Read Books Online and Download eBooks, EPub, PDF, Mobi, Kindle, Text Full Free.
Colloquium On Computer Aided Test And Diagnosis
Download Colloquium On Computer Aided Test And Diagnosis full books in PDF, epub, and Kindle. Read online Colloquium On Computer Aided Test And Diagnosis ebook anywhere anytime directly on your device. Fast Download speed and no annoying ads. We cannot guarantee that every ebooks is available!
Book Synopsis Proceedings of 2023 International Conference on Medical Imaging and Computer-Aided Diagnosis (MICAD 2023) by : Ruidan Su
Download or read book Proceedings of 2023 International Conference on Medical Imaging and Computer-Aided Diagnosis (MICAD 2023) written by Ruidan Su and published by Springer Nature. This book was released on with total page 414 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Proceedings of the 14th International Scientific Conference: Computer Aided Engineering by : Eugeniusz Rusiński
Download or read book Proceedings of the 14th International Scientific Conference: Computer Aided Engineering written by Eugeniusz Rusiński and published by Springer. This book was released on 2019-03-09 with total page 886 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents the proceedings of the 14th International Conference on Computer Aided Engineering, collecting the best papers from the event, which was held in Wrocław, Poland in June 2018. It includes contributions from researchers in computer engineering addressing the applied science and development of the industry and offering up-to-date information on the development of the key technologies in technology transfer. It is divided into the following thematic sections: • parametric and concurrent design, • advanced numerical simulations of physical systems, • integration of CAD/CAE systems for machine design, • presentation of professional CAD and CAE systems, • presentation of the modern methods of machine testing, • presentation of practical CAD/CAM/CAE applications: – designing and manufacturing of machines and technical systems, – durability prediction, repairs and retrofitting of power equipment, – strength and thermodynamic analyses of power equipment, – design and calculation of various types of load-carrying structures, – numerical methods of dimensioning materials handling and long-distance transport equipment (cranes, gantries, automotive, rail, air, space and other special vehicles and earth-moving machinery), • CAE integration problems. The conference and its proceedings offer a major interdisciplinary forum for researchers and engineers in innovative studies and advances in this dynamic field.
Book Synopsis Debug Automation from Pre-Silicon to Post-Silicon by : Mehdi Dehbashi
Download or read book Debug Automation from Pre-Silicon to Post-Silicon written by Mehdi Dehbashi and published by Springer. This book was released on 2014-09-25 with total page 180 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book describes automated debugging approaches for the bugs and the faults which appear in different abstraction levels of a hardware system. The authors employ a transaction-based debug approach to systems at the transaction-level, asserting the correct relation of transactions. The automated debug approach for design bugs finds the potential fault candidates at RTL and gate-level of a circuit. Debug techniques for logic bugs and synchronization bugs are demonstrated, enabling readers to localize the most difficult bugs. Debug automation for electrical faults (delay faults)finds the potentially failing speedpaths in a circuit at gate-level. The various debug approaches described achieve high diagnosis accuracy and reduce the debugging time, shortening the IC development cycle and increasing the productivity of designers. Describes a unified framework for debug automation used at both pre-silicon and post-silicon stages; Provides approaches for debug automation of a hardware system at different levels of abstraction, i.e., chip, gate-level, RTL and transaction level; Includes techniques for debug automation of design bugs and electrical faults, as well as an infrastructure to debug NoC-based multiprocessor SoCs.
Book Synopsis Proceedings of the International Conference on Big Data, IoT, and Machine Learning by : Mohammad Shamsul Arefin
Download or read book Proceedings of the International Conference on Big Data, IoT, and Machine Learning written by Mohammad Shamsul Arefin and published by Springer Nature. This book was released on 2021-12-03 with total page 784 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book gathers a collection of high-quality peer-reviewed research papers presented at the International Conference on Big Data, IoT and Machine Learning (BIM 2021), held in Cox’s Bazar, Bangladesh, during 23–25 September 2021. The book covers research papers in the field of big data, IoT and machine learning. The book will be helpful for active researchers and practitioners in the field.
Book Synopsis Testing of Digital Systems by : N. K. Jha
Download or read book Testing of Digital Systems written by N. K. Jha and published by Cambridge University Press. This book was released on 2003-05-08 with total page 1022 pages. Available in PDF, EPUB and Kindle. Book excerpt: Device testing represents the single largest manufacturing expense in the semiconductor industry, costing over $40 billion a year. The most comprehensive and wide ranging book of its kind, Testing of Digital Systems covers everything you need to know about this vitally important subject. Starting right from the basics, the authors take the reader through automatic test pattern generation, design for testability and built-in self-test of digital circuits before moving on to more advanced topics such as IDDQ testing, functional testing, delay fault testing, memory testing, and fault diagnosis. The book includes detailed treatment of the latest techniques including test generation for various fault models, discussion of testing techniques at different levels of integrated circuit hierarchy and a chapter on system-on-a-chip test synthesis. Written for students and engineers, it is both an excellent senior/graduate level textbook and a valuable reference.
Book Synopsis Theory and Applications of Satisfiability Testing by : Enrico Giunchiglia
Download or read book Theory and Applications of Satisfiability Testing written by Enrico Giunchiglia and published by Springer Science & Business Media. This book was released on 2004-01-26 with total page 542 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book constitutes the thoroughly refereed post-proceedings of the 6th International Conference on Theory and Applications of Satisfiability Testing, SAT 2003, held in Santa Margherita Ligure, Italy, in May 2003. The 33 revised full papers presented together with 5 articles reporting results of the related SAT competition and QBF evaluation were carefully selected during two rounds of reviewing and improvement from 67 submissions. The whole spectrum of research in propositional and quantified Boolean formula satisfiability testing is covered including proof systems, search techniques, probabilistic analysis of algorithms and their properties, problem encodings, industrial applications, specific tools, case studies, and empirical results.
Author :Hans-Joachim Wunderlich Publisher :Springer Science & Business Media ISBN 13 :9048132827 Total Pages :263 pages Book Rating :4.0/5 (481 download)
Book Synopsis Models in Hardware Testing by : Hans-Joachim Wunderlich
Download or read book Models in Hardware Testing written by Hans-Joachim Wunderlich and published by Springer Science & Business Media. This book was released on 2009-11-12 with total page 263 pages. Available in PDF, EPUB and Kindle. Book excerpt: Model based testing is the most powerful technique for testing hardware and software systems. Models in Hardware Testing describes the use of models at all the levels of hardware testing. The relevant fault models for nanoscaled CMOS technology are introduced, and their implications on fault simulation, automatic test pattern generation, fault diagnosis, memory testing and power aware testing are discussed. Models and the corresponding algorithms are considered with respect to the most recent state of the art, and they are put into a historical context by a concluding chapter on the use of physical fault models in fault tolerance.
Download or read book ISTFA 2010 written by and published by ASM International. This book was released on 2010-01-01 with total page 487 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis 3rd International Conference on Nanotechnologies and Biomedical Engineering by : Victor Sontea
Download or read book 3rd International Conference on Nanotechnologies and Biomedical Engineering written by Victor Sontea and published by Springer. This book was released on 2015-09-23 with total page 573 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume presents the proceedings of the 3rd International Conference on Nanotechnologies and Biomedical Engineering which was held on September 23-26, 2015 in Chisinau, Republic of Moldova. ICNBME-2015 continues the series of International Conferences in the field of nanotechnologies and biomedical engineering. It aims at bringing together scientists and engineers dealing with fundamental and applied research for reporting on the latest theoretical developments and applications involved in the fields. Topics include Nanotechnologies and nanomaterials Plasmonics and metamaterials Bio-micro/nano technologies Biomaterials Biosensors and sensors systems Biomedical instrumentation Biomedical signal processing Biomedical imaging and image processing Molecular, cellular and tissue engineering Clinical engineering, health technology management and assessment; Health informatics, e-health and telemedicine Biomedical engineering education Nuclear and radiation safety and security Innovations and technology transfer
Book Synopsis Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits by : Sandeep K. Goel
Download or read book Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits written by Sandeep K. Goel and published by CRC Press. This book was released on 2013-10-25 with total page 266 pages. Available in PDF, EPUB and Kindle. Book excerpt: Advances in design methods and process technologies have resulted in a continuous increase in the complexity of integrated circuits (ICs). However, the increased complexity and nanometer-size features of modern ICs make them susceptible to manufacturing defects, as well as performance and quality issues. Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits covers common problems in areas such as process variations, power supply noise, crosstalk, resistive opens/bridges, and design-for-manufacturing (DfM)-related rule violations. The book also addresses testing for small-delay defects (SDDs), which can cause immediate timing failures on both critical and non-critical paths in the circuit. Overviews semiconductor industry test challenges and the need for SDD testing, including basic concepts and introductory material Describes algorithmic solutions incorporated in commercial tools from Mentor Graphics Reviews SDD testing based on "alternative methods" that explores new metrics, top-off ATPG, and circuit topology-based solutions Highlights the advantages and disadvantages of a diverse set of metrics, and identifies scope for improvement Written from the triple viewpoint of university researchers, EDA tool developers, and chip designers and tool users, this book is the first of its kind to address all aspects of SDD testing from such a diverse perspective. The book is designed as a one-stop reference for current industrial practices, research challenges in the domain of SDD testing, and recent developments in SDD solutions.
Book Synopsis Proceedings of the 21st EANN (Engineering Applications of Neural Networks) 2020 Conference by : Lazaros Iliadis
Download or read book Proceedings of the 21st EANN (Engineering Applications of Neural Networks) 2020 Conference written by Lazaros Iliadis and published by Springer Nature. This book was released on 2020-05-27 with total page 630 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book gathers the proceedings of the 21st Engineering Applications of Neural Networks Conference, which is supported by the International Neural Networks Society (INNS). Artificial Intelligence (AI) has been following a unique course, characterized by alternating growth spurts and “AI winters.” Today, AI is an essential component of the fourth industrial revolution and enjoying its heyday. Further, in specific areas, AI is catching up with or even outperforming human beings. This book offers a comprehensive guide to AI in a variety of areas, concentrating on new or hybrid AI algorithmic approaches with robust applications in diverse sectors. One of the advantages of this book is that it includes robust algorithmic approaches and applications in a broad spectrum of scientific fields, namely the use of convolutional neural networks (CNNs), deep learning and LSTM in robotics/machine vision/engineering/image processing/medical systems/the environment; machine learning and meta learning applied to neurobiological modeling/optimization; state-of-the-art hybrid systems; and the algorithmic foundations of artificial neural networks.
Book Synopsis Testing of Interposer-Based 2.5D Integrated Circuits by : Ran Wang
Download or read book Testing of Interposer-Based 2.5D Integrated Circuits written by Ran Wang and published by Springer. This book was released on 2017-03-20 with total page 192 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides readers with an insightful guide to the design, testing and optimization of 2.5D integrated circuits. The authors describe a set of design-for-test methods to address various challenges posed by the new generation of 2.5D ICs, including pre-bond testing of the silicon interposer, at-speed interconnect testing, built-in self-test architecture, extest scheduling, and a programmable method for low-power scan shift in SoC dies. This book covers many testing techniques that have already been used in mainstream semiconductor companies. Readers will benefit from an in-depth look at test-technology solutions that are needed to make 2.5D ICs a reality and commercially viable.
Book Synopsis PROCEEDINGS OF THE 22ND CONFERENCE ON FORMAL METHODS IN COMPUTER-AIDED DESIGN – FMCAD 2022 by : Alberto Griggio
Download or read book PROCEEDINGS OF THE 22ND CONFERENCE ON FORMAL METHODS IN COMPUTER-AIDED DESIGN – FMCAD 2022 written by Alberto Griggio and published by TU Wien Academic Press. This book was released on 2022-10-12 with total page 405 pages. Available in PDF, EPUB and Kindle. Book excerpt: The Conference on Formal Methods in Computer-Aided Design (FMCAD) is an annual conference on the theory and applications of formal methods in hardware and system in academia and industry for presenting and discussing groundbreaking methods, technologies, theoretical results, and tools for reasoning formally about computing systems. FMCAD covers formal aspects of computer-aided system testing.
Book Synopsis PROCEEDINGS OF THE 20TH CONFERENCE ON FORMAL METHODS IN COMPUTER-AIDED DESIGN – FMCAD 2020 by : Alexander Ivrii
Download or read book PROCEEDINGS OF THE 20TH CONFERENCE ON FORMAL METHODS IN COMPUTER-AIDED DESIGN – FMCAD 2020 written by Alexander Ivrii and published by TU Wien Academic Press. This book was released on 2020-09-11 with total page 284 pages. Available in PDF, EPUB and Kindle. Book excerpt: Formal Methods in Computer-Aided Design (FMCAD) is a conference series on the theory and applications of formal methods in hardware and system verification. FMCAD provides a leading forum to researchers in academia and industry for presenting and discussing ground-breaking methods, technologies, theoretical results, and tools for reasoning formally about computing systems. FMCAD covers formal aspects of computer-aided system design including verification, specification, synthesis, and testing.
Book Synopsis Electronic Design Automation for IC System Design, Verification, and Testing by : Luciano Lavagno
Download or read book Electronic Design Automation for IC System Design, Verification, and Testing written by Luciano Lavagno and published by CRC Press. This book was released on 2017-12-19 with total page 773 pages. Available in PDF, EPUB and Kindle. Book excerpt: The first of two volumes in the Electronic Design Automation for Integrated Circuits Handbook, Second Edition, Electronic Design Automation for IC System Design, Verification, and Testing thoroughly examines system-level design, microarchitectural design, logic verification, and testing. Chapters contributed by leading experts authoritatively discuss processor modeling and design tools, using performance metrics to select microprocessor cores for integrated circuit (IC) designs, design and verification languages, digital simulation, hardware acceleration and emulation, and much more. New to This Edition: Major updates appearing in the initial phases of the design flow, where the level of abstraction keeps rising to support more functionality with lower non-recurring engineering (NRE) costs Significant revisions reflected in the final phases of the design flow, where the complexity due to smaller and smaller geometries is compounded by the slow progress of shorter wavelength lithography New coverage of cutting-edge applications and approaches realized in the decade since publication of the previous edition—these are illustrated by new chapters on high-level synthesis, system-on-chip (SoC) block-based design, and back-annotating system-level models Offering improved depth and modernity, Electronic Design Automation for IC System Design, Verification, and Testing provides a valuable, state-of-the-art reference for electronic design automation (EDA) students, researchers, and professionals.
Book Synopsis PROCEEDINGS OF THE 21ST CONFERENCE ON FORMAL METHODS IN COMPUTER-AIDED DESIGN – FMCAD 2021 by : Michael W. Whalen
Download or read book PROCEEDINGS OF THE 21ST CONFERENCE ON FORMAL METHODS IN COMPUTER-AIDED DESIGN – FMCAD 2021 written by Michael W. Whalen and published by TU Wien Academic Press. This book was released on 2021-10-14 with total page 297 pages. Available in PDF, EPUB and Kindle. Book excerpt: Our life is dominated by hardware: a USB stick, the processor in our laptops or the SIM card in our smart phone. But who or what makes sure that these systems work stably, safely and securely from the word go? The computer - with a little help from humans. The overall name for this is CAD (computer-aided design), and it’s become hard to imagine our modern industrial world without it. So how can we be sure that the hardware and computer systems we use are reliable? By using formal methods: these are techniques and tools to calculate whether a system description is in itself consistent or whether requirements have been developed and implemented correctly. Or to put it another way: they can be used to check the safety and security of hardware and software. Just how this works in real life was also of interest at the annual conference on "Formal Methods in Computer-Aided Design (FMCAD)". Under the direction of Ruzica Piskac and Michael Whalen, the 21st Conference in October 2021 addressed the results of the latest research in the field of formal methods. A volume of conference proceedings with over 30 articles covering a wide range of formal methods has now been published for this online conference: starting from the verification of hardware, parallel and distributed systems as well as neuronal networks, right through to machine learning and decision-making procedures. This volume provides a fascinating insight into revolutionary methods, technologies, theoretical results and tools for formal logic in computer systems and system developments.
Book Synopsis 2021 International Conference on Big Data Analytics for Cyber-Physical System in Smart City by : Mohammed Atiquzzaman
Download or read book 2021 International Conference on Big Data Analytics for Cyber-Physical System in Smart City written by Mohammed Atiquzzaman and published by Springer Nature. This book was released on 2021-12-09 with total page 1314 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book gathers a selection of peer-reviewed papers presented at the third Big Data Analytics for Cyber-Physical System in Smart City (BDCPS 2021) conference, held in Shanghai, China, on Nov. 27, 2021. The contributions, prepared by an international team of scientists and engineers, cover the latest advances made in the field of machine learning, and big data analytics methods and approaches for the data-driven co-design of communication, computing, and control for smart cities. Given its scope, it offers a valuable resource for all researchers and professionals interested in big data, smart cities, and cyber-physical systems.
