, EPUB and Kindle. Book excerpt: This new book highlights the link between the luminescence phenomena of phosphors used in different displays. Both fluorescence (used in display phosphors) and phosphorescence (used in after glow phosphors and storage phosphors) mechanisms and the efforts made in phosphor synthesis to reduce the interference of one on another are dealt with in detail.
Book Synopsis Scientific Basis for Nuclear Waste Management XX: Volume 465 by : Walter J. Gray
Download or read book Scientific Basis for Nuclear Waste Management XX: Volume 465 written by Walter J. Gray and published by . This book was released on 1997-07 with total page 1398 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book features scientific research that supports the safe and effective disposal of radioactive waste in a geological repository. One highlight of the volume is the opening talk by Rustum Roy, who was instrumental in establishing the first symposium on this topic in 1978. Professor Roy summarizes his views of the past 19 years of progress in the field. A second highlight is the participation by several Russian and Ukrainian scientists who authored papers on nuclear waste disposal aspects of the Chernobyl Unit 4 reactor that exploded in April 1986. Additional topics include: glass formulations and properties; glass/water interactions; cements in radioactive waste management; ceramic and crystalline waste forms; spent nuclear fuel; waste processing and treatment; radiation effects in ceramics, glasses and nuclear waste materials; waste package materials; radionuclide solubility and speciation; radionuclide sorption; radionuclide transport; repository backfill; performance assessment; natural analogues and excess plutonium dispositioning.
Download or read book Forthcoming Books written by Rose Arny and published by . This book was released on 1996-10 with total page 1592 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Rare-Earth Doped Semiconductors II: Volume 422 by : S. Coffa
Download or read book Rare-Earth Doped Semiconductors II: Volume 422 written by S. Coffa and published by . This book was released on 1996 with total page 392 pages. Available in PDF, EPUB and Kindle. Book excerpt: Rare-earth doped semiconductors hold great potential for a variety of optoelectronic applications, including lasers, LEDs and optical amplifiers. In fact, the field has grown rapidly over the past several years, with a clear switch in direction. The first book by this name was devoted to rare-earth doped II-VI and III-V semiconductors; more than half of the papers in this new volume are devoted to rare-earth doped silicon. This indicates that rare-earth doping of silicon is now seriously considered as a means to achieve silicon-based optoelectronic devices. In addition, new reports on rare-earth doped III-nitrides are also presented. Researchers from 14 countries come together in the volume to discuss current trends, highlight new developments and identify potential electronic and optoelectronic applications. Topics include: incorporation methods and properties; structural, electrical and optical properties; excitation mechanisms and electroluminescence and integration.
Book Synopsis Materials Reliability in Microelectronics by :
Download or read book Materials Reliability in Microelectronics written by and published by . This book was released on 1999 with total page 392 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Materials Reliability in Microelectronics VI: Volume 428 by : William F. Filter
Download or read book Materials Reliability in Microelectronics VI: Volume 428 written by William F. Filter and published by . This book was released on 1996-11-18 with total page 616 pages. Available in PDF, EPUB and Kindle. Book excerpt: MRS books on materials reliability in microelectronics have become the snapshot of progress in this field. Reduced feature size, increased speed, and larger area are all factors contributing to the continual performance and functionality improvements in integrated circuit technology. These same factors place demands on the reliability of the individual components that make up the IC. Achieving increased reliability requires an improved understanding of both thin-film and patterned-feature materials properties and their degradation mechanisms, how materials and processes used to fabricate ICs interact, and how they may be tailored to enable reliability improvements. This book focuses on the physics and materials science of microelectronics reliability problems rather than the traditional statistical, accelerated electrical testing aspects. Studies are grouped into three large sections covering electromigration, gate oxide reliability and mechanical stress behavior. Topics include: historical summary; reliability issues for Cu metallization; characterization of electromigration phenomena; modelling; microstructural evolution and influences; oxide and device reliability; thin oxynitride dielectrics; noncontact diagnostics; stress effects in thin films and interconnects and microbeam X-ray techniques for stress measurements.
Book Synopsis High-temperature Ordered Intermetallic Alloys by :
Download or read book High-temperature Ordered Intermetallic Alloys written by and published by . This book was released on 1999 with total page 882 pages. Available in PDF, EPUB and Kindle. Book excerpt:
