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Author : Clyde N. Herrick
Publisher :
ISBN 13 :
Total Pages : 197 pages
Book Rating : 4.:/5 (65 download)
Download or read book Experiments in Semiconductor Application and Design written by Clyde N. Herrick and published by . This book was released on 1967 with total page 197 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Clyde N. Herrick
Publisher :
ISBN 13 :
Total Pages : 218 pages
Book Rating : 4.3/5 (91 download)
Download or read book Experiments in Semiconductor Application and Design written by Clyde N. Herrick and published by . This book was released on 1963 with total page 218 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : J. R. Abrahams
Publisher : Elsevier
ISBN 13 : 1483137007
Total Pages : 321 pages
Book Rating : 4.4/5 (831 download)
Download or read book Semiconductor Circuits written by J. R. Abrahams and published by Elsevier. This book was released on 2013-10-22 with total page 321 pages. Available in PDF, EPUB and Kindle. Book excerpt: Semiconductor Circuits: Theory, Design and Experiment focuses on the design and modification of circuits involving transistors and related semiconductor devices. This book is divided into three parts. The four chapters of Part I are concerned with the physical theory of semiconductors; production of pn junctions; and characteristics and equivalent circuits of transistors. The treatment of physical theory is briefly mentioned. Part II forms the major portion of this book and is made up of seven chapters. These chapters have been written at a practical level, including a number of complete circuit designs. Chapters 10 and 11, in particular, deal with the aspects of semiconductors. Several laboratory demonstrations and experiments with semiconductors are provided in Part III. This publication is written as an undergraduate and technical college textbook that helps electrical engineering students in choosing the right component and device for a particular application.
Author : Rupam Goswami
Publisher : Springer Nature
ISBN 13 : 981169124X
Total Pages : 313 pages
Book Rating : 4.8/5 (116 download)
Download or read book Contemporary Trends in Semiconductor Devices written by Rupam Goswami and published by Springer Nature. This book was released on 2022-02-16 with total page 313 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book covers evolution, concept and applications of modern semiconductor devices such as tunnel field effect transistors (TFETs), vertical super-thin body MOSFETs, ion sensing FETs (ISFETs), non-conventional solar cells, opto-electro mechanical devices and thin film transistors (TFTs). Comprising of theory, experimentation and applications of devices, the chapters describe state-of-art methods and techniques which shall be highly assistive in having an overall perspective on emerging technologies and working on a research area. The book is aimed at the scholars, enthusiasts and researchers who are currently working on devices in the contemporary era of semiconductor devices. Additionally, the chapters are lucid and descriptive and carry the potential of serving as a reference book for scholars in their undergraduate studies, who are looking ahead for a prospective career in semiconductor devices.
Author : Wei Lu
Publisher : Springer
ISBN 13 : 3319949535
Total Pages : 245 pages
Book Rating : 4.3/5 (199 download)
Download or read book Spectroscopy of Semiconductors written by Wei Lu and published by Springer. This book was released on 2018-07-31 with total page 245 pages. Available in PDF, EPUB and Kindle. Book excerpt: The science and technology related to semiconductors have received significant attention for applications in various fields including microelectronics, nanophotonics, and biotechnologies. Understanding of semiconductors has advanced to such a level that we are now able to design novel system complexes before we go for the proof-of-principle experimental demonstration. This book explains the experimental setups for optical spectral analysis of semiconductors and describes the experimental methods and the basic quantum mechanical principles underlying the fast-developing nanotechnology for semiconductors. Further, it uses numerous case studies with detailed theoretical discussions and calculations to demonstrate the data analysis. Covering structures ranging from bulk to the nanoscale, it examines applications in the semiconductor industry and biomedicine. Starting from the most basic physics of geometric optics, wave optics, quantum mechanics, solid-state physics, it provides a self-contained resource on the subject for university undergraduates. The book can be further used as a toolbox for researching and developing semiconductor nanotechnology based on spectroscopy.
Author : Rizwan Shuja
Publisher :
ISBN 13 :
Total Pages : 182 pages
Book Rating : 4.:/5 (488 download)
Download or read book Design and Development of Methods and Experiments for Semiconductor Measurements written by Rizwan Shuja and published by . This book was released on 2001 with total page 182 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Keats A. Pullen
Publisher :
ISBN 13 :
Total Pages : 514 pages
Book Rating : 4.0/5 ( download)
Download or read book Design of Transistor Circuits, with Experiments written by Keats A. Pullen and published by . This book was released on 1979 with total page 514 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Mike Peralta
Publisher : Createspace Independent Publishing Platform
ISBN 13 : 9781725895263
Total Pages : 30 pages
Book Rating : 4.8/5 (952 download)
Download or read book Semiconductor Modeling Using RelXpert and Design of Experiments written by Mike Peralta and published by Createspace Independent Publishing Platform. This book was released on 2018-08-18 with total page 30 pages. Available in PDF, EPUB and Kindle. Book excerpt: RELIABILITY MODELING USING RELXPERT Cadence's simulation tool for Reliability Simulation, RelXpertTM, requires models to properly predict such behavior as Hot Carrier Injection, which among other things, causes the threshold voltage, VT, to shift according to ID, VDG, and L (Gate Length). Proper reliability modeling requires sample measurements of VT shifts (or other device parameters such as gm etc.) at known ID, VDG, and L. Since reliability Hot Carrier shifts tend to have significant variation from sample-to-sample, it is imperative to use a few sample measurements at each ID, VDG, and L use conditions. We show how using a 3 factor DOE (Design Of Experiment) with 4 replicates for each factor combination is an excellent approach to distinguishing between actual factor effects and random experimental measurement variation. In this monograph we cover the following: 1. Replicates are used to distinguish random measurement variation from actual factor effects. 2. DOE's and use conditions such as ID, VDG, and L are used to fully model the use condition range. 3. Core industry standard Hot Carrier model is used. 4. Moderate current levels are used for reasonable time durations for the measurement procedure. 5. ICCAPTM parameter extraction software is used to extract the standard Hot Carrier model parameters. 6. How the RelXpertTM model is scaled to match measured-to-RelXpert-simulator values. 7. Differential Amplifier (Diff Amp) Example to illustrate how Hot Carrier VT shifts can be reduced thereby enhancing circuit reliability. 8. How ID, VDG can also be changed instead of W, L to reduce Hot Carrier VT shifts.
Author : Ravindra Khattree
Publisher : Gulf Professional Publishing
ISBN 13 : 9780444506146
Total Pages : 1224 pages
Book Rating : 4.5/5 (61 download)
Download or read book Statistics in Industry written by Ravindra Khattree and published by Gulf Professional Publishing. This book was released on 2003-07-18 with total page 1224 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume presents an exposition of topics in industrial statistics. It serves as a reference for researchers in industrial statistics/industrial engineering and a source of information for practicing statisticians/industrial engineers. A variety of topics in the areas of industrial process monitoring, industrial experimentation, industrial modelling and data analysis are covered and are authored by leading researchers or practitioners in the particular specialized topic. Targeting the audiences of researchers in academia as well as practitioners and consultants in industry, the book provides comprehensive accounts of the relevant topics. In addition, whenever applicable ample data analytic illustrations are provided with the help of real world data.
Author : Gary S. May
Publisher : John Wiley & Sons
ISBN 13 : 0471790273
Total Pages : 428 pages
Book Rating : 4.4/5 (717 download)
Download or read book Fundamentals of Semiconductor Manufacturing and Process Control written by Gary S. May and published by John Wiley & Sons. This book was released on 2006-05-26 with total page 428 pages. Available in PDF, EPUB and Kindle. Book excerpt: A practical guide to semiconductor manufacturing from processcontrol to yield modeling and experimental design Fundamentals of Semiconductor Manufacturing and Process Controlcovers all issues involved in manufacturing microelectronic devicesand circuits, including fabrication sequences, process control,experimental design, process modeling, yield modeling, and CIM/CAMsystems. Readers are introduced to both the theory and practice ofall basic manufacturing concepts. Following an overview of manufacturing and technology, the textexplores process monitoring methods, including those that focus onproduct wafers and those that focus on the equipment used toproduce wafers. Next, the text sets forth some fundamentals ofstatistics and yield modeling, which set the foundation for adetailed discussion of how statistical process control is used toanalyze quality and improve yields. The discussion of statistical experimental design offers readers apowerful approach for systematically varying controllable processconditions and determining their impact on output parameters thatmeasure quality. The authors introduce process modeling concepts,including several advanced process control topics such asrun-by-run, supervisory control, and process and equipmentdiagnosis. Critical coverage includes the following: * Combines process control and semiconductor manufacturing * Unique treatment of system and software technology and managementof overall manufacturing systems * Chapters include case studies, sample problems, and suggestedexercises * Instructor support includes electronic copies of the figures andan instructor's manual Graduate-level students and industrial practitioners will benefitfrom the detailed exami?nation of how electronic materials andsupplies are converted into finished integrated circuits andelectronic products in a high-volume manufacturingenvironment. An Instructor's Manual presenting detailed solutions to all theproblems in the book is available from the Wiley editorialdepartment. An Instructor Support FTP site is also available.
Author : Omar Mounkachi
Publisher : Nova Science Publishers
ISBN 13 : 9781536140774
Total Pages : 177 pages
Book Rating : 4.1/5 (47 download)
Download or read book First-Principle Vs Experimental Design of Diluted Magnetic Semiconductors written by Omar Mounkachi and published by Nova Science Publishers. This book was released on 2018-10 with total page 177 pages. Available in PDF, EPUB and Kindle. Book excerpt: Recent discoveries have given rise to a new class of electronics known as "spin electronics or spintronics," which uses the electron spin rather than its charge to create polarized currents. Spintronics is currently experiencing an extraordinary development with the manufacture of nanoscale devices based on ferromagnetic materials and semiconductors. Their applications are numerous, ranging from recording, electronics, and optoelectronics to quantum information. Spintronics is a new generation of electronics that has brought and continues to bring a lot of progress to information storage; this is due to the discovery of new materials with new functionalities and multiple applications. The discovery of giant magnetoresistance (GMR) in 1988 by Albert Fert and Peter Grünberg (receiver of the Nobel Prize in Physics in 2007) is considered a starting point of spintronics. GMR is based on the variation of the electric current in the presence of a magnetic field. The spintronics has made important contributions to the miniaturization desired for electronics; it uses nanometric components for processing and storing information. However, the limits of miniaturization on a nanometric scale are known, and it is imperative to develop new ways and new materials to exceed those limits. The most desired properties for these materials are high spin polarization, modular magnetic properties by an electric field and a long lifetime of the spin polarization. Among the new promising materials, we cite the following: Diluted magnetic semiconductors, which give new magnetic properties of conventional semiconductors, functional oxides (including the semi-metals and multiferroic metals) and organic semiconductors. The main theoretical challenge in this area is to understand how the macroscopic magnetic behavior observed results from interactions of a large number of degrees of microscopic freedom. In these systems the disorder is an essential parameter of magnetic phenomena, and due to random locations of impurity atoms it can lead to a total physical difference from the observed absence. There has been considerable recent advances in the design of these materials as diluted magnetic semiconductors (DMS, or diluted magnetic semiconductors), and a number of semiconductors were investigated as II-VI group and III-V group doped compounds, with transition metals substituting their original cations. There are several different theoretical approaches to study these magnetic materials. The ab-initio approach starts from the Schrödinger equation to simulate a given material. Such an approach is essential to determine the parameters and microscopic properties of such a system. In this book, the authors analyzed the electronic structure of magnetic semiconductors diluted in the case of ZnO, GaN, SnO2, TiO2, MgH2, EuO and EuN doped RENs (RE=GdN, DyN and HoN). The authors focused on magnetic, optical and exchange mechanisms which control the ferromagnetism in these systems. The purpose of this book is to propose some ideas to answer the most important question in material science for semiconductor spintronics, primarily considering how room-temperature ferromagnetism in DMS can be realized. Additionally, the correlation between first principle and experimental design to see how properties of yet-to-be-synthesized materials can be predicted is discussed.
Author : Amir Afshar
Publisher : Elsevier
ISBN 13 : 0080539564
Total Pages : 229 pages
Book Rating : 4.0/5 (85 download)
Download or read book Principles of Semiconductor Network Testing written by Amir Afshar and published by Elsevier. This book was released on 1996-04-22 with total page 229 pages. Available in PDF, EPUB and Kindle. Book excerpt: Principles of Semiconductor Network Testing gathers together comprehensive information which test and process professionals will find invaluable. The techniques outlined will help ensure that test methods and data collected reflect actual device performance, rather than 'testing the tester' or being lost in the noise floor. This book addresses the fundamental issues underlying the semiconductor test discipline. The test engineer must understand the basic principles of semiconductor fabrication and process and have an in-depth knowledge of circuit functions, instrumentation and noise sources. Introduces a novel component-testing philosophy for semiconductor test, product and design engineers Best new source of information for experienced semiconductor engineers as well as entry-level personnel Eight chapters about semiconductor testing
Author : Tanay Rahul Nerurkar
Publisher :
ISBN 13 :
Total Pages : 117 pages
Book Rating : 4.:/5 (971 download)
Download or read book Design of Experiments on a Semiconductor Plasma Ashing Process written by Tanay Rahul Nerurkar and published by . This book was released on 2016 with total page 117 pages. Available in PDF, EPUB and Kindle. Book excerpt: Characterizing and controlling process variations in semiconductor manufacturing processes is crucial to ensure the extremely low defect and scrap rates that are needed for semiconductor manufacturing companies to maximize profitability. As semiconductor device critical dimensions become smaller and chips become more complex, and with customers inquiring about process capability metrics to make sure they get the highest quality product, there is a need for chip manufacturers to thoroughly analyze and define their process capabilities. The work in this thesis done in collaboration with Analog Devices Inc., a leading chip manufacturer, shows how the concept of design of experiments (DOE) and statistical regression modeling techniques can be implemented in a practical industrial setting to rigorously understand and mathematically characterize process variations in a semiconductor fabrication process (plasma ashing). New approaches are introduced to Analog Devices Inc. in calculating wafer statistics. Methodologies are developed that will help the company to choose the right experimental designs based on the objective (e.g. accurate prediction of the response variable, process optimization, process robustness, etc.) while taking into account the process, time, and cost constraints. Multiple regression modeling techniques are utilized to analyze the outcomes of the experiment and the results of these techniques are compared to each other in order to choose the right model needed to satisfy the objective. The statistical software JMP is used to tease out subtle implications of the outcomes of the DOE and formulate hypotheses about any anomalies. The DOEs are performed on two Gasonics Aura 3010 machines that carry out the plasma ashing process using the same process parameters in order to highlight not only the similarities but also the differences in the machines which come from factors like the intrinsic build and state of the machines. The findings and results identify opportunities for the development of new process improvement strategies, faster root cause analysis of failures, methods to systematically calibrate new equipment, update standard operating procedures, and opportunities for machine matching. The purpose of this thesis is to serve as a pedagogical document and template for the process engineers at Analog Devices Inc. in the future to perform DOEs on other processes and machines in the fabrication center.
Author : Robert T. Stone
Publisher : Sams
ISBN 13 :
Total Pages : 208 pages
Book Rating : 4.:/5 (89 download)
Download or read book Design of VMOS Circuits, with Experiments written by Robert T. Stone and published by Sams. This book was released on 1980 with total page 208 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Dieter K. Schroder
Publisher : John Wiley & Sons
ISBN 13 : 0471739065
Total Pages : 800 pages
Book Rating : 4.4/5 (717 download)
Download or read book Semiconductor Material and Device Characterization written by Dieter K. Schroder and published by John Wiley & Sons. This book was released on 2015-06-29 with total page 800 pages. Available in PDF, EPUB and Kindle. Book excerpt: This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also examines new interpretations and new applications of existing techniques. Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring semiconductor materials and devices. Coverage includes the full range of electrical and optical characterization methods, including the more specialized chemical and physical techniques. Readers familiar with the previous two editions will discover a thoroughly revised and updated Third Edition, including: Updated and revised figures and examples reflecting the most current data and information 260 new references offering access to the latest research and discussions in specialized topics New problems and review questions at the end of each chapter to test readers' understanding of the material In addition, readers will find fully updated and revised sections in each chapter. Plus, two new chapters have been added: Charge-Based and Probe Characterization introduces charge-based measurement and Kelvin probes. This chapter also examines probe-based measurements, including scanning capacitance, scanning Kelvin force, scanning spreading resistance, and ballistic electron emission microscopy. Reliability and Failure Analysis examines failure times and distribution functions, and discusses electromigration, hot carriers, gate oxide integrity, negative bias temperature instability, stress-induced leakage current, and electrostatic discharge. Written by an internationally recognized authority in the field, Semiconductor Material and Device Characterization remains essential reading for graduate students as well as for professionals working in the field of semiconductor devices and materials. An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department.
Author : B. Somanathan Nair
Publisher :
ISBN 13 : 9789381141236
Total Pages : 312 pages
Book Rating : 4.1/5 (412 download)
Download or read book A Manual of Laboratory Experiments and Workshop Practice written by B. Somanathan Nair and published by . This book was released on 2011-04-24 with total page 312 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book is designed as a laboratory-cum-workshop manual to cater the needs of the students of B.Tech. and B.E. degree courses in the various branches of engineering such as Electrical and Electronics Engineering, and Electronics and Communication Engineering. It can also be used for the undergraduate and postgraduate degree courses in Electronics and Physics.There are no books similar in nature to this manual. This is the only book of this nature available in our country which describes practical design of electronics circuits and experiments that will work in the lab.
Author : Mike Golio
Publisher : CRC Press
ISBN 13 : 1420039970
Total Pages : 336 pages
Book Rating : 4.4/5 (2 download)
Download or read book RF and Microwave Semiconductor Device Handbook written by Mike Golio and published by CRC Press. This book was released on 2017-12-19 with total page 336 pages. Available in PDF, EPUB and Kindle. Book excerpt: Offering a single volume reference for high frequency semiconductor devices, this handbook covers basic material characteristics, system level concerns and constraints, simulation and modeling of devices, and packaging. Individual chapters detail the properties and characteristics of each semiconductor device type, including: Varactors, Schottky diodes, transit-time devices, BJTs, HBTs, MOSFETs, MESFETs, and HEMTs. Written by leading researchers in the field, the RF and Microwave Semiconductor Device Handbook provides an excellent starting point for programs involving development, technology comparison, or acquisition of RF and wireless semiconductor devices.
