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Author :
Publisher :
ISBN 13 : 9789992232972
Total Pages : pages
Book Rating : 4.2/5 (329 download)
Download or read book Applications of Electron Microscopy in the Earth Sciences written by and published by . This book was released on 1990 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Mineralogical Association of Canada
Publisher :
ISBN 13 :
Total Pages : 228 pages
Book Rating : 4.0/5 ( download)
Download or read book Applications of Electron Microscopy in the Earth Sciences written by Mineralogical Association of Canada and published by . This book was released on 1985 with total page 228 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Association minéralogique du Canada
Publisher :
ISBN 13 :
Total Pages : 213 pages
Book Rating : 4.:/5 (17 download)
Download or read book Applications of Electron Microscopy in the Earth Sciences written by Association minéralogique du Canada and published by . This book was released on 1985 with total page 213 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Philip J. Potts
Publisher : Springer Science & Business Media
ISBN 13 : 1461520533
Total Pages : 430 pages
Book Rating : 4.4/5 (615 download)
Download or read book Microprobe Techniques in the Earth Sciences written by Philip J. Potts and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 430 pages. Available in PDF, EPUB and Kindle. Book excerpt: 30% discount for members of The Mineralogical Society of Britain and Ireland This text covers the range of microanalytical techniques available for the analysis of geological samples, principally in research applications. Each chapter is written in a clear, informative style and has a tutorial element, designed to introduce each technique for the beginning and experienced researcher alike.
Author : Joseph Clancy White
Publisher :
ISBN 13 :
Total Pages : 213 pages
Book Rating : 4.:/5 (498 download)
Download or read book Applications of Electron Microscopy in the Earth Sciences written by Joseph Clancy White and published by . This book was released on 1985 with total page 213 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : J. C. White
Publisher :
ISBN 13 :
Total Pages : 213 pages
Book Rating : 4.:/5 (86 download)
Download or read book Short Course in Applications of Electron Microscopy in the Earth Sciences written by J. C. White and published by . This book was released on 1985 with total page 213 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : S. J. B. Reed
Publisher : Cambridge University Press
ISBN 13 : 113944638X
Total Pages : 232 pages
Book Rating : 4.1/5 (394 download)
Download or read book Electron Microprobe Analysis and Scanning Electron Microscopy in Geology written by S. J. B. Reed and published by Cambridge University Press. This book was released on 2005-08-25 with total page 232 pages. Available in PDF, EPUB and Kindle. Book excerpt: Originally published in 2005, this book covers the closely related techniques of electron microprobe analysis (EMPA) and scanning electron microscopy (SEM) specifically from a geological viewpoint. Topics discussed include: principles of electron-target interactions, electron beam instrumentation, X-ray spectrometry, general principles of SEM image formation, production of X-ray 'maps' showing elemental distributions, procedures for qualitative and quantitative X-ray analysis (both energy-dispersive and wavelength-dispersive), the use of both 'true' electron microprobes and SEMs fitted with X-ray spectrometers, and practical matters such as sample preparation and treatment of results. Throughout, there is an emphasis on geological aspects not mentioned in similar books aimed at a more general readership. The book avoids unnecessary technical detail in order to be easily accessible, and forms a comprehensive text on EMPA and SEM for geological postgraduate and postdoctoral researchers, as well as those working in industrial laboratories.
Author : Mineralogical Association of Canada
Publisher :
ISBN 13 :
Total Pages : 213 pages
Book Rating : 4.:/5 (315 download)
Download or read book Applications of Electron Microscopy in the Earth Science written by Mineralogical Association of Canada and published by . This book was released on 1985 with total page 213 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Joseph Goldstein
Publisher : Springer Science & Business Media
ISBN 13 : 1461332737
Total Pages : 679 pages
Book Rating : 4.4/5 (613 download)
Download or read book Scanning Electron Microscopy and X-Ray Microanalysis written by Joseph Goldstein and published by Springer Science & Business Media. This book was released on 2013-11-11 with total page 679 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book has evolved by processes of selection and expansion from its predecessor, Practical Scanning Electron Microscopy (PSEM), published by Plenum Press in 1975. The interaction of the authors with students at the Short Course on Scanning Electron Microscopy and X-Ray Microanalysis held annually at Lehigh University has helped greatly in developing this textbook. The material has been chosen to provide a student with a general introduction to the techniques of scanning electron microscopy and x-ray microanalysis suitable for application in such fields as biology, geology, solid state physics, and materials science. Following the format of PSEM, this book gives the student a basic knowledge of (1) the user-controlled functions of the electron optics of the scanning electron microscope and electron microprobe, (2) the characteristics of electron-beam-sample inter actions, (3) image formation and interpretation, (4) x-ray spectrometry, and (5) quantitative x-ray microanalysis. Each of these topics has been updated and in most cases expanded over the material presented in PSEM in order to give the reader sufficient coverage to understand these topics and apply the information in the laboratory. Throughout the text, we have attempted to emphasize practical aspects of the techniques, describing those instru ment parameters which the microscopist can and must manipulate to obtain optimum information from the specimen. Certain areas in particular have been expanded in response to their increasing importance in the SEM field. Thus energy-dispersive x-ray spectrometry, which has undergone a tremendous surge in growth, is treated in substantial detail.
Author : Renée Heilbronner
Publisher : Springer Science & Business Media
ISBN 13 : 364210343X
Total Pages : 521 pages
Book Rating : 4.6/5 (421 download)
Download or read book Image Analysis in Earth Sciences written by Renée Heilbronner and published by Springer Science & Business Media. This book was released on 2013-07-03 with total page 521 pages. Available in PDF, EPUB and Kindle. Book excerpt: Image Analysis in Earth Sciences is a graduate level textbook for researchers and students interested in the quantitative microstructure and texture analysis of earth materials. Methods of analysis and applications are introduced using carefully worked examples. The input images are typically derived from earth materials, acquired at a wide range of scales, through digital photography, light and electron microscopy. The book focuses on image acquisition, pre- and post-processing, on the extraction of objects (segmentation), the analysis of volumes and grain size distributions, on shape fabric analysis (particle and surface fabrics) and the analysis of the frequency domain (FFT and ACF). The last chapters are dedicated to the analysis of crystallographic fabrics and orientation imaging. Throughout the book the free software Image SXM is used.
Author : Joseph Goldstein
Publisher : Springer
ISBN 13 : 9781461332756
Total Pages : 673 pages
Book Rating : 4.3/5 (327 download)
Download or read book Scanning Electron Microscopy and X-Ray Microanalysis written by Joseph Goldstein and published by Springer. This book was released on 2013-03-20 with total page 673 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book has evolved by processes of selection and expansion from its predecessor, Practical Scanning Electron Microscopy (PSEM), published by Plenum Press in 1975. The interaction of the authors with students at the Short Course on Scanning Electron Microscopy and X-Ray Microanalysis held annually at Lehigh University has helped greatly in developing this textbook. The material has been chosen to provide a student with a general introduction to the techniques of scanning electron microscopy and x-ray microanalysis suitable for application in such fields as biology, geology, solid state physics, and materials science. Following the format of PSEM, this book gives the student a basic knowledge of (1) the user-controlled functions of the electron optics of the scanning electron microscope and electron microprobe, (2) the characteristics of electron-beam-sample inter actions, (3) image formation and interpretation, (4) x-ray spectrometry, and (5) quantitative x-ray microanalysis. Each of these topics has been updated and in most cases expanded over the material presented in PSEM in order to give the reader sufficient coverage to understand these topics and apply the information in the laboratory. Throughout the text, we have attempted to emphasize practical aspects of the techniques, describing those instru ment parameters which the microscopist can and must manipulate to obtain optimum information from the specimen. Certain areas in particular have been expanded in response to their increasing importance in the SEM field. Thus energy-dispersive x-ray spectrometry, which has undergone a tremendous surge in growth, is treated in substantial detail.
Author : V. Randle
Publisher : Routledge
ISBN 13 : 9781906540111
Total Pages : 146 pages
Book Rating : 4.5/5 (41 download)
Download or read book B0798 Microtexture Determination and Its Applications written by V. Randle and published by Routledge. This book was released on 2013-02 with total page 146 pages. Available in PDF, EPUB and Kindle. Book excerpt: The characterisation of microstructure is a cornerstone in the study of both natural and technological materials. In the widest sense this topic encompasses for all phases present: morphology, including size and shape distributions; chemical composition; and crystallographic parameters, including orientation and orientation relationships. A landmark advance for the materials community occurred with the genesis of 'microtexture', which for the first time provided integration of crystallographic parameters and other aspects of the microstructure. Microtexture can be defined as 'a population of crystallographic orientations whose individual components are linked to their location within the microstructure'. The term microtexture can also be applied to any experimental technique used to determine this information. Essentially, atomic planes in the sampled volume of specimen diffract a stationary beam of electrons. Analysis of the resulting diffraction pattern provides crystallographic information which can be related back to its position of origin. An estimated 95% of microtexture determination is by electron backscatter diffraction (EBSD) in a scanning electron microscope (SEM), with the remaining 5% contributed mainly by transmission electron microscopy (TEM) counterparts to EBSD. Evaluation determination is by electron backscatter diffraction (EBSD) in a scanning electron microscope (SEM), with the remaining 5% contributed mainly by transmission electron microscopy (TEM) counterparts to EBSD. Evaluation (indexing) of EBSD diffraction patterns and output of data in a variety of formats is in most cases fully automated. The most exciting EBSD output is an 'orientation map', which is a quantitative depiction of the microstructure in terms of its orientation constituents. Microtexture determination is now firmly established as the most comprehensive experimental tool for quantitative characterisation and analysis of microstructure, and is used extensively in both research and industry. Much has changed since this book was first published and the second edition has been completely rewritten to reflect these developments.
Author : Peter R. Buseck
Publisher : Walter de Gruyter GmbH & Co KG
ISBN 13 : 150150973X
Total Pages : 532 pages
Book Rating : 4.5/5 (15 download)
Download or read book Minerals and Reactions at the Atomic Scale written by Peter R. Buseck and published by Walter de Gruyter GmbH & Co KG. This book was released on 2018-12-17 with total page 532 pages. Available in PDF, EPUB and Kindle. Book excerpt: Volume 27 of Reviews in Mineralogy provides a background to the TEM as a mineralogical tool, to give an introduction to the principles underlying its operation, and to explore mineralogical applications and ways in which electron microscopy can augment our knowledge of mineral structures, chemistry, and origin. Much time will be devoted to mineralogical applications. It provides sufficient information to allow mineralogists and petrologists to have an informed understanding of the data produced by transmission electron microscopy and to have enough knowledge and experience to undertake initial studies on their own. The opening chapters cover the principles of electron microscopy and chemical analysis using the TEM; while the following chapters consider mineralogical, petrological, and geochemical applications and their implications, for both low- and high-temperature geological environments. The Mineralogical Society of America sponsored a short courses in conjunction with their annual meetings with the Geological Society of America, and this volume represents the proceedings of the eighteenth in the sequence. This TEM course was convened October 23-25, 1992, at Hueston Woods State Park, College Comer, Ohio.
Author : P.E. Champness
Publisher : Springer Science & Business Media
ISBN 13 : 3642661963
Total Pages : 574 pages
Book Rating : 4.6/5 (426 download)
Download or read book Electron Microscopy in Mineralogy written by P.E. Champness and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 574 pages. Available in PDF, EPUB and Kindle. Book excerpt: During the last five years transmission electron microscopy (TEM) has added numerous important new data to mineralogy and has considerably changed its outlook. This is partly due to the fact that metallurgists and crystal physicists having solved most of the structural and crystallographic problems in metals have begun to show a widening interest in the much more complicated structures of minerals, and partly to recent progress in experimental techniques, mainly the availability of ion-thinning devices. While electron microscopists have become increasingly interested in minerals (judging from special symposia at recent meetings such as Fifth European Congress on Electron microscopy, Man chester 1972; Eight International Congress on Electron Microscopy, Canberra 1974) mineralogists have realized advantages of the new technique and applied it with increasing frequency. In an effort to coordinate the growing quantity of research, electron microscopy sessions have been included in meetings of mineralogists (e. g. Geological Society of America, Minneapolis, 1972, American Crystallographic Association, Berkeley, 1974). The tremendous response for the TEM symposium which H. -R. Wenk and G. Thomas organized at the Berkeley Conference of the American Crystallographic Association formed the basis for this book. It appeared useful at this stage to summarize the achievements of electron microscopy, scattered in many different journals in several different fields and present them to mineralogists. A group of participants as the Berkeley symposium formed an Editorial Committee and outlined the content of this book.
Author : P.E. Champness
Publisher : Garland Science
ISBN 13 : 1000102335
Total Pages : 185 pages
Book Rating : 4.0/5 (1 download)
Download or read book Electron Diffraction in the Transmission Electron Microscope written by P.E. Champness and published by Garland Science. This book was released on 2020-08-13 with total page 185 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book is a practical guide to electron diffraction in the transmission electron microscope (TEM). Case studies and examples are used to provide an invaluable introduction to the subject for those new to the technique. The book explains the basic methods used to obtain diffraction patterns with the TEM. The numerous illustrations aid the understanding of the conclusions reached.
Author : Neil S. Mancktelow
Publisher :
ISBN 13 :
Total Pages : 88 pages
Book Rating : 4.F/5 ( download)
Download or read book The Simplon Fault Zone written by Neil S. Mancktelow and published by . This book was released on 1990 with total page 88 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Adam J. Schwartz
Publisher : Springer Science & Business Media
ISBN 13 : 1475732058
Total Pages : 352 pages
Book Rating : 4.4/5 (757 download)
Download or read book Electron Backscatter Diffraction in Materials Science written by Adam J. Schwartz and published by Springer Science & Business Media. This book was released on 2013-06-29 with total page 352 pages. Available in PDF, EPUB and Kindle. Book excerpt: Crystallographic texture or preferred orientation has long been known to strongly influence material properties. Historically, the means of obtaining such texture data has been though the use of x-ray or neutron diffraction for bulk texture measurements, or transmission electron microscopy or electron channeling for local crystallographic information. In recent years, we have seen the emergence of a new characterization technique for probing the microtexture of materials. This advance has come about primarily through the automated indexing of electron backscatter diffraction (EBSD) patterns. The first commercially available system was introduced in 1994, and since then of sales worldwide has been dramatic. This has accompanied widening the growth applicability in materials scienceproblems such as microtexture, phase identification, grain boundary character distribution, deformation microstructures, etc. and is evidence that this technique can, in some cases, replace more time-consuming transmission electron microscope (TEM) or x-ray diffraction investigations. The benefits lie in the fact that the spatial resolution on new field emission scanning electron microscopes (SEM) can approach 50 nm, but spatial extent can be as large a centimeter or greater with a computer controlled stage and montagingofthe images. Additional benefits include the relative ease and low costofattaching EBSD hardware to new or existing SEMs. Electron backscatter diffraction is also known as backscatter Kikuchi diffraction (BKD), or electron backscatter pattern technique (EBSP). Commercial names for the automation include Orientation Imaging Microscopy (OIMTM) and Automated Crystal Orientation Mapping (ACOM).
