Semiconductor Material and Device Characterization

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Publisher : John Wiley & Sons
ISBN 13 : 0471739065
Total Pages : 800 pages
Book Rating : 4.4/5 (717 download)

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Book Synopsis Semiconductor Material and Device Characterization by : Dieter K. Schroder

Download or read book Semiconductor Material and Device Characterization written by Dieter K. Schroder and published by John Wiley & Sons. This book was released on 2015-06-29 with total page 800 pages. Available in PDF, EPUB and Kindle. Book excerpt: This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also examines new interpretations and new applications of existing techniques. Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring semiconductor materials and devices. Coverage includes the full range of electrical and optical characterization methods, including the more specialized chemical and physical techniques. Readers familiar with the previous two editions will discover a thoroughly revised and updated Third Edition, including: Updated and revised figures and examples reflecting the most current data and information 260 new references offering access to the latest research and discussions in specialized topics New problems and review questions at the end of each chapter to test readers' understanding of the material In addition, readers will find fully updated and revised sections in each chapter. Plus, two new chapters have been added: Charge-Based and Probe Characterization introduces charge-based measurement and Kelvin probes. This chapter also examines probe-based measurements, including scanning capacitance, scanning Kelvin force, scanning spreading resistance, and ballistic electron emission microscopy. Reliability and Failure Analysis examines failure times and distribution functions, and discusses electromigration, hot carriers, gate oxide integrity, negative bias temperature instability, stress-induced leakage current, and electrostatic discharge. Written by an internationally recognized authority in the field, Semiconductor Material and Device Characterization remains essential reading for graduate students as well as for professionals working in the field of semiconductor devices and materials. An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department.

Electrical & Electronics Abstracts

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Publisher :
ISBN 13 :
Total Pages : 2304 pages
Book Rating : 4.3/5 (243 download)

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Book Synopsis Electrical & Electronics Abstracts by :

Download or read book Electrical & Electronics Abstracts written by and published by . This book was released on 1997 with total page 2304 pages. Available in PDF, EPUB and Kindle. Book excerpt:

International Aerospace Abstracts

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Publisher :
ISBN 13 :
Total Pages : 1046 pages
Book Rating : 4.F/5 ( download)

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Book Synopsis International Aerospace Abstracts by :

Download or read book International Aerospace Abstracts written by and published by . This book was released on 1992 with total page 1046 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Low-Frequency Noise in Advanced MOS Devices

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Publisher : Springer Science & Business Media
ISBN 13 : 1402059108
Total Pages : 224 pages
Book Rating : 4.4/5 (2 download)

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Book Synopsis Low-Frequency Noise in Advanced MOS Devices by : Martin Haartman

Download or read book Low-Frequency Noise in Advanced MOS Devices written by Martin Haartman and published by Springer Science & Business Media. This book was released on 2007-08-23 with total page 224 pages. Available in PDF, EPUB and Kindle. Book excerpt: This is an introduction to noise, describing fundamental noise sources and basic circuit analysis, discussing characterization of low-frequency noise and offering practical advice that bridges concepts of noise theory and modelling, characterization, CMOS technology and circuits. The text offers the latest research, reviewing the most recent publications and conference presentations. The book concludes with an introduction to noise in analog/RF circuits and describes how low-frequency noise can affect these circuits.

Electrical Characterization of Silicon-on-Insulator Materials and Devices

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Publisher : Springer Science & Business Media
ISBN 13 : 9780792395485
Total Pages : 414 pages
Book Rating : 4.3/5 (954 download)

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Book Synopsis Electrical Characterization of Silicon-on-Insulator Materials and Devices by : Sorin Cristoloveanu

Download or read book Electrical Characterization of Silicon-on-Insulator Materials and Devices written by Sorin Cristoloveanu and published by Springer Science & Business Media. This book was released on 1995-06-30 with total page 414 pages. Available in PDF, EPUB and Kindle. Book excerpt: Silicon on Insulator is more than a technology, more than a job, and more than a venture in microelectronics; it is something different and refreshing in device physics. This book recalls the activity and enthu siasm of our SOl groups. Many contributing students have since then disappeared from the SOl horizon. Some of them believed that SOl was the great love of their scientific lives; others just considered SOl as a fantastic LEGO game for adults. We thank them all for kindly letting us imagine that we were guiding them. This book was very necessary to many people. SOl engineers will certainly be happy: indeed, if the performance of their SOl components is not always outstanding, they can now safely incriminate the relations given in the book rather than their process. Martine, Gunter, and Y. S. Chang can contemplate at last the amount of work they did with the figures. Our SOl accomplices already know how much we borrowed from their expertise and would find it indecent to have their detailed contri butions listed. Jean-Pierre and Dimitris incited the book, while sharing their experience in the reliability of floating bodies. Our families and friends now realize the SOl capability of dielectrically isolating us for about two years in a BOX. Our kids encouraged us to start writing. Our wives definitely gave us the courage to stop writing. They had a hard time fighting the symptoms of a rapidly developing SOl allergy.

Semiconductor Radiation Detectors

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Publisher : Springer
ISBN 13 : 3540716793
Total Pages : 351 pages
Book Rating : 4.5/5 (47 download)

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Book Synopsis Semiconductor Radiation Detectors by : Gerhard Lutz

Download or read book Semiconductor Radiation Detectors written by Gerhard Lutz and published by Springer. This book was released on 2007-06-15 with total page 351 pages. Available in PDF, EPUB and Kindle. Book excerpt: Starting from basic principles, this book describes the rapidly growing field of modern semiconductor detectors used for energy and position measurement radiation. The author, whose own contributions to these developments have been significant, explains the working principles of semiconductor radiation detectors in an intuitive way. Broad coverage is also given to electronic signal readout and to the subject of radiation damage.

Chemical Abstracts

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Publisher :
ISBN 13 :
Total Pages : 2692 pages
Book Rating : 4.3/5 (91 download)

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Book Synopsis Chemical Abstracts by :

Download or read book Chemical Abstracts written by and published by . This book was released on 2002 with total page 2692 pages. Available in PDF, EPUB and Kindle. Book excerpt:

The Electrical Characterization of Semiconductors

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Publisher :
ISBN 13 :
Total Pages : 774 pages
Book Rating : 4.3/5 (91 download)

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Book Synopsis The Electrical Characterization of Semiconductors by : Peter Blood

Download or read book The Electrical Characterization of Semiconductors written by Peter Blood and published by . This book was released on 1992 with total page 774 pages. Available in PDF, EPUB and Kindle. Book excerpt: Describes the physical principles behind experimental techniques used for measuring the electrical properties of semiconductors. The principles involved are illustrated by reference to selected examples drawn from the world of semiconductor materials.

Semiconductor Detector Systems

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Publisher : OUP Oxford
ISBN 13 : 0191523658
Total Pages : 513 pages
Book Rating : 4.1/5 (915 download)

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Book Synopsis Semiconductor Detector Systems by : Helmuth Spieler

Download or read book Semiconductor Detector Systems written by Helmuth Spieler and published by OUP Oxford. This book was released on 2005-08-25 with total page 513 pages. Available in PDF, EPUB and Kindle. Book excerpt: Semiconductor sensors patterned at the micron scale combined with custom-designed integrated circuits have revolutionized semiconductor radiation detector systems. Designs covering many square meters with millions of signal channels are now commonplace in high-energy physics and the technology is finding its way into many other fields, ranging from astrophysics to experiments at synchrotron light sources and medical imaging. This book is the first to present a comprehensive discussion of the many facets of highly integrated semiconductor detector systems, covering sensors, signal processing, transistors and circuits, low-noise electronics, and radiation effects. The diversity of design approaches is illustrated in a chapter describing systems in high-energy physics, astronomy, and astrophysics. Finally a chapter "Why things don't work" discusses common pitfalls. Profusely illustrated, this book provides a unique reference in a key area of modern science.

Scientific and Technical Aerospace Reports

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Publisher :
ISBN 13 :
Total Pages : 584 pages
Book Rating : 4.:/5 (3 download)

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Book Synopsis Scientific and Technical Aerospace Reports by :

Download or read book Scientific and Technical Aerospace Reports written by and published by . This book was released on 1994 with total page 584 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Publications of the National Institute of Standards and Technology ... Catalog

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Publisher :
ISBN 13 :
Total Pages : 480 pages
Book Rating : 4.:/5 (31 download)

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Book Synopsis Publications of the National Institute of Standards and Technology ... Catalog by : National Institute of Standards and Technology (U.S.)

Download or read book Publications of the National Institute of Standards and Technology ... Catalog written by National Institute of Standards and Technology (U.S.) and published by . This book was released on 1991 with total page 480 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Ultra Low Noise CMOS Image Sensors

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Publisher : Springer
ISBN 13 : 3319687743
Total Pages : 187 pages
Book Rating : 4.3/5 (196 download)

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Book Synopsis Ultra Low Noise CMOS Image Sensors by : Assim Boukhayma

Download or read book Ultra Low Noise CMOS Image Sensors written by Assim Boukhayma and published by Springer. This book was released on 2017-11-28 with total page 187 pages. Available in PDF, EPUB and Kindle. Book excerpt: This thesis provides a thorough noise analysis for conventional CIS readout chains, while also presenting and discussing a variety of noise reduction techniques that allow the read noise in standard processes to be optimized. Two physical implementations featuring sub-0.5-electron RMS are subsequently presented to verify the proposed noise reduction techniques and provide a full characterization of a VGA imager. Based on the verified noise calculation, the impact of the technology downscaling on the input-referred noise is also studied. Further, the thesis covers THz CMOS image sensors and presents an original design that achieves ultra-low-noise performance. Last but not least, it provides a comprehensive review of CMOS image sensors.

Random Telegraph Signals in Semiconductor Devices

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Publisher :
ISBN 13 : 9780750312745
Total Pages : 0 pages
Book Rating : 4.3/5 (127 download)

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Book Synopsis Random Telegraph Signals in Semiconductor Devices by : Eddy Simoen

Download or read book Random Telegraph Signals in Semiconductor Devices written by Eddy Simoen and published by . This book was released on 2016 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: "Following their first observation in 1984, random telegraph signals (RTSs) were initially a purely scientific tool to study fundamental aspects of defects in semiconductor devices. As semiconductor devices move to the nanoscale however, RTSs have become an issue of major concern to the semiconductor industry, both in development of current technology, such as memory devices and logic circuits, as well as in future semiconductor devices beyond the silicon roadmap, such as nanowire, TFET and carbon nanotube-based devices. It has become clear that the reliability of state-of-the-art and future CMOS technology nodes is dominated by RTS and single trap phenomena, and so its understanding is of vital importance for the modelling and simulation of the operation and the expected lifetime of CMOS devices and circuits. It is the aim of this book to provide a comprehensive and up-to-date review of one of the most challenging issues facing the semiconductor industry, from the fundamentals of RTSs to applied technology."--Prové de l'editor.

Particle Physics Reference Library

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Publisher : Springer Nature
ISBN 13 : 3030353184
Total Pages : 1083 pages
Book Rating : 4.0/5 (33 download)

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Book Synopsis Particle Physics Reference Library by : Christian W. Fabjan

Download or read book Particle Physics Reference Library written by Christian W. Fabjan and published by Springer Nature. This book was released on 2020 with total page 1083 pages. Available in PDF, EPUB and Kindle. Book excerpt: This second open access volume of the handbook series deals with detectors, large experimental facilities and data handling, both for accelerator and non-accelerator based experiments. It also covers applications in medicine and life sciences. A joint CERN-Springer initiative, the "Particle Physics Reference Library" provides revised and updated contributions based on previously published material in the well-known Landolt-Boernstein series on particle physics, accelerators and detectors (volumes 21A, B1,B2,C), which took stock of the field approximately one decade ago. Central to this new initiative is publication under full open access

NASA SP.

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Publisher :
ISBN 13 :
Total Pages : 132 pages
Book Rating : 4.:/5 (3 download)

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Book Synopsis NASA SP. by :

Download or read book NASA SP. written by and published by . This book was released on 1962 with total page 132 pages. Available in PDF, EPUB and Kindle. Book excerpt:

The Physics of Semiconductor Devices

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Publisher : Springer
ISBN 13 : 3319976044
Total Pages : 1260 pages
Book Rating : 4.3/5 (199 download)

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Book Synopsis The Physics of Semiconductor Devices by : R. K. Sharma

Download or read book The Physics of Semiconductor Devices written by R. K. Sharma and published by Springer. This book was released on 2019-01-31 with total page 1260 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book disseminates the current knowledge of semiconductor physics and its applications across the scientific community. It is based on a biennial workshop that provides the participating research groups with a stimulating platform for interaction and collaboration with colleagues from the same scientific community. The book discusses the latest developments in the field of III-nitrides; materials & devices, compound semiconductors, VLSI technology, optoelectronics, sensors, photovoltaics, crystal growth, epitaxy and characterization, graphene and other 2D materials and organic semiconductors.

Noise in Physical Systems

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Publisher : Springer Science & Business Media
ISBN 13 : 3642876404
Total Pages : 344 pages
Book Rating : 4.6/5 (428 download)

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Book Synopsis Noise in Physical Systems by : D. Wolf

Download or read book Noise in Physical Systems written by D. Wolf and published by Springer Science & Business Media. This book was released on 2013-12-11 with total page 344 pages. Available in PDF, EPUB and Kindle. Book excerpt: Noise in physical systems - as a consequence of the corpuscular nature of matter - conveys information about microscopic mechanisms determining the macroscopic behavior of the system. Besides being a source of information, noise also represents a source of annoying disturbances which affect information transMission along a physical system. Therefore, noise analysis can promote our insight into the behavior of a physical system, as well as our knowledge of the natural constraints imposed upon physical-information transmission channels and devices. In recent years the continuous scientific and technical interest in noise problems has led to a remarkable progress in the understanding of noise phenomena. This progress is reflected by the rich material presented at the Fifth International Conference on Noise in Physical Systems. The conference papers originally published in these proceedings cover the various aspects of today's noise research in the fields of solid-state devices, l/f-noise, magnetic and superconducting materials, measuring methods, and theory of fluctuations. Each session of the conference was introduced by one or two invited review lectures which are included in these proceedings in full length. The 12 invited papers and more than 40 contributed papers on specific topics (only three of them have been omitted from the proceedings since they will be published elsewhere) provide a comprehensive survey of the current state-of-the-art and recent advances of noise analysis.