A Practitioner's Guide to Software Test Design

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Author :
Publisher : Artech House
ISBN 13 : 9781580537322
Total Pages : 328 pages
Book Rating : 4.5/5 (373 download)

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Book Synopsis A Practitioner's Guide to Software Test Design by : Lee Copeland

Download or read book A Practitioner's Guide to Software Test Design written by Lee Copeland and published by Artech House. This book was released on 2004 with total page 328 pages. Available in PDF, EPUB and Kindle. Book excerpt: Written by a leading expert in the field, this unique volume contains current test design approaches and focuses only on software test design. Copeland illustrates each test design through detailed examples and step-by-step instructions.

Practical Test Design

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Author :
Publisher : BCS, The Chartered Institute for IT
ISBN 13 : 9781780174723
Total Pages : 336 pages
Book Rating : 4.1/5 (747 download)

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Book Synopsis Practical Test Design by : Istvan Forgacs

Download or read book Practical Test Design written by Istvan Forgacs and published by BCS, The Chartered Institute for IT. This book was released on 2019-08-28 with total page 336 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents the key test design techniques, in line with ISTQB, and explains the why and when of using them, with practical examples and code snippets. How and why the techniques can be combined is covered, as are automated test design methods. Tips and exercises are included throughout the book.

Linear Models for Optimal Test Design

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Author :
Publisher : Springer Science & Business Media
ISBN 13 : 0387290540
Total Pages : 421 pages
Book Rating : 4.3/5 (872 download)

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Book Synopsis Linear Models for Optimal Test Design by : Wim J. van der Linden

Download or read book Linear Models for Optimal Test Design written by Wim J. van der Linden and published by Springer Science & Business Media. This book was released on 2006-01-01 with total page 421 pages. Available in PDF, EPUB and Kindle. Book excerpt: Wim van der Linden was just given a lifetime achievement award by the National Council on Measurement in Education. There is no one more prominent in the area of educational testing. There are hundreds of computer-based credentialing exams in areas such as accounting, real estate, nursing, and securities, as well as the well-known admissions exams for college, graduate school, medical school, and law school - there is great need on the theory of testing. This book presents the statistical theory and practice behind constructing good tests e.g., how is the first test item selected, how are the next items selected, and when do you have enough items.

Digital System Test and Testable Design

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Author :
Publisher : Springer Science & Business Media
ISBN 13 : 1441975489
Total Pages : 452 pages
Book Rating : 4.4/5 (419 download)

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Book Synopsis Digital System Test and Testable Design by : Zainalabedin Navabi

Download or read book Digital System Test and Testable Design written by Zainalabedin Navabi and published by Springer Science & Business Media. This book was released on 2010-12-10 with total page 452 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book is about digital system testing and testable design. The concepts of testing and testability are treated together with digital design practices and methodologies. The book uses Verilog models and testbenches for implementing and explaining fault simulation and test generation algorithms. Extensive use of Verilog and Verilog PLI for test applications is what distinguishes this book from other test and testability books. Verilog eliminates ambiguities in test algorithms and BIST and DFT hardware architectures, and it clearly describes the architecture of the testability hardware and its test sessions. Describing many of the on-chip decompression algorithms in Verilog helps to evaluate these algorithms in terms of hardware overhead and timing, and thus feasibility of using them for System-on-Chip designs. Extensive use of testbenches and testbench development techniques is another unique feature of this book. Using PLI in developing testbenches and virtual testers provides a powerful programming tool, interfaced with hardware described in Verilog. This mixed hardware/software environment facilitates description of complex test programs and test strategies.

Design Driven Testing

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Author :
Publisher : Apress
ISBN 13 : 1430229446
Total Pages : 359 pages
Book Rating : 4.4/5 (32 download)

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Book Synopsis Design Driven Testing by : Matt Stephens

Download or read book Design Driven Testing written by Matt Stephens and published by Apress. This book was released on 2011-01-11 with total page 359 pages. Available in PDF, EPUB and Kindle. Book excerpt: The groundbreaking book Design Driven Testing brings sanity back to the software development process by flipping around the concept of Test Driven Development (TDD)—restoring the concept of using testing to verify a design instead of pretending that unit tests are a replacement for design. Anyone who feels that TDD is “Too Damn Difficult” will appreciate this book. Design Driven Testing shows that, by combining a forward-thinking development process with cutting-edge automation, testing can be a finely targeted, business-driven, rewarding effort. In other words, you’ll learn how to test smarter, not harder. Applies a feedback-driven approach to each stage of the project lifecycle. Illustrates a lightweight and effective approach using a core subset of UML. Follows a real-life example project using Java and Flex/ActionScript. Presents bonus chapters for advanced DDTers covering unit-test antipatterns (and their opposite, “test-conscious” design patterns), and showing how to create your own test transformation templates in Enterprise Architect.

VLSI Design and Test for Systems Dependability

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Publisher : Springer
ISBN 13 : 4431565949
Total Pages : 792 pages
Book Rating : 4.4/5 (315 download)

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Book Synopsis VLSI Design and Test for Systems Dependability by : Shojiro Asai

Download or read book VLSI Design and Test for Systems Dependability written by Shojiro Asai and published by Springer. This book was released on 2018-07-20 with total page 792 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book discusses the new roles that the VLSI (very-large-scale integration of semiconductor circuits) is taking for the safe, secure, and dependable design and operation of electronic systems. The book consists of three parts. Part I, as a general introduction to this vital topic, describes how electronic systems are designed and tested with particular emphasis on dependability engineering, where the simultaneous assessment of the detrimental outcome of failures and cost of their containment is made. This section also describes the related research project “Dependable VLSI Systems,” in which the editor and authors of the book were involved for 8 years. Part II addresses various threats to the dependability of VLSIs as key systems components, including time-dependent degradations, variations in device characteristics, ionizing radiation, electromagnetic interference, design errors, and tampering, with discussion of technologies to counter those threats. Part III elaborates on the design and test technologies for dependability in such applications as control of robots and vehicles, data processing, and storage in a cloud environment and heterogeneous wireless telecommunications. This book is intended to be used as a reference for engineers who work on the design and testing of VLSI systems with particular attention to dependability. It can be used as a textbook in graduate courses as well. Readers interested in dependable systems from social and industrial–economic perspectives will also benefit from the discussions in this book.

VLSI Test Principles and Architectures

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Author :
Publisher : Elsevier
ISBN 13 : 0080474799
Total Pages : 809 pages
Book Rating : 4.0/5 (84 download)

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Book Synopsis VLSI Test Principles and Architectures by : Laung-Terng Wang

Download or read book VLSI Test Principles and Architectures written by Laung-Terng Wang and published by Elsevier. This book was released on 2006-08-14 with total page 809 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. - Most up-to-date coverage of design for testability. - Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. - Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.

Introduction to Advanced System-on-Chip Test Design and Optimization

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Author :
Publisher : Springer Science & Business Media
ISBN 13 : 0387256245
Total Pages : 397 pages
Book Rating : 4.3/5 (872 download)

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Book Synopsis Introduction to Advanced System-on-Chip Test Design and Optimization by : Erik Larsson

Download or read book Introduction to Advanced System-on-Chip Test Design and Optimization written by Erik Larsson and published by Springer Science & Business Media. This book was released on 2006-03-30 with total page 397 pages. Available in PDF, EPUB and Kindle. Book excerpt: SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. It gives an introduction to testing, describes the problems related to SOC testing, discusses the modeling granularity and the implementation into EDA (electronic design automation) tools. The book is divided into three sections: i) test concepts, ii) SOC design for test, and iii) SOC test applications. The first part covers an introduction into test problems including faults, fault types, design-flow, design-for-test techniques such as scan-testing and Boundary Scan. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling. Finally, the third part focuses on SOC applications, such as integrated test scheduling and TAM design, defect-oriented scheduling, and integrating test design with the core selection process.

Performance Assessments for Adult Education

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Publisher : National Academies Press
ISBN 13 : 0309084539
Total Pages : 132 pages
Book Rating : 4.3/5 (9 download)

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Book Synopsis Performance Assessments for Adult Education by : National Research Council

Download or read book Performance Assessments for Adult Education written by National Research Council and published by National Academies Press. This book was released on 2002-08-01 with total page 132 pages. Available in PDF, EPUB and Kindle. Book excerpt: In the United States, the nomenclature of adult education includes adult literacy, adult secondary education, and English for speakers of other languages (ESOL) services provided to undereducated and limited English proficient adults. Those receiving adult education services have diverse reasons for seeking additional education. With the passage of the WIA, the assessment of adult education students became mandatory-regardless of their reasons for seeking services. The law does allow the states and local programs flexibility in selecting the most appropriate assessment for the student. The purpose of the NRC's workshop was to explore issues related to efforts to measure learning gains in adult basic education programs, with a focus on performance-based assessments.

Design-for-Test and Test Optimization Techniques for TSV-based 3D Stacked ICs

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Author :
Publisher : Springer Science & Business Media
ISBN 13 : 3319023780
Total Pages : 260 pages
Book Rating : 4.3/5 (19 download)

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Book Synopsis Design-for-Test and Test Optimization Techniques for TSV-based 3D Stacked ICs by : Brandon Noia

Download or read book Design-for-Test and Test Optimization Techniques for TSV-based 3D Stacked ICs written by Brandon Noia and published by Springer Science & Business Media. This book was released on 2013-11-19 with total page 260 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book describes innovative techniques to address the testing needs of 3D stacked integrated circuits (ICs) that utilize through-silicon-vias (TSVs) as vertical interconnects. The authors identify the key challenges facing 3D IC testing and present results that have emerged from cutting-edge research in this domain. Coverage includes topics ranging from die-level wrappers, self-test circuits, and TSV probing to test-architecture design, test scheduling, and optimization. Readers will benefit from an in-depth look at test-technology solutions that are needed to make 3D ICs a reality and commercially viable.

Exploratory Software Testing

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Author :
Publisher : Pearson Education
ISBN 13 : 0321647858
Total Pages : 475 pages
Book Rating : 4.3/5 (216 download)

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Book Synopsis Exploratory Software Testing by : James A. Whittaker

Download or read book Exploratory Software Testing written by James A. Whittaker and published by Pearson Education. This book was released on 2009-08-25 with total page 475 pages. Available in PDF, EPUB and Kindle. Book excerpt: How to Find and Fix the Killer Software Bugs that Evade Conventional Testing In Exploratory Software Testing, renowned software testing expert James Whittaker reveals the real causes of today’s most serious, well-hidden software bugs--and introduces powerful new “exploratory” techniques for finding and correcting them. Drawing on nearly two decades of experience working at the cutting edge of testing with Google, Microsoft, and other top software organizations, Whittaker introduces innovative new processes for manual testing that are repeatable, prescriptive, teachable, and extremely effective. Whittaker defines both in-the-small techniques for individual testers and in-the-large techniques to supercharge test teams. He also introduces a hybrid strategy for injecting exploratory concepts into traditional scripted testing. You’ll learn when to use each, and how to use them all successfully. Concise, entertaining, and actionable, this book introduces robust techniques that have been used extensively by real testers on shipping software, illuminating their actual experiences with these techniques, and the results they’ve achieved. Writing for testers, QA specialists, developers, program managers, and architects alike, Whittaker answers crucial questions such as: • Why do some bugs remain invisible to automated testing--and how can I uncover them? • What techniques will help me consistently discover and eliminate “show stopper” bugs? • How do I make manual testing more effective--and less boring and unpleasant? • What’s the most effective high-level test strategy for each project? • Which inputs should I test when I can’t test them all? • Which test cases will provide the best feature coverage? • How can I get better results by combining exploratory testing with traditional script or scenario-based testing? • How do I reflect feedback from the development process, such as code changes?

Integrated Test Design and Automation

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Author :
Publisher : Addison-Wesley Professional
ISBN 13 :
Total Pages : 264 pages
Book Rating : 4.3/5 (91 download)

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Book Synopsis Integrated Test Design and Automation by : Hans Buwalda

Download or read book Integrated Test Design and Automation written by Hans Buwalda and published by Addison-Wesley Professional. This book was released on 2002 with total page 264 pages. Available in PDF, EPUB and Kindle. Book excerpt: Zero-defect software is the holy grail of all development projects, and sophisticated techniques have now emerged to automate the testing process so that high-quality software can be delivered on time and on budget. This practical guide enables readers to understand and apply the TestFrame method -- an open method developed by the authors and their colleagues that is rapidly becoming a standard in the testing industry. With the aid of this book, readers will learn how to: customize the TestFrame method for their organizationsdevelop reusable testing standardsmake optimum use of automated testing toolsreuse and maintain test products IT managers will learn how to improve the control the test process and assess results, and expert testers will learn effective ways of automating test execution in a structured way. 0201737256B10162001

Sprint

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Publisher : Random House
ISBN 13 : 1473526809
Total Pages : 288 pages
Book Rating : 4.4/5 (735 download)

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Book Synopsis Sprint by : Jake Knapp

Download or read book Sprint written by Jake Knapp and published by Random House. This book was released on 2016-03-10 with total page 288 pages. Available in PDF, EPUB and Kindle. Book excerpt: A NEW YORK TIMES and WALL STREET JOURNAL bestseller 'A must read for entrepreneurs of all stripes' - Eric Ries, author of The Lean Startup From three partners at Google Ventures, a unique five-day process for solving tough business problems, proven at more than 100 companies. What’s the most important place to focus your effort? How many meetings and discussions does it take before you can be sure you have the right solution? What will your idea look like in real life? How do you start? Now there’s a surefire way to answer these important questions: the sprint. Designer Jake Knapp created the five-day process at Google, where sprints were used on everything from Google Search to Google X. He joined Braden Kowitz and John Zeratsky at Google Ventures, and together they have completed more than one hundred sprints with companies in mobile, e-commerce, healthcare, finance, and more. A practical guide to answering critical business questions, Sprint is a book for teams of any size, from small startups to Fortune 100s, from teachers to nonprofits. It’s for anyone with a big opportunity, problem, or idea who needs to get answers today.

Handbook of Usability Testing

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Author :
Publisher : John Wiley & Sons
ISBN 13 : 1118080408
Total Pages : 391 pages
Book Rating : 4.1/5 (18 download)

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Book Synopsis Handbook of Usability Testing by : Jeffrey Rubin

Download or read book Handbook of Usability Testing written by Jeffrey Rubin and published by John Wiley & Sons. This book was released on 2011-03-10 with total page 391 pages. Available in PDF, EPUB and Kindle. Book excerpt: Whether it's software, a cell phone, or a refrigerator, your customer wants - no, expects - your product to be easy to use. This fully revised handbook provides clear, step-by-step guidelines to help you test your product for usability. Completely updated with current industry best practices, it can give you that all-important marketplace advantage: products that perform the way users expect. You'll learn to recognize factors that limit usability, decide where testing should occur, set up a test plan to assess goals for your product's usability, and more.

Design and Test of Integrated Inductors for RF Applications

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Author :
Publisher : Springer Science & Business Media
ISBN 13 : 0306487055
Total Pages : 203 pages
Book Rating : 4.3/5 (64 download)

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Book Synopsis Design and Test of Integrated Inductors for RF Applications by : Jaime Aguilera

Download or read book Design and Test of Integrated Inductors for RF Applications written by Jaime Aguilera and published by Springer Science & Business Media. This book was released on 2007-05-08 with total page 203 pages. Available in PDF, EPUB and Kindle. Book excerpt: Intended for engineers who are starting out in the design of integrated inductors, this book describes the whole design flow, basic selection of the geometry and optimisation of the quality by redesigning the geometry, measurement and de-embedding and characterisation.

Essential Software Test Design

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Author :
Publisher :
ISBN 13 : 9789185699032
Total Pages : 292 pages
Book Rating : 4.6/5 (99 download)

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Book Synopsis Essential Software Test Design by : Torbjörn Ryber

Download or read book Essential Software Test Design written by Torbjörn Ryber and published by . This book was released on 2007-12-01 with total page 292 pages. Available in PDF, EPUB and Kindle. Book excerpt: The author is a true test enthusiast who has spoken to several thousand people about testing. The book is the result from many years of teaching test design with the goal of creating a highly useful testbook. It is full of examples from the real world and contains exercises for most of the techniques described. It can be used as class-material or for self studies. From the forewords: This book focuses on test design, and I am glad it does. Design is the intellectual part of testing. It is the puzzle solving part. (James Bach) In this book Torbjorn Ryber has managed to produce a text that is not only useful, but also concise and to-the-point. dEspite beeing kept to a sensible length it still manages to include guest chapters and material from renowned experts in areas such as exploratory testing and combinatorial testing, and understanding is greatly enhanced by the widespreaduse of examples that clearly demonstrates the application of the techniques. (Stuart Reid)

System-on-Chip Test Architectures

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Author :
Publisher : Morgan Kaufmann
ISBN 13 : 0080556809
Total Pages : 893 pages
Book Rating : 4.0/5 (85 download)

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Book Synopsis System-on-Chip Test Architectures by : Laung-Terng Wang

Download or read book System-on-Chip Test Architectures written by Laung-Terng Wang and published by Morgan Kaufmann. This book was released on 2010-07-28 with total page 893 pages. Available in PDF, EPUB and Kindle. Book excerpt: Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today's overall product cost. This book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers, DFT practitioners, and VLSI designers to master quickly System-on-Chip Test architectures, for test debug and diagnosis of digital, memory, and analog/mixed-signal designs. - Emphasizes VLSI Test principles and Design for Testability architectures, with numerous illustrations/examples. - Most up-to-date coverage available, including Fault Tolerance, Low-Power Testing, Defect and Error Tolerance, Network-on-Chip (NOC) Testing, Software-Based Self-Testing, FPGA Testing, MEMS Testing, and System-In-Package (SIP) Testing, which are not yet available in any testing book. - Covers the entire spectrum of VLSI testing and DFT architectures, from digital and analog, to memory circuits, and fault diagnosis and self-repair from digital to memory circuits. - Discusses future nanotechnology test trends and challenges facing the nanometer design era; promising nanotechnology test techniques, including Quantum-Dots, Cellular Automata, Carbon-Nanotubes, and Hybrid Semiconductor/Nanowire/Molecular Computing. - Practical problems at the end of each chapter for students.