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Application Of Automated Expert Spectral Image Analysis Axsia To Time Of Flight Secondary Ion Mass Spectrometry Tof Sims
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Book Synopsis Application of Automated Expert Spectral Image Analysis (AXSIA) to Time-of-flight Secondary Ion Mass Spectrometry (TOF-SIMS) by : James A. Ohlhausen
Download or read book Application of Automated Expert Spectral Image Analysis (AXSIA) to Time-of-flight Secondary Ion Mass Spectrometry (TOF-SIMS) written by James A. Ohlhausen and published by . This book was released on 2004 with total page 216 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis The Practice of TOF-SIMS by : Alan M. Spool
Download or read book The Practice of TOF-SIMS written by Alan M. Spool and published by Momentum Press. This book was released on 2016-03-24 with total page 267 pages. Available in PDF, EPUB and Kindle. Book excerpt: Time of flight secondary ion mass spectrometry, TOF-SIMS, is a highly surface sensitive analytical technique that provides information about composition with submicron lateral resolution. For select materials, TOF-SIMS provides unparalleled sensitivity along with excellent reproducibility, and as a mass spectrometric technique, it also provides excellent specificity. Of the analytical methods available, it is among the most surface sensitive, but the physical principles that underlie it are also the least understood. This volume describes the instrumentation, the physical principles behind the technique to the extent they are understood, and provides a practical approach for the interpretation of TOF-SIMS data. The use of advanced data processing methods such as multivariate statistics are described in a readily approachable manner. Given a basic background in undergraduate chemistry and physics, the book will be of use to any student with an interest in the technique.
Book Synopsis An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science by : Sarah Fearn
Download or read book An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science written by Sarah Fearn and published by Morgan & Claypool Publishers. This book was released on 2015-10-16 with total page 67 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book highlights the application of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) for high-resolution surface analysis and characterization of materials. While providing a brief overview of the principles of SIMS, it also provides examples of how dual-beam ToF-SIMS is used to investigate a range of materials systems and properties. Over the years, SIMS instrumentation has dramatically changed since the earliest secondary ion mass spectrometers were first developed. Instruments were once dedicated to either the depth profiling of materials using high-ion-beam currents to analyse near surface to bulk regions of materials (dynamic SIMS), or time-of-flight instruments that produced complex mass spectra of the very outer-most surface of samples, using very low-beam currents (static SIMS). Now, with the development of dual-beam instruments these two very distinct fields now overlap.
Download or read book ToF-SIMS written by J. C. Vickerman and published by IM Publications. This book was released on 2013 with total page 742 pages. Available in PDF, EPUB and Kindle. Book excerpt: Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is the most versatile of the surface analysis techniques that have been developed during the last 30 years. This is the Second Edition of the first book ToF-SIMS: Surface analysis by Mass Spectrometry to be dedicated to the subject and the treatment is comprehensive
Book Synopsis New Trends and Potentialities of ToF-SIMS in Surface Studies by : Jacek Grams
Download or read book New Trends and Potentialities of ToF-SIMS in Surface Studies written by Jacek Grams and published by Nova Publishers. This book was released on 2007 with total page 292 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents the latest trends and applications of time-of-flight secondary ion mass spectrometry (ToF-SIMS). It includes research and applications of the new primary ion guns. It also describes new possibilities of mass spectrometers and instrumentation development.
Book Synopsis The Application of Time-of-flight Secondary Ion Mass Spectrometry (ToF-SIMS) to Forensic Glass Analysis and Questioned Document Examination by : John Denman
Download or read book The Application of Time-of-flight Secondary Ion Mass Spectrometry (ToF-SIMS) to Forensic Glass Analysis and Questioned Document Examination written by John Denman and published by . This book was released on 2007 with total page 488 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Advanced Analytical Methods in Tribology by : Martin Dienwiebel
Download or read book Advanced Analytical Methods in Tribology written by Martin Dienwiebel and published by Springer. This book was released on 2018-10-04 with total page 332 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents the basics and methods of nanoscale analytical techniques for tribology field. It gives guidance to the application of mechanical, microstructural, chemical characterization methods and topography analysis of materials. It provides an overview of the of state-of-the-art for researchers and practitioners in the field of tribology. It shows different examples to the application of mechanical, microstructural, chemical characterization methods and topography analysis of materials. Friction and Wear phenomena are governed by complexe processes at the interface of sliding surfaces. For a detailed understanding of these phenomena many surface sensitive techniques have become available in recent years. The applied methods are atom probe tomography, in situ TEM, SERS, NEXAFS, in situ XPS, nanoindentation and in situ Raman spectroscopy. A survey of new related numerical calculations completes this book. This concerns ab-initio coupling, numerical calculations for mechanical aspects and density functional theory (DFT) to study chemical reactivity.
Book Synopsis Application of Time-of-flight Secondary Ion Mass Spectrometry (TOF-SIMS) for High Performance Depth Profiling of Semiconductor Materials by : Karsten Iltgen
Download or read book Application of Time-of-flight Secondary Ion Mass Spectrometry (TOF-SIMS) for High Performance Depth Profiling of Semiconductor Materials written by Karsten Iltgen and published by . This book was released on 1997 with total page 82 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Secondary Ion Mass Spectrometry SIMS VIII by : A. Benninghoven
Download or read book Secondary Ion Mass Spectrometry SIMS VIII written by A. Benninghoven and published by . This book was released on 1992-09-29 with total page 950 pages. Available in PDF, EPUB and Kindle. Book excerpt: The proceedings of the Eighth International Conference on Secondary Ion Mass Spectrometry was held in Amsterdam, September 15-20, 1991. Contains over 200 contributions by international experts in their respective fields regarding the recent progress in analytical applications, instrument development and understanding the secondary ion formation and emission processes. Coverage includes techniques for extremely sensitive quantitative element analysis with high lateral and depth resolution, increasing SIMS application to molecular and, in particular, organic materials and much more.
Book Synopsis Optimization and Application of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) for the Detection of Nanomaterials in Tissue Thin Sections by : Lothar Veith
Download or read book Optimization and Application of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) for the Detection of Nanomaterials in Tissue Thin Sections written by Lothar Veith and published by . This book was released on 2019 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Accounting for the Dead Time in Analysis of Time of Flight Secondary Ion Mass Spectrometry Data by : Negar Shahrokhesfahani
Download or read book Accounting for the Dead Time in Analysis of Time of Flight Secondary Ion Mass Spectrometry Data written by Negar Shahrokhesfahani and published by . This book was released on 2018 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: Time of Flight Secondary Ion Mass Spectrometry (ToF SIMS) is a powerful tool for advanced surface analysis. It produces large data sets, which consist of mass spectra at each pixel at an imaged area. Many ToF SIMS instruments use a type of detector that suffers from two problems that lead to non-linearity in the measured sample properties: detector saturation and dead time. Linearity in this type of system is defined as the proportionality of the measured and true ion counts. Non-linearity can influence the interpretation of the data with methods such as multivariate analysis. "Detector saturation" happens when more than one ion arrives at the detector in the time interval related to one specific channel but the detector records only a single count. "Dead time" is when one event happens at a certain channel and the detector become insensitive to subsequent ions arriving within the dead time window. These problems both lead to under-counting of ions. In this thesis, we mainly focus on correcting for the dead time effects. Using extensive simulations, we first characterize the adverse effects of dead time on the output and evaluate quality of existing ways to "correct" for dead time effects. Then, we propose a novel method using the Maximum Likelihood Estimation (MLE) to estimate the true spectrum for the measured data. Specifically, we incorporate the statistical distribution of the dead time affected data in MLE, which leads to a new method for dead time correction.
Book Synopsis Applications of Time-of-flight Secondary Ion Mass Spectrometry (TOF-SIMS) and X-ray Photoelectron Spectroscopy (XPS) to Study Interactions of Genetically Engineered Proteins with Noble Metal Films by : Noriaki Suzuki
Download or read book Applications of Time-of-flight Secondary Ion Mass Spectrometry (TOF-SIMS) and X-ray Photoelectron Spectroscopy (XPS) to Study Interactions of Genetically Engineered Proteins with Noble Metal Films written by Noriaki Suzuki and published by . This book was released on 2006 with total page 340 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Application of Molecular Primary Ions for Time-of-flight Secondary Ion Mass Spectrometry (TOF-SIMS) of Organic Surfaces by : Dietmar Stapel
Download or read book Application of Molecular Primary Ions for Time-of-flight Secondary Ion Mass Spectrometry (TOF-SIMS) of Organic Surfaces written by Dietmar Stapel and published by . This book was released on 2000 with total page 85 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Multivariate Statistical Analysis of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) Raw Data Files by :
Download or read book Multivariate Statistical Analysis of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) Raw Data Files written by and published by . This book was released on 2007 with total page 43 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Time-of-flight Secondary Ion Mass Spectrometry by : Joanna Lee
Download or read book Time-of-flight Secondary Ion Mass Spectrometry written by Joanna Lee and published by . This book was released on 2011 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is a powerful technique for the analysis of organic surfaces and interfaces for many innovative technologies. However, despite recent developments, there are still many issues and challenges hindering the robust, validated use of ToF-SIMS for quantitative measurement. These include: the lack of metrology and fundamental understanding for the use of novel cluster primary ion beams such as C60n+ and Ar2000 +; the need for validated and robust measurement protocols for difficult samples, such as those with significant micron scale surface topography; the lack of guidance on novel data analysis methods including multivariate analysis which have the potential to simplify many time-consuming and intensive analyses in industry; and the need to establish best practice to improve the accuracy of measurements. This thesis describes research undertaken to address the above challenges. Sample topography and field effects were evaluated experimentally using model conducting and insulating fibres and compared with computer simulations to provide recommendation to diagnose and reduce the effects. Two popular multivariate methods, principal component analysis (PCA) and multivariate curve resolution (MCR), were explored using mixed organic systems consisting of a simple polymer blend and complex hair fibres treated with a multi-component formulation to evaluate different multivariate and data preprocessing methods for the optimal identification, localisation and quantification of the chemical components. Finally, cluster ion beams C60 n+ and ArSOO-2S00 + were evaluated on an inorganic surface and an organic delta layer reference material respectively to elucidate the fundamental metrology of cluster ion sputtering and pave the way for their use in organic depth profiling. These studies provide the essential metrological foundation to address frontier issues in surface and nanoanalysis and extend the measurement capabilities ofToF-SIMS.
Book Synopsis Applications of Time-of-flight Mass Spectrometry for Coupling with Separations and Polymer Analysis by : John Timothy Mehl
Download or read book Applications of Time-of-flight Mass Spectrometry for Coupling with Separations and Polymer Analysis written by John Timothy Mehl and published by . This book was released on 1999 with total page 312 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Dissertation Abstracts International by :
Download or read book Dissertation Abstracts International written by and published by . This book was released on 2006 with total page 884 pages. Available in PDF, EPUB and Kindle. Book excerpt:
