Read Books Online and Download eBooks, EPub, PDF, Mobi, Kindle, Text Full Free.
Development Of X Ray Diffraction Imaging Techniques For The Quasi In Situ Characterization Of Crystal Defects
Download Development Of X Ray Diffraction Imaging Techniques For The Quasi In Situ Characterization Of Crystal Defects full books in PDF, epub, and Kindle. Read online Development Of X Ray Diffraction Imaging Techniques For The Quasi In Situ Characterization Of Crystal Defects ebook anywhere anytime directly on your device. Fast Download speed and no annoying ads. We cannot guarantee that every ebooks is available!
Book Synopsis Development of X-Ray Diffraction Imaging Techniques for the Quasi in Situ Characterization of Crystal Defects by : Simon Bode
Download or read book Development of X-Ray Diffraction Imaging Techniques for the Quasi in Situ Characterization of Crystal Defects written by Simon Bode and published by . This book was released on 2022* with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Characterization of Crystal Growth Defects by X-Ray Methods by : B.K. Tanner
Download or read book Characterization of Crystal Growth Defects by X-Ray Methods written by B.K. Tanner and published by Springer Science & Business Media. This book was released on 2013-04-17 with total page 615 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book contains the proceedings of a NATO Advanced Study Institute entitled "Characterization of Crystal Growth Defects by X-ray Methods' held in the University of Durham, England from 29th August to 10th September 1979. The current interest in electronic materials, in particular silicon, gallium aluminium arsenide, and quartz, and the recent availability of synchrotron radiation for X-ray diffraction studies made this Advanced Study Institute particularly timely. Two main themes ran through the course: 1. A survey of the various types of defect occurring in crystal growth, the mechanism of their different methods of generation and their influence on the properties of relativelY perfect crystals. 2. A detailed and advanced course on the observation and characterization of such defects by X-ray methods. The main emphasis was on X-ray topographic techniques but a substantial amount of time was spent on goniometric techniques such as double crystal diffractometry and gamma ray diffraction. The presentation of material in this book reflects these twin themes. Section A is concerned with defects, Section C with techniques and in linking them. Section B provides a concise account of the basic theory necessary for the interpretation of X-ray topographs and diffractometric data. Although the sequence follows roughly the order of presentation at the Advanced Study Institute certain major changes have been made in order to improve the pedagogy. In particular, the first two chapters provide a vital, and seldom articulated, case for the need for characterization for crystals used in device technologies.
Book Synopsis Diffraction and Imaging Techniques in Material Science P2 by : S Amelinckx
Download or read book Diffraction and Imaging Techniques in Material Science P2 written by S Amelinckx and published by Elsevier. This book was released on 2012-12-02 with total page 412 pages. Available in PDF, EPUB and Kindle. Book excerpt: Diffraction and Imaging Techniques in Material Science reviews recent developments in diffraction and imaging techniques used in the study of materials. It discusses advances in high-voltage electron microscopy, low-energy electron diffraction (LEED), X-ray and neutron diffraction, X-ray topography, mirror electron microscopy, and field emission microscopy. Organized into five parts encompassing nine chapters, this volume begins with an overview of the dynamical theory of the diffraction of high-energy electrons in crystals and methodically introduces the reader to dynamical diffraction in perfect and imperfect crystals, inelastic scattering of electrons in crystals, and X-ray production. It then explores back scattering effects, the technical features of high-voltage electron microscopes, and surface characterization by LEED. Other chapters focus on the kinematical theory of X-ray diffraction, techniques and interpretation in X-ray topography, and interpretation of the contrast of the images of defects on X-ray topographs. The book also describes theory and applications of mirror electron microscopy, surface studies by field emission of electrons, field ionization and field evaporation, and gas-surface interactions before concluding with a discussion on lattice imperfections. Scientists and students taking courses on diffraction and solid-state electron microscopy will benefit from this book.
Book Synopsis X-Ray Diffraction Topography by : B. K. Tanner
Download or read book X-Ray Diffraction Topography written by B. K. Tanner and published by Elsevier. This book was released on 2013-10-22 with total page 189 pages. Available in PDF, EPUB and Kindle. Book excerpt: X-Ray Diffraction Topography presents an elementary treatment of X-ray topography which is comprehensible to the non-specialist. It discusses the development of the principles and application of the subject matter. X-ray topography is the study of crystals which use x-ray diffraction. Some of the topics covered in the book are the basic dynamical x-ray diffraction theory, the Berg-Barrett method, Lang's method, double crystal methods, the contrast on x-ray topography, and the analysis of crystal defects and distortions. The crystals grown from solution are covered. The naturally occurring crystals are discussed. The text defines the meaning of melt, solid state and vapour growth. An analysis of the properties of inorganic crystals is presented. A chapter of the volume is devoted to the characteristics of metals. Another section of the book focuses on the production of ice crystals and the utilization of oxides as laser materials. The book will provide useful information to chemists, scientists, students and researchers.
Book Synopsis Development of a New in Situ X-ray Diffraction Technique for Characterising Embedded Nanoparticles by : Nadia Alexandrovna Zatsepin
Download or read book Development of a New in Situ X-ray Diffraction Technique for Characterising Embedded Nanoparticles written by Nadia Alexandrovna Zatsepin and published by . This book was released on 2010 with total page 210 pages. Available in PDF, EPUB and Kindle. Book excerpt: A new non-destructive, high resolution X-ray diffraction technique is developed for the characterisation of ensembles of embedded nanoparticles. The method is based on reciprocal space mapping using an analyser crystal, making it sensitive to very low diffraction contrast between nanoparticles and their surrounds, and capable of encompassing a large volume, representative of the bulk material. The robustness of the technique is demonstrated by its lack of dependence on the X-ray coherence volume and optical stability. In addition, the use of a counting detector provides the necessary high dynamic range, and avoids the restrictions imposed by the finite pixelsize of a direct space detector and loss of information due to a beamstop. We review the most widely used techniques for imaging on the nanometre scale and highlight their unique capabilities. We then demonstrate that no single technique alone is sufficient for model independent, non-destructive, nanoscale characterisation of embedded nanoparticles in a bulk material sample. In situ and real-time investigations are imperative for the understanding, and ultimately the control of nanoparticle nucleation and growth in technologically important alloys, colloidal suspensions and various nanomaterial specimens. In this thesis we make significantprogress in addressing this crucial omission. We begin by presenting the particulars of scalar diffraction theory that enable us to mathematically describe kinematic diffraction from large ensembles of nanoparticles embedded in a matrix. The requirements of X-ray optics are then discussed, from the pertinent properties of synchrotron X-ray sources through high quality analysing and monochromating crystals. A method of simulating Fraunhofer diffraction and reciprocal space maps from a large, sparse ensemble of weakly diffracting Al-Cu nanoparticles is deduced from elementary coherence considerations. We then demonstrate that quantitative information regarding the nanoparticle ensemble polydispersity can be extracted from thereconstructions of nanoparticles from the Fraunhofer diffraction patterns of numerous such ensembles. In simulated reciprocal space maps we examine the effects of nanoparticle ensemble polydispersity and nanoparticle orientation with respect to the diffraction plane. Experimentally obtained reciprocal space maps of diffracted intensity from nanoparticles in an Al-Cu alloy are then presented, demonstrating the sensitivity of the technique to weakly diffracting embedded nanoparticles and their orientation relative to the diffraction plane. Here we also present the results of an iterative algorithm applied to reconstruct, with
Book Synopsis Fifty Years of X-Ray Diffraction by : P.P. Ewald
Download or read book Fifty Years of X-Ray Diffraction written by P.P. Ewald and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 735 pages. Available in PDF, EPUB and Kindle. Book excerpt: Origin, Scope, and Plan of this Book In July 1962 the fiftieth anniversary of Max von Laue's discovery of the Diffraction of X-rays by crystals is going to be celebrated in Munich by a large international group of crystallographers, physi cists, chemists, spectroscopists, biologists, industrialists, and many others who are employing the methods based on Laue's discovery for their own research. The invitation for this celebration will be issued jointly by the Ludwig Maximilian University of Munich, where the discovery was made, by the Bavarian Academy of Sciences, where it was first made public, and by the International Union of Crystallo graphy, which is the international organization of the National Committees of Crystallography formed in some 30 countries to repre sent and advance the interests of the 3500 research workers in this field. The year 1912 also is the birth year of two branches of the physical sciences which developed promptly from Laue's discovery, namely X-ray Crystal Structure Analysis which is most closely linked to the names ofW. H. (Sir William) Bragg and W. L. (Sir Lawrence) Bragg, and X-ray Spectroscopy which is associated with the names of W. H. Bragg, H. G. J. Moseley, M. de Broglie and Manne Siegbahn. Crystal Structure Analysis began in November 1912 with the first papers ofW. L. Bragg, then still a student in Cambridge, in which, by analysis of the Laue diagrams _of zinc blende, he determined the correct lattice upon which the structure of this crystal is built.
Book Synopsis Defect and Microstructure Analysis by Diffraction by : Robert L. Snyder
Download or read book Defect and Microstructure Analysis by Diffraction written by Robert L. Snyder and published by International Union of Crystal. This book was released on 1999 with total page 785 pages. Available in PDF, EPUB and Kindle. Book excerpt: Defect and Microstructure Analysis by Diffraction is focused on extracting information on the real structure of materials from their diffraction patterns. The primary features of a powder diffraction pattern are determined by the "idealized" periodic nature of the crystal structure. With theadvent of computer automation the techniques for carrying out qualitative, quantitative and structure analysis based on the primary pattern features rapidly matured. In general, the deviations of a particular specimen, from the ideal or perfect crystal structure, cause diffraction peak profiles tobroaden and sometimes to become asymmetric. Thus, information on the real structure or microstructure of a specimen can be obtained from a careful study of the diffraction line profiles. The evolving techniques for microstructure analysis from diffraction patterns such as micro-strain, crystallitesize, macro-strain and preferred orientation analysis require an ever more detailed understanding of the effects of crystallographic mistakes on peak assymmetry and the effect of the distribution of small crystallites on the tails of diffraction peaks. This book provides a comprehensive analysis ofthe fundamental theory and techniques for microstructure analysis from diffraction patterns and summarizes the current state of the art. This complete survey lays the foundation for the next and last major development in this field: the extraction of the full information in a powder pattern by thesimulation of the full experimental pattern. The goal of this branch of science is to extract all of the information locked in the powder diffraction pattern including: the types and densities of stacking faults, the strain field produced by each, the anisotropic crystallite size and orientation,along with the size and strain distributions of each phase in a specimen. This book provides a complete summary of the developments of the twentieth century and points the way.
Book Synopsis Characterization of Crystal Growth Defects by X-Ray Methods (Applications of Communications Theory) by : B. K. Tanner
Download or read book Characterization of Crystal Growth Defects by X-Ray Methods (Applications of Communications Theory) written by B. K. Tanner and published by . This book was released on 2014-01-15 with total page 616 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Characterization of Crystal Growth Defects by X-Ray Methods by : B.K. Tanner
Download or read book Characterization of Crystal Growth Defects by X-Ray Methods written by B.K. Tanner and published by Springer. This book was released on 1981-01-01 with total page 589 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book contains the proceedings of a NATO Advanced Study Institute entitled "Characterization of Crystal Growth Defects by X-ray Methods' held in the University of Durham, England from 29th August to 10th September 1979. The current interest in electronic materials, in particular silicon, gallium aluminium arsenide, and quartz, and the recent availability of synchrotron radiation for X-ray diffraction studies made this Advanced Study Institute particularly timely. Two main themes ran through the course: 1. A survey of the various types of defect occurring in crystal growth, the mechanism of their different methods of generation and their influence on the properties of relativelY perfect crystals. 2. A detailed and advanced course on the observation and characterization of such defects by X-ray methods. The main emphasis was on X-ray topographic techniques but a substantial amount of time was spent on goniometric techniques such as double crystal diffractometry and gamma ray diffraction. The presentation of material in this book reflects these twin themes. Section A is concerned with defects, Section C with techniques and in linking them. Section B provides a concise account of the basic theory necessary for the interpretation of X-ray topographs and diffractometric data. Although the sequence follows roughly the order of presentation at the Advanced Study Institute certain major changes have been made in order to improve the pedagogy. In particular, the first two chapters provide a vital, and seldom articulated, case for the need for characterization for crystals used in device technologies.
Book Synopsis X-ray Diffraction at Elevated Temperatures by : Deborah D. L. Chung
Download or read book X-ray Diffraction at Elevated Temperatures written by Deborah D. L. Chung and published by Wiley-VCH. This book was released on 1993 with total page 288 pages. Available in PDF, EPUB and Kindle. Book excerpt: A textbook for a graduate or undergraduate course in programs such as x-ray diffraction, materials characterization, and thermal analysis. Introduces the principles and instrumentation of x-ray diffraction at elevated temperatures, and its application to crystallography, materials science, chemical and electrical engineering, and other fields. Focusing on intense sources and position-sensitive detectors, describes in-situ phase identification, texture analysis, and grain-size measurement. Annotation copyright by Book News, Inc., Portland, OR
Book Synopsis X-Ray Diffraction by Disordered Lamellar Structures by : Victor A. Drits
Download or read book X-Ray Diffraction by Disordered Lamellar Structures written by Victor A. Drits and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 384 pages. Available in PDF, EPUB and Kindle. Book excerpt: New methods for the determination of the nature, proportion, and distribution of structural defects in microcrystallized lamellar systems are of utmost importance not only to experimentalists but also to theoreticians. Mathematical formalism - indispensable for such analyses - is well-illustrated by various examples, allowing this method to be easily adopted and even to be applied to other solids with lamellar or pseudo-lamellar structures.
Download or read book X-Ray Diffraction written by A. Guinier and published by Courier Corporation. This book was released on 2013-01-17 with total page 404 pages. Available in PDF, EPUB and Kindle. Book excerpt: Exploration of fundamentals of x-ray diffraction theory using Fourier transforms applies general results to various atomic structures, amorphous bodies, crystals, and imperfect crystals. 154 illustrations. 1963 edition.
Book Synopsis X-Ray Diffraction by : Oliver H. Seeck
Download or read book X-Ray Diffraction written by Oliver H. Seeck and published by CRC Press. This book was released on 2015-02-10 with total page 438 pages. Available in PDF, EPUB and Kindle. Book excerpt: High-resolution x-ray diffraction and scattering is a key tool for structure analysis not only in bulk materials but also at surfaces and buried interfaces from the sub-nanometer range to micrometers. This book offers an overview of diffraction and scattering methods currently available at modern synchrotron sources and illustrates bulk and interface investigations of solid and liquid matter with up-to-date research examples. It presents important characteristics of the sources, experimental set-up, and new detector developments. The book also considers future exploitation of x-ray free electron lasers for diffraction applications.
Book Synopsis X-Ray Diffraction Crystallography by : Yoshio Waseda
Download or read book X-Ray Diffraction Crystallography written by Yoshio Waseda and published by Springer Science & Business Media. This book was released on 2011-03-18 with total page 320 pages. Available in PDF, EPUB and Kindle. Book excerpt: X-ray diffraction crystallography for powder samples is a well-established and widely used method. It is applied to materials characterization to reveal the atomic scale structure of various substances in a variety of states. The book deals with fundamental properties of X-rays, geometry analysis of crystals, X-ray scattering and diffraction in polycrystalline samples and its application to the determination of the crystal structure. The reciprocal lattice and integrated diffraction intensity from crystals and symmetry analysis of crystals are explained. To learn the method of X-ray diffraction crystallography well and to be able to cope with the given subject, a certain number of exercises is presented in the book to calculate specific values for typical examples. This is particularly important for beginners in X-ray diffraction crystallography. One aim of this book is to offer guidance to solving the problems of 90 typical substances. For further convenience, 100 supplementary exercises are also provided with solutions. Some essential points with basic equations are summarized in each chapter, together with some relevant physical constants and the atomic scattering factors of the elements.
Book Synopsis X-Ray Diffraction Imaging of Biological Cells by : Masayoshi Nakasako
Download or read book X-Ray Diffraction Imaging of Biological Cells written by Masayoshi Nakasako and published by Springer. This book was released on 2018-03-29 with total page 243 pages. Available in PDF, EPUB and Kindle. Book excerpt: In this book, the author describes the development of the experimental diffraction setup and structural analysis of non-crystalline particles from material science and biology. Recent advances in X-ray free electron laser (XFEL)-coherent X-ray diffraction imaging (CXDI) experiments allow for the structural analysis of non-crystalline particles to a resolution of 7 nm, and to a resolution of 20 nm for biological materials. Now XFEL-CXDI marks the dawn of a new era in structural analys of non-crystalline particles with dimensions larger than 100 nm, which was quite impossible in the 20th century. To conduct CXDI experiments in both synchrotron and XFEL facilities, the author has developed apparatuses, named KOTOBUKI-1 and TAKASAGO-6 for cryogenic diffraction experiments on frozen-hydrated non-crystalline particles at around 66 K. At the synchrotron facility, cryogenic diffraction experiments dramatically reduce radiation damage of specimen particles and allow tomography CXDI experiments. In addition, in XFEL experiments, non-crystalline particles scattered on thin support membranes and flash-cooled can be used to efficiently increase the rate of XFEL pulses. The rate, which depends on the number density of scattered particles and the size of X-ray beams, is currently 20-90%, probably the world record in XFEL-CXDI experiments. The experiment setups and results are introduced in this book. The author has also developed software suitable for efficiently processing of diffraction patterns and retrieving electron density maps of specimen particles based on the diffraction theory used in CXDI.
Book Synopsis Publications of the National Institute of Standards and Technology ... Catalog by : National Institute of Standards and Technology (U.S.)
Download or read book Publications of the National Institute of Standards and Technology ... Catalog written by National Institute of Standards and Technology (U.S.) and published by . This book was released on 1994 with total page 1162 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis CHARACTERIZATION OF CRYSTAL GROWTH DEFECTS BY X-RAY METHODS (Volume 63B). by :
Download or read book CHARACTERIZATION OF CRYSTAL GROWTH DEFECTS BY X-RAY METHODS (Volume 63B). written by and published by . This book was released on 1980 with total page 589 pages. Available in PDF, EPUB and Kindle. Book excerpt:
