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Download or read book Determination of Interface Structure and Bonding by Z-contrast Stem written by and published by . This book was released on 1995 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
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ISBN 13 :
Total Pages : 6 pages
Book Rating : 4.:/5 (685 download)
Download or read book Determination of Interface Structure and Bonding at Atomic Resolution in the Stem written by and published by . This book was released on 1994 with total page 6 pages. Available in PDF, EPUB and Kindle. Book excerpt: The scanning transmission electron microscope now routinely produces probes of atomic dimensions, 2.2Å at 100 kV and 1.3Å at 300 kV. This capability opens up a new strategy for determining the structure and bonding of materials at the atomic scale, which is particularly advantageous for complex interfaces such as grain boundaries. The Z-contrast image allows the high-Z column locations to be determined by direct inspection, and quantified through maximum entropy methods to a positional accuracy of currently (approximately)0.2Å. With the same electron probe, located to sub-Angstrom precision with reference to the Z-contrast image, parallel detection EELS can determine light element coordination from core edge fine structure, in principle around a single atomic column. There are several attractive features to combining Z-contrast imaging with EELS. First, the incoherent nature of Z-contrast imaging provides higher resolution, compared with 0.66 for phase contrast imaging, freedom from contrast reversals and a highly local image. This allows a greatly extended regieme of intuitive image interpretation. For example, the presence of dumbbells, with a spacing of 1.36Å, in a Si110 image is seen directly at 2.2Å resolution from the elongation of the image features. For microanalysis, the Z-contrast image facilitates the accurate placement of the probe over selected atomic columns, either a single atomic column or using a line scan to reduce the effects of beam damage. Column-by-column analysis by EELS is possible, without beam broadening, through the columnar channeling effect that occurs when a highly convergent coherent probe is incident along a low order crystal zone axis.
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ISBN 13 :
Total Pages : 6 pages
Book Rating : 4.:/5 (685 download)
Download or read book Atomic-scale Structure and Chemistry of Interfaces by Z-contrast Imaging and Electron Energy Loss Spectroscopy in the STEM. written by and published by . This book was released on 1993 with total page 6 pages. Available in PDF, EPUB and Kindle. Book excerpt: The macroscopic properties of many materials are controlled by the structure and chemistry at grain boundaries. A basic understanding of the structure-property relationship requires a technique which probes both composition and chemical bonding on an atomic scale. The high-resolution Z-contrast imaging technique in the scanning transmission electron microscope (STEM) forms an incoherent image in which changes in atomic structure and composition can be interpreted intuitively. This direct image allows the electron probe to be positioned over individual atomic columns for parallel detection electron energy loss spectroscopy (EELS) at a spatial resolution approaching 0.22nm. In this paper we have combined the structural information available in the Z-contrast images with the bonding information obtained from the fine structure within the EELS edges to determine the grain boundary structure in a SrTiO3 bicrystal.
Download or read book Direct Experimental Determination of the Atomic Structure at Internal Interfaces written by and published by . This book was released on 2001 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: A crucial first step in understanding the effect that internal interfaces have on the properties of materials is the ability to determine the atomic structure at the interface. As interfaces can contain atomic disorder, dislocations, segregated impurities and interphases, sensitivity to all of these features is essential for complete experimental characterization. By combining Z-contrast imaging and electron energy loss spectroscopy (EELS) in a dedicated scanning transmission electron microscope (STEM), the ability to probe the structure, bonding and composition at interfaces with the necessary atomic resolution has been obtained. Experimental conditions can be controlled to provide, simultaneously, both incoherent imaging and spectroscopy. This enables interface structures observed in the image to be interpreted intuitively and the bonding in a specified atomic column to be probed directly by EELS. The bonding and structure information can then be correlated using bond-valence sum analysis to produce structural models. This technique is demonstrated for 25[degrees], 36[degrees] and 67[degrees] symmetric and 45[degrees] and 25[degrees] asymmetric[001] tilt grain boundaries in SrTiO[sub 3] The structures of both types of boundary were found to contain partially occupied columns in the boundary plane. From these experimental results, a series of structural units were identified which could be combined, using continuity of gain boundary structure principles, to construct all[001] tilt boundaries in SrTiO[sub 3]. Using these models, the ability of this technique to address the issues of vacancies and dopant segregation at grain boundaries in electroceramics is discussed.
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ISBN 13 :
Total Pages : 994 pages
Book Rating : 4.:/5 (31 download)
Download or read book Scientific and Technical Aerospace Reports written by and published by . This book was released on 1995 with total page 994 pages. Available in PDF, EPUB and Kindle. Book excerpt:
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ISBN 13 :
Total Pages : 782 pages
Book Rating : 4.3/5 (129 download)
Download or read book Energy Research Abstracts written by and published by . This book was released on 1995 with total page 782 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Daniele Benoit
Publisher : Springer Science & Business Media
ISBN 13 : 3709165555
Total Pages : 628 pages
Book Rating : 4.7/5 (91 download)
Download or read book Microbeam and Nanobeam Analysis written by Daniele Benoit and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 628 pages. Available in PDF, EPUB and Kindle. Book excerpt: The European Microanalysis Society held its Fourth Workshop in Saint Malo in May 1995. This volume includes the revised presentations, 10 tutorial chapters and 50 brief articles, from leading experts in electron probe microanalysis, secondary mass spectroscopy, analytical electron microscopy, and related fields.
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ISBN 13 :
Total Pages : 1744 pages
Book Rating : 4.:/5 (3 download)
Download or read book Government Reports Annual Index written by and published by . This book was released on 1994 with total page 1744 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : J. Doneker
Publisher : Routledge
ISBN 13 : 1351456466
Total Pages : 552 pages
Book Rating : 4.3/5 (514 download)
Download or read book Defect Recognition and Image Processing in Semiconductors 1997 written by J. Doneker and published by Routledge. This book was released on 2017-11-22 with total page 552 pages. Available in PDF, EPUB and Kindle. Book excerpt: Defect Recognition and Image Processing in Semiconductors 1997 provides a valuable overview of current techniques used to assess, monitor, and characterize defects from the atomic scale to inhomogeneities in complete silicon wafers. This volume addresses advances in defect analyzing techniques and instrumentation and their application to substrates, epilayers, and devices. The book discusses the merits and limits of characterization techniques; standardization; correlations between defects and device performance, including degradation and failure analysis; and the adaptation and application of standard characterization techniques to new materials. It also examines the impressive advances made possible by the increase in the number of nanoscale scanning techniques now available. The book investigates defects in layers and devices, and examines the problems that have arisen in characterizing gallium nitride and silicon carbide.
Author : Zhong-lin Wang
Publisher : Springer Science & Business Media
ISBN 13 : 1461553679
Total Pages : 528 pages
Book Rating : 4.4/5 (615 download)
Download or read book Functional and Smart Materials written by Zhong-lin Wang and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 528 pages. Available in PDF, EPUB and Kindle. Book excerpt: In the search for new functional materials, a clear understanding about the relationship between the physical properties and the atomic-scale structure of materials is needed. Here, the authors provide graduate students and scientists with an in-depth account of the evolutionary behavior of oxide functional materials within specific structural systems, discussing the intrinsic connections among these different structural systems. Over 300 illustrations and key appendices support the text.
Author : S. Kar
Publisher : The Electrochemical Society
ISBN 13 : 1566776511
Total Pages : 550 pages
Book Rating : 4.5/5 (667 download)
Download or read book Physics and Technology of High-k Gate Dielectrics 6 written by S. Kar and published by The Electrochemical Society. This book was released on 2008-10 with total page 550 pages. Available in PDF, EPUB and Kindle. Book excerpt: The issue covers in detail all aspects of the physics and the technology of high dielectric constant gate stacks, including high mobility substrates, novel and still higher permittivity dielectric materials, CMOS processing with high-K layers, metals for gate electrodes, interface issues, physical, chemical, and electrical characterization, gate stack reliability, and DRAM and non-volatile memories.
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ISBN 13 :
Total Pages : 3 pages
Book Rating : 4.:/5 (873 download)
Download or read book Atomic-resolution Characterization of Interface Structure and Chemistry in the STEM. written by and published by . This book was released on 1994 with total page 3 pages. Available in PDF, EPUB and Kindle. Book excerpt: Combination of Z-contrast imaging and EELS (electron energy loss spectroscopy) allows the local structure and chemistry of interfaces to be determined on the atomic scale. In this paper, these two complementary techniques are used to analyze the structure and chemistry of a nominally 25 degree [100] symmetric tilt boundary in an electroceramic SrTiO3 bicrystal.
Author : Bernard Jouffrey
Publisher :
ISBN 13 :
Total Pages : 1094 pages
Book Rating : 4.0/5 ( download)
Download or read book Electron Microscopy 1994: Interdisciplinary developments and tools written by Bernard Jouffrey and published by . This book was released on 1994 with total page 1094 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Daniel M. Fleetwood
Publisher : CRC Press
ISBN 13 : 1420043773
Total Pages : 772 pages
Book Rating : 4.4/5 (2 download)
Download or read book Defects in Microelectronic Materials and Devices written by Daniel M. Fleetwood and published by CRC Press. This book was released on 2008-11-19 with total page 772 pages. Available in PDF, EPUB and Kindle. Book excerpt: Uncover the Defects that Compromise Performance and ReliabilityAs microelectronics features and devices become smaller and more complex, it is critical that engineers and technologists completely understand how components can be damaged during the increasingly complicated fabrication processes required to produce them.A comprehensive survey of defe
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ISBN 13 :
Total Pages : 954 pages
Book Rating : 4.5/5 (31 download)
Download or read book Electron Microscopy written by and published by . This book was released on 1998 with total page 954 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Yves J. Chabal
Publisher : Springer Science & Business Media
ISBN 13 : 3642567118
Total Pages : 269 pages
Book Rating : 4.6/5 (425 download)
Download or read book Fundamental Aspects of Silicon Oxidation written by Yves J. Chabal and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 269 pages. Available in PDF, EPUB and Kindle. Book excerpt: Discusses silicon oxidation in a tutorial fashion from both experimental and theoretical viewpoints. The authors report on the state of the art both at Lucent Technology and in academic research. The book will appeal to researchers and advanced students.
Author : D Williams
Publisher : CRC Press
ISBN 13 : 9780750306850
Total Pages : 546 pages
Book Rating : 4.3/5 (68 download)
Download or read book Microbeam Analysis written by D Williams and published by CRC Press. This book was released on 2000-01-01 with total page 546 pages. Available in PDF, EPUB and Kindle. Book excerpt: Microbeam Analysis provides a major forum for the discussion of the latest microanalysis techniques using electron, ion, and photon beams. The volume contains 250 papers from the leading researchers in this advancing field. Researchers in physics, materials science, and electrical and electronic engineering will find useful information in this volume.
