Digital Logic Testing And Simulation

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Digital Logic Testing and Simulation

Author : Alexander Miczo
Publisher : John Wiley & Sons
ISBN 13 : 0471457779
Total Pages : 697 pages
Book Rating : 4.4/5 (714 download)

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Book Synopsis Digital Logic Testing and Simulation by : Alexander Miczo

Download or read book Digital Logic Testing and Simulation written by Alexander Miczo and published by John Wiley & Sons. This book was released on 2003-10-24 with total page 697 pages. Available in PDF, EPUB and Kindle. Book excerpt: Your road map for meeting today's digital testing challenges Today, digital logic devices are common in products that impact public safety, including applications in transportation and human implants. Accurate testing has become more critical to reliability, safety, and the bottom line. Yet, as digital systems become more ubiquitous and complex, the challenge of testing them has become more difficult. As one development group designing a RISC stated, "the work required to . . . test a chip of this size approached the amount of effort required to design it." A valued reference for nearly two decades, Digital Logic Testing and Simulation has been significantly revised and updated for designers and test engineers who must meet this challenge. There is no single solution to the testing problem. Organized in an easy-to-follow, sequential format, this Second Edition familiarizes the reader with the many different strategies for testing and their applications, and assesses the strengths and weaknesses of the various approaches. The book reviews the building blocks of a successful testing strategy and guides the reader on choosing the best solution for a particular application. Digital Logic Testing and Simulation, Second Edition covers such key topics as: * Binary Decision Diagrams (BDDs) and cycle-based simulation * Tester architectures/Standard Test Interface Language (STIL) * Practical algorithms written in a Hardware Design Language (HDL) * Fault tolerance * Behavioral Automatic Test Pattern Generation (ATPG) * The development of the Test Design Expert (TDX), the many obstacles encountered and lessons learned in creating this novel testing approach Up-to-date and comprehensive, Digital Logic Testing and Simulation is an important resource for anyone charged with pinpointing faulty products and assuring quality, safety, and profitability.

Digital Logic Testing and Simulation

Author : Alexander Miczo
Publisher : Wiley
ISBN 13 : 9780471604228
Total Pages : 480 pages
Book Rating : 4.6/5 (42 download)

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Book Synopsis Digital Logic Testing and Simulation by : Alexander Miczo

Download or read book Digital Logic Testing and Simulation written by Alexander Miczo and published by Wiley. This book was released on 1985-12 with total page 480 pages. Available in PDF, EPUB and Kindle. Book excerpt: The new standard in the field, presenting the latest design and testing methods for logic circuits, and the development of a BASIC-based simulation. Offers designers and test engineers unique coverage of circuit design for testability, stressing the incorporation of hardware into designs that facilitate testing and diagnosis by allowing greater access to internal circuits. Examines various ways of representing a design, as well as external testing methods that apply this information.

Solutions Manual to Accompany Digital Logic Testing and Simulation

Author : Alexander Miczo
Publisher :
ISBN 13 :
Total Pages : 126 pages
Book Rating : 4.0/5 ( download)

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Book Synopsis Solutions Manual to Accompany Digital Logic Testing and Simulation by : Alexander Miczo

Download or read book Solutions Manual to Accompany Digital Logic Testing and Simulation written by Alexander Miczo and published by . This book was released on 1986 with total page 126 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Testing of Digital Systems

Author : N. K. Jha
Publisher : Cambridge University Press
ISBN 13 : 9781139437431
Total Pages : 1022 pages
Book Rating : 4.4/5 (374 download)

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Book Synopsis Testing of Digital Systems by : N. K. Jha

Download or read book Testing of Digital Systems written by N. K. Jha and published by Cambridge University Press. This book was released on 2003-05-08 with total page 1022 pages. Available in PDF, EPUB and Kindle. Book excerpt: Device testing represents the single largest manufacturing expense in the semiconductor industry, costing over $40 billion a year. The most comprehensive and wide ranging book of its kind, Testing of Digital Systems covers everything you need to know about this vitally important subject. Starting right from the basics, the authors take the reader through automatic test pattern generation, design for testability and built-in self-test of digital circuits before moving on to more advanced topics such as IDDQ testing, functional testing, delay fault testing, memory testing, and fault diagnosis. The book includes detailed treatment of the latest techniques including test generation for various fault models, discussion of testing techniques at different levels of integrated circuit hierarchy and a chapter on system-on-a-chip test synthesis. Written for students and engineers, it is both an excellent senior/graduate level textbook and a valuable reference.

Digital Logic Design

Author : Brian Holdsworth
Publisher : Elsevier
ISBN 13 : 0080477305
Total Pages : 535 pages
Book Rating : 4.0/5 (84 download)

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Book Synopsis Digital Logic Design by : Brian Holdsworth

Download or read book Digital Logic Design written by Brian Holdsworth and published by Elsevier. This book was released on 2002-11-01 with total page 535 pages. Available in PDF, EPUB and Kindle. Book excerpt: New, updated and expanded topics in the fourth edition include: EBCDIC, Grey code, practical applications of flip-flops, linear and shaft encoders, memory elements and FPGAs. The section on fault-finding has been expanded. A new chapter is dedicated to the interface between digital components and analog voltages. A highly accessible, comprehensive and fully up to date digital systems text A well known and respected text now revamped for current courses Part of the Newnes suite of texts for HND/1st year modules

Practical Digital Logic Design and Testing

Author : Parag K. Lala
Publisher :
ISBN 13 :
Total Pages : 440 pages
Book Rating : 4.X/5 (2 download)

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Book Synopsis Practical Digital Logic Design and Testing by : Parag K. Lala

Download or read book Practical Digital Logic Design and Testing written by Parag K. Lala and published by . This book was released on 1996 with total page 440 pages. Available in PDF, EPUB and Kindle. Book excerpt: This text presents the essentials of modern logic design. The author conveys key concepts in a clear, informal manner, demonstrating theory through numerous examples to establish a theoretical basis for practical applications. All major topics, including PLD-based digital design, are covered, and detailed coverage of digital logic circuit testing methods critical to successful chip manufacturing, are included. The industry standard PLD programming language ABEL is fully integrated where appropriate. The work also includes coverage of test generation techniques and design methods for testability, a complete discussion of PLD (Programmable Logic Device) based digital design, and coverage of state assignment and minimization explained using computer aided techniques.

Digital Systems Testing and Testable Design

Author : Miron Abramovici
Publisher : Wiley-IEEE Press
ISBN 13 : 9780780310629
Total Pages : 672 pages
Book Rating : 4.3/5 (16 download)

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Book Synopsis Digital Systems Testing and Testable Design by : Miron Abramovici

Download or read book Digital Systems Testing and Testable Design written by Miron Abramovici and published by Wiley-IEEE Press. This book was released on 1994-09-27 with total page 672 pages. Available in PDF, EPUB and Kindle. Book excerpt: This updated printing of the leading text and reference in digital systems testing and testable design provides comprehensive, state-of-the-art coverage of the field. Included are extensive discussions of test generation, fault modeling for classic and new technologies, simulation, fault simulation, design for testability, built-in self-test, and diagnosis. Complete with numerous problems, this book is a must-have for test engineers, ASIC and system designers, and CAD developers, and advanced engineering students will find this book an invaluable tool to keep current with recent changes in the field.

Logic Testing and Design for Testability

Author : Hideo Fujiwara
Publisher : MIT Press (MA)
ISBN 13 : 9780262561990
Total Pages : 298 pages
Book Rating : 4.5/5 (619 download)

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Book Synopsis Logic Testing and Design for Testability by : Hideo Fujiwara

Download or read book Logic Testing and Design for Testability written by Hideo Fujiwara and published by MIT Press (MA). This book was released on 1985-06-01 with total page 298 pages. Available in PDF, EPUB and Kindle. Book excerpt: Today's computers must perform with increasing reliability, which in turn depends onthe problem of determining whether a circuit has been manufactured properly or behaves correctly.However, the greater circuit density of VLSI circuits and systems has made testing more difficultand costly. This book notes that one solution is to develop faster and more efficient algorithms togenerate test patterns or use design techniques to enhance testability - that is, "design fortestability." Design for testability techniques offer one approach toward alleviating this situationby adding enough extra circuitry to a circuit or chip to reduce the complexity of testing. Becausethe cost of hardware is decreasing as the cost of testing rises, there is now a growing interest inthese techniques for VLSI circuits.The first half of the book focuses on the problem of testing:test generation, fault simulation, and complexity of testing. The second half takes up the problemof design for testability: design techniques to minimize test application and/or test generationcost, scan design for sequential logic circuits, compact testing, built-in testing, and variousdesign techniques for testable systems.Hideo Fujiwara is an associate professor in the Department ofElectronics and Communication, Meiji University. Logic Testing and Design for Testability isincluded in the Computer Systems Series, edited by Herb Schwetman.

An Introduction to Logic Circuit Testing

Author : Parag K. Lala
Publisher : Springer Nature
ISBN 13 : 303179785X
Total Pages : 99 pages
Book Rating : 4.0/5 (317 download)

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Book Synopsis An Introduction to Logic Circuit Testing by : Parag K. Lala

Download or read book An Introduction to Logic Circuit Testing written by Parag K. Lala and published by Springer Nature. This book was released on 2022-06-01 with total page 99 pages. Available in PDF, EPUB and Kindle. Book excerpt: An Introduction to Logic Circuit Testing provides a detailed coverage of techniques for test generation and testable design of digital electronic circuits/systems. The material covered in the book should be sufficient for a course, or part of a course, in digital circuit testing for senior-level undergraduate and first-year graduate students in Electrical Engineering and Computer Science. The book will also be a valuable resource for engineers working in the industry. This book has four chapters. Chapter 1 deals with various types of faults that may occur in very large scale integration (VLSI)-based digital circuits. Chapter 2 introduces the major concepts of all test generation techniques such as redundancy, fault coverage, sensitization, and backtracking. Chapter 3 introduces the key concepts of testability, followed by some ad hoc design-for-testability rules that can be used to enhance testability of combinational circuits. Chapter 4 deals with test generation and response evaluation techniques used in BIST (built-in self-test) schemes for VLSI chips. Table of Contents: Introduction / Fault Detection in Logic Circuits / Design for Testability / Built-in Self-Test / References

Digital System Test and Testable Design

Author : Zainalabedin Navabi
Publisher : Springer Science & Business Media
ISBN 13 : 1441975489
Total Pages : 452 pages
Book Rating : 4.4/5 (419 download)

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Book Synopsis Digital System Test and Testable Design by : Zainalabedin Navabi

Download or read book Digital System Test and Testable Design written by Zainalabedin Navabi and published by Springer Science & Business Media. This book was released on 2010-12-10 with total page 452 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book is about digital system testing and testable design. The concepts of testing and testability are treated together with digital design practices and methodologies. The book uses Verilog models and testbenches for implementing and explaining fault simulation and test generation algorithms. Extensive use of Verilog and Verilog PLI for test applications is what distinguishes this book from other test and testability books. Verilog eliminates ambiguities in test algorithms and BIST and DFT hardware architectures, and it clearly describes the architecture of the testability hardware and its test sessions. Describing many of the on-chip decompression algorithms in Verilog helps to evaluate these algorithms in terms of hardware overhead and timing, and thus feasibility of using them for System-on-Chip designs. Extensive use of testbenches and testbench development techniques is another unique feature of this book. Using PLI in developing testbenches and virtual testers provides a powerful programming tool, interfaced with hardware described in Verilog. This mixed hardware/software environment facilitates description of complex test programs and test strategies.

Principles of Testing Electronic Systems

Author : Samiha Mourad
Publisher : John Wiley & Sons
ISBN 13 : 9780471319313
Total Pages : 444 pages
Book Rating : 4.3/5 (193 download)

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Book Synopsis Principles of Testing Electronic Systems by : Samiha Mourad

Download or read book Principles of Testing Electronic Systems written by Samiha Mourad and published by John Wiley & Sons. This book was released on 2000-07-25 with total page 444 pages. Available in PDF, EPUB and Kindle. Book excerpt: A pragmatic approach to testing electronic systems As we move ahead in the electronic age, rapid changes in technology pose an ever-increasing number of challenges in testing electronic products. Many practicing engineers are involved in this arena, but few have a chance to study the field in a systematic way-learning takes place on the job. By covering the fundamental disciplines in detail, Principles of Testing Electronic Systems provides design engineers with the much-needed knowledge base. Divided into five major parts, this highly useful reference relates design and tests to the development of reliable electronic products; shows the main vehicles for design verification; examines designs that facilitate testing; and investigates how testing is applied to random logic, memories, FPGAs, and microprocessors. Finally, the last part offers coverage of advanced test solutions for today's very deep submicron designs. The authors take a phenomenological approach to the subject matter while providing readers with plenty of opportunities to explore the foundation in detail. Special features include: * An explanation of where a test belongs in the design flow * Detailed discussion of scan-path and ordering of scan-chains * BIST solutions for embedded logic and memory blocks * Test methodologies for FPGAs * A chapter on testing system on a chip * Numerous references

Simulation in the Design of Digital Electronic Systems

Author : John B. Gosling
Publisher : Cambridge University Press
ISBN 13 : 9780521426725
Total Pages : 302 pages
Book Rating : 4.4/5 (267 download)

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Book Synopsis Simulation in the Design of Digital Electronic Systems by : John B. Gosling

Download or read book Simulation in the Design of Digital Electronic Systems written by John B. Gosling and published by Cambridge University Press. This book was released on 1993-10-29 with total page 302 pages. Available in PDF, EPUB and Kindle. Book excerpt: This description of the structure of simulators suitable for use in the design of digital electronic systems includes the compiled code and event driven algorithms for digital electronic system simulators, together with timing verification as well as structural limitations and problems.

Simulation and Optimization of Digital Circuits

Author : Vazgen Melikyan
Publisher : Springer
ISBN 13 : 3319716379
Total Pages : 365 pages
Book Rating : 4.3/5 (197 download)

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Book Synopsis Simulation and Optimization of Digital Circuits by : Vazgen Melikyan

Download or read book Simulation and Optimization of Digital Circuits written by Vazgen Melikyan and published by Springer. This book was released on 2018-04-12 with total page 365 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book describes new, fuzzy logic-based mathematical apparatus, which enable readers to work with continuous variables, while implementing whole circuit simulations with speed, similar to gate-level simulators and accuracy, similar to circuit-level simulators. The author demonstrates newly developed principles of digital integrated circuit simulation and optimization that take into consideration various external and internal destabilizing factors, influencing the operation of digital ICs. The discussion includes factors including radiation, ambient temperature, electromagnetic fields, and climatic conditions, as well as non-ideality of interconnects and power rails.

Digital Circuit Testing

Author : Francis C. Wang
Publisher : Academic Press
ISBN 13 : 9780127345802
Total Pages : 266 pages
Book Rating : 4.3/5 (458 download)

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Book Synopsis Digital Circuit Testing by : Francis C. Wang

Download or read book Digital Circuit Testing written by Francis C. Wang and published by Academic Press. This book was released on 1991-07-28 with total page 266 pages. Available in PDF, EPUB and Kindle. Book excerpt: Recent technological advances have created a testing crisis in the electronics industry--smaller, more highly integrated electronic circuits and new packaging techniques make it increasingly difficult to physically access test nodes. New testing methods are needed for the next generation of electronic equipment and a great deal of emphasis is being placed on the development of these methods. Some of the techniques now becoming popular include design for testability (DFT), built-in self-test (BIST), and automatic test vector generation (ATVG). This book will provide a practical introduction to these and other testing techniques. For each technique introduced, the author provides real-world examples so the reader can achieve a working knowledge of how to choose and apply these increasingly important testing methods.

VLSI Testing

Author : Stanley Leonard Hurst
Publisher : IET
ISBN 13 : 9780852969014
Total Pages : 560 pages
Book Rating : 4.9/5 (69 download)

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Book Synopsis VLSI Testing by : Stanley Leonard Hurst

Download or read book VLSI Testing written by Stanley Leonard Hurst and published by IET. This book was released on 1998 with total page 560 pages. Available in PDF, EPUB and Kindle. Book excerpt: Hurst, an editor at the Microelectronics Journal, analyzes common problems that electronics engineers and circuit designers encounter while testing integrated circuits and the systems in which they are used, and explains a variety of solutions available for overcoming them in both digital and mixed circuits. Among his topics are faults in digital circuits, generating a digital test pattern, signatures and self-tests, structured design for testability, testing structured digital circuits and microprocessors, and financial aspects of testing. The self- contained reference is also suitable as a textbook in a formal course on the subject. Annotation copyrighted by Book News, Inc., Portland, OR

Digital Design

Author : Frank Vahid
Publisher : John Wiley & Sons
ISBN 13 :
Total Pages : 558 pages
Book Rating : 4.:/5 (318 download)

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Book Synopsis Digital Design by : Frank Vahid

Download or read book Digital Design written by Frank Vahid and published by John Wiley & Sons. This book was released on 2006 with total page 558 pages. Available in PDF, EPUB and Kindle. Book excerpt: "Digital Design provides a modern approach to learning the increasingly important topic of digital systems design. The text's focus on register-transfer-level design and present-day applications not only leads to a better appreciation of computers and of today's ubiquitous digital devices, but also provides for a better understanding of careers involving digital design and embedded system design. The book's key features include: An emphasis on register-transfer-level (RTL) design, the level at which most digital design is practiced today, giving readers a modern perspective of the field's applicability. Yet, coverage stays bottom-up and concrete, starting from basic transistors and gates, and moving step-by-step up to more complex components. Extensive use of basic examples to teach and illustrate new concepts, and of application examples, such as pacemakers, ultrasound machines, automobiles, and cell phones, to demonstrate the immediate relevance of the concepts. Separation of basic design from optimization, allowing development of a solid understanding of basic design, before considering the more advanced topic of optimization. Flexible organization, enabling early or late coverage of optimization methods or of HDLs, and enabling choice of VHDL, Verilog, or SystemC HDLs. Career insights and advice from designers with varying levels of experience. A clear bottom-up description of field-programmable gate arrays (FPGAs). About the Author: Frank Vahid is a Professor of Computer Science & Engineering at the University of California, Riverside. He holds Electrical Engineering and Computer Science degrees; has worked/consulted for Hewlett Packard, AMCC, NEC, Motorola, and medical equipment makers; holds 3 U.S. patents; has received several teaching awards; helped setup UCR's Computer Engineering program; has authored two previous textbooks; and has published over 120 papers on digital design topics (automation, architecture, and low-power).

Design, Analysis and Test of Logic Circuits Under Uncertainty

Author : Smita Krishnaswamy
Publisher : Springer Science & Business Media
ISBN 13 : 9048196434
Total Pages : 130 pages
Book Rating : 4.0/5 (481 download)

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Book Synopsis Design, Analysis and Test of Logic Circuits Under Uncertainty by : Smita Krishnaswamy

Download or read book Design, Analysis and Test of Logic Circuits Under Uncertainty written by Smita Krishnaswamy and published by Springer Science & Business Media. This book was released on 2012-09-21 with total page 130 pages. Available in PDF, EPUB and Kindle. Book excerpt: Logic circuits are becoming increasingly susceptible to probabilistic behavior caused by external radiation and process variation. In addition, inherently probabilistic quantum- and nano-technologies are on the horizon as we approach the limits of CMOS scaling. Ensuring the reliability of such circuits despite the probabilistic behavior is a key challenge in IC design---one that necessitates a fundamental, probabilistic reformulation of synthesis and testing techniques. This monograph will present techniques for analyzing, designing, and testing logic circuits with probabilistic behavior.