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Applied Scanning Probe Methods Characterization
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Book Synopsis Applied Scanning Probe Methods VIII by : Bharat Bhushan
Download or read book Applied Scanning Probe Methods VIII written by Bharat Bhushan and published by Springer Science & Business Media. This book was released on 2007-12-20 with total page 512 pages. Available in PDF, EPUB and Kindle. Book excerpt: The volumes VIII, IX and X examine the physical and technical foundation for recent progress in applied scanning probe techniques. This is the first book to summarize the state-of-the-art of this technique. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications.
Book Synopsis Applied Scanning Probe Methods XII by : Bharat Bhushan
Download or read book Applied Scanning Probe Methods XII written by Bharat Bhushan and published by Springer Science & Business Media. This book was released on 2008-10-24 with total page 271 pages. Available in PDF, EPUB and Kindle. Book excerpt: Crack initiation and growth are key issues when it comes to the mechanical reliab- ity of microelectronic devices and microelectromechanical systems (MEMS). Es- cially in organic electronics where exible substrates will play a major role these issues will become of utmost importance. It is therefore necessary to develop me- ods which in situ allow the experimental investigation of surface deformation and fracture processes in thin layers at a micro and nanometer scale. While scanning electron microscopy (SEM) might be used it is also associated with some major experimental drawbacks. First of all if polymers are investigated they usually have to be coated with a metal layer due to their commonly non-conductive nature. Additi- ally they might be damaged by the electron beam of the microscope or the vacuum might cause outgasing of solvents or evaporation of water and thus change material properties. Furthermore, for all kinds of materials a considerable amount of expe- mental effort is necessary to build a tensile testing machine that ts into the chamber. Therefore, a very promising alternative to SEM is based on the use of an atomic force microscope (AFM) to observe in situ surface deformation processes during straining of a specimen. First steps towards this goal were shown in the 1990s in [1–4] but none of these approaches truly was a microtensile test with sample thicknesses in the range of micrometers. To the authors’ knowledge, this was shown for the rst time by Hild et al. in [5]. 16.
Book Synopsis Applied Scanning Probe Methods XIII by : Bharat Bhushan
Download or read book Applied Scanning Probe Methods XIII written by Bharat Bhushan and published by Springer Science & Business Media. This book was released on 2008-10-29 with total page 284 pages. Available in PDF, EPUB and Kindle. Book excerpt: The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004, the second to fourth volumes in early 2006 and the fifth to seventh volumes in late 2006. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications. After introducing scanning probe microscopy, including sensor technology and tip characterization, chapters on use in various industrial applications are presented. Industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters have been written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.
Book Synopsis Applied Scanning Probe Methods XI by : Bharat Bhushan
Download or read book Applied Scanning Probe Methods XI written by Bharat Bhushan and published by Springer Science & Business Media. This book was released on 2008-10-22 with total page 281 pages. Available in PDF, EPUB and Kindle. Book excerpt: The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. These volumes constitute a timely comprehensive overview of SPM applications. Real industrial applications are included.
Book Synopsis Applied Scanning Probe Methods X by : Bharat Bhushan
Download or read book Applied Scanning Probe Methods X written by Bharat Bhushan and published by Springer Science & Business Media. This book was released on 2007-12-20 with total page 475 pages. Available in PDF, EPUB and Kindle. Book excerpt: The volumes VIII, IX and X examine the physical and technical foundation for recent progress in applied scanning probe techniques. This is the first book to summarize the state-of-the-art of this technique. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications.
Book Synopsis Applied Scanning Probe Methods I by : Bharat Bhushan
Download or read book Applied Scanning Probe Methods I written by Bharat Bhushan and published by Springer Science & Business Media. This book was released on 2014-02-26 with total page 485 pages. Available in PDF, EPUB and Kindle. Book excerpt: Examining the physical and technical foundation for recent progress with this technique, Applied Scanning Probe Methods offers a timely and comprehensive overview of SPM applications, now that industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. First it lays the theoretical background of static and dynamic force microscopies, including sensor technology and tip characterization, contributions detail applications such as macro- and nanotribology, polymer surfaces, and roughness investigations. The final part on industrial research addresses special applications of scanning force nanoprobes such as atomic manipulation and surface modification, as well as single electron devices based on SPM.
Book Synopsis Scanning Probe Microscopy by : Sergei V. Kalinin
Download or read book Scanning Probe Microscopy written by Sergei V. Kalinin and published by Springer Science & Business Media. This book was released on 2007-04-03 with total page 1002 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume will be devoted to the technical aspects of electrical and electromechanical SPM probes and SPM imaging on the limits of resolution, thus providing technical introduction into the field. This volume will also address the fundamental physical phenomena underpinning the imaging mechanism of SPMs.
Book Synopsis Applied Scanning Probe Methods IX by : Bharat Bhushan
Download or read book Applied Scanning Probe Methods IX written by Bharat Bhushan and published by Springer Science & Business Media. This book was released on 2007-12-20 with total page 436 pages. Available in PDF, EPUB and Kindle. Book excerpt: The volumes VIII, IX and X examine the physical and technical foundation for recent progress in applied scanning probe techniques. This is the first book to summarize the state-of-the-art of this technique. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely and comprehensive overview of SPM applications.
Book Synopsis Scanning Probe Microscopy and Spectroscopy by : Roland Wiesendanger
Download or read book Scanning Probe Microscopy and Spectroscopy written by Roland Wiesendanger and published by Cambridge University Press. This book was released on 1994-09-29 with total page 664 pages. Available in PDF, EPUB and Kindle. Book excerpt: The investigation and manipulation of matter on the atomic scale have been revolutionised by scanning tunnelling microscopy and related scanning probe techniques. This book is the first to provide a clear and comprehensive introduction to this subject. Beginning with the theoretical background of scanning tunnelling microscopy, the design and instrumentation of practical STM and associated systems are described in detail, as are the applications of these techniques in fields such as condensed matter physics, chemistry, biology, and nanotechnology. Containing 350 illustrations, and over 1200 references, this unique book represents an ideal introduction to the subject for final-year undergraduates in physics or materials science. It will also be invaluable to graduate students and researchers in any branch of science where scanning probe techniques are used.
Book Synopsis Nanocharacterization Techniques by : Osvaldo de Oliveira Jr
Download or read book Nanocharacterization Techniques written by Osvaldo de Oliveira Jr and published by William Andrew. This book was released on 2017-03-18 with total page 224 pages. Available in PDF, EPUB and Kindle. Book excerpt: Nanocharacterization Techniques covers the main characterization techniques used in nanomaterials and nanostructures. The chapters focus on the fundamental aspects of characterization techniques and their distinctive approaches. Significant advances that have taken place over recent years in refining techniques are covered, and the mathematical foundations needed to use the techniques are also explained in detail. This book is an important reference for materials scientists and engineers looking for a through analysis of nanocharacterization techniques in order to establish which is best for their needs. - Includes a detailed analysis of different nanocharacterization techniques, allowing readers to explore which one is best for their particular needs - Provides examples of how each characterization technique has been used, giving readers a greater understanding of how each technique can be profitably used - Covers the mathematical background needed to utilize each of these techniques to their best effect, meaning that readers can gain a full understanding of the theoretical principles behind each technique covered - Serves as an important, go-to reference for materials scientists and engineers
Book Synopsis Scanning Probe Microscopy by : Ernst Meyer
Download or read book Scanning Probe Microscopy written by Ernst Meyer and published by Springer Nature. This book was released on 2021-05-31 with total page 330 pages. Available in PDF, EPUB and Kindle. Book excerpt: Written by three leading experts in the field, this textbook describes and explains all aspects of the scanning probe microscopy. Emphasis is placed on the experimental design and procedures required to optimize the performance of the various methods. Scanning Probe Microscopy covers not only the physical principles behind scanning probe microscopy but also questions of instrumental designs, basic features of the different imaging modes, and recurring artifacts. The intention is to provide a general textbook for all types of classes that address scanning probe microscopy. Third year undergraduates and beyond should be able to use it for self-study or as textbook to accompany a course on probe microscopy. Furthermore, it will be valuable as reference book in any scanning probe microscopy laboratory. Novel applications and the latest important results are also presented, and the book closes with a look at the future prospects of scanning probe microscopy, also discussing related techniques in nanoscience. Ideally suited as an introduction for graduate students, the book will also serve as a valuable reference for practising researchers developing and using scanning probe techniques.
Book Synopsis Spectroscopy for Materials Characterization by : Simonpietro Agnello
Download or read book Spectroscopy for Materials Characterization written by Simonpietro Agnello and published by John Wiley & Sons. This book was released on 2021-09-08 with total page 500 pages. Available in PDF, EPUB and Kindle. Book excerpt: SPECTROSCOPY FOR MATERIALS CHARACTERIZATION Learn foundational and advanced spectroscopy techniques from leading researchers in physics, chemistry, surface science, and nanoscience In Spectroscopy for Materials Characterization, accomplished researcher Simonpietro Agnello delivers a practical and accessible compilation of various spectroscopy techniques taught and used to today. The book offers a wide-ranging approach taught by leading researchers working in physics, chemistry, surface science, and nanoscience. It is ideal for both new students and advanced researchers studying and working with spectroscopy. Topics such as confocal and two photon spectroscopy, as well as infrared absorption and Raman and micro-Raman spectroscopy, are discussed, as are thermally stimulated luminescence and spectroscopic studies of radiation effects on optical materials. Each chapter includes a basic introduction to the theory necessary to understand a specific technique, details about the characteristic instrumental features and apparatuses used, including tips for the appropriate arrangement of a typical experiment, and a reproducible case study that shows the discussed techniques used in a real laboratory. Readers will benefit from the inclusion of: Complete and practical case studies at the conclusion of each chapter to highlight the concepts and techniques discussed in the material Citations of additional resources ideal for further study A thorough introduction to the basic aspects of radiation matter interaction in the visible-ultraviolet range and the fundamentals of absorption and emission A rigorous exploration of time resolved spectroscopy at the nanosecond and femtosecond intervals Perfect for Master and Ph.D. students and researchers in physics, chemistry, engineering, and biology, Spectroscopy for Materials Characterization will also earn a place in the libraries of materials science researchers and students seeking a one-stop reference to basic and advanced spectroscopy techniques.
Book Synopsis Scanning Probe Microscopy in Nanoscience and Nanotechnology 2 by : Bharat Bhushan
Download or read book Scanning Probe Microscopy in Nanoscience and Nanotechnology 2 written by Bharat Bhushan and published by Springer Science & Business Media. This book was released on 2010-12-17 with total page 823 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.
Book Synopsis Scanning Probe Microscopy and Spectroscopy by : Dawn Bonnell
Download or read book Scanning Probe Microscopy and Spectroscopy written by Dawn Bonnell and published by John Wiley & Sons. This book was released on 2000-12-05 with total page 520 pages. Available in PDF, EPUB and Kindle. Book excerpt: A practical introduction to basic theory and contemporary applications across a wide range of research disciplines Over the past two decades, scanning probe microscopies and spectroscopies have gained acceptance as indispensable characterization tools for an array of disciplines. This book provides novices and experienced researchers with a highly accessible treatment of basic theory, alongside detailed examples of current applications of both scanning tunneling and force microscopies and spectroscopies. Like its popular predecessor, Scanning Probe Microscopy and Spectroscopy, Second Edition features contributions from distinguished scientists working in a wide range of specialties at university, commercial, and government research labs around the world. Chapters have been edited for clarity, conciseness, and uniformity of presentation to provide professionals with a concise working reference to scanning probe microscopic and spectroscopic principles, techniques, and practices. This Second Edition has been substantially revised and expanded to reflect important advances and new applications. In addition to numerous examples, the Second Edition features expanded coverage of electrostatic and magnetic force microscopies, near-field optical microscopies, and new applications of buried interfaces in nanomechanics, electrochemistry, and biology. Scanning Probe Microscopy and Spectroscopy, Second Edition is an indispensable working resource for surface scientists, microscopists, and spectroscopists in materials science, chemistry, engineering, biochemistry, physics, and the life sciences. It is also an unparalleled reference text for advanced undergraduates and graduate students in those fields.
Book Synopsis Kelvin Probe Force Microscopy by : Sascha Sadewasser
Download or read book Kelvin Probe Force Microscopy written by Sascha Sadewasser and published by Springer. This book was released on 2018-03-09 with total page 530 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides a comprehensive introduction to the methods and variety of Kelvin probe force microscopy, including technical details. It also offers an overview of the recent developments and numerous applications, ranging from semiconductor materials, nanostructures and devices to sub-molecular and atomic scale electrostatics. In the last 25 years, Kelvin probe force microscopy has developed from a specialized technique applied by a few scanning probe microscopy experts into a tool used by numerous research and development groups around the globe. This sequel to the editors’ previous volume “Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces,” presents new and complementary topics. It is intended for a broad readership, from undergraduate students to lab technicians and scanning probe microscopy experts who are new to the field.
Book Synopsis Multiscale Dissipative Mechanisms and Hierarchical Surfaces by : Michael Nosonovsky
Download or read book Multiscale Dissipative Mechanisms and Hierarchical Surfaces written by Michael Nosonovsky and published by Springer Science & Business Media. This book was released on 2008-06-21 with total page 285 pages. Available in PDF, EPUB and Kindle. Book excerpt: Multiscale Dissipative Mechanisms and Hierarchical Surfaces covers the rapidly developing topics of hierarchical surfaces, roughness-induced superhydrophobicity and biomimetic surfaces. The research in these topics has been progressing rapidly in the recent years due to the advances in the nanosciences and surfaces science and due to potential applications in nanotechnology. The first in its field, this monograph provides a comprehensive review of these subjects and presents the background introduction as well as recent and new results in the area.
Book Synopsis Semiconductor Nanostructures by : Dieter Bimberg
Download or read book Semiconductor Nanostructures written by Dieter Bimberg and published by Springer Science & Business Media. This book was released on 2008-06-03 with total page 369 pages. Available in PDF, EPUB and Kindle. Book excerpt: Reducing the size of a coherently grown semiconductor cluster in all three directions of space to a value below the de Broglie wavelength of a charge carrier leads to complete quantization of the energy levels, density of states, etc. Such “quantum dots” are more similar to giant atoms in a dielectric cage than to classical solids or semiconductors showing a dispersion of energy as a function of wavevector. Their electronic and optical properties depend strongly on their size and shape, i.e. on their geometry. By designing the geometry by controlling the growth of QDs, absolutely novel possibilities for material design leading to novel devices are opened. This multiauthor book written by world-wide recognized leaders of their particular fields and edited by the recipient of the Max-Born Award and Medal 2006 Professor Dieter Bimberg reports on the state of the art of the growing of quantum dots, the theory of self-organised growth, the theory of electronic and excitonic states, optical properties and transport in a variety of materials. It covers the subject from the early work beginning of the 1990s up to 2006. The topics addressed in the book are the focus of research in all leading semiconductor and optoelectronic device laboratories of the world.
