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Author :
Publisher :
ISBN 13 :
Total Pages : 192 pages
Book Rating : 4.:/5 (31 download)
Download or read book ARFTG Conference Digest written by and published by . This book was released on 1998 with total page 192 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : J. Apolinar Reynoso Hernández
Publisher : CRC Press
ISBN 13 : 1040262317
Total Pages : 176 pages
Book Rating : 4.0/5 (42 download)
Download or read book Principles and Applications of Vector Network Analyzer Calibration Techniques written by J. Apolinar Reynoso Hernández and published by CRC Press. This book was released on 2024-12-19 with total page 176 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book summarizes the work developed over more than two decades in the field of advanced calibration techniques for vector network analyzers, by the RF and Microwave Group at The Center for Scientific Research and Higher Education of Ensenada, Baja California, Mexico, which is led by Dr. J. Apolinar Reynoso-Hernández, author of this book. This book is written so that every electrical engineer, with knowledge of electrical circuits and linear algebra basics, can understand the principles of VNA calibration techniques. Vector network analyzers are normally used by engineers and researchers working in the RF and microwave field, which usually requires advanced and specialized courses at graduate level. The reader should be able to implement any VNA calibration technique, decide the most adequate calibration for a given measurement condition, and interpret the measurement results, as a seasoned RF metrology expert. Principles and Applications of Vector Network Analyzer Calibration Techniques is a useful book for beginners and professionals working on • Microwave de-embedding and test fixture characterization • Characterization of uniform transmission lines • Load-pull measurements. It is also: • An ideal tutorial for professionals and postgraduate/research stu-dents taking courses in microwave calibration techniques. • A useful textbook for practicing electronics engineering and researchers working in the RF microwave field: calibration techniques and load-pull measurements.
Author : Peter Aaen
Publisher : Cambridge University Press
ISBN 13 : 113946812X
Total Pages : 375 pages
Book Rating : 4.1/5 (394 download)
Download or read book Modeling and Characterization of RF and Microwave Power FETs written by Peter Aaen and published by Cambridge University Press. This book was released on 2007-06-25 with total page 375 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book is a comprehensive exposition of FET modeling, and is a must-have resource for seasoned professionals and new graduates in the RF and microwave power amplifier design and modeling community. In it, you will find descriptions of characterization and measurement techniques, analysis methods, and the simulator implementation, model verification and validation procedures that are needed to produce a transistor model that can be used with confidence by the circuit designer. Written by semiconductor industry professionals with many years' device modeling experience in LDMOS and III-V technologies, this was the first book to address the modeling requirements specific to high-power RF transistors. A technology-independent approach is described, addressing thermal effects, scaling issues, nonlinear modeling, and in-package matching networks. These are illustrated using the current market-leading high-power RF technology, LDMOS, as well as with III-V power devices.
Author : Abdullah Eroglu
Publisher : CRC Press
ISBN 13 : 1351648004
Total Pages : 400 pages
Book Rating : 4.3/5 (516 download)
Download or read book Linear and Switch-Mode RF Power Amplifiers written by Abdullah Eroglu and published by CRC Press. This book was released on 2017-09-06 with total page 400 pages. Available in PDF, EPUB and Kindle. Book excerpt: RF power amplifiers are implemented in communication, semiconductor wafer processing, magnetic resonance imaging (MRI), and radar systems to produce RF signal with the desired characteristics to perform several critical tasks in the entire system. They can be designed to operate in linear or switch-mode, depending on the specific application. This book explores the design and implementation methods for both linear and switch-mode amplifiers with real world engineering problems. The text discusses phased controlled switch-mode amplifiers and distortion and modulation effects in RF amplifiers. It illustrates the interface and integration of components and sub-systems for RF amplifiers. The material is further reinforced with MATLAB design files.
Author : Nosherwan Shoaib
Publisher : Springer
ISBN 13 : 3319447726
Total Pages : 91 pages
Book Rating : 4.3/5 (194 download)
Download or read book Vector Network Analyzer (VNA) Measurements and Uncertainty Assessment written by Nosherwan Shoaib and published by Springer. This book was released on 2016-09-22 with total page 91 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book describes vector network analyzer measurements and uncertainty assessments, particularly in waveguide test-set environments, in order to establish their compatibility to the International System of Units (SI) for accurate and reliable characterization of communication networks. It proposes a fully analytical approach to measurement uncertainty evaluation, while also highlighting the interaction and the linear propagation of different uncertainty sources to compute the final uncertainties associated with the measurements. The book subsequently discusses the dimensional characterization of waveguide standards and the quality of the vector network analyzer (VNA) calibration techniques. The book concludes with an in-depth description of the novel verification artefacts used to assess the performance of the VNAs. It offers a comprehensive reference guide for beginners to experts, in both academia and industry, whose work involves the field of network analysis, instrumentation and measurements.
Author : Andrej Rumiantsev
Publisher : CRC Press
ISBN 13 : 1000792854
Total Pages : 279 pages
Book Rating : 4.0/5 (7 download)
Download or read book On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the mm-Wave Range and Beyond written by Andrej Rumiantsev and published by CRC Press. This book was released on 2022-09-01 with total page 279 pages. Available in PDF, EPUB and Kindle. Book excerpt: The increasing demand for more content, services, and security drives the development of high-speed wireless technologies, optical communication, automotive radar, imaging and sensing systems and many other mm-wave and THz applications. S-parameter measurement at mm-wave and sub-mm wave frequencies plays a crucial role in the modern IC design debug. Most importantly, however, is the step of device characterization for development and optimization of device model parameters for new technologies. Accurate characterization of the intrinsic device in its entire operation frequency range becomes extremely important and this task is very challenging. This book presents solutions for accurate mm-wave characterization of advanced semiconductor devices. It guides through the process of development, implementation and verification of the in-situ calibration methods optimized for high-performance silicon technologies. Technical topics discussed in the book include: Specifics of S-parameter measurements of planar structures Complete mathematical solution for lumped-standard based calibration methods, including the transfer Thru-Match-Reflect (TMR) algorithms Design guideline and examples for the on-wafer calibration standards realized in both advanced SiGe BiCMOS and RF CMOS processes Methods for verification of electrical characteristics of calibration standards and accuracy of the in-situ calibration results Comparison of the new technique vs. conventional approaches: the probe-tip calibration and the pad parasitic de-embedding for various device types, geometries and model parameters New aspects of the on-wafer RF measurements at mmWave frequency range and calibration assurance.
Author : José Carlos Pedro
Publisher : Cambridge University Press
ISBN 13 : 1107140595
Total Pages : 361 pages
Book Rating : 4.1/5 (71 download)
Download or read book Nonlinear Circuit Simulation and Modeling written by José Carlos Pedro and published by Cambridge University Press. This book was released on 2018-06-14 with total page 361 pages. Available in PDF, EPUB and Kindle. Book excerpt: A practical, tutorial guide to the nonlinear methods and techniques needed to design real-world microwave circuits.
Author : Fadhel M. Ghannouchi
Publisher : Springer Science & Business Media
ISBN 13 : 9400744617
Total Pages : 241 pages
Book Rating : 4.4/5 (7 download)
Download or read book Load-Pull Techniques with Applications to Power Amplifier Design written by Fadhel M. Ghannouchi and published by Springer Science & Business Media. This book was released on 2012-06-06 with total page 241 pages. Available in PDF, EPUB and Kindle. Book excerpt: This first book on load-pull systems is intended for readers with a broad knowledge of high frequency transistor device characterization, nonlinear and linear microwave measurements, RF power amplifiers and transmitters. Load-Pull Techniques with Applications to Power Amplifier Design fulfills the demands of users, designers, and researchers both from industry and academia who have felt the need of a book on this topic. It presents a comprehensive reference spanning different load-pull measurement systems, waveform measurement and engineering systems, and associated calibration procedures for accurate large signal characterization. Besides, this book also provides in-depth practical considerations required in the realization and usage of load-pull and waveform engineering systems. In addition, it also provides procedure to design application specific load-pull setup and includes several case studies where the user can customize architecture of load-pull setups to meet any specific measurement requirements. Furthermore, the materials covered in this book can be part of a full semester graduate course on microwave device characterization and power amplifier design.
Author : Nemai Chandra Karmakar
Publisher : John Wiley & Sons
ISBN 13 : 1119215773
Total Pages : 298 pages
Book Rating : 4.1/5 (192 download)
Download or read book Chipless Radio Frequency Identification Reader Signal Processing written by Nemai Chandra Karmakar and published by John Wiley & Sons. This book was released on 2016-03-17 with total page 298 pages. Available in PDF, EPUB and Kindle. Book excerpt: Presents a comprehensive overview and analysis of the recent developments in signal processing for Chipless Radio Frequency Identification Systems This book presents the recent research results on Radio Frequency Identification (RFID) and provides smart signal processing methods for detection, signal integrity, multiple-access and localization, tracking, and collision avoidance in Chipless RFID systems. The book is divided into two sections: The first section discusses techniques for detection and denoising in Chipless RFID systems. These techniques include signal space representation, detection of frequency signatures using UWB impulse radio interrogation, time domain analysis, singularity expansion method for data extraction, and noise reduction and filtering techniques. The second section covers collision and error correction protocols, multi-tag identification through time-frequency analysis, FMCW radar based collision detection and multi-access for Chipless RFID tags as we as localization and tag tracking. Describes the use of UWB impulse radio interrogation to remotely estimate the frequency signature of Chipless RFID tags using the backscatter principle Reviews the collision problem in both chipped and Chipless RFID systems and summarizes the prevailing anti-collision algorithms to address the problem Proposes state-of-the-art multi-access and signal integrity protocols to improve the efficacy of the system in multiple tag reading scenarios Features an industry approach to the integration of various systems of the Chipless RFID reader-integration of physical layers, middleware, and enterprise software Chipless Radio Frequency Identification Reader Signal Processing is primarily written for researchers in the field of RF sensors but can serve as supplementary reading for graduate students and professors in electrical engineering and wireless communications.
Author : James Randa
Publisher : John Wiley & Sons
ISBN 13 : 1119910110
Total Pages : 180 pages
Book Rating : 4.1/5 (199 download)
Download or read book Precision Measurement of Microwave Thermal Noise written by James Randa and published by John Wiley & Sons. This book was released on 2022-11-02 with total page 180 pages. Available in PDF, EPUB and Kindle. Book excerpt: Precision Measurement of Microwave Comprehensive resource covering the foundations and analysis of precision noise measurements with a detailed treatment of their uncertainties Precision Measurement of Microwave Thermal Noise presents the basics of precise measurements of thermal noise at microwave frequencies and guides readers through how to evaluate the uncertainties in such measurement. The focus is on measurement methods used at the U.S. National Institute of Standards and Technology (NIST), but the general principles and methods are useful in a wide range of applications. Readers will learn how to perform accurate microwave noise measurements using the respected author’s expertise of calculations to aid understanding of the challenges and solutions. The text covers the background required for the analysis of the measurements and the standards employed to calibrate radiofrequency and microwave radiometers. It also covers measurements of noise temperature (power) and the noise characteristics of amplifiers and transistors. In addition to the usual room-temperature two-port devices, cryogenic devices and multiport amplifiers are also discussed. Finally, the connection of these lab-based measurements to remote-sensing measurement (especially from space) is considered, and possible contributions of the lab-based measurements to remote-sensing applications are discussed. Specific topics and concepts covered in the text include: Noise-temperature standards, covering ambient standards, hot (oven) standards, cryogenic standards, and other standards and noise sources Amplifier noise, covering definition of noise parameters, measurement of noise parameters, uncertainty analysis for noise-parameter measurements, and simulations and strategies On-wafer noise measurements, covering on-wafer microwave formalism, noise temperature, on-wafer noise-parameter measurements, and uncertainties Multiport amplifiers, covering formalism and noise matrix, definition of noise figure for multiports, and degradation of signal-to-noise ratio Containing some introductory material, Precision Measurement of Microwave Thermal Noise is an invaluable resource on the subject for advanced students and all professionals working in (or entering) the field of microwave noise measurements, be it in a standards lab, a commercial lab, or academic research.
Author : Valeria Teppati
Publisher : Cambridge University Press
ISBN 13 : 1107245184
Total Pages : 475 pages
Book Rating : 4.1/5 (72 download)
Download or read book Modern RF and Microwave Measurement Techniques written by Valeria Teppati and published by Cambridge University Press. This book was released on 2013-06-20 with total page 475 pages. Available in PDF, EPUB and Kindle. Book excerpt: This comprehensive, hands-on review of the most up-to-date techniques in RF and microwave measurement combines microwave circuit theory and metrology, in-depth analysis of advanced modern instrumentation, methods and systems, and practical advice for professional RF and microwave engineers and researchers. Topics covered include microwave instrumentation, such as network analyzers, real-time spectrum analyzers and microwave synthesizers; linear measurements, such as VNA calibrations, noise figure measurements, time domain reflectometry and multiport measurements; and non-linear measurements, such as load- and source-pull techniques, broadband signal measurements, and non-linear NVAs. Each technique is discussed in detail and accompanied by state-of-the-art solutions to the unique technical challenges associated with its use. With each chapter written by internationally recognised experts in the field, this is an invaluable resource for researchers and professionals involved with microwave measurements.
Author : Mueller, Daniel
Publisher : KIT Scientific Publishing
ISBN 13 : 3731508222
Total Pages : 212 pages
Book Rating : 4.7/5 (315 download)
Download or read book RF Probe-Induced On-Wafer Measurement Errors in the Millimeter-Wave Frequency Range written by Mueller, Daniel and published by KIT Scientific Publishing. This book was released on 2018-11-22 with total page 212 pages. Available in PDF, EPUB and Kindle. Book excerpt: Measurement at millimeter-wave frequencies are prone to parasitic effects which distort the overall results. Especially the use of RF probes introduces unknown distortions, even after the measurement setup is calibrated. This works investigates these distortions based on electromagnetic field simulations of integrated circuits in conjunction with models of the used RF probes. This allows to comprehend the observed distortions and successfully resolve the root of the distortions.
Author : Jingchang Nan
Publisher : CRC Press
ISBN 13 : 1000409597
Total Pages : 217 pages
Book Rating : 4.0/5 (4 download)
Download or read book Nonlinear Modeling Analysis and Predistortion Algorithm Research of Radio Frequency Power Amplifiers written by Jingchang Nan and published by CRC Press. This book was released on 2021-07-30 with total page 217 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book is a summary of a series of achievements made by the authors and colleagues in the areas of radio frequency power amplifier modeling (including neural Volterra series modeling, neural network modeling, X-parameter modeling), nonlinear analysis methods, and power amplifier predistortion technology over the past 10 years. The book is organized into ten chapters, which respectively describe an overview of research of power amplifier behavioral models and predistortion technology, nonlinear characteristics of power amplifiers, power amplifier behavioral models and the basis of nonlinear analysis, an overview of power amplifier predistortion, Volterra series modeling of power amplifiers, power amplifier modeling based on neural networks, power amplifier modeling with X-parameters, the modeling of other power amplifiers, nonlinear circuit analysis methods, and predistortion algorithms and applications. Blending theory with analysis, this book will provide researchers and RF/microwave engineering students with a valuable resource.
Author :
Publisher :
ISBN 13 :
Total Pages : 148 pages
Book Rating : 4.F/5 ( download)
Download or read book National Semiconductor Metrology Program, Semiconductor Electronics Division, NIST List Of Publications, LP 103, March 1999 written by and published by . This book was released on 1999 with total page 148 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : National Institute of Standards and Technology (U.S.)
Publisher :
ISBN 13 :
Total Pages : 160 pages
Book Rating : 4.3/5 (91 download)
Download or read book National Semiconductor Metrology Program written by National Institute of Standards and Technology (U.S.) and published by . This book was released on 2000 with total page 160 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : National Semiconductor Metrology Program (U.S.)
Publisher :
ISBN 13 :
Total Pages : 136 pages
Book Rating : 4.F/5 ( download)
Download or read book National Semiconductor Metrology Program written by National Semiconductor Metrology Program (U.S.) and published by . This book was released on with total page 136 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author :
Publisher :
ISBN 13 :
Total Pages : 160 pages
Book Rating : 4.F/5 ( download)
Download or read book National Semiconductor Metrology Program, NIST List OF Publications, LP 103, May 2000 written by and published by . This book was released on 2000 with total page 160 pages. Available in PDF, EPUB and Kindle. Book excerpt:
