Defects in Semiconductors 17

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Publisher : Trans Tech Publications Ltd
ISBN 13 : 3035704813
Total Pages : 1722 pages
Book Rating : 4.0/5 (357 download)

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Book Synopsis Defects in Semiconductors 17 by : Helmut Heinrich

Download or read book Defects in Semiconductors 17 written by Helmut Heinrich and published by Trans Tech Publications Ltd. This book was released on 1993-10-28 with total page 1722 pages. Available in PDF, EPUB and Kindle. Book excerpt: This comprehensive issue presents 297 papers that cover a broad range of topics in the fundamental science of imperfections in semiconductor materials including the creation and/or origin, structure, electronic, optical, thermodynamical and chemical properties of defects, often also with strong relevance to technological problems in semiconductor devices.

Defects in Semiconductors 17

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Publisher : Trans Tech Publications
ISBN 13 :
Total Pages : 444 pages
Book Rating : 4.X/5 (2 download)

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Book Synopsis Defects in Semiconductors 17 by : Helmut Heinrich

Download or read book Defects in Semiconductors 17 written by Helmut Heinrich and published by Trans Tech Publications. This book was released on 1994 with total page 444 pages. Available in PDF, EPUB and Kindle. Book excerpt: This comprehensive issue presents 297 papers that cover a broad range of topics in the fundamental science of imperfections in semiconductor materials, including the creation and/or origin, structure, electronic, optical, thermodynamical and chemical properties of defects, often also with strong relevance to technological problems in semiconductor devices.

Proceedings of the 17th International Conference on Defects in Semiconductors

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Publisher :
ISBN 13 :
Total Pages : 656 pages
Book Rating : 4.X/5 (2 download)

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Book Synopsis Proceedings of the 17th International Conference on Defects in Semiconductors by : Helmut Heinrich

Download or read book Proceedings of the 17th International Conference on Defects in Semiconductors written by Helmut Heinrich and published by . This book was released on 1994 with total page 656 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Proceedings of the 17th International Conference on Defects in Semiconductors

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Publisher :
ISBN 13 :
Total Pages : 673 pages
Book Rating : 4.:/5 (618 download)

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Book Synopsis Proceedings of the 17th International Conference on Defects in Semiconductors by : International Conference on Defects in Semiconductors

Download or read book Proceedings of the 17th International Conference on Defects in Semiconductors written by International Conference on Defects in Semiconductors and published by . This book was released on 1994 with total page 673 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Defects in Semiconductors

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Publisher : Academic Press
ISBN 13 : 0128019409
Total Pages : 458 pages
Book Rating : 4.1/5 (28 download)

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Book Synopsis Defects in Semiconductors by :

Download or read book Defects in Semiconductors written by and published by Academic Press. This book was released on 2015-06-08 with total page 458 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume, number 91 in the Semiconductor and Semimetals series, focuses on defects in semiconductors. Defects in semiconductors help to explain several phenomena, from diffusion to getter, and to draw theories on materials' behavior in response to electrical or mechanical fields. The volume includes chapters focusing specifically on electron and proton irradiation of silicon, point defects in zinc oxide and gallium nitride, ion implantation defects and shallow junctions in silicon and germanium, and much more. It will help support students and scientists in their experimental and theoretical paths. Expert contributors Reviews of the most important recent literature Clear illustrations A broad view, including examination of defects in different semiconductors

Defects in Semiconductors 16

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Publisher : Trans Tech Publications
ISBN 13 :
Total Pages : 584 pages
Book Rating : 4.X/5 (2 download)

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Book Synopsis Defects in Semiconductors 16 by : Gordon Davies

Download or read book Defects in Semiconductors 16 written by Gordon Davies and published by Trans Tech Publications. This book was released on 1992 with total page 584 pages. Available in PDF, EPUB and Kindle. Book excerpt: Part 1. 1. Hydrogen in Elemental Hosts . 2. Transition Metal Impurities in Elemental Hosts . 3. Impurities in Elemental Hosts . 4. Irradiation Defects in Elemental Hosts . 5. Oxygen in GaAs, Si and Ge . 6. Theory . Part 2 . 7. Hydrogen in Compound Semiconductors . 8. Rare Earth Impurities in Silicon and Compound Semiconductors . 9. Transition Metal Impurities in Compound Semiconductors . 10. Donors in Compound Semiconductors . 11. EL2 And Anti-Site Related Defects . 12. Other Defects in III-V Semiconductors . 13. Growth Defects . Part 3 . 14. New Techniques . 15. Defects in SiC and Diamond . 16. Defects in II-VI Semiconductors . 17. Hetero-Epitaxy and Strained Layers . 18. Dislocations . 19. Superlattices . 20. Defects at Surfaces and Interfaces and in Low-Dimensional Structures . 21. Processing-Induced Defects . 22. Effects of Defects on Devices .

International Conference on Defects in Semiconductors : ICDS ; 17

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ISBN 13 :
Total Pages : pages
Book Rating : 4.:/5 (258 download)

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Book Synopsis International Conference on Defects in Semiconductors : ICDS ; 17 by :

Download or read book International Conference on Defects in Semiconductors : ICDS ; 17 written by and published by . This book was released on 1993 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

Defect Control in Semiconductors

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Publisher :
ISBN 13 :
Total Pages : 826 pages
Book Rating : 4.F/5 ( download)

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Book Synopsis Defect Control in Semiconductors by : Kōji Sumino

Download or read book Defect Control in Semiconductors written by Kōji Sumino and published by . This book was released on 1990 with total page 826 pages. Available in PDF, EPUB and Kindle. Book excerpt: Defect control in semiconductors is a key technology for realizing the ultimate possibilities of modern electronics. The basis of such control lies in an integrated knowledge of a variety of defect properties. From this viewpoint, the volume discusses defect-related problems in connection with defect control in semiconducting materials, such as silicon, III-V, II-VI compounds, organic semiconductors, heterostructure, etc. The conference brought together scientists in the field of fundamental research and engineers involved in application related to electronic devices in order to promote future research activity in both fields and establish a fundamental knowledge of defect control. The main emphasis of the 254 papers presented in this volume is on the control of the concentration, distribution, structural and electronic states of any types of defects including impurities as well as control of the electrical, optical and other activities of defects. Due to the extensive length of the contents, only the number of papers presented per session is listed below.

Identification of Defects in Semiconductors

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Publisher : Academic Press
ISBN 13 : 0080864481
Total Pages : 393 pages
Book Rating : 4.0/5 (88 download)

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Book Synopsis Identification of Defects in Semiconductors by :

Download or read book Identification of Defects in Semiconductors written by and published by Academic Press. This book was released on 1998-07-02 with total page 393 pages. Available in PDF, EPUB and Kindle. Book excerpt: Since its inception in 1966, the series of numbered volumes known as Semiconductors and Semimetals has distinguished itself through the careful selection of well-known authors, editors, and contributors.The"Willardson and Beer"Series, as it is widely known, has succeeded in publishing numerous landmark volumes and chapters. Not only did many of these volumes make an impact at the time of their publication, but they continue to be well-cited years after their original release. Recently, Professor Eicke R. Weber of the University of California at Berkeley joined as a co-editor of the series. Professor Weber, a well-known expert in the field of semiconductor materials, will further contribute to continuing the series' tradition of publishing timely, highly relevant, and long-impacting volumes. Some of the recent volumes, such as Hydrogen in Semiconductors, Imperfections in III/V Materials, Epitaxial Microstructures, High-Speed Heterostructure Devices,Oxygen in Silicon, and others promise indeed that this tradition will be maintained and even expanded.Reflecting the truly interdisciplinary nature of the field that the series covers, the volumes in Semiconductors and Semimetals have been and will continue to be of great interest to physicists, chemists, materials scientists, and device engineers in modern industry.

Identification of Defects in Semiconductors

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Publisher : Academic Press
ISBN 13 : 008086449X
Total Pages : 449 pages
Book Rating : 4.0/5 (88 download)

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Book Synopsis Identification of Defects in Semiconductors by :

Download or read book Identification of Defects in Semiconductors written by and published by Academic Press. This book was released on 1998-10-27 with total page 449 pages. Available in PDF, EPUB and Kindle. Book excerpt: GENERAL DESCRIPTION OF THE SERIESSince its inception in 1966, the series of numbered volumes known as Semiconductors and Semimetals has distinguished itself through the careful selection of well-known authors, editors, and contributors. The "Willardson and Beer" Series, as it is widely known, has succeeded in publishing numerous landmark volumes and chapters. Not only did many of these volumes make an impact at the time of their publication, but they continue to be well-cited years after their original release. Recently, Professor Eicke R. Weber of the University of California at Berkeley joined as a co-editor of the series. Professor Weber, a well-known expert in the field of semiconductor materials, will further contribute to continuing the series' tradition of publishing timely, highly relevant, and long-impacting volumes. Some of the recent volumes, such as Hydrogen in Semiconductors, Imperfections in III/V Materials, Epitaxial Microstructures, High-Speed Heterostructure Devices, Oxygen in Silicon, and others promise indeed that this tradition will be maintained and even expanded.Reflecting the truly interdisciplinary nature of the field that the series covers, the volumes in Semiconductors and Semimetals have been and will continue to be of great interest to physicists, chemists, materials scientists, and device engineers in modern industry. GENERAL DESCRIPTION OF THE VOLUMEThis volume has contributions on Advanced Characterization Techniques with a focus on defect identification. The combination of beam techniques with electrical and optical characterization has not been discussed elsewhere.

Photo-induced Defects in Semiconductors

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Publisher : Cambridge University Press
ISBN 13 : 0521461960
Total Pages : 231 pages
Book Rating : 4.5/5 (214 download)

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Book Synopsis Photo-induced Defects in Semiconductors by : David Redfield

Download or read book Photo-induced Defects in Semiconductors written by David Redfield and published by Cambridge University Press. This book was released on 1996-01-26 with total page 231 pages. Available in PDF, EPUB and Kindle. Book excerpt: A thorough review of the properties of deep-level, localized defects in semiconductors.

Proceedings of the 17th International Conference on Defects in Semiconductors

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Publisher :
ISBN 13 :
Total Pages : 724 pages
Book Rating : 4.X/5 (2 download)

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Book Synopsis Proceedings of the 17th International Conference on Defects in Semiconductors by : Helmut Heinrich

Download or read book Proceedings of the 17th International Conference on Defects in Semiconductors written by Helmut Heinrich and published by . This book was released on 1994 with total page 724 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Defects and Properties of Semiconductors

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Publisher : Springer
ISBN 13 :
Total Pages : 280 pages
Book Rating : 4.F/5 ( download)

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Book Synopsis Defects and Properties of Semiconductors by : J. Chikawa

Download or read book Defects and Properties of Semiconductors written by J. Chikawa and published by Springer. This book was released on 1987-03-31 with total page 280 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume contains nearly all of the papers presented at the Symposium on "Defects and Qualities of Semiconductors" which was held in Tokyo on May 17-18, 1984, under the sponsorship of the SOCIETY OF NON-TRADITIONAL TECHNOLOGY. The Symposium was organized by the promoting committee of the research project "Quality Developement of Semiconductors by Utilization of Crystal Defects" sponsored by the Science and Technology Agency of Japan. Defect study in semiconductor engineering started originally with seeking methods how to suppress generation of harmful defects during device processing in order to achieve a high yield of device fabrication. Recently, a new trend has appeared in which crystal defects are positively utilized to improve the device performance and reliability. A typical example is the intrinsic gettering technique for Czochralski silicon. Thus, a new term "DEFECT ENGINEERING" was born. It is becoming more important to control density and distribution of defects than to eliminate all the defects. Very precise and deep knowledge on defects is required to establish such techniques as generation and development of defects desired depending on type of devices and degree of integration. Electrical, optical and mechanical effects of defects should be also understood correctly. Such knowledge is essential even for eliminating defects from some specified device regions. It is the time now to investigate defect properties and defect kinetics in an energetic way. From this point of view, all the speakers in this symposium were invited among the most active investigators in the field of defect engineering in Japan.

Point and Extended Defects in Semiconductors

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Publisher : Springer Science & Business Media
ISBN 13 : 1468457098
Total Pages : 286 pages
Book Rating : 4.4/5 (684 download)

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Book Synopsis Point and Extended Defects in Semiconductors by : Giorgio Benedek

Download or read book Point and Extended Defects in Semiconductors written by Giorgio Benedek and published by Springer Science & Business Media. This book was released on 2013-06-29 with total page 286 pages. Available in PDF, EPUB and Kindle. Book excerpt: The systematic study of defects in semiconductors began in the early fifties. FrQm that time on many questions about the defect structure and properties have been an swered, but many others are still a matter of investigation and discussion. Moreover, during these years new problems arose in connection with the identification and char acterization of defects, their role in determining transport and optical properties of semiconductor materials and devices, as well as from the technology of the ever in creasing scale of integration. This book presents to the reader a view into both basic concepts of defect physics and recent developments of high resolution experimental techniques. The book does not aim at an exhaustive presentation of modern defect physics; rather it gathers a number of topics which represent the present-time research in this field. The volume collects the contributions to the Advanced Research Workshop "Point, Extended and Surface Defects in Semiconductors" held at the Ettore Majo rana Centre at Erice (Italy) from 2 to 7 November 1988, in the framework of the International School of Materials Science and Technology. The workshop has brought together scientists from thirteen countries. Most participants are currently working on defect problems in either silicon submicron technology or in quantum wells and superlattices, where point defects, dislocations, interfaces and surfaces are closely packed together.

Proceedings of the 17th International Conference on Defects in Semiconductors

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Publisher :
ISBN 13 :
Total Pages : 610 pages
Book Rating : 4.:/5 (311 download)

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Book Synopsis Proceedings of the 17th International Conference on Defects in Semiconductors by : International Conference on Defects in Semiconductors (17, 1993, Gmunden)

Download or read book Proceedings of the 17th International Conference on Defects in Semiconductors written by International Conference on Defects in Semiconductors (17, 1993, Gmunden) and published by . This book was released on 1994 with total page 610 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Dopants and Defects in Semiconductors

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Publisher : CRC Press
ISBN 13 : 143983153X
Total Pages : 372 pages
Book Rating : 4.4/5 (398 download)

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Book Synopsis Dopants and Defects in Semiconductors by : Matthew D. McCluskey

Download or read book Dopants and Defects in Semiconductors written by Matthew D. McCluskey and published by CRC Press. This book was released on 2012-02-23 with total page 372 pages. Available in PDF, EPUB and Kindle. Book excerpt: Dopants and Defects in Semiconductors covers the theory, experimentation, and identification of impurities, dopants, and intrinsic defects in semiconductors. The book fills a crucial gap between solid-state physics and more specialized course texts.The authors first present introductory concepts, including basic semiconductor theory, defect classif

Characterisation and Control of Defects in Semiconductors

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Publisher : Materials, Circuits and Device
ISBN 13 : 1785616552
Total Pages : 601 pages
Book Rating : 4.7/5 (856 download)

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Book Synopsis Characterisation and Control of Defects in Semiconductors by : Filip Tuomisto

Download or read book Characterisation and Control of Defects in Semiconductors written by Filip Tuomisto and published by Materials, Circuits and Device. This book was released on 2019-10-27 with total page 601 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides an up-to-date review of the experimental and theoretical methods used for studying defects in semiconductors, this book focuses on recent developments driven by the requirements of new materials, including nitrides, oxide semiconductors and 2-D semiconductors.