Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis

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Publisher : Springer Science & Business Media
ISBN 13 : 0306469146
Total Pages : 430 pages
Book Rating : 4.3/5 (64 download)

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Book Synopsis Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis by : Alvin W. Czanderna

Download or read book Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis written by Alvin W. Czanderna and published by Springer Science & Business Media. This book was released on 2006-04-11 with total page 430 pages. Available in PDF, EPUB and Kindle. Book excerpt: Many books are available that detail the basic principles of the different methods of surface characterization. On the other hand, the scientific literature provides a resource of how individual pieces of research are conducted by particular labo- tories. Between these two extremes the literature is thin but it is here that the present volume comfortably sits. Both the newcomer and the more mature scientist will find in these chapters a wealth of detail as well as advice and general guidance of the principal phenomena relevant to the study of real samples. In the analysis of samples, practical analysts have fairly simple models of how everything works. Superimposed on this ideal world is an understanding of how the parameters of the measurement method, the instrumentation, and the char- teristics of the sample distort this ideal world into something less precise, less controlled, and less understood. The guidance given in these chapters allows the scientist to understand how to obtain the most precise and understood measu- ments that are currently possible and, where there are inevitable problems, to have clear guidance as the extent of the problem and its likely behavior.

Proceedings of the 10th International Conference on Metrology and Properties of Engineering Surfaces

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Publisher : Université de Saint-Etienne
ISBN 13 : 9782862723891
Total Pages : 498 pages
Book Rating : 4.7/5 (238 download)

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Book Synopsis Proceedings of the 10th International Conference on Metrology and Properties of Engineering Surfaces by : Tom R. Thomas

Download or read book Proceedings of the 10th International Conference on Metrology and Properties of Engineering Surfaces written by Tom R. Thomas and published by Université de Saint-Etienne. This book was released on 2005 with total page 498 pages. Available in PDF, EPUB and Kindle. Book excerpt:

4M 2005 - First International Conference on Multi-Material Micro Manufacture

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Publisher : Elsevier
ISBN 13 : 0080462553
Total Pages : 537 pages
Book Rating : 4.0/5 (84 download)

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Book Synopsis 4M 2005 - First International Conference on Multi-Material Micro Manufacture by : Stefan Dimov

Download or read book 4M 2005 - First International Conference on Multi-Material Micro Manufacture written by Stefan Dimov and published by Elsevier. This book was released on 2005-12-07 with total page 537 pages. Available in PDF, EPUB and Kindle. Book excerpt: 4M 2005 - First International Conference on Multi-Material Micro Manufacture

Surface Structure Determination by LEED and X-rays

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Publisher : Cambridge University Press
ISBN 13 : 1108418090
Total Pages : 475 pages
Book Rating : 4.1/5 (84 download)

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Book Synopsis Surface Structure Determination by LEED and X-rays by : Wolfgang Moritz

Download or read book Surface Structure Determination by LEED and X-rays written by Wolfgang Moritz and published by Cambridge University Press. This book was released on 2022-08-25 with total page 475 pages. Available in PDF, EPUB and Kindle. Book excerpt: Discover exciting new developments and applications of LEED and X-ray diffraction, alongside detailed introductory material.

Performance and Durability Assessment:

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Publisher : Elsevier
ISBN 13 : 0080538630
Total Pages : 412 pages
Book Rating : 4.0/5 (85 download)

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Book Synopsis Performance and Durability Assessment: by : Michael Kohl

Download or read book Performance and Durability Assessment: written by Michael Kohl and published by Elsevier. This book was released on 2004-10-09 with total page 412 pages. Available in PDF, EPUB and Kindle. Book excerpt: 2 real examples demonstrate how to obtain the service life of solar collector systems Durable, providing fundamentals that will continue to be valuable over the next 5-10 years Lighting a pathway to the commercialisation of solar products Solar devices lose their performance over time. The rate of degradation controls the service life of these devices. The essential concepts used to assess durability and performance of two specific solar collector systems are described, enabling researchers to assess durability in other solar devices. The examples of modelling, testing and performance measurements give researchers a how-to approach to reach crucial service lifetime predictions. Achieving successful and sustainable commercialisation of solar products relies on the fulfilment of 2 further criteria and these are also discussed. The methodology of service lifetime predictions (SLP), which is explained in detail in the book, is crucially needed in other solar technologies and is generally applicable to a wide variety of materials, components and systems used in other solar, biomedical, aerospace, electronic and coatings technologies. 2 real examples demonstrate how to obtain the service life of solar collector systems Reassuringly durable, providing fundamentals that will continue to be valuable over the next 5-10 years Lighting a pathway for the commercialisation of solar products

Advances in Imaging and Electron Physics

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Publisher : Academic Press
ISBN 13 : 0128174757
Total Pages : 376 pages
Book Rating : 4.1/5 (281 download)

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Book Synopsis Advances in Imaging and Electron Physics by : Peter W. Hawkes

Download or read book Advances in Imaging and Electron Physics written by Peter W. Hawkes and published by Academic Press. This book was released on 2019-10-25 with total page 376 pages. Available in PDF, EPUB and Kindle. Book excerpt: Advances in Imaging and Electron Physics, Volume 212, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains. Contains contributions from leading authorities on the subject matter Informs and updates on the latest developments in the field of imaging and electron physics Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electrons and ion emission with a valuable resource Features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing

Nanofabrication Using Focused Ion and Electron Beams

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Publisher : Oxford University Press
ISBN 13 : 0199920990
Total Pages : 840 pages
Book Rating : 4.1/5 (999 download)

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Book Synopsis Nanofabrication Using Focused Ion and Electron Beams by : Ivo Utke

Download or read book Nanofabrication Using Focused Ion and Electron Beams written by Ivo Utke and published by Oxford University Press. This book was released on 2012-03-05 with total page 840 pages. Available in PDF, EPUB and Kindle. Book excerpt: Nanofabrication Using Focused Ion and Electron Beams presents fundamentals of the interaction of focused ion and electron beams (FIB/FEB) with surfaces, as well as numerous applications of these techniques for nanofabrication involving different materials and devices. The book begins by describing the historical evolution of FIB and FEB systems, applied first for micro- and more recently for nanofabrication and prototyping, practical solutions available in the market for different applications, and current trends in development of tools and their integration in a fast growing field of nanofabrication and nanocharacterization. Limitations of the FIB/FEB techniques, especially important when nanoscale resolution is considered, as well as possible ways to overcome the experimental difficulties in creating new nanodevices and improving resolution of processing, are outlined. Chapters include tutorials describing fundamental aspects of the interaction of beams (FIB/FEB) with surfaces, nanostructures and adsorbed molecules; electron and ion beam chemistries; basic theory, design and configuration of equipment; simulations of processes; basic solutions for nanoprototyping. Emerging technologies as processing by cluster beams are also discussed. In addition, the book considers numerous applications of these techniques (milling, etching, deposition) for nanolithography, nanofabrication and characterization, involving different nanostructured materials and devices. Its main focus is on practical details of using focused ion and electron beams with gas assistance (deposition and etching) and without gas assistance (milling/cutting) for fabrication of devices from the fields of nanoelectronics, nanophotonics, nanomagnetics, functionalized scanning probe tips, nanosensors and other types of NEMS (nanoelectromechanical systems). Special attention is given to strategies designed to overcome limitations of the techniques (e.g., due to damaging produced by energetic ions interacting with matter), particularly those involving multi-step processes and multi-layer materials. Through its thorough demonstration of fundamental concepts and its presentation of a wide range of technologies developed for specific applications, this volume is ideal for researches from many different disciplines, as well as engineers and professors in nanotechnology and nanoscience.

Electronic Characterisation of Earth‐Abundant Sulphides for Solar Photovoltaics

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Publisher : Springer
ISBN 13 : 3319916653
Total Pages : 362 pages
Book Rating : 4.3/5 (199 download)

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Book Synopsis Electronic Characterisation of Earth‐Abundant Sulphides for Solar Photovoltaics by : Thomas James Whittles

Download or read book Electronic Characterisation of Earth‐Abundant Sulphides for Solar Photovoltaics written by Thomas James Whittles and published by Springer. This book was released on 2018-07-31 with total page 362 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book examines the electronic structure of earth-abundant and environmentally friendly materials for use as absorber layers within photovoltaic cells. The corroboration between high-quality photoemission measurements and density of states calculations yields valuable insights into why these materials have demonstrated poor device efficiencies in the vast literature cited. The book shows how the materials’ underlying electronic structures affect their properties, and how the band positions make them unsuitable for use with established solar cell technologies. After explaining these poor efficiencies, the book offers alternative window layer materials to improve the use of these absorbers. The power of photoemission and interpretation of the data in terms of factors generally overlooked in the literature, such as the materials’ oxidation and phase impurity, is demonstrated. Representing a unique reference guide, the book will be of considerable interest and value to members of the photoemission community engaged in solar cell research, and to a wider materials science audience as well.

Corrosion Tests and Standards

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Publisher : ASTM International
ISBN 13 :
Total Pages : 887 pages
Book Rating : 4./5 ( download)

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Book Synopsis Corrosion Tests and Standards by : Robert Baboian

Download or read book Corrosion Tests and Standards written by Robert Baboian and published by ASTM International. This book was released on 2005 with total page 887 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Surface Analysis

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Publisher : John Wiley & Sons
ISBN 13 : 1119965519
Total Pages : 690 pages
Book Rating : 4.1/5 (199 download)

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Book Synopsis Surface Analysis by : John C. Vickerman

Download or read book Surface Analysis written by John C. Vickerman and published by John Wiley & Sons. This book was released on 2011-08-10 with total page 690 pages. Available in PDF, EPUB and Kindle. Book excerpt: This completely updated and revised second edition of Surface Analysis: The Principal Techniques, deals with the characterisation and understanding of the outer layers of substrates, how they react, look and function which are all of interest to surface scientists. Within this comprehensive text, experts in each analysis area introduce the theory and practice of the principal techniques that have shown themselves to be effective in both basic research and in applied surface analysis. Examples of analysis are provided to facilitate the understanding of this topic and to show readers how they can overcome problems within this area of study.

Methods of Surface Analysis

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Publisher : CUP Archive
ISBN 13 : 9780521386906
Total Pages : 356 pages
Book Rating : 4.3/5 (869 download)

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Book Synopsis Methods of Surface Analysis by : J. M. Walls

Download or read book Methods of Surface Analysis written by J. M. Walls and published by CUP Archive. This book was released on 1990-04-12 with total page 356 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Thin Film and Depth Profile Analysis

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Publisher : Springer Science & Business Media
ISBN 13 : 3642464998
Total Pages : 214 pages
Book Rating : 4.6/5 (424 download)

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Book Synopsis Thin Film and Depth Profile Analysis by : H. Oechsner

Download or read book Thin Film and Depth Profile Analysis written by H. Oechsner and published by Springer Science & Business Media. This book was released on 2013-03-08 with total page 214 pages. Available in PDF, EPUB and Kindle. Book excerpt: The characterization of thin films and solid interfaces as well as the determina tion of concentration profiles in thin solid layers is one of the fields which re quire a rapid transfer of the results from basic research to technological applica tions and developments. It is the merit of the Dr. Wilhelm Heinrich and Else Heraeus-Stiftung to promote such a transfer by organizing high standard seminars mostly held at the "Physikzentrum" in Bad Honnef near Bonn. The present book has been stimulated by one of these seminars assembling most of the invited speakers as co-authors. The editor appreciates the cooperation of his colleagues contributing to this book. H. Oechsner Kaiserslautern, April 1984 v Contents 1. Introduction. ByH. Oechsner . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1. 1 Requirements for Thin Film and In-Depth Analysis . . . . . . . . . . . . . . . . . . . 1 1. 2 Object and Outl i ne of the Book . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2 4 References 2. The Application of Beam and Diffraction Techniques to Thin Film and Surface Micro-Analysis. By H. W. Werner (With 25 Fi gures) . . . . . . . . . . . . . . . . 5 2. 1 Methods to Determine Chemical Structures in Material Research 5 2. 2 Selected Analytical Features Used to Determine Chemical Structures 9 2. 2. 1 Depth Profi 1 ing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9 9 a) Destructive Depth Profiling b) Nondestructive Methods for Depth and Thin Film Analysis 15 19 2. 2. 2 Microspot Analysis and Element Imaging 2. 3 Determining Physical Structures in Material Research . . . . . . . . . . . . . . . 27 2. 3. 1 X-Ray Diffraction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27 2. 3. 2 X-Ray Double Crystal Diffraction . . . . . . . . . . . . . . . . . . . . . . . . . . . . 28 2. 3.

Auger- and X-Ray Photoelectron Spectroscopy in Materials Science

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Publisher : Springer Science & Business Media
ISBN 13 : 3642273815
Total Pages : 528 pages
Book Rating : 4.6/5 (422 download)

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Book Synopsis Auger- and X-Ray Photoelectron Spectroscopy in Materials Science by : Siegfried Hofmann

Download or read book Auger- and X-Ray Photoelectron Spectroscopy in Materials Science written by Siegfried Hofmann and published by Springer Science & Business Media. This book was released on 2012-10-25 with total page 528 pages. Available in PDF, EPUB and Kindle. Book excerpt: To anyone who is interested in surface chemical analysis of materials on the nanometer scale, this book is prepared to give appropriate information. Based on typical application examples in materials science, a concise approach to all aspects of quantitative analysis of surfaces and thin films with AES and XPS is provided. Starting from basic principles which are step by step developed into practically useful equations, extensive guidance is given to graduate students as well as to experienced researchers. Key chapters are those on quantitative surface analysis and on quantitative depth profiling, including recent developments in topics such as surface excitation parameter and backscattering correction factor. Basic relations are derived for emission and excitation angle dependencies in the analysis of bulk material and of fractional nano-layer structures, and for both smooth and rough surfaces. It is shown how to optimize the analytical strategy, signal-to-noise ratio, certainty and detection limit. Worked examples for quantification of alloys and of layer structures in practical cases (e.g. contamination, evaporation, segregation and oxidation) are used to critically review different approaches to quantification with respect to average matrix correction factors and matrix relative sensitivity factors. State-of-the-art issues in quantitative, destructive and non-destructive depth profiling are discussed with emphasis on sputter depth profiling and on angle resolved XPS and AES. Taking into account preferential sputtering and electron backscattering corrections, an introduction to the mixing-roughness-information depth (MRI) model and its extensions is presented.

Inorganic Mass Spectrometry

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Publisher : John Wiley & Sons
ISBN 13 : 9780470517208
Total Pages : 514 pages
Book Rating : 4.5/5 (172 download)

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Book Synopsis Inorganic Mass Spectrometry by : Sabine Becker

Download or read book Inorganic Mass Spectrometry written by Sabine Becker and published by John Wiley & Sons. This book was released on 2008-02-28 with total page 514 pages. Available in PDF, EPUB and Kindle. Book excerpt: Providing an exhaustive review of this topic, Inorganic Mass Spectrometry: Principles and Applications provides details on all aspects of inorganic mass spectrometry, from a historical overview of the topic to the principles and functions of mass separation and ion detection systems. Offering a comprehensive treatment of inorganic mass spectrometry, topics covered include: Recent developments in instrumentation Developing analytical techniques for measurements of trace and ultratrace impurities in different materials This broad textbook in inorganic mass spectrometry, presents the most important mass spectrometric techniques used in all fields of analytical chemistry. By covering recent developments and advances in all fields of inorganic mass spectrometry, this text provides researchers and students with information to answer any questions on this topic as well as providing the basic fundamentals for understanding this potentially complex, but increasingly relevant subject.

Erosion and Growth of Solids Stimulated by Atom and Ion Beams

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Publisher : Springer Science & Business Media
ISBN 13 : 9400944225
Total Pages : 476 pages
Book Rating : 4.4/5 (9 download)

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Book Synopsis Erosion and Growth of Solids Stimulated by Atom and Ion Beams by : G. Kiriakidis

Download or read book Erosion and Growth of Solids Stimulated by Atom and Ion Beams written by G. Kiriakidis and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 476 pages. Available in PDF, EPUB and Kindle. Book excerpt: The members of the organising Committee and their colleagues have, for many years been investigating the evol ution of the fas'cinating surface features which develop during sputtering erosion of solids. Such experimental, theoretical and computational studies have also been carried out in many international laboratories and, as well as much cow~onality and agreement, substantial disagreements were unresolved. In view of the increasing importance of such processes in technological applications such as microlitho graphic etching for the patterning of solid state devices and in fusion technology it was felt opportune to hold a meeting in this area. Furthermore the use of energetic atomic and ion fluxes is also becoming of increasing importance in assisting or modifying the growth of thin films in a number of important industrial processes and it was therefore rational to combine the, study of both erosional and growth processes in a single meeting. These proceedings include 16 invited review and 15 oral or poster presented contributions to the NATO Advanced Study Institute on the "Erosion and Growth of Solids Stimulated by Atom and Ion Beams". The review contributions span the range from the fundamental concepts of ballistic sputtering, and how this influences surface morphology evolution, through processes involving entrapment of incident species to mechanisms involved in'the use of chemically reactive ion species. Further reviews outline the influence of energetic irradiation upon surface growth by atomic deposition whilst others discuss technologkal applications of both areas of growth and erosion.

Surface Analysis and Techniques in Biology

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Publisher : Springer Science & Business Media
ISBN 13 : 3319013602
Total Pages : 326 pages
Book Rating : 4.3/5 (19 download)

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Book Synopsis Surface Analysis and Techniques in Biology by : Vincent S. Smentkowski

Download or read book Surface Analysis and Techniques in Biology written by Vincent S. Smentkowski and published by Springer Science & Business Media. This book was released on 2014-03-18 with total page 326 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book summarizes the main surface analysis techniques that are being used to study biological specimens/systems. The compilation of chapters in this book highlight the benefits that surface analysis provides. The outer layer of bulk solid or liquid samples is referred to as the surface of the sample/material. At the surface, the composition, microstructure, phase, chemical bonding, electronic states, and/or texture is often different than that of the bulk material. The outer surface is where many material interactions/reactions take place. This is especially true biomaterials which may be fabricated into bio-devices and in turn implanted into tissues and organs. Surfaces of biomaterials (synthetic or modified natural materials) are of critical importance since the surface is typically the only part of the biomaterial/bio-device that comes in contact with the biological system. Analytical techniques are required to characterize the surface of biomaterials and quantify their impact in real-world biological systems. Surface analysis of biological materials started in the 1960’s and the number of researchers working in this area have increased very rapidly since then, a number of advances have been made to standard surface analytical instrumentation, and a number of new instruments have been introduced.

Proceedings

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Publisher :
ISBN 13 :
Total Pages : 752 pages
Book Rating : 4.:/5 (318 download)

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Book Synopsis Proceedings by :

Download or read book Proceedings written by and published by . This book was released on 2007 with total page 752 pages. Available in PDF, EPUB and Kindle. Book excerpt: "Proceedings A publishes refereed research papers in the mathematical, physical, and engineering sciences. The emphasis is on new, emerging areas of interdisciplinary and multidisciplinary research." Continues: Proceedings. Mathematical and physical sciences.