Author : IEEE Staff
Publisher :
ISBN 13 : 9781509029730
Total Pages : pages
Book Rating : 4.0/5 (297 download)
Book Synopsis Do Not Process Test 2016 May Release Testing by : IEEE Staff
Download or read book Do Not Process Test 2016 May Release Testing written by IEEE Staff and published by . This book was released on 2016-09-12 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: The aim of ESSCIRC is to provide an annual European forum for the presentation and discussion of recent advances in solid state circuits It is jointly organized with the sister conference ESSDERC (European Solid State Device Conference) The increasing level of integration for system on chip design made available by advances in silicon technology is, more than ever before, calling for a deeper interaction among technologists, device experts, IC designers, and system designers While keeping separate Technical Program Committees, ESSCIRC and ESSDERC are governed by a common Steering Committee and share Plenary Keynote Presentations and Joint Sessions bridging both communities Attendees registered for either conference are encouraged to attend any of the scheduled parallel sessions, regardless to which conference they belong