Electrical Characterization of GaAs Materials and Devices

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Publisher :
ISBN 13 :
Total Pages : 280 pages
Book Rating : 4.:/5 (133 download)

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Book Synopsis Electrical Characterization of GaAs Materials and Devices by : David C. Look

Download or read book Electrical Characterization of GaAs Materials and Devices written by David C. Look and published by . This book was released on 1992 with total page 280 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Electrical Characterization of GaAs by Derivative Surface Photovoltage Spectroscopy

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Publisher :
ISBN 13 :
Total Pages : 100 pages
Book Rating : 4.:/5 (783 download)

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Book Synopsis Electrical Characterization of GaAs by Derivative Surface Photovoltage Spectroscopy by : Ching-Ye Hsiaw

Download or read book Electrical Characterization of GaAs by Derivative Surface Photovoltage Spectroscopy written by Ching-Ye Hsiaw and published by . This book was released on 1980 with total page 100 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Electrical Characterization of GaAs Materials and Devices

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Publisher : Wiley
ISBN 13 : 9780471935735
Total Pages : 290 pages
Book Rating : 4.9/5 (357 download)

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Book Synopsis Electrical Characterization of GaAs Materials and Devices by : David C. Look

Download or read book Electrical Characterization of GaAs Materials and Devices written by David C. Look and published by Wiley. This book was released on 1992-07-14 with total page 290 pages. Available in PDF, EPUB and Kindle. Book excerpt: Summarizes electrical measurement data in GaAs materials and devices, and describes in detail the techniques used to obtain these data and the ideas behind them. Special emphasis is given to subjects sometimes ignored in other works such as impurity and defect Fermi functions, degeneracy factors and multiband conduction, and also to relatively new subjects such as the application of magnetoresistance to determine carrier mobility in device structures. Some of the information is quite practical, e.g., how to make ohmic contacts or where to buy a commercial, automated Hall-effect apparatus. Includes many detailed derivations.

Electrical Characterization of GaAs Materialsand

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ISBN 13 :
Total Pages : 280 pages
Book Rating : 4.:/5 (88 download)

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Book Synopsis Electrical Characterization of GaAs Materialsand by : David C. Look

Download or read book Electrical Characterization of GaAs Materialsand written by David C. Look and published by . This book was released on 1989 with total page 280 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Semiconductor Material and Device Characterization

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Publisher : John Wiley & Sons
ISBN 13 : 0471739065
Total Pages : 800 pages
Book Rating : 4.4/5 (717 download)

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Book Synopsis Semiconductor Material and Device Characterization by : Dieter K. Schroder

Download or read book Semiconductor Material and Device Characterization written by Dieter K. Schroder and published by John Wiley & Sons. This book was released on 2015-06-29 with total page 800 pages. Available in PDF, EPUB and Kindle. Book excerpt: This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also examines new interpretations and new applications of existing techniques. Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring semiconductor materials and devices. Coverage includes the full range of electrical and optical characterization methods, including the more specialized chemical and physical techniques. Readers familiar with the previous two editions will discover a thoroughly revised and updated Third Edition, including: Updated and revised figures and examples reflecting the most current data and information 260 new references offering access to the latest research and discussions in specialized topics New problems and review questions at the end of each chapter to test readers' understanding of the material In addition, readers will find fully updated and revised sections in each chapter. Plus, two new chapters have been added: Charge-Based and Probe Characterization introduces charge-based measurement and Kelvin probes. This chapter also examines probe-based measurements, including scanning capacitance, scanning Kelvin force, scanning spreading resistance, and ballistic electron emission microscopy. Reliability and Failure Analysis examines failure times and distribution functions, and discusses electromigration, hot carriers, gate oxide integrity, negative bias temperature instability, stress-induced leakage current, and electrostatic discharge. Written by an internationally recognized authority in the field, Semiconductor Material and Device Characterization remains essential reading for graduate students as well as for professionals working in the field of semiconductor devices and materials. An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department.

GaAs High-Speed Devices

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Publisher : John Wiley & Sons
ISBN 13 : 9780471856412
Total Pages : 632 pages
Book Rating : 4.8/5 (564 download)

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Book Synopsis GaAs High-Speed Devices by : C. Y. Chang

Download or read book GaAs High-Speed Devices written by C. Y. Chang and published by John Wiley & Sons. This book was released on 1994-10-28 with total page 632 pages. Available in PDF, EPUB and Kindle. Book excerpt: The performance of high-speed semiconductor devices—the genius driving digital computers, advanced electronic systems for digital signal processing, telecommunication systems, and optoelectronics—is inextricably linked to the unique physical and electrical properties of gallium arsenide. Once viewed as a novel alternative to silicon, gallium arsenide has swiftly moved into the forefront of the leading high-tech industries as an irreplaceable material in component fabrication. GaAs High-Speed Devices provides a comprehensive, state-of-the-science look at the phenomenally expansive range of engineering devices gallium arsenide has made possible—as well as the fabrication methods, operating principles, device models, novel device designs, and the material properties and physics of GaAs that are so keenly integral to their success. In a clear five-part format, the book systematically examines each of these aspects of GaAs device technology, forming the first authoritative study to consider so many important aspects at once and in such detail. Beginning with chapter 2 of part one, the book discusses such basic subjects as gallium arsenide materials and crystal properties, electron energy band structures, hole and electron transport, crystal growth of GaAs from the melt and defect density analysis. Part two describes the fabrication process of gallium arsenide devices and integrated circuits, shedding light, in chapter 3, on epitaxial growth processes, molecular beam epitaxy, and metal organic chemical vapor deposition techniques. Chapter 4 provides an introduction to wafer cleaning techniques and environment control, wet etching methods and chemicals, and dry etching systems, including reactive ion etching, focused ion beam, and laser assisted methods. Chapter 5 provides a clear overview of photolithography and nonoptical lithography techniques that include electron beam, x-ray, and ion beam lithography systems. The advances in fabrication techniques described in previous chapters necessitate an examination of low-dimension device physics, which is carried on in detail in chapter 6 of part three. Part four includes a discussion of innovative device design and operating principles which deepens and elaborates the ideas introduced in chapter 1. Key areas such as metal-semiconductor contact systems, Schottky Barrier and ohmic contact formation and reliability studies are examined in chapter 7. A detailed discussion of metal semiconductor field-effect transistors, the fabrication technology, and models and parameter extraction for device analyses occurs in chapter 8. The fifth part of the book progresses to an up-to-date discussion of heterostructure field-effect (HEMT in chapter 9), potential-effect (HBT in chapter 10), and quantum-effect devices (chapters 11 and 12), all of which are certain to have a major impact on high-speed integrated circuits and optoelectronic integrated circuit (OEIC) applications. Every facet of GaAs device technology is placed firmly in a historical context, allowing readers to see instantly the significant developmental changes that have shaped it. Featuring a look at devices still under development and device structures not yet found in the literature, GaAs High-Speed Devices also provides a valuable glimpse into the newest innovations at the center of the latest GaAs technology. An essential text for electrical engineers, materials scientists, physicists, and students, GaAs High-Speed Devices offers the first comprehensive and up-to-date look at these formidable 21st century tools. The unique physical and electrical properties of gallium arsenide has revolutionized the hardware essential to digital computers, advanced electronic systems for digital signal processing, telecommunication systems, and optoelectronics. GaAs High-Speed Devices provides the first fully comprehensive look at the enormous range of engineering devices gallium arsenide has made possible as well as the backbone of the technology—ication methods, operating principles, and the materials properties and physics of GaAs—device models and novel device designs. Featuring a clear, six-part format, the book covers: GaAs materials and crystal properties Fabrication processes of GaAs devices and integrated circuits Electron beam, x-ray, and ion beam lithography systems Metal-semiconductor contact systems Heterostructure field-effect, potential-effect, and quantum-effect devices GaAs Microwave Monolithic Integrated Circuits and Digital Integrated Circuits In addition, this comprehensive volume places every facet of the technology in an historical context and gives readers an unusual glimpse at devices still under development and device structures not yet found in the literature.

Electrical Characterization of Process and Irradiation-induced Defects in GaAs

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ISBN 13 :
Total Pages : 186 pages
Book Rating : 4.:/5 (17 download)

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Book Synopsis Electrical Characterization of Process and Irradiation-induced Defects in GaAs by : Shandirai Malven Tunhuma

Download or read book Electrical Characterization of Process and Irradiation-induced Defects in GaAs written by Shandirai Malven Tunhuma and published by . This book was released on 2016 with total page 186 pages. Available in PDF, EPUB and Kindle. Book excerpt: Gallium arsenide (GaAs) technology leads the implementation of high frequency devices with superior performance. A vast number of optoelectronic applications are based on the material owing to its direct and wide bandgap. Over the years the number of these applications continues to grow but they remain highly cost-ineffective partly due to the growth techniques and the presence of defects in GaAs. These areas have been researched on intensively over the past four decades with much controversy, particularly on the subject of the EL2 defect. This defect plays an important role in the design and operation of GaAs based devices. It is therefore important to understand its electronic properties and influence on device operation. Schottky barrier diodes (SBDs) were fabricated on n-type GaAs. The quality of the contacts was evaluated using current-voltage (I-V) and capacitance-voltage (C-V) measurements before and after exposing them to different processing techniques and radiation types. Deep-level transient spectroscopy (DLTS) and Laplace deeplevel transient spectroscopy (L-DLTS) were used to characterize the electrically active defects in the material. Defects with almost similar emission rates which were not observed in the past were identified using L-DLTS due to its high resolution. I-V and C-V measurements on as-deposited Au/n-GaAs SBDs in the 80 ?? 480 K range showed that the EL2 defect has a profound effect on the diode characteristics. The influence of the defect caused the temperature dependent behavior of the C-V barrier height to be split into two temperature intervals, each with a unique temperature coefficient. Exposure of the devices to temperatures above 300 K resulted in the deterioration of their I-V characteristics. Permanent physical modification of the SBDs was observed at 400 K and above. Inductively coupled plasma (ICP) etching, Electron beam deposition (EBD) and electron beam exposure (EBE) were observed to impact significantly on diode I-V and C-V.

Gan-based Materials And Devices: Growth, Fabrication, Characterization And Performance

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Publisher : World Scientific
ISBN 13 : 9814482692
Total Pages : 295 pages
Book Rating : 4.8/5 (144 download)

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Book Synopsis Gan-based Materials And Devices: Growth, Fabrication, Characterization And Performance by : Robert F Davis

Download or read book Gan-based Materials And Devices: Growth, Fabrication, Characterization And Performance written by Robert F Davis and published by World Scientific. This book was released on 2004-05-07 with total page 295 pages. Available in PDF, EPUB and Kindle. Book excerpt: The unique materials properties of GaN-based semiconductors have stimulated a great deal of interest in research and development regarding nitride materials growth and optoelectronic and nitride-based electronic devices. High electron mobility and saturation velocity, high sheet carrier concentration at heterojunction interfaces, high breakdown field, and low thermal impedance of GaN-based films grown over SiC or bulk AlN substrates make nitride-based electronic devices very promising. The chemical inertness of nitrides is another key property.This volume, written by experts on different aspects of nitride technology, addresses the entire spectrum of issues related to nitride materials and devices, and it will be useful for technologists, scientists, engineers, and graduate students who are working on wide bandgap materials and devices. The book can also be used as a supplementary text for graduate courses on wide bandgap semiconductor technology.

Fabrication of GaAs Devices

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Publisher : IET
ISBN 13 : 9780863413537
Total Pages : 372 pages
Book Rating : 4.4/5 (135 download)

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Book Synopsis Fabrication of GaAs Devices by : Albert G. Baca

Download or read book Fabrication of GaAs Devices written by Albert G. Baca and published by IET. This book was released on 2005-09 with total page 372 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides fundamental and practical information on all aspects of GaAs processing and gives pragmatic advice on cleaning and passivation, wet and dry etching and photolithography. Other topics covered include device performance for HBTs (Heterojunction Bipolar Transistors) and FETs (Field Effect Transistors), how these relate to processing choices, and special processing issues such as wet oxidation, which are especially important in optoelectronic devices. This book is suitable for both new and practising engineers.

Electrical Characterization of GaAs Grown by Vapour Phase Epitaxy

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ISBN 13 :
Total Pages : 136 pages
Book Rating : 4.:/5 (615 download)

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Book Synopsis Electrical Characterization of GaAs Grown by Vapour Phase Epitaxy by : Nicholas Christoforou

Download or read book Electrical Characterization of GaAs Grown by Vapour Phase Epitaxy written by Nicholas Christoforou and published by . This book was released on 1981 with total page 136 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Gallium Arsenide and Related Compounds 1993, Proceedings of the 20th INT Symposium, 29 August - 2 September 1993, Freiburg im Braunschweig, Germany

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Publisher : CRC Press
ISBN 13 : 9780750302951
Total Pages : 880 pages
Book Rating : 4.3/5 (29 download)

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Book Synopsis Gallium Arsenide and Related Compounds 1993, Proceedings of the 20th INT Symposium, 29 August - 2 September 1993, Freiburg im Braunschweig, Germany by : Günter Weimann

Download or read book Gallium Arsenide and Related Compounds 1993, Proceedings of the 20th INT Symposium, 29 August - 2 September 1993, Freiburg im Braunschweig, Germany written by Günter Weimann and published by CRC Press. This book was released on 1994-01-01 with total page 880 pages. Available in PDF, EPUB and Kindle. Book excerpt: Gallium Arsenide and Related Compounds 1993 covers III-V compounds from crystal growth of materials to their device applications. Focusing on the fields of optical communications and satellite broadcasting, the book describes the practical applications for GaAs and III-V compounds in devices and circuits, both conventional and those based on quantum effects. It also discusses ultrafast GaAs transistors and integrated circuits, novel laser diodes, and tunneling devices, and considers the direction for future technologies. In addition, this volume addresses the increasing demands of ultra high speed systems that require careful selection of III-V materials to optimize the performance of electronic and optoelectronic components. It is ideal reading for physicists, materials scientists, electrical, and electronics engineers investigating III-V compound materials, properties, and devices.

Electrical Characterization of Particle Irradiated GaAs

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Publisher :
ISBN 13 :
Total Pages : 104 pages
Book Rating : 4.:/5 (889 download)

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Book Synopsis Electrical Characterization of Particle Irradiated GaAs by : Matshisa Johannes Legodi

Download or read book Electrical Characterization of Particle Irradiated GaAs written by Matshisa Johannes Legodi and published by . This book was released on 1999 with total page 104 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Characterization of Semiconductor Heterostructures and Nanostructures

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Publisher : Elsevier
ISBN 13 : 0080558151
Total Pages : 501 pages
Book Rating : 4.0/5 (85 download)

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Book Synopsis Characterization of Semiconductor Heterostructures and Nanostructures by : Giovanni Agostini

Download or read book Characterization of Semiconductor Heterostructures and Nanostructures written by Giovanni Agostini and published by Elsevier. This book was released on 2011-08-11 with total page 501 pages. Available in PDF, EPUB and Kindle. Book excerpt: In the last couple of decades, high-performance electronic and optoelectronic devices based on semiconductor heterostructures have been required to obtain increasingly strict and well-defined performances, needing a detailed control, at the atomic level, of the structural composition of the buried interfaces. This goal has been achieved by an improvement of the epitaxial growth techniques and by the parallel use of increasingly sophisticated characterization techniques and of refined theoretical models based on ab initio approaches. This book deals with description of both characterization techniques and theoretical models needed to understand and predict the structural and electronic properties of semiconductor heterostructures and nanostructures. Comprehensive collection of the most powerful characterization techniques for semiconductor heterostructures and nanostructures Most of the chapters are authored by scientists that are among the top 10 worldwide in publication ranking of the specific field Each chapter starts with a didactic introduction on the technique The second part of each chapter deals with a selection of top examples highlighting the power of the specific technique to analyze the properties of semiconductors

Electrical Characterization of GaAs Anodic Oxides Using Isothermal Dielectric Relaxation Current

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ISBN 13 :
Total Pages : pages
Book Rating : 4.:/5 (132 download)

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Book Synopsis Electrical Characterization of GaAs Anodic Oxides Using Isothermal Dielectric Relaxation Current by : Martin John Biancalana (CAPT, USAF.)

Download or read book Electrical Characterization of GaAs Anodic Oxides Using Isothermal Dielectric Relaxation Current written by Martin John Biancalana (CAPT, USAF.) and published by . This book was released on 1978 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Iii-nitride Materials, Devices And Nano-structures

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Publisher : World Scientific
ISBN 13 : 1786343207
Total Pages : 424 pages
Book Rating : 4.7/5 (863 download)

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Book Synopsis Iii-nitride Materials, Devices And Nano-structures by : Zhe Chuan Feng

Download or read book Iii-nitride Materials, Devices And Nano-structures written by Zhe Chuan Feng and published by World Scientific. This book was released on 2017-04-20 with total page 424 pages. Available in PDF, EPUB and Kindle. Book excerpt: Group III-Nitrides semiconductor materials, including GaN, InN, AlN, InGaN, AlGaN and AlInGaN, i.e. (Al, In, Ga)N, are excellent semiconductors, covering the spectral range from deep ultraviolet (DUV) to UV, visible and infrared, with unique properties very suitable for modern electronic and optoelectronic applications. Remarkable breakthroughs have been achieved in recent years for research and development (R&D) in these materials and devices, such as high-power and high brightness UV-blue-green-white light emitting diodes (LEDs), UV-blue-green laser diodes (LDs), photo-detectors and various optoelectronics and electronics devices and applications.The Nobel Prize in Physics 2014 was awarded jointly to Isamu Akasaki, Hiroshi Amano and Shuji Nakamura 'for the invention of efficient blue light-emitting diodes which has enabled bright and energy-saving white light sources'. Red and green diodes had been invented since 1960s-70s but without blue LED. Despite considerable efforts, the blue LED had remained a challenge for a long time. The success and inventions on GaN-based LEDs were revolutionary and benefiting for mankind. III-Nitrides-based industry has formed and acquired rapid developments over the world. Incandescent light bulbs lit the 20th century and the 21st century will be lit by LED lamps.Before this book, the editor has edited two books, III-Nitride Semiconductor Materials (2006) and III-Nitride Devices and Nanoengineering (2008), both published by ICP/WSP, in the fields of III-Nitride. The developments of these materials and devices are moving rapidly. Many data or knowledge, some even just published only recently, have been modified and needed to be upgraded. This new book, III-Nitride Materials, Devices and Nano-Structures as the third instalment, will cover the rapid new developments and achievements in the III-Nitride fields, particularly those made since 2009.

Electrical Characterization of Electronic Materials

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ISBN 13 :
Total Pages : 182 pages
Book Rating : 4.:/5 (464 download)

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Book Synopsis Electrical Characterization of Electronic Materials by : Hugh David Bowen

Download or read book Electrical Characterization of Electronic Materials written by Hugh David Bowen and published by . This book was released on 1997 with total page 182 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Electrical Characterization of Transition Metallic Related Deep Levels in N-GaAs Using DLTS and ODLTS

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ISBN 13 :
Total Pages : 366 pages
Book Rating : 4.:/5 (859 download)

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Book Synopsis Electrical Characterization of Transition Metallic Related Deep Levels in N-GaAs Using DLTS and ODLTS by : André Venter

Download or read book Electrical Characterization of Transition Metallic Related Deep Levels in N-GaAs Using DLTS and ODLTS written by André Venter and published by . This book was released on 1990 with total page 366 pages. Available in PDF, EPUB and Kindle. Book excerpt: