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Author :
Publisher : DIANE Publishing
ISBN 13 : 9781422329931
Total Pages : 10 pages
Book Rating : 4.3/5 (299 download)
Download or read book Diffraction Line Broadening Analysis written by and published by DIANE Publishing. This book was released on with total page 10 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Gubicza, Jen?
Publisher : IGI Global
ISBN 13 : 1466658533
Total Pages : 359 pages
Book Rating : 4.4/5 (666 download)
Download or read book X-Ray Line Profile Analysis in Materials Science written by Gubicza, Jen? and published by IGI Global. This book was released on 2014-03-31 with total page 359 pages. Available in PDF, EPUB and Kindle. Book excerpt: X-ray line profile analysis is an effective and non-destructive method for the characterization of the microstructure in crystalline materials. Supporting research in the area of x-ray line profile analysis is necessary in promoting further developments in this field. X-Ray Line Profile Analysis in Materials Science aims to synthesize the existing knowledge of the theory, methodology, and applications of x-ray line profile analysis in real-world settings. This publication presents both the theoretical background and practical implementation of x-ray line profile analysis and serves as a reference source for engineers in various disciplines as well as scholars and upper-level students.
Author : Eric J. Mittemeijer
Publisher : Springer Science & Business Media
ISBN 13 : 3662067234
Total Pages : 557 pages
Book Rating : 4.6/5 (62 download)
Download or read book Diffraction Analysis of the Microstructure of Materials written by Eric J. Mittemeijer and published by Springer Science & Business Media. This book was released on 2013-11-21 with total page 557 pages. Available in PDF, EPUB and Kindle. Book excerpt: Overview of diffraction methods applied to the analysis of the microstructure of materials. Since crystallite size and the presence of lattice defects have a decisive influence on the properties of many engineering materials, information about this microstructure is of vital importance in developing and assessing materials for practical applications. The most powerful and usually non-destructive evaluation techniques available are X-ray and neutron diffraction. The book details, among other things, diffraction-line broadening methods for determining crystallite size and atomic-scale strain due, e.g. to dislocations, and methods for the analysis of residual (macroscale) stress. The book assumes only a basic knowledge of solid-state physics and supplies readers sufficient information to apply the methods themselves.
Author : Robert L. Snyder
Publisher : International Union of Crystal
ISBN 13 : 9780198501893
Total Pages : 785 pages
Book Rating : 4.5/5 (18 download)
Download or read book Defect and Microstructure Analysis by Diffraction written by Robert L. Snyder and published by International Union of Crystal. This book was released on 1999 with total page 785 pages. Available in PDF, EPUB and Kindle. Book excerpt: Defect and Microstructure Analysis by Diffraction is focused on extracting information on the real structure of materials from their diffraction patterns. The primary features of a powder diffraction pattern are determined by the "idealized" periodic nature of the crystal structure. With theadvent of computer automation the techniques for carrying out qualitative, quantitative and structure analysis based on the primary pattern features rapidly matured. In general, the deviations of a particular specimen, from the ideal or perfect crystal structure, cause diffraction peak profiles tobroaden and sometimes to become asymmetric. Thus, information on the real structure or microstructure of a specimen can be obtained from a careful study of the diffraction line profiles. The evolving techniques for microstructure analysis from diffraction patterns such as micro-strain, crystallitesize, macro-strain and preferred orientation analysis require an ever more detailed understanding of the effects of crystallographic mistakes on peak assymmetry and the effect of the distribution of small crystallites on the tails of diffraction peaks. This book provides a comprehensive analysis ofthe fundamental theory and techniques for microstructure analysis from diffraction patterns and summarizes the current state of the art. This complete survey lays the foundation for the next and last major development in this field: the extraction of the full information in a powder pattern by thesimulation of the full experimental pattern. The goal of this branch of science is to extract all of the information locked in the powder diffraction pattern including: the types and densities of stacking faults, the strain field produced by each, the anisotropic crystallite size and orientation,along with the size and strain distributions of each phase in a specimen. This book provides a complete summary of the developments of the twentieth century and points the way.
Author : F. C. Matacotta
Publisher : World Scientific
ISBN 13 : 9810221932
Total Pages : 369 pages
Book Rating : 4.8/5 (12 download)
Download or read book Science and Technology of Thin Films written by F. C. Matacotta and published by World Scientific. This book was released on 1995 with total page 369 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book brings together detailed discussions by leading experts on the various innovative aspects of thin films growth, deposition and characterization techniques, and new thin film materials and devices. It addresses through the different viewpoints of the contributors, the major problem of thin films science - the relation between the energy of the condensing species and the resulting properties of the films. Some of the issues considered include energetic condensation, bombardment stabilization, pulsed electron beam ablation, orientation and self-organization of organic, ferroelectric and nanoparticle thin films. Several chapters focus on applications such as the recent developments in organic optoelectronics, large area electronic technology and superconducting thin film devices.
Author : Peter Brouwer
Publisher :
ISBN 13 : 9789090167589
Total Pages : 71 pages
Book Rating : 4.1/5 (675 download)
Download or read book Theory of XRF : getting acquainted with the principles written by Peter Brouwer and published by . This book was released on 2006 with total page 71 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Robert Alan Young
Publisher : International Union of Crystallography
ISBN 13 :
Total Pages : 316 pages
Book Rating : 4.F/5 ( download)
Download or read book The Rietveld Method written by Robert Alan Young and published by International Union of Crystallography. This book was released on 1995 with total page 316 pages. Available in PDF, EPUB and Kindle. Book excerpt: The Rietveld method is a powerful and relatively new method for extracting detailed crystal structural information from X-ray and neutron powder diffraction data. Since then structural details dictate much of the physical and chemical attributes of materials, knowledge of them is crucial toour understanding of those properties and our ability to manipulate them. Since most materials of technological interest are not available as single crystals but often are available only in polycrystalline or powder form, the Rietveld method has become very important and is now widely used in allbranches of science that deal with materials at the atomic level.
Author :
Publisher : DIANE Publishing
ISBN 13 : 9781422318324
Total Pages : 18 pages
Book Rating : 4.3/5 (183 download)
Download or read book Powder Diffraction written by and published by DIANE Publishing. This book was released on 1995 with total page 18 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : David L. Bish
Publisher : Walter de Gruyter GmbH & Co KG
ISBN 13 : 1501509012
Total Pages : 384 pages
Book Rating : 4.5/5 (15 download)
Download or read book Modern Powder Diffraction written by David L. Bish and published by Walter de Gruyter GmbH & Co KG. This book was released on 2018-12-17 with total page 384 pages. Available in PDF, EPUB and Kindle. Book excerpt: Volume 20 of Reviews in Mineralogy attempted to: (1) provide examples illustrating the state-of-the-art in powder diffraction, with emphasis on applications to geological materials; (2) describe how to obtain high-quality powder diffraction data; and (3) show how to extract maximum information from available data. In particular, the nonambient experiments are examples of some of the new and exciting areas of study using powder diffraction, and the interested reader is directed to the rapidly growing number of published papers on these subjects. Powder diffraction has evolved to a point where considerable information can be obtained from ug-sized samples, where detection limits are in the hundreds of ppm range, and where useful data can be obtained in milliseconds to microseconds. We hope that the information in this volume will increase the reader's access to the considerable amount of information contained in typical diffraction data.
Author : Emil Zolotoyabko
Publisher : John Wiley & Sons
ISBN 13 : 3527681183
Total Pages : 299 pages
Book Rating : 4.5/5 (276 download)
Download or read book Basic Concepts of X-Ray Diffraction written by Emil Zolotoyabko and published by John Wiley & Sons. This book was released on 2014-02-10 with total page 299 pages. Available in PDF, EPUB and Kindle. Book excerpt: Authored by a university professor deeply involved in X-ray diffraction-related research, this textbook is based on his lectures given to graduate students for more than 20 years. It adopts a well-balanced approach, describing basic concepts and experimental techniques, which make X-ray diffraction an unsurpassed method for studying the structure of materials. Both dynamical and kinematic X-ray diffraction is considered from a unified viewpoint, in which the dynamical diffraction in single-scattering approximation serves as a bridge between these two parts. The text emphasizes the fundamental laws that govern the interaction of X-rays with matter, but also covers in detail classical and modern applications, e.g., line broadening, texture and strain/stress analyses, X-ray mapping in reciprocal space, high-resolution X-ray diffraction in the spatial and wave vector domains, X-ray focusing, inelastic and time-resolved X-ray scattering. This unique scope, in combination with otherwise hard-to-find information on analytic expressions for simulating X-ray diffraction profiles in thin-film heterostructures, X-ray interaction with phonons, coherent scattering of Mossbauer radiation, and energy-variable X-ray diffraction, makes the book indispensable for any serious user of X-ray diffraction techniques. Compact and self-contained, this textbook is suitable for students taking X-ray diffraction courses towards specialization in materials science, physics, chemistry, or biology. Numerous clear-cut illustrations, an easy-to-read style of writing, as well as rather short, easily digestible chapters all facilitate comprehension.
Author : Arthur James Cochran Wilson
Publisher :
ISBN 13 :
Total Pages : 150 pages
Book Rating : 4.:/5 (319 download)
Download or read book Mathematical Theory of X-ray Powder Diffractometry written by Arthur James Cochran Wilson and published by . This book was released on 1963 with total page 150 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Ismail C. Noyan
Publisher : Springer
ISBN 13 : 1461395704
Total Pages : 286 pages
Book Rating : 4.4/5 (613 download)
Download or read book Residual Stress written by Ismail C. Noyan and published by Springer. This book was released on 2013-03-07 with total page 286 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Henryk Morawiec
Publisher : World Scientific
ISBN 13 : 981281132X
Total Pages : 415 pages
Book Rating : 4.8/5 (128 download)
Download or read book Applied Crystallography written by Henryk Morawiec and published by World Scientific. This book was released on 2001 with total page 415 pages. Available in PDF, EPUB and Kindle. Book excerpt: This proceedings volume contains research data from structural investigation of materials of high industrial value. Contents: Determination of Crystal Structure from Powder Diffraction by Rietveld Method; Development of Methods and Techniques in X-Ray, Electron and Neutron Diffraction; Crystallography of Phase Transformation, Martensitic Transformation in Shape Memory Alloys; Texture Studies, Defect Structure and Microstructure Characterisation; Material Structure: Metals, Ceramic, Polymers, Amorphous Materials, Nanomaterials and Thin Films. Readership: Graduate students and researchers in crystallography and materials science.
Author : Mario Birkholz
Publisher : John Wiley & Sons
ISBN 13 : 3527607048
Total Pages : 378 pages
Book Rating : 4.5/5 (276 download)
Download or read book Thin Film Analysis by X-Ray Scattering written by Mario Birkholz and published by John Wiley & Sons. This book was released on 2006-05-12 with total page 378 pages. Available in PDF, EPUB and Kindle. Book excerpt: With contributions by Paul F. Fewster and Christoph Genzel While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the 21st century are driven by the materials science of thin films. Very much an interdisciplinary field, chemists, biochemists, materials scientists, physicists and engineers all have a common interest in thin films and their manifold uses and applications. Grain size, porosity, density, preferred orientation and other properties are important to know: whether thin films fulfill their intended function depends crucially on their structure and morphology once a chemical composition has been chosen. Although their backgrounds differ greatly, all the involved specialists a profound understanding of how structural properties may be determined in order to perform their respective tasks in search of new and modern materials, coatings and functions. The author undertakes this in-depth introduction to the field of thin film X-ray characterization in a clear and precise manner.
Author : E. Yasuda
Publisher : Elsevier
ISBN 13 : 0080528538
Total Pages : 584 pages
Book Rating : 4.0/5 (85 download)
Download or read book Carbon Alloys written by E. Yasuda and published by Elsevier. This book was released on 2003-03-05 with total page 584 pages. Available in PDF, EPUB and Kindle. Book excerpt: In recent years the Japanese have funded a comprehensive study of carbon materials which incorporate other elements including boron, nitrogen and fluorine, hence the title of the project "Carbon Alloys".Coined in 1992, the phrase "Carbon Alloys" can be applied to those materials mainly composed of carbon materials in multi-component systems. The carbon atoms of each component have a physical and/or chemical interactive relationship with other atoms or compounds. The carbon atoms of the components may have different hybrid bonding orbitals to create quite different carbon components.Eiichi Yasuda and his team consider the definition of Carbon Alloys, present the results of the Carbon Alloys projects, describe typical Carbon Alloys and their uses, discuss recent techniques for their characterization, and finally, illustrate potential applications and future developments for Carbon Alloy science. The book contains over thirty chapters on these studies from as many researchers.The most modern of techniques, particularly in the area of spectroscopy, were used as diagnostic tools, and many of these are applicable to pure carbons also. Porosity in carbons received considerable attention.
Author : Robert E. Dinnebier
Publisher : Walter de Gruyter GmbH & Co KG
ISBN 13 : 3110461382
Total Pages : 348 pages
Book Rating : 4.1/5 (14 download)
Download or read book Rietveld Refinement written by Robert E. Dinnebier and published by Walter de Gruyter GmbH & Co KG. This book was released on 2018-12-17 with total page 348 pages. Available in PDF, EPUB and Kindle. Book excerpt: Almost 50 years have passed since the famous papers of Hugo Rietveld from the late sixties where he describes a method for the refinement of crystal structures from neutron powder diffraction data. Soon after, the potential of the method for laboratory X-ray powder diffraction was discovered. Although the method is now widely accepted, there are still many pitfalls in the theoretical understanding and in practical daily use. This book closes the gap with a theoretical introduction for each chapter followed by a practical approach. The flexible macro type language of the Topas Rietveld software can be considered as the defacto standard.
Author : V. Hauk
Publisher : Elsevier
ISBN 13 : 008054195X
Total Pages : 655 pages
Book Rating : 4.0/5 (85 download)
Download or read book Structural and Residual Stress Analysis by Nondestructive Methods written by V. Hauk and published by Elsevier. This book was released on 1997-11-10 with total page 655 pages. Available in PDF, EPUB and Kindle. Book excerpt: The field of stress analysis has gained its momentum from the widespread applications in industry and technology and has now become an important part of materials science. Various destructive as well as nondestructive methods have been developed for the determination of stresses. This timely book provides a comprehensive review of the nondestructive techniques for strain evaluation written by experts in their respective fields.The main part of the book deals with X-ray stress analysis (XSA), focussing on measurement and evaluation methods which can help to solve the problems of today, the numerous applications of metallic, polymeric and ceramic materials as well as of thin-film-substrate composites and of advanced microcomponents. Furthermore it contains data, results, hints and recommendations that are valuable to laboratories for the certification and accreditation of their stress analysis.Stress analysis is an active field in which many questions remain unsettled. Accordingly, unsolved problems and conflicting results are discussed as well. The assessment of the experimentally determined residual and structural stress states on the static and dynamic behavior of materials and components is handled in a separate chapter.Students and engineers of materials science and scientists working in laboratories and industries will find this book invaluable.
