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Fault Detection In Digital Circuits
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Book Synopsis Digital Circuit Testing and Testability by : Parag K. Lala
Download or read book Digital Circuit Testing and Testability written by Parag K. Lala and published by Academic Press. This book was released on 1997 with total page 222 pages. Available in PDF, EPUB and Kindle. Book excerpt: An easy to use introduction to the practices and techniques in the field of digital circuit testing. Lala writes in a user-friendly and tutorial style, making the book easy to read, even for the newcomer to fault-tolerant system design. Each informative chapter is self-contained, with little or no previous knowledge of a topic assumed. Extensive references follow each chapter.
Book Synopsis Fault Detection in Digital Circuits by : Arthur D. Friedman
Download or read book Fault Detection in Digital Circuits written by Arthur D. Friedman and published by Prentice Hall. This book was released on 1971 with total page 252 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis An Introduction to Logic Circuit Testing by : Parag K. Lala
Download or read book An Introduction to Logic Circuit Testing written by Parag K. Lala and published by Morgan & Claypool Publishers. This book was released on 2009 with total page 111 pages. Available in PDF, EPUB and Kindle. Book excerpt: An Introduction to Logic Circuit Testing provides a detailed coverage of techniques for test generation and testable design of digital electronic circuits/systems. The material covered in the book should be sufficient for a course, or part of a course, in digital circuit testing for senior-level undergraduate and first-year graduate students in Electrical Engineering and Computer Science. The book will also be a valuable resource for engineers working in the industry. This book has four chapters. Chapter 1 deals with various types of faults that may occur in very large scale integration (VLSI)-based digital circuits. Chapter 2 introduces the major concepts of all test generation techniques such as redundancy, fault coverage, sensitization, and backtracking. Chapter 3 introduces the key concepts of testability, followed by some ad hoc design-for-testability rules that can be used to enhance testability of combinational circuits. Chapter 4 deals with test generation and response evaluation techniques used in BIST (built-in self-test) schemes for VLSI chips. Table of Contents: Introduction / Fault Detection in Logic Circuits / Design for Testability / Built-in Self-Test / References
Book Synopsis DIGITAL ELECTRONICS AND LOGIC DESIGN by : B. SOMANATHAN NAIR
Download or read book DIGITAL ELECTRONICS AND LOGIC DESIGN written by B. SOMANATHAN NAIR and published by PHI Learning Pvt. Ltd.. This book was released on 2002-01-01 with total page 452 pages. Available in PDF, EPUB and Kindle. Book excerpt: Designed as a textbook for undergraduate students in Electrical Engineering, Electronics, Computer Science, and Information Technology, this up-to-date, well-organized study gives an exhaustive treatment of the basic principles of Digital Electronics and Logic Design. It aims at bridging the gap between these two subjects. The many years of teaching undergraduate and postgraduate students of engineering that Professor Somanathan Nair has done is reflected in the in-depth analysis and student-friendly approach of this book. Concepts are illustrated with the help of a large number of diagrams so that students can comprehend the subject with ease. Worked-out examples within the text illustrate the concepts discussed, and questions at the end of each chapter drill the students in self-study.
Book Synopsis Fault Diagnosis of Digital Circuits by : V. N. Yarmolik
Download or read book Fault Diagnosis of Digital Circuits written by V. N. Yarmolik and published by John Wiley & Sons. This book was released on 1990 with total page 216 pages. Available in PDF, EPUB and Kindle. Book excerpt: The continual explosion of computer development has led to inadequate coverage of proper & useful on-line testing techniques. This text fills the gap in the literature by presenting the latest techniques available for digital devices used in the most popular computers. Initial chapters explore the classic problems of on-line testing, pointing out the limited applications of conventional approaches to the problem of diagnosing digital devices using LSI & VLSI chips. Chapters 4-7 cover compact testing methods used to diagnose complex digital circuits. Chapters 8 & 9 analyze the techniques of compressing output responses of a digital circuit, while chapter 10 surveys promising recent signature generation techniques for binary sequences. The final chapter covers multi-output digital circuits.
Book Synopsis Random Testing of Digital Circuits by : Rene David
Download or read book Random Testing of Digital Circuits written by Rene David and published by CRC Press. This book was released on 2020-11-26 with total page 508 pages. Available in PDF, EPUB and Kindle. Book excerpt: "Introduces a theory of random testing in digital circuits for the first time and offers practical guidance for the implementation of random pattern generators, signature analyzers design for random testability, and testing results. Contains several new and unpublished results. "
Book Synopsis Electronic Testing and Fault Diagnosis by : George Loveday
Download or read book Electronic Testing and Fault Diagnosis written by George Loveday and published by . This book was released on 1989 with total page 282 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Digital Circuit Testing by : Francis C. Wong
Download or read book Digital Circuit Testing written by Francis C. Wong and published by Elsevier. This book was released on 2012-12-02 with total page 248 pages. Available in PDF, EPUB and Kindle. Book excerpt: Recent technological advances have created a testing crisis in the electronics industry--smaller, more highly integrated electronic circuits and new packaging techniques make it increasingly difficult to physically access test nodes. New testing methods are needed for the next generation of electronic equipment and a great deal of emphasis is being placed on the development of these methods. Some of the techniques now becoming popular include design for testability (DFT), built-in self-test (BIST), and automatic test vector generation (ATVG). This book will provide a practical introduction to these and other testing techniques. For each technique introduced, the author provides real-world examples so the reader can achieve a working knowledge of how to choose and apply these increasingly important testing methods.
Book Synopsis Signal Processing for Fault Detection and Diagnosis in Electric Machines and Systems by : Mohamed Benbouzid
Download or read book Signal Processing for Fault Detection and Diagnosis in Electric Machines and Systems written by Mohamed Benbouzid and published by IET. This book was released on 2020-12-09 with total page 283 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book contains 5 chapters that discusses the following topics: Parametric signal processing approach; The signal demodulation techniques; Kullback-Leibler divergence for incipient fault diagnosis; Higher-order spectra and Fault detection and diagnosis based on principal component analysis.
Book Synopsis Practical Digital Logic Design and Testing by : Parag K. Lala
Download or read book Practical Digital Logic Design and Testing written by Parag K. Lala and published by . This book was released on 1996 with total page 440 pages. Available in PDF, EPUB and Kindle. Book excerpt: This text presents the essentials of modern logic design. The author conveys key concepts in a clear, informal manner, demonstrating theory through numerous examples to establish a theoretical basis for practical applications. All major topics, including PLD-based digital design, are covered, and detailed coverage of digital logic circuit testing methods critical to successful chip manufacturing, are included. The industry standard PLD programming language ABEL is fully integrated where appropriate. The work also includes coverage of test generation techniques and design methods for testability, a complete discussion of PLD (Programmable Logic Device) based digital design, and coverage of state assignment and minimization explained using computer aided techniques.
Book Synopsis Testing of Digital Systems by : N. K. Jha
Download or read book Testing of Digital Systems written by N. K. Jha and published by Cambridge University Press. This book was released on 2003-05-08 with total page 1022 pages. Available in PDF, EPUB and Kindle. Book excerpt: Device testing represents the single largest manufacturing expense in the semiconductor industry, costing over $40 billion a year. The most comprehensive and wide ranging book of its kind, Testing of Digital Systems covers everything you need to know about this vitally important subject. Starting right from the basics, the authors take the reader through automatic test pattern generation, design for testability and built-in self-test of digital circuits before moving on to more advanced topics such as IDDQ testing, functional testing, delay fault testing, memory testing, and fault diagnosis. The book includes detailed treatment of the latest techniques including test generation for various fault models, discussion of testing techniques at different levels of integrated circuit hierarchy and a chapter on system-on-a-chip test synthesis. Written for students and engineers, it is both an excellent senior/graduate level textbook and a valuable reference.
Author :Prithviraj Kabisatpathy Publisher :Springer Science & Business Media ISBN 13 :0387257438 Total Pages :183 pages Book Rating :4.3/5 (872 download)
Book Synopsis Fault Diagnosis of Analog Integrated Circuits by : Prithviraj Kabisatpathy
Download or read book Fault Diagnosis of Analog Integrated Circuits written by Prithviraj Kabisatpathy and published by Springer Science & Business Media. This book was released on 2006-01-13 with total page 183 pages. Available in PDF, EPUB and Kindle. Book excerpt: Enables the reader to test an analog circuit that is implemented either in bipolar or MOS technology. Examines the testing and fault diagnosis of analog and analog part of mixed signal circuits. Covers the testing and fault diagnosis of both bipolar and Metal Oxide Semiconductor (MOS) circuits and introduces . Also contains problems that can be used as quiz or homework.
Book Synopsis Spectral Techniques and Fault Detection by : Marg Karpovsky
Download or read book Spectral Techniques and Fault Detection written by Marg Karpovsky and published by Elsevier. This book was released on 2012-12-02 with total page 619 pages. Available in PDF, EPUB and Kindle. Book excerpt: Spectral Techniques and Fault Detection focuses on the spectral techniques for the analysis, testing, and design of digital devices. This book discusses the error detection and correction in digital devices. Organized into 10 chapters, this book starts with an overview of the concepts and tools to evaluate the applicability of various spectral approaches and fault-detection techniques to the design. This text then describes the class of generalized Programmable Logic Array configurations called Encoded PLAs. Other chapters consider the two-sided Chrestenson Transform to the analysis of some pattern properties. This book describes as well a certain type of cellular arrays for highly parallel processing, namely, three-dimensional arrays. The final chapter deals with the system design methods that allow and encourage designers to incorporate the necessary distributed error correction throughout any digital system. This book is a valuable resource for graduate students and engineers working in the fields of logic design, spectral techniques, testing, and self-testing of digital devices.
Book Synopsis Testing of Digital Systems by : N. K. Jha
Download or read book Testing of Digital Systems written by N. K. Jha and published by Cambridge University Press. This book was released on 2003-05-08 with total page 1016 pages. Available in PDF, EPUB and Kindle. Book excerpt: Device testing represents the single largest manufacturing expense in the semiconductor industry, costing over $40 billion a year. The most comprehensive and wide-ranging book of its kind, Testing of Digital Systems covers everything you need to know about this vitally important subject. Starting right from the basics, the authors take the reader through every key area, including detailed treatment of the latest techniques such as system-on-a-chip and IDDQ testing. Written for students and engineers, it is both an excellent senior/graduate level textbook and a valuable reference.
Book Synopsis An Introduction to Logic Circuit Testing by : Parag K. Lala
Download or read book An Introduction to Logic Circuit Testing written by Parag K. Lala and published by Springer Nature. This book was released on 2022-06-01 with total page 99 pages. Available in PDF, EPUB and Kindle. Book excerpt: An Introduction to Logic Circuit Testing provides a detailed coverage of techniques for test generation and testable design of digital electronic circuits/systems. The material covered in the book should be sufficient for a course, or part of a course, in digital circuit testing for senior-level undergraduate and first-year graduate students in Electrical Engineering and Computer Science. The book will also be a valuable resource for engineers working in the industry. This book has four chapters. Chapter 1 deals with various types of faults that may occur in very large scale integration (VLSI)-based digital circuits. Chapter 2 introduces the major concepts of all test generation techniques such as redundancy, fault coverage, sensitization, and backtracking. Chapter 3 introduces the key concepts of testability, followed by some ad hoc design-for-testability rules that can be used to enhance testability of combinational circuits. Chapter 4 deals with test generation and response evaluation techniques used in BIST (built-in self-test) schemes for VLSI chips. Table of Contents: Introduction / Fault Detection in Logic Circuits / Design for Testability / Built-in Self-Test / References
Book Synopsis Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits by : M. Bushnell
Download or read book Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits written by M. Bushnell and published by Springer Science & Business Media. This book was released on 2006-04-11 with total page 690 pages. Available in PDF, EPUB and Kindle. Book excerpt: The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device techn- ogy, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester course and a teacher will have to select from the topics. We did not restrict such freedom because the selection may depend upon the individual expertise and interests. Besides, there is merit in having a larger book that will retain its usefulness for the owner even after the completion of the course. With equal tenacity, we address the needs of three other groups of readers.
Book Synopsis Space Programs Summary by : Jet Propulsion Laboratory (U.S.)
Download or read book Space Programs Summary written by Jet Propulsion Laboratory (U.S.) and published by . This book was released on 1967 with total page 294 pages. Available in PDF, EPUB and Kindle. Book excerpt:
