Masters Theses in the Pure and Applied Sciences

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Publisher : Springer Science & Business Media
ISBN 13 : 1461559693
Total Pages : 341 pages
Book Rating : 4.4/5 (615 download)

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Book Synopsis Masters Theses in the Pure and Applied Sciences by : Wade H. Shafer

Download or read book Masters Theses in the Pure and Applied Sciences written by Wade H. Shafer and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 341 pages. Available in PDF, EPUB and Kindle. Book excerpt: Masters Theses in the Pure and Applied Sciences was first conceived, published, and disseminated by the Center for Information and Numerical Data Analysis and Synthesis (CINDAS)* at Purdue University in 1957, starting its coverage of theses with the academic year 1955. Beginning with Volume 13, the printing and dis semination phases of the activity were transferred to University Microfilms/Xerox of Ann Arbor, Michigan, with the thought that such an arrangement would be more beneficial to the academic and general scientific and technical community. After five years of this jOint undertaking we had concluded that it was in the interest of all concerned if the printing and distribution of the volumes were handled by an international publishing house to assure improved service and broader dissemination. Hence, starting with Volume 18, Masters Theses in the Pure and Applied Sciences has been disseminated on a worldwide basis by Plenum Publishing Corporation of New York, and in the same year the coverage was broadened to include Canadian universities. All back issues can also be ordered from Plenum. We have reported in Volume 40 (thesis year 1995) a total of 10,746 thesis titles from 19 Canadian and 144 United States universities. We are sure that this broader base for these titles reported will greatly enhance the value of this impor tant annual reference work. While Volume 40 reports theses submitted in 1995, on occasion, certain uni versities do report theses submitted in previous years but not reported at the time.

Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits

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Publisher : Springer Science & Business Media
ISBN 13 : 0306470403
Total Pages : 690 pages
Book Rating : 4.3/5 (64 download)

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Book Synopsis Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits by : M. Bushnell

Download or read book Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits written by M. Bushnell and published by Springer Science & Business Media. This book was released on 2006-04-11 with total page 690 pages. Available in PDF, EPUB and Kindle. Book excerpt: The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device techn- ogy, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester course and a teacher will have to select from the topics. We did not restrict such freedom because the selection may depend upon the individual expertise and interests. Besides, there is merit in having a larger book that will retain its usefulness for the owner even after the completion of the course. With equal tenacity, we address the needs of three other groups of readers.

Analog and Mixed-Signal Boundary-Scan

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Publisher : Springer Science & Business Media
ISBN 13 : 1475744994
Total Pages : 171 pages
Book Rating : 4.4/5 (757 download)

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Book Synopsis Analog and Mixed-Signal Boundary-Scan by : Adam Osseiran

Download or read book Analog and Mixed-Signal Boundary-Scan written by Adam Osseiran and published by Springer Science & Business Media. This book was released on 2013-03-09 with total page 171 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book contains more than the IEEE Standard 1149.4. It also contains the thoughts of those who developed the standard. Adam Osseiran has edited the original writings of Brian Wilkins, Colin Maunder, Rod Tulloss, Steve Sunter, Mani Soma, Keith Lofstrom and John McDermid, all of whom have personally contributed to this standard. To preserve the original spirit, only minor changes were made, and the reader will sense a chapter-to-chapter variation in the style of expression. This may appear awkward to some, although I found the Iack of monotonicity refreshing. A system consists of a specific organization of parts. The function of the system cannot be performed by an individual part or even a disorganized collection ofthe same parts. Testing has a system-like characteristic. Testing of a system does not follow directly from the testing of its parts, and a system built with testable parts can sometimes be impossible to test. Therefore, testability of the system must be organized. Some years ago, the IEEE published the boundary-scan Standard 1149.1. That Standard provided an architecture for digital VLSI chips. The chips designed with the 1149.1 architecture can be integrated into a testable system. However, many systems today contain both analog and digital chips. Even if all digital chips are compliant with the standard, the testability of a mixed-signal system cannot be guaranteed. The new Standard 1149.4, described in this book, extends the previous architecture to mixed-signal systems.

High Speed PCB Design

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Publisher :
ISBN 13 : 9781882812042
Total Pages : 412 pages
Book Rating : 4.8/5 (12 download)

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Book Synopsis High Speed PCB Design by : Lee W. Ritchey

Download or read book High Speed PCB Design written by Lee W. Ritchey and published by . This book was released on 1996 with total page 412 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Economics of Electronic Design, Manufacture and Test

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Publisher : Springer Science & Business Media
ISBN 13 : 147575048X
Total Pages : 181 pages
Book Rating : 4.4/5 (757 download)

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Book Synopsis Economics of Electronic Design, Manufacture and Test by : M. Abadir

Download or read book Economics of Electronic Design, Manufacture and Test written by M. Abadir and published by Springer Science & Business Media. This book was released on 2013-06-29 with total page 181 pages. Available in PDF, EPUB and Kindle. Book excerpt: The general understanding of design is that it should lead to a manufacturable product. Neither the design nor the process of manufacturing is perfect. As a result, the product will be faulty, will require testing and fixing. Where does economics enter this scenario? Consider the cost of testing and fixing the product. If a manufactured product is grossly faulty, or too many of the products are faulty, the cost of testing and fixing will be high. Suppose we do not like that. We then ask what is the cause of the faulty product. There must be something wrong in the manufacturing process. We trace this cause and fix it. Suppose we fix all possible causes and have no defective products. We would have eliminated the need for testing. Unfortunately, things are not so perfect. There is a cost involved with finding and eliminating the causes of faults. We thus have two costs: the cost of testing and fixing (we will call it cost-1), and the cost of finding and eliminating causes of faults (call it cost-2). Both costs, in some way, are included in the overall cost of the product. If we try to eliminate cost-1, cost-2 goes up, and vice versa. An economic system of production will minimize the overall cost of the product. Economics of Electronic Design, Manufacture and Test is a collection of research contributions derived from the Second Workshop on Economics of Design, Manufacture and Test, written for inclusion in this book.

Accelerated Reliability and Durability Testing Technology

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Publisher : John Wiley & Sons
ISBN 13 : 111809400X
Total Pages : 432 pages
Book Rating : 4.1/5 (18 download)

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Book Synopsis Accelerated Reliability and Durability Testing Technology by : Lev M. Klyatis

Download or read book Accelerated Reliability and Durability Testing Technology written by Lev M. Klyatis and published by John Wiley & Sons. This book was released on 2012-02-03 with total page 432 pages. Available in PDF, EPUB and Kindle. Book excerpt: Learn how ART and ADT can reduce cost, time, product recalls, and customer complaints This book provides engineers with the techniques and tools they need to use accelerated reliability testing (ART) and accelerated durability testing (ADT) as key factors to accurately predict a product's quality, reliability, durability, and maintainability during a given time, such as service life or warranty period. It covers new ideas and offers a unique approach to accurate simulation and integration of field inputs, safety, and human factors, as well as accelerated product development, as components of interdisciplinary systems engineering. Beginning with a comprehensive introduction to the subject of ART and ADT, the book covers: ART and ADT as components of an interdisciplinary systems of systems approach Methodology of ART and ADT performance Equipment for ART and ADT technology ART and ADT as sources of initial information for accurate quality, reliability, maintainability, and durability prediction and product accelerated development The economical results of the usage of ART and ADT ART and ADT standardization The book covers the newest techniques in the field and provides many case studies that illuminate how the implementation of ART and ADT can solve previously inaccessible problems in the field of engineering, such as reducing product recalls, cost, and time during design, manufacture, and usage. Professionals will find the answers to how one can carry out ART and ADT technology in a practical manner. Accelerated Reliability and Durability Testing Technology is indispensable reading for engineers, researchers in industry, usage, and academia who are involved in the design of experiments, field simulations, maintenance, reliabilty, durabilty, accurate prediction, and product development, and graduate students in related courses.

Testing and Measurement: Techniques and Applications

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Publisher : CRC Press
ISBN 13 : 1315684934
Total Pages : 477 pages
Book Rating : 4.3/5 (156 download)

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Book Synopsis Testing and Measurement: Techniques and Applications by : Kennis Chan

Download or read book Testing and Measurement: Techniques and Applications written by Kennis Chan and published by CRC Press. This book was released on 2015-06-11 with total page 477 pages. Available in PDF, EPUB and Kindle. Book excerpt: Testing and Measurement: Techniques and Applications is divided into 6 sections: Microwave, Ultrasonic and Acoustic Measurement and Application; Material Performance and Measuring and Testing Technique; Laser, Optics Fiber and Sensor; Industrial Autoimmunization and Measurement; Artificial Intelligence and Application; and Image, Signal and In

Test & Measurement Catalog

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Publisher :
ISBN 13 :
Total Pages : 666 pages
Book Rating : 4.3/5 (91 download)

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Book Synopsis Test & Measurement Catalog by : Hewlett-Packard Company

Download or read book Test & Measurement Catalog written by Hewlett-Packard Company and published by . This book was released on 1997 with total page 666 pages. Available in PDF, EPUB and Kindle. Book excerpt:

CMOS High Efficiency On-chip Power Management

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Publisher : Springer Science & Business Media
ISBN 13 : 1441995269
Total Pages : 128 pages
Book Rating : 4.4/5 (419 download)

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Book Synopsis CMOS High Efficiency On-chip Power Management by : John Hu

Download or read book CMOS High Efficiency On-chip Power Management written by John Hu and published by Springer Science & Business Media. This book was released on 2011-09-03 with total page 128 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book will introduce various power management integrated circuits (IC) design techniques to build future energy-efficient “green” electronics. The goal is to achieve high efficiency, which is essential to meet consumers’ growing need for longer battery lives. The focus is to study topologies amiable for full on-chip implementation (few external components) in the mainstream CMOS technology, which will reduce the physical size and the manufacturing cost of the devices.

Istfa '98

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Publisher : ASM International
ISBN 13 : 161503076X
Total Pages : 453 pages
Book Rating : 4.6/5 (15 download)

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Book Synopsis Istfa '98 by : ASM International

Download or read book Istfa '98 written by ASM International and published by ASM International. This book was released on 1998-01-01 with total page 453 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Signals

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Publisher :
ISBN 13 :
Total Pages : 918 pages
Book Rating : 4.3/5 (91 download)

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Book Synopsis Signals by :

Download or read book Signals written by and published by . This book was released on 1966 with total page 918 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Official Gazette of the United States Patent and Trademark Office

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Publisher :
ISBN 13 :
Total Pages : 1278 pages
Book Rating : 4.0/5 ( download)

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Book Synopsis Official Gazette of the United States Patent and Trademark Office by : United States. Patent and Trademark Office

Download or read book Official Gazette of the United States Patent and Trademark Office written by United States. Patent and Trademark Office and published by . This book was released on 2000 with total page 1278 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Scientific and Technical Aerospace Reports

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Publisher :
ISBN 13 :
Total Pages : 702 pages
Book Rating : 4.:/5 (31 download)

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Book Synopsis Scientific and Technical Aerospace Reports by :

Download or read book Scientific and Technical Aerospace Reports written by and published by . This book was released on 1995 with total page 702 pages. Available in PDF, EPUB and Kindle. Book excerpt:

U.S. Industrial Outlook

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Publisher :
ISBN 13 :
Total Pages : 654 pages
Book Rating : 4.3/5 (121 download)

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Book Synopsis U.S. Industrial Outlook by :

Download or read book U.S. Industrial Outlook written by and published by . This book was released on 1994 with total page 654 pages. Available in PDF, EPUB and Kindle. Book excerpt: Presents industry reviews including a section of "trends and forecasts," complete with tables and graphs for industry analysis.

Design to Test

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Publisher : Springer Science & Business Media
ISBN 13 : 9401160449
Total Pages : 334 pages
Book Rating : 4.4/5 (11 download)

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Book Synopsis Design to Test by : John Turino

Download or read book Design to Test written by John Turino and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 334 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book is the second edition of Design to Test. The first edition, written by myself and H. Frank Binnendyk and first published in 1982, has undergone several printings and become a standard in many companies, even in some countries. Both Frank and I are very proud of the success that our customers have had in utilizing the information, all of it still applicable to today's electronic designs. But six years is a long time in any technology field. I therefore felt it was time to write a new edition. This new edition, while retaining the basic testability prin ciples first documented six years ago, contains the latest material on state-of-the-art testability techniques for electronic devices, boards, and systems and has been completely rewritten and up dated. Chapter 15 from the first edition has been converted to an appendix. Chapter 6 has been expanded to cover the latest tech nology devices. Chapter 1 has been revised, and several examples throughout the book have been revised and updated. But some times the more things change, the more they stay the same. All of the guidelines and information presented in this book deal with the three basic testability principles-partitioning, control, and visibility. They have not changed in years. But many people have gotten smarter about how to implement those three basic test ability principles, and it is the aim of this text to enlighten the reader regarding those new (and old) testability implementation techniques.

Electrical & Electronics Abstracts

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Publisher :
ISBN 13 :
Total Pages : 2304 pages
Book Rating : 4.3/5 (243 download)

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Download or read book Electrical & Electronics Abstracts written by and published by . This book was released on 1997 with total page 2304 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Science Abstracts

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Publisher :
ISBN 13 :
Total Pages : 980 pages
Book Rating : 4.3/5 (243 download)

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Book Synopsis Science Abstracts by :

Download or read book Science Abstracts written by and published by . This book was released on 1993 with total page 980 pages. Available in PDF, EPUB and Kindle. Book excerpt: