An Artificial Intelligence Approach to Test Generation

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Publisher : Springer Science & Business Media
ISBN 13 : 146131979X
Total Pages : 202 pages
Book Rating : 4.4/5 (613 download)

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Book Synopsis An Artificial Intelligence Approach to Test Generation by : Narinder Singh

Download or read book An Artificial Intelligence Approach to Test Generation written by Narinder Singh and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 202 pages. Available in PDF, EPUB and Kindle. Book excerpt: I am indebted to my thesis advisor, Michael Genesereth, for his guidance, inspiration, and support which has made this research possible. As a teacher and a sounding board for new ideas, Mike was extremely helpful in pointing out Haws, and suggesting new directions to explore. I would also like to thank Harold Brown for introducing me to the application of artificial intelligence to reasoning about designs, and his many valuable comments as a reader of this thesis. Significant contribu tions by the other members of my reading committee, Mark Horowitz, and Allen Peterson have greatly improved the content and organization of this thesis by forcing me to communicate my ideas more clearly. I am extremely grateful to the other members of the Logic Group at the Heuristic Programming Project for being a sounding board for my ideas, and providing useful comments. In particular, I would like to thank Matt Ginsberg, Vineet Singh, Devika Subramanian, Richard Trietel, Dave Smith, Jock Mackinlay, and Glenn Kramer for their pointed criticisms. This research was supported by Schlumberger Palo Alto Research (previously Fairchild Laboratory for Artificial Intelligence). I am grateful to Peter Hart, the former head of the AI lab, and his successor Marty Tenenbaum for providing an excellent environment for performing this research.

Application of Artificial Intelligence to Assessment

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Publisher : IAP
ISBN 13 : 1641139536
Total Pages : 223 pages
Book Rating : 4.6/5 (411 download)

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Book Synopsis Application of Artificial Intelligence to Assessment by : Hong Jiao

Download or read book Application of Artificial Intelligence to Assessment written by Hong Jiao and published by IAP. This book was released on 2020-03-01 with total page 223 pages. Available in PDF, EPUB and Kindle. Book excerpt: The general theme of this book is to present the applications of artificial intelligence (AI) in test development. In particular, this book includes research and successful examples of using AI technology in automated item generation, automated test assembly, automated scoring, and computerized adaptive testing. By utilizing artificial intelligence, the efficiency of item development, test form construction, test delivery, and scoring could be dramatically increased. Chapters on automated item generation offer different perspectives related to generating a large number of items with controlled psychometric properties including the latest development of using machine learning methods. Automated scoring is illustrated for different types of assessments such as speaking and writing from both methodological aspects and practical considerations. Further, automated test assembly is elaborated for the conventional linear tests from both classical test theory and item response theory perspectives. Item pool design and assembly for the linear-on-the-fly tests elaborates more complications in practice when test security is a big concern. Finally, several chapters focus on computerized adaptive testing (CAT) at either item or module levels. CAT is further illustrated as an effective approach to increasing test-takers’ engagement in testing. In summary, the book includes both theoretical, methodological, and applied research and practices that serve as the foundation for future development. These chapters provide illustrations of efforts to automate the process of test development. While some of these automation processes have become common practices such as automated test assembly, automated scoring, and computerized adaptive testing, some others such as automated item generation calls for more research and exploration. When new AI methods are emerging and evolving, it is expected that researchers can expand and improve the methods for automating different steps in test development to enhance the automation features and practitioners can adopt quality automation procedures to improve assessment practices.

Artificial Intelligence Methods In Software Testing

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Author :
Publisher : World Scientific
ISBN 13 : 9814482609
Total Pages : 221 pages
Book Rating : 4.8/5 (144 download)

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Book Synopsis Artificial Intelligence Methods In Software Testing by : Mark Last

Download or read book Artificial Intelligence Methods In Software Testing written by Mark Last and published by World Scientific. This book was released on 2004-06-03 with total page 221 pages. Available in PDF, EPUB and Kindle. Book excerpt: An inadequate infrastructure for software testing is causing major losses to the world economy. The characteristics of software quality problems are quite similar to other tasks successfully tackled by artificial intelligence techniques. The aims of this book are to present state-of-the-art applications of artificial intelligence and data mining methods to quality assurance of complex software systems, and to encourage further research in this important and challenging area.

Artificial Intelligence Methods in Software Testing

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Author :
Publisher : World Scientific
ISBN 13 : 9812794751
Total Pages : 221 pages
Book Rating : 4.8/5 (127 download)

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Book Synopsis Artificial Intelligence Methods in Software Testing by : Horst Bunke

Download or read book Artificial Intelligence Methods in Software Testing written by Horst Bunke and published by World Scientific. This book was released on 2004 with total page 221 pages. Available in PDF, EPUB and Kindle. Book excerpt: An inadequate infrastructure for software testing is causing major losses to the world economy. The characteristics of software quality problems are quite similar to other tasks successfully tackled by artificial intelligence techniques. The aims of this book are to present state-of-the-art applications of artificial intelligence and data mining methods to quality assurance of complex software systems, and to encourage further research in this important and challenging area. Contents: Fuzzy CauseOCoEffect Models of Software Testing (W Pedrycz & G Vukovich); Black-Box Testing with Info-Fuzzy Networks (M Last & M Friedman); Automated GUI Regression Testing Using AI Planning (A M Memon); Test Set Generation and Reduction with Artificial Neural Networks (P Saraph et al.); Three-Group Software Quality Classification Modeling Using an Automated Reasoning Approach (T M Khoshgoftaar & N Seliya); Data Mining with Resampling in Software Metrics Databases (S Dick & A Kandel). Readership: Students, researchers and professionals in computer science, information systems, software testing and data mining."

Introduction to Advanced System-on-Chip Test Design and Optimization

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Publisher : Springer Science & Business Media
ISBN 13 : 0387256245
Total Pages : 397 pages
Book Rating : 4.3/5 (872 download)

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Book Synopsis Introduction to Advanced System-on-Chip Test Design and Optimization by : Erik Larsson

Download or read book Introduction to Advanced System-on-Chip Test Design and Optimization written by Erik Larsson and published by Springer Science & Business Media. This book was released on 2006-03-30 with total page 397 pages. Available in PDF, EPUB and Kindle. Book excerpt: SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. It gives an introduction to testing, describes the problems related to SOC testing, discusses the modeling granularity and the implementation into EDA (electronic design automation) tools. The book is divided into three sections: i) test concepts, ii) SOC design for test, and iii) SOC test applications. The first part covers an introduction into test problems including faults, fault types, design-flow, design-for-test techniques such as scan-testing and Boundary Scan. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling. Finally, the third part focuses on SOC applications, such as integrated test scheduling and TAM design, defect-oriented scheduling, and integrating test design with the core selection process.

Neural Models and Algorithms for Digital Testing

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Publisher : Springer Science & Business Media
ISBN 13 : 1461539587
Total Pages : 187 pages
Book Rating : 4.4/5 (615 download)

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Book Synopsis Neural Models and Algorithms for Digital Testing by : S.T. Chadradhar

Download or read book Neural Models and Algorithms for Digital Testing written by S.T. Chadradhar and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 187 pages. Available in PDF, EPUB and Kindle. Book excerpt: References . . . . . . . . . . . . . . . . . . . . . . . . . . . . 82 9 QUADRATIC 0-1 PROGRAMMING 8S 9. 1 Energy Minimization 86 9. 2 Notation and Tenninology . . . . . . . . . . . . . . . . . 87 9. 3 Minimization Technique . . . . . . . . . . . . . . . . . . 88 9. 4 An Example . . . . . . . . . . . . . . . . . . . . . . . . 92 9. 5 Accelerated Energy Minimization. . . . . . . . . . . . . 94 9. 5. 1 Transitive Oosure . . . . . . . . . . . . . . . . . 94 9. 5. 2 Additional Pairwise Relationships 96 9. 5. 3 Path Sensitization . . . . . . . . . . . . . . . . . 97 9. 6 Experimental Results 98 9. 7 Summary. . . . . . . . . . . . . . . . . . . . . . . . . . 100 References . . . . . . . . . . . . . . . . . . . . . . . . . . . . 100 10 TRANSITIVE CLOSURE AND TESTING 103 10. 1 Background . . . . . . . . . . . . . . . . . . . . . . . . 104 10. 2 Transitive Oosure Definition 105 10. 3 Implication Graphs 106 10. 4 A Test Generation Algorithm 107 10. 5 Identifying Necessary Assignments 112 10. 5. 1 Implicit Implication and Justification 113 10. 5. 2 Transitive Oosure Does More Than Implication and Justification 115 10. 5. 3 Implicit Sensitization of Dominators 116 10. 5. 4 Redundancy Identification 117 10. 6 Summary 119 References . . . . . . . . . . . . . . . . . . . . . . . . . . . . 119 11 POLYNOMIAL-TIME TESTABILITY 123 11. 1 Background 124 11. 1. 1 Fujiwara's Result 125 11. 1. 2 Contribution of the Present Work . . . . . . . . . 126 11. 2 Notation and Tenninology 127 11. 3 A Polynomial TlDle Algorithm 128 11. 3. 1 Primary Output Fault 129 11. 3. 2 Arbitrary Single Fault 135 11. 3. 3 Multiple Faults. . . . . . . . . . . . . . . . . . . 137 11. 4 Summary. . . . . . . . . . . . . . . . . . . . . . . . . . 139 References . . . . . . . . . . . . . . . . . . . . . . . . . . . . 139 ix 12 SPECIAL CASES OF HARD PROBLEMS 141 12. 1 Problem Statement 142 12. 2 Logic Simulation 143 12. 3 Logic Circuit Modeling . 146 12. 3. 1 Modelfor a Boolean Gate . . . . . . . . . . . . . 147 12. 3. 2 Circuit Modeling 148 12.

Knowledge-Based Software Engineering

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Publisher : Springer Science & Business Media
ISBN 13 : 058534714X
Total Pages : 105 pages
Book Rating : 4.5/5 (853 download)

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Book Synopsis Knowledge-Based Software Engineering by : Dorothy E. Setliff

Download or read book Knowledge-Based Software Engineering written by Dorothy E. Setliff and published by Springer Science & Business Media. This book was released on 2007-12-14 with total page 105 pages. Available in PDF, EPUB and Kindle. Book excerpt: Knowledge-Based Software Engineering brings together in one place important contributions and up-to-date research results in this important area. Knowledge-Based Software Engineering serves as an excellent reference, providing insight into some of the most important research issues in the field.

Principles of Testing Electronic Systems

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Publisher : John Wiley & Sons
ISBN 13 : 9780471319313
Total Pages : 444 pages
Book Rating : 4.3/5 (193 download)

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Book Synopsis Principles of Testing Electronic Systems by : Samiha Mourad

Download or read book Principles of Testing Electronic Systems written by Samiha Mourad and published by John Wiley & Sons. This book was released on 2000-07-25 with total page 444 pages. Available in PDF, EPUB and Kindle. Book excerpt: A pragmatic approach to testing electronic systems As we move ahead in the electronic age, rapid changes in technology pose an ever-increasing number of challenges in testing electronic products. Many practicing engineers are involved in this arena, but few have a chance to study the field in a systematic way-learning takes place on the job. By covering the fundamental disciplines in detail, Principles of Testing Electronic Systems provides design engineers with the much-needed knowledge base. Divided into five major parts, this highly useful reference relates design and tests to the development of reliable electronic products; shows the main vehicles for design verification; examines designs that facilitate testing; and investigates how testing is applied to random logic, memories, FPGAs, and microprocessors. Finally, the last part offers coverage of advanced test solutions for today's very deep submicron designs. The authors take a phenomenological approach to the subject matter while providing readers with plenty of opportunities to explore the foundation in detail. Special features include: * An explanation of where a test belongs in the design flow * Detailed discussion of scan-path and ordering of scan-chains * BIST solutions for embedded logic and memory blocks * Test methodologies for FPGAs * A chapter on testing system on a chip * Numerous references

Industrial And Engineering Applications Of Artificial Intelligence And Expert Systems

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Publisher : CRC Press
ISBN 13 : 9780897912716
Total Pages : 636 pages
Book Rating : 4.9/5 (127 download)

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Book Synopsis Industrial And Engineering Applications Of Artificial Intelligence And Expert Systems by : Moonis Ali

Download or read book Industrial And Engineering Applications Of Artificial Intelligence And Expert Systems written by Moonis Ali and published by CRC Press. This book was released on 1988-08 with total page 636 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Coordination of Distributed Problem Solvers

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Publisher : Springer Science & Business Media
ISBN 13 : 1461316995
Total Pages : 278 pages
Book Rating : 4.4/5 (613 download)

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Book Synopsis Coordination of Distributed Problem Solvers by : Edmund H. Durfee

Download or read book Coordination of Distributed Problem Solvers written by Edmund H. Durfee and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 278 pages. Available in PDF, EPUB and Kindle. Book excerpt: As artificial intelligence (AI) is applied to more complex problems and a wider set of applications, the ability to take advantage of the computational power of distributed and parallel hardware architectures and to match these architec tures with the inherent distributed aspects of applications (spatial, functional, or temporal) has become an important research issue. Out of these research concerns, an AI subdiscipline called distributed problem solving has emerged. Distributed problem-solving systems are broadly defined as loosely-coupled, distributed networks of semi-autonomous problem-solving agents that perform sophisticated problem solving and cooperatively interact to solve problems. N odes operate asynchronously and in parallel with limited internode commu nication. Limited internode communication stems from either inherent band width limitations of the communication medium or from the high computa tional cost of packaging and assimilating information to be sent and received among agents. Structuring network problem solving to deal with consequences oflimited communication-the lack of a global view and the possibility that the individual agents may not have all the information necessary to accurately and completely solve their subproblems-is one of the major focuses of distributed problem-solving research. It is this focus that also is one of the important dis tinguishing characteristics of distributed problem-solving research that sets it apart from previous research in AI.

Testing Artificial Intelligence-based Software Systems

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Publisher :
ISBN 13 :
Total Pages : 155 pages
Book Rating : 4.:/5 (132 download)

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Book Synopsis Testing Artificial Intelligence-based Software Systems by : Jaganmohan Chandrasekaran

Download or read book Testing Artificial Intelligence-based Software Systems written by Jaganmohan Chandrasekaran and published by . This book was released on 2022 with total page 155 pages. Available in PDF, EPUB and Kindle. Book excerpt: Artificial Intelligence (AI)-based software systems are increasingly used in high-stake and safety-critical domains, including recidivism prediction, medical diagnosis, and autonomous driving. There is an urgent need to ensure the reliability and correctness of AI-based systems. At the core of AI-based software systems is a machine learning (ML) model that is used to perform tasks such as classification and prediction. Unlike software programs, where a developer explicitly writes the decision logic, ML models learn the decision logic from a large training dataset. Furthermore, many ML models encode the decision logic in the form of mathematic functions that can be quite abstract and complex. Thus, existing software testing techniques cannot be directly applied to test AI-based applications.The goal of this dissertation is to develop methodologies for testing AI-based software systems. This dissertation makes contributions in the following areas: Test input generation: 1) A combinatorial approach for generating test configurations to test five classical machine learning algorithms. 2) A combinatorial approach for generating test data (synthetic images) to test Deep Neural Network (DNN) models used in autonomous driving cars. Test Cost Reduction: 3) An empirical study that analyzes the effect of using sampled datasets to test supervised learning algorithms. Explainable AI (XAI): 4) A software fault localization-based explainable AI (XAI) approach that produces counterfactual explanations for decisions made by image classifier models (DNN models).This dissertation is presented in an article-based format and includes five research papers. The first paper reports our work on applying combinatorial testing to test five classical machine learning algorithms. The second paper reports an extensive empirical evaluation of testing ML algorithms with sampled datasets. The third paper introduces a combinatorial testing-based approach to generating test images to test pre-trained DNN models used in autonomous driving cars. The fourth paper is an extension of the third paper. This paper presents an initial study that evaluates the performance of combinatorial testing in testing DNNs used in autonomous driving cars. The fifth paper presents an explainable AI (XAI) approach that adopts BEN, an existing software fault localization technique, and produces explanations for decisions made by ML models. All five papers have been accepted at peer-reviewed venues. Paper 1, Paper 2, Paper 3,and Paper 5 have been published, while Paper 4 is currently in press.

Artificial Intelligence in the Pacific Rim

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Publisher : IOS Press
ISBN 13 : 9789051990539
Total Pages : 1024 pages
Book Rating : 4.9/5 (95 download)

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Book Synopsis Artificial Intelligence in the Pacific Rim by : Hozumi Tanaka

Download or read book Artificial Intelligence in the Pacific Rim written by Hozumi Tanaka and published by IOS Press. This book was released on 1991 with total page 1024 pages. Available in PDF, EPUB and Kindle. Book excerpt: In the last decade, AI firmly settled into our industrial society with the expert systems as the representative product. However, almost every one of the systems could cover only a single task domain. In the highly mechanized world of the 21st century, systems will become smart and user friendly enough to cover a wide range of task domains. Systems with much user friendliness must be multilingual because users in different domains usually have different languages. Language is formed in its own culture. Therefore, promotion for cross-cultural scientific interchange will be indispensable for the progress of AI.

Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits

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Publisher : Springer Science & Business Media
ISBN 13 : 0792379918
Total Pages : 712 pages
Book Rating : 4.7/5 (923 download)

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Book Synopsis Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits by : M. Bushnell

Download or read book Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits written by M. Bushnell and published by Springer Science & Business Media. This book was released on 2004-12-15 with total page 712 pages. Available in PDF, EPUB and Kindle. Book excerpt: The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device techn- ogy, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester course and a teacher will have to select from the topics. We did not restrict such freedom because the selection may depend upon the individual expertise and interests. Besides, there is merit in having a larger book that will retain its usefulness for the owner even after the completion of the course. With equal tenacity, we address the needs of three other groups of readers.

Efficient Branch and Bound Search with Application to Computer-Aided Design

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Publisher : Springer Science & Business Media
ISBN 13 : 1461313295
Total Pages : 151 pages
Book Rating : 4.4/5 (613 download)

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Book Synopsis Efficient Branch and Bound Search with Application to Computer-Aided Design by : Xinghao Chen

Download or read book Efficient Branch and Bound Search with Application to Computer-Aided Design written by Xinghao Chen and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 151 pages. Available in PDF, EPUB and Kindle. Book excerpt: Branch-and-bound search has been known for a long time and has been widely used in solving a variety of problems in computer-aided design (CAD) and many important optimization problems. In many applications, the classic branch-and-bound search methods perform duplications of computations, or rely on the search decision trees which keep track of the branch-and-bound search processes. In CAD and many other technical fields, the computational cost of constructing branch-and-bound search decision trees in solving large scale problems is prohibitive and duplications of computations are intolerable. Efficient branch-and-bound methods are needed to deal with today's computational challenges. Efficient branch-and-bound methods must not duplicate computations. Efficient Branch and Bound Search with Application to Computer-Aided Design describes an efficient branch-and-bound method for logic justification, which is fundamental to automatic test pattern generation (ATPG), redundancy identification, logic synthesis, minimization, verification, and other problems in CAD. The method is called justification equivalence, based on the observation that justification processes may share identical subsequent search decision sequences. With justification equivalence, duplication of computations is avoided in the dynamic branch-and-bound search process without using search decision trees. Efficient Branch and Bound Search with Application to Computer-Aided Design consists of two parts. The first part, containing the first three chapters, provides the theoretical work. The second part deals with applications, particularly ATPG for sequential circuits. This book is particularly useful to readers who are interested in the design and test of digital circuits.

Artificial Intelligence and Instruction

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Publisher : Educational Technology
ISBN 13 : 9780877782209
Total Pages : 116 pages
Book Rating : 4.7/5 (822 download)

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Book Synopsis Artificial Intelligence and Instruction by : William D. Milheim

Download or read book Artificial Intelligence and Instruction written by William D. Milheim and published by Educational Technology. This book was released on 1989 with total page 116 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Artificial Intelligence Methods for Optimization of the Software Testing Process

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Author :
Publisher : Academic Press
ISBN 13 : 0323912826
Total Pages : 232 pages
Book Rating : 4.3/5 (239 download)

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Book Synopsis Artificial Intelligence Methods for Optimization of the Software Testing Process by : Sahar Tahvili

Download or read book Artificial Intelligence Methods for Optimization of the Software Testing Process written by Sahar Tahvili and published by Academic Press. This book was released on 2022-07-21 with total page 232 pages. Available in PDF, EPUB and Kindle. Book excerpt: Artificial Intelligence Methods for Optimization of the Software Testing Process: With Practical Examples and Exercises presents different AI-based solutions for overcoming the uncertainty found in many initial testing problems. The concept of intelligent decision making is presented as a multi-criteria, multi-objective undertaking. The book provides guidelines on how to manage diverse types of uncertainty with intelligent decision-making that can help subject matter experts in many industries improve various processes in a more efficient way. As the number of required test cases for testing a product can be large (in industry more than 10,000 test cases are usually created). Executing all these test cases without any particular order can impact the results of the test execution, hence this book fills the need for a comprehensive resource on the topics on the how's, what's and whys. To learn more about Elsevier’s Series, Uncertainty, Computational Techniques and Decision Intelligence, please visit this link: https://www.elsevier.com/books-and-journals/book-series/uncertainty-computational-techniques-and-decision-intelligence Presents one of the first empirical studies in the field, contrasting theoretical assumptions on innovations in a real industrial environment with a large set of use cases from developed and developing testing processes at various large industries Explores specific comparative methodologies, focusing on developed and developing AI-based solutions Serves as a guideline for conducting industrial research in the artificial intelligence and software testing domain Explains all proposed solutions through real industrial case studies

Defect and Fault Tolerance in VLSI Systems

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Publisher : Springer Science & Business Media
ISBN 13 : 1475799578
Total Pages : 313 pages
Book Rating : 4.4/5 (757 download)

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Book Synopsis Defect and Fault Tolerance in VLSI Systems by : C.H. Stapper

Download or read book Defect and Fault Tolerance in VLSI Systems written by C.H. Stapper and published by Springer Science & Business Media. This book was released on 2013-06-29 with total page 313 pages. Available in PDF, EPUB and Kindle. Book excerpt: Higher circuit densities, increasingly more complex application ohjectives, and advanced packaging technologies have suhstantially increased the need to incorporate defect-tolerance and fault-tolerance in the design of VLSI and WSI systems. The goals of defect-tolerance and fault-tolerance are yield enhancement and improved reliahility. The emphasis on this area has resulted in a new field of interdisciplinary scientific research. I n fact, advanced methods of defect/fault control and tolerance are resulting in enhanced manufacturahility and productivity of integrated circuit chips, VI.SI systems, and wafer scale integrated circuits. In 1987, Dr. W. Moore organized an "International Workshop on Designing for Yield" at Oxford University. Edited papers of that workshop were published in reference [II. The participants in that workshop agreed that meetings of this type should he con tinued. preferahly on a yearly hasis. It was Dr. I. Koren who organized the "IEEE Inter national Workshop on Defect and Fault Tolerance in VLSI Systems" in Springfield Massachusetts the next year. Selected papers from that workshop were puhlished as the first volume of this series [21.