Modern Developments in X-Ray and Neutron Optics

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Author :
Publisher : Springer
ISBN 13 : 3540745610
Total Pages : 541 pages
Book Rating : 4.5/5 (47 download)

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Book Synopsis Modern Developments in X-Ray and Neutron Optics by : Alexei Erko

Download or read book Modern Developments in X-Ray and Neutron Optics written by Alexei Erko and published by Springer. This book was released on 2008-04-01 with total page 541 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume describes modern developments in reflective, refractive and diffractive optics for short wavelength radiation. It also covers recent theoretical approaches to modelling and ray-tracing the x-ray and neutron optical systems. It is based on the joint research activities of specialists in x-ray and neutron optics, working together under the framework of the European Programme for Cooperation in Science and Technology (COST, Action P7) in the period 2002-2006.

High-precision EUV and X-ray Optics for Advanced Photon Source Facilities

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Author :
Publisher : Frontiers Media SA
ISBN 13 : 2832513182
Total Pages : 95 pages
Book Rating : 4.8/5 (325 download)

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Book Synopsis High-precision EUV and X-ray Optics for Advanced Photon Source Facilities by : Qiushi Huang

Download or read book High-precision EUV and X-ray Optics for Advanced Photon Source Facilities written by Qiushi Huang and published by Frontiers Media SA. This book was released on 2023-02-02 with total page 95 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Advances in X-ray/EUV Optics, Components, and Applications

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Publisher :
ISBN 13 :
Total Pages : 406 pages
Book Rating : 4.3/5 (91 download)

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Book Synopsis Advances in X-ray/EUV Optics, Components, and Applications by :

Download or read book Advances in X-ray/EUV Optics, Components, and Applications written by and published by . This book was released on 2006 with total page 406 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Advances in Metrology for X-Ray and EUV Optics II

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Publisher :
ISBN 13 :
Total Pages : pages
Book Rating : 4.:/5 (746 download)

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Book Synopsis Advances in Metrology for X-Ray and EUV Optics II by :

Download or read book Advances in Metrology for X-Ray and EUV Optics II written by and published by . This book was released on 2007 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

EUV Sources for Lithography

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Publisher : SPIE Press
ISBN 13 : 9780819458452
Total Pages : 1104 pages
Book Rating : 4.4/5 (584 download)

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Book Synopsis EUV Sources for Lithography by : Vivek Bakshi

Download or read book EUV Sources for Lithography written by Vivek Bakshi and published by SPIE Press. This book was released on 2006 with total page 1104 pages. Available in PDF, EPUB and Kindle. Book excerpt: This comprehensive volume, edited by a senior technical staff member at SEMATECH, is the authoritative reference book on EUV source technology. The volume contains 38 chapters contributed by leading researchers and suppliers in the EUV source field. Topics range from a state-of-the-art overview and in-depth explanation of EUV source requirements, to fundamental atomic data and theoretical models of EUV sources based on discharge-produced plasmas (DPP) and laser-produced plasmas, to a description of prominent DPP and LPP designs and other technologies for producing EUV radiation. Additional topics include EUV source metrology and components (collectors, electrodes), debris mitigation, and mechanisms of component erosion in EUV sources. The volume is intended to meet the needs of both practitioners of the technology and readers seeking an introduction to the subject.

Optical Technologies for Extreme-Ultraviolet and Soft X-ray Coherent Sources

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Author :
Publisher : Springer
ISBN 13 : 3662474433
Total Pages : 205 pages
Book Rating : 4.6/5 (624 download)

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Book Synopsis Optical Technologies for Extreme-Ultraviolet and Soft X-ray Coherent Sources by : Federico Canova

Download or read book Optical Technologies for Extreme-Ultraviolet and Soft X-ray Coherent Sources written by Federico Canova and published by Springer. This book was released on 2015-08-17 with total page 205 pages. Available in PDF, EPUB and Kindle. Book excerpt: The book reviews the most recent achievements in optical technologies for XUV and X-ray coherent sources. Particular attention is given to free-electron-laser facilities, but also to other sources available at present, such as synchrotrons, high-order laser harmonics and X-ray lasers. The optical technologies relevant to each type of source are discussed. In addition, the main technologies used for photon handling and conditioning, namely multilayer mirrors, adaptive optics, crystals and gratings are explained. Experiments using coherent light received during the last decades a lot of attention for the X-ray regime. Strong efforts were taken for the realization of almost fully coherent sources, e.g. the free-electron lasers, both as independent sources in the femtosecond and attosecond regimes and as seeding sources for free-electron-lasers and X-ray gas lasers. In parallel to the development of sources, optical technologies for photon handling and conditioning of such coherent and intense X-ray beams advanced. New problems were faced for the realization of optical components of beamlines demanding to manage coherent X-ray photons, e.g. the preservation of coherence and time structure of ultra short pulses.

EUV Lithography

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Publisher : SPIE Press
ISBN 13 : 0819469645
Total Pages : 704 pages
Book Rating : 4.8/5 (194 download)

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Book Synopsis EUV Lithography by : Vivek Bakshi

Download or read book EUV Lithography written by Vivek Bakshi and published by SPIE Press. This book was released on 2009 with total page 704 pages. Available in PDF, EPUB and Kindle. Book excerpt: Editorial Review Dr. Bakshi has compiled a thorough, clear reference text covering the important fields of EUV lithography for high-volume manufacturing. This book has resulted from his many years of experience in EUVL development and from teaching this subject to future specialists. The book proceeds from an historical perspective of EUV lithography, through source technology, optics, projection system design, mask, resist, and patterning performance, to cost of ownership. Each section contains worked examples, a comprehensive review of challenges, and relevant citations for those who wish to further investigate the subject matter. Dr. Bakshi succeeds in presenting sometimes unfamiliar material in a very clear manner. This book is also valuable as a teaching tool. It has become an instant classic and far surpasses others in the EUVL field. --Dr. Akira Endo, Chief Development Manager, Gigaphoton Inc. Description Extreme ultraviolet lithography (EUVL) is the principal lithography technology aiming to manufacture computer chips beyond the current 193-nm-based optical lithography, and recent progress has been made on several fronts: EUV light sources, optics, optics metrology, contamination control, masks and mask handling, and resists. This comprehensive volume is comprised of contributions from the world's leading EUVL researchers and provides all of the critical information needed by practitioners and those wanting an introduction to the field. Interest in EUVL technology continues to increase, and this volume provides the foundation required for understanding and applying this exciting technology. About the editor of EUV Lithography Dr. Vivek Bakshi previously served as a senior member of the technical staff at SEMATECH; he is now president of EUV Litho, Inc., in Austin, Texas.

Microlithography

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Publisher : CRC Press
ISBN 13 : 1351643444
Total Pages : 913 pages
Book Rating : 4.3/5 (516 download)

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Book Synopsis Microlithography by : Bruce W. Smith

Download or read book Microlithography written by Bruce W. Smith and published by CRC Press. This book was released on 2020-05-01 with total page 913 pages. Available in PDF, EPUB and Kindle. Book excerpt: The completely revised Third Edition to the bestselling Microlithography: Science and Technology provides a balanced treatment of theoretical and operational considerations, from fundamental principles to advanced topics of nanoscale lithography. The book is divided into chapters covering all important aspects related to the imaging, materials, and processes that have been necessary to drive semiconductor lithography toward nanometer-scale generations. Renowned experts from the world’s leading academic and industrial organizations have provided in-depth coverage of the technologies involved in optical, deep-ultraviolet (DUV), immersion, multiple patterning, extreme ultraviolet (EUV), maskless, nanoimprint, and directed self-assembly lithography, together with comprehensive descriptions of the advanced materials and processes involved. New in the Third Edition In addition to the full revision of existing chapters, this new Third Edition features coverage of the technologies that have emerged over the past several years, including multiple patterning lithography, design for manufacturing, design process technology co-optimization, maskless lithography, and directed self-assembly. New advances in lithography modeling are covered as well as fully updated information detailing the new technologies, systems, materials, and processes for optical UV, DUV, immersion, and EUV lithography. The Third Edition of Microlithography: Science and Technology authoritatively covers the science and engineering involved in the latest generations of microlithography and looks ahead to the future systems and technologies that will bring the next generations to fruition. Loaded with illustrations, equations, tables, and time-saving references to the most current technology, this book is the most comprehensive and reliable source for anyone, from student to seasoned professional, looking to better understand the complex world of microlithography science and technology.

National Semiconductor Metrology Program

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Publisher :
ISBN 13 :
Total Pages : 82 pages
Book Rating : 4.F/5 ( download)

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Book Synopsis National Semiconductor Metrology Program by : National Semiconductor Metrology Program (U.S.)

Download or read book National Semiconductor Metrology Program written by National Semiconductor Metrology Program (U.S.) and published by . This book was released on with total page 82 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Publications of the National Institute of Standards and Technology ... Catalog

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Publisher :
ISBN 13 :
Total Pages : 1162 pages
Book Rating : 4.3/5 (243 download)

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Book Synopsis Publications of the National Institute of Standards and Technology ... Catalog by : National Institute of Standards and Technology (U.S.)

Download or read book Publications of the National Institute of Standards and Technology ... Catalog written by National Institute of Standards and Technology (U.S.) and published by . This book was released on 1994 with total page 1162 pages. Available in PDF, EPUB and Kindle. Book excerpt:

National Semiconductor Metrology Program

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Publisher :
ISBN 13 :
Total Pages : 160 pages
Book Rating : 4.3/5 (91 download)

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Book Synopsis National Semiconductor Metrology Program by : National Institute of Standards and Technology (U.S.)

Download or read book National Semiconductor Metrology Program written by National Institute of Standards and Technology (U.S.) and published by . This book was released on 2000 with total page 160 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Advances in Optics, Vol. 1

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Author :
Publisher : Lulu.com
ISBN 13 : 8469794353
Total Pages : 484 pages
Book Rating : 4.4/5 (697 download)

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Book Synopsis Advances in Optics, Vol. 1 by : Sergey Yurish

Download or read book Advances in Optics, Vol. 1 written by Sergey Yurish and published by Lulu.com. This book was released on 2018-04-22 with total page 484 pages. Available in PDF, EPUB and Kindle. Book excerpt: The Vol.1 devoted to various topics of optics and optic instrumentation, and contains 17 chapters written by 36 experts in the field from 15 countries: Brazil, China, Denmark, France, Germany, India, Japan, Mexico, Russia, Turkey, Slovenia, South Korea, UK, Ukraine and USA. 'Advances in Optics: Reviews' Book Series is a comprehensive study of the field of optics, which provides readers with the most up-to-date coverage of optics, photonics and lasers with a good balance of practical and theoretical aspects. Directed towards both physicists and engineers this Book Series is also suitable for audiences focusing on applications of optics. A clear comprehensive presentation makes these books work well as both a teaching resources and a reference books. The book is intended for researchers and scientists in physics and optics, in academia and industry, as well as postgraduate students.

X-Ray Lasers 2014

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Publisher : Springer
ISBN 13 : 3319195212
Total Pages : 415 pages
Book Rating : 4.3/5 (191 download)

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Book Synopsis X-Ray Lasers 2014 by : Jorge Rocca

Download or read book X-Ray Lasers 2014 written by Jorge Rocca and published by Springer. This book was released on 2015-09-19 with total page 415 pages. Available in PDF, EPUB and Kindle. Book excerpt: These proceedings comprise invited and contributed papers presented at the 14th International Conference on X-Ray Lasers (ICXRL 2014). This conference is part of a continuing series dedicated to recent developments and applications of x-ray lasers and other coherent x-ray sources with attention to supporting technologies and instrumentation. New results in the generation of intense, coherent x-rays and progress toward practical devices and their applications in numerous fields are reported. Areas of research in plasma-based x-ray lasers, 4th generation accelerator-based sources and higher harmonic generation, and other x-ray generation schemes are covered. The scope of ICXRL 2014 included, but was not limited to: Laser-pumped X-ray lasers Discharge excitation and other X-ray laser pumping methods Injection/seeding of X-ray amplifiers New lasing transitions and novel X-ray laser schemes High Harmonic sources-Free-electron laser generation in the XUV and X-ray range Novel schemes for coherent XUV and X-ray generation XUV and X-ray optics and metrology-Driving laser technology Theory and modeling of X-ray gain medium and beam characteristics Applications of high brightness and ultrashort X-ray sources

Advances in Optics Reviews 1

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Author :
Publisher : Lulu.com
ISBN 13 : 0244423288
Total Pages : 484 pages
Book Rating : 4.2/5 (444 download)

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Book Synopsis Advances in Optics Reviews 1 by : Sergey Y. Yurish Editor

Download or read book Advances in Optics Reviews 1 written by Sergey Y. Yurish Editor and published by Lulu.com. This book was released on 2018-10-17 with total page 484 pages. Available in PDF, EPUB and Kindle. Book excerpt: ÔAdvances in Optics: ReviewsÕ Book Series is a comprehensive study of the field of optics, which provides readers with the most up-to-date coverage of optics, photonics and lasers with a good balance of practical and theoretical aspects. Directed towards both physicists and engineers this Book Series is also suitable for audiences focusing on applications of optics. A clear comprehensive presentation makes these books work well as both a teaching resources and a reference books. The book is intended for researchers and scientists in physics and optics, in academia and industry, as well as postgraduate students. The Vol.1 is devoted to various topics of optics and optic instrumentation, and contains 17 chapters written by 36 experts in the field from 15 countries: Brazil, China, Denmark, France, Germany, India, Japan, Mexico, Russia, Turkey, Slovenia, South Korea, UK, Ukraine and USA.

Activity report

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Publisher :
ISBN 13 :
Total Pages : 226 pages
Book Rating : 4.:/5 (89 download)

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Book Synopsis Activity report by : Brookhaven National Laboratory. National Synchrotron Light Source

Download or read book Activity report written by Brookhaven National Laboratory. National Synchrotron Light Source and published by . This book was released on 2004 with total page 226 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Optical Constants of Materials for UV and X-ray Wavelengths

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Author :
Publisher : SPIE-International Society for Optical Engineering
ISBN 13 :
Total Pages : 190 pages
Book Rating : 4.3/5 (91 download)

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Book Synopsis Optical Constants of Materials for UV and X-ray Wavelengths by : John F. Seely

Download or read book Optical Constants of Materials for UV and X-ray Wavelengths written by John F. Seely and published by SPIE-International Society for Optical Engineering. This book was released on 2004 with total page 190 pages. Available in PDF, EPUB and Kindle. Book excerpt: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

Handbook of X-ray and Gamma-ray Astrophysics

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Author :
Publisher : Springer Nature
ISBN 13 : 9811969604
Total Pages : 5912 pages
Book Rating : 4.8/5 (119 download)

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Book Synopsis Handbook of X-ray and Gamma-ray Astrophysics by : Cosimo Bambi

Download or read book Handbook of X-ray and Gamma-ray Astrophysics written by Cosimo Bambi and published by Springer Nature. This book was released on with total page 5912 pages. Available in PDF, EPUB and Kindle. Book excerpt: