Aberration Corrected Imaging In Transmission Electron Microscopy An Introduction 2nd Edition

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Aberration-corrected Imaging In Transmission Electron Microscopy: An Introduction (2nd Edition)

Author : Rolf Erni
Publisher : World Scientific Publishing Company
ISBN 13 : 1783265302
Total Pages : 432 pages
Book Rating : 4.7/5 (832 download)

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Book Synopsis Aberration-corrected Imaging In Transmission Electron Microscopy: An Introduction (2nd Edition) by : Rolf Erni

Download or read book Aberration-corrected Imaging In Transmission Electron Microscopy: An Introduction (2nd Edition) written by Rolf Erni and published by World Scientific Publishing Company. This book was released on 2015-03-23 with total page 432 pages. Available in PDF, EPUB and Kindle. Book excerpt: Aberration-Corrected Imaging in Transmission Electron Microscopy provides an introduction to aberration-corrected atomic-resolution electron microscopy imaging in materials and physical sciences. It covers both the broad beam transmission mode (TEM; transmission electron microscopy) and the scanning transmission mode (STEM; scanning transmission electron microscopy). The book is structured in three parts. The first part introduces the basics of conventional atomic-resolution electron microscopy imaging in TEM and STEM modes. This part also describes limits of conventional electron microscopes and possible artefacts which are caused by the intrinsic lens aberrations that are unavoidable in such instruments. The second part introduces fundamental electron optical concepts and thus provides a brief introduction to electron optics. Based on the first and second parts of the book, the third part focuses on aberration correction; it describes the various aberrations in electron microscopy and introduces the concepts of spherical aberration correctors and advanced aberration correctors, including correctors for chromatic aberration. This part also provides guidelines on how to optimize the imaging conditions for atomic-resolution STEM and TEM imaging.This second edition has been completely revised and updated in order to incorporate the very recent technological and scientific achievements that have been realized since the first edition appeared in 2010.

Liquid Cell Electron Microscopy

Author : Frances M. Ross
Publisher : Cambridge University Press
ISBN 13 : 1107116570
Total Pages : 529 pages
Book Rating : 4.1/5 (71 download)

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Book Synopsis Liquid Cell Electron Microscopy by : Frances M. Ross

Download or read book Liquid Cell Electron Microscopy written by Frances M. Ross and published by Cambridge University Press. This book was released on 2017 with total page 529 pages. Available in PDF, EPUB and Kindle. Book excerpt: 2.6.2 Electrodes for Electrochemistry

Aberration-Corrected Imaging in Transmission Electron Microscopy

Author : Rolf Erni
Publisher :
ISBN 13 : 9781848165373
Total Pages : 348 pages
Book Rating : 4.1/5 (653 download)

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Book Synopsis Aberration-Corrected Imaging in Transmission Electron Microscopy by : Rolf Erni

Download or read book Aberration-Corrected Imaging in Transmission Electron Microscopy written by Rolf Erni and published by . This book was released on 2010 with total page 348 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Advanced Computing in Electron Microscopy

Author : Earl J. Kirkland
Publisher : Springer Science & Business Media
ISBN 13 : 1441965335
Total Pages : 289 pages
Book Rating : 4.4/5 (419 download)

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Book Synopsis Advanced Computing in Electron Microscopy by : Earl J. Kirkland

Download or read book Advanced Computing in Electron Microscopy written by Earl J. Kirkland and published by Springer Science & Business Media. This book was released on 2010-08-12 with total page 289 pages. Available in PDF, EPUB and Kindle. Book excerpt: Preface to Second Edition Several new topics have been added, some small errors have been corrected and some new references have been added in this edition. New topics include aberration corrected instruments, scanning confocal mode of operations, Bloch wave eigenvalue methods and parallel computing techniques. The ?rst edition - cluded a CD with computer programs, which is not included in this edition. - stead the associated programs will be available on an associated web site (currently people.ccmr.cornell.edu/ ̃kirkland,but may move as time goes on). I wish to thank Mick Thomas for preparing the specimen used to record the image in Fig.5.26 and to thank Stephen P. Meisburger for suggesting an interesting biological specimen to use in Fig.7.24. Again, I apologize in advance for leaving out some undoubtedlyoutstanding r- erences. I also apologize for the as yet undiscovered errors that remain in the text. Earl J. Kirkland, December 2009 Preface to First Edition Image simulation has become a common tool in HREM (High Resolution El- tron Microscopy) in recent years. However, the literature on the subject is scattered among many different journals and conference proceedings that have occurred in the last two or three decades. It is dif?cult for beginners to get started in this ?eld.

Advanced Transmission Electron Microscopy

Author : Jian Min Zuo
Publisher : Springer
ISBN 13 : 1493966073
Total Pages : 741 pages
Book Rating : 4.4/5 (939 download)

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Book Synopsis Advanced Transmission Electron Microscopy by : Jian Min Zuo

Download or read book Advanced Transmission Electron Microscopy written by Jian Min Zuo and published by Springer. This book was released on 2016-10-26 with total page 741 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume expands and updates the coverage in the authors' popular 1992 book, Electron Microdiffraction. As the title implies, the focus of the book has changed from electron microdiffraction and convergent beam electron diffraction to all forms of advanced transmission electron microscopy. Special attention is given to electron diffraction and imaging, including high-resolution TEM and STEM imaging, and the application of these methods to crystals, their defects, and nanostructures. The authoritative text summarizes and develops most of the useful knowledge which has been gained over the years from the study of the multiple electron scattering problem, the recent development of aberration correctors and their applications to materials structure characterization, as well as the authors' extensive teaching experience in these areas. Advanced Transmission Electron Microscopy: Imaging and Diffraction in Nanoscience is ideal for use as an advanced undergraduate or graduate level text in support of course materials in Materials Science, Physics or Chemistry departments.

Transmission Electron Microscopy

Author : C. Barry Carter
Publisher : Springer
ISBN 13 : 3319266519
Total Pages : 543 pages
Book Rating : 4.3/5 (192 download)

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Book Synopsis Transmission Electron Microscopy by : C. Barry Carter

Download or read book Transmission Electron Microscopy written by C. Barry Carter and published by Springer. This book was released on 2016-08-24 with total page 543 pages. Available in PDF, EPUB and Kindle. Book excerpt: This text is a companion volume to Transmission Electron Microscopy: A Textbook for Materials Science by Williams and Carter. The aim is to extend the discussion of certain topics that are either rapidly changing at this time or that would benefit from more detailed discussion than space allowed in the primary text. World-renowned researchers have contributed chapters in their area of expertise, and the editors have carefully prepared these chapters to provide a uniform tone and treatment for this exciting material. The book features an unparalleled collection of color figures showcasing the quality and variety of chemical data that can be obtained from today’s instruments, as well as key pitfalls to avoid. As with the previous TEM text, each chapter contains two sets of questions, one for self assessment and a second more suitable for homework assignments. Throughout the book, the style follows that of Williams & Carter even when the subject matter becomes challenging—the aim is always to make the topic understandable by first-year graduate students and others who are working in the field of Materials Science Topics covered include sources, in-situ experiments, electron diffraction, Digital Micrograph, waves and holography, focal-series reconstruction and direct methods, STEM and tomography, energy-filtered TEM (EFTEM) imaging, and spectrum imaging. The range and depth of material makes this companion volume essential reading for the budding microscopist and a key reference for practicing researchers using these and related techniques.

Physical Principles of Electron Microscopy

Author : R.F. Egerton
Publisher : Springer
ISBN 13 : 3319398776
Total Pages : 203 pages
Book Rating : 4.3/5 (193 download)

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Book Synopsis Physical Principles of Electron Microscopy by : R.F. Egerton

Download or read book Physical Principles of Electron Microscopy written by R.F. Egerton and published by Springer. This book was released on 2016-07-01 with total page 203 pages. Available in PDF, EPUB and Kindle. Book excerpt: Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences. This book introduces current theory and practice of electron microscopy, primarily for undergraduates who need to understand how the principles of physics apply in an area of technology that has contributed greatly to our understanding of life processes and "inner space." Physical Principles of Electron Microscopy will appeal to technologists who use electron microscopes and to graduate students, university teachers and researchers who need a concise reference on the basic principles of microscopy.

Advanced Computing in Electron Microscopy

Author : Earl J. Kirkland
Publisher : Springer Nature
ISBN 13 : 3030332608
Total Pages : 357 pages
Book Rating : 4.0/5 (33 download)

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Book Synopsis Advanced Computing in Electron Microscopy by : Earl J. Kirkland

Download or read book Advanced Computing in Electron Microscopy written by Earl J. Kirkland and published by Springer Nature. This book was released on 2020-03-09 with total page 357 pages. Available in PDF, EPUB and Kindle. Book excerpt: This updated and revised edition of a classic work provides a summary of methods for numerical computation of high resolution conventional and scanning transmission electron microscope images. At the limits of resolution, image artifacts due to the instrument and the specimen interaction can complicate image interpretation. Image calculations can help the user to interpret and understand high resolution information in recorded electron micrographs. The book contains expanded sections on aberration correction, including a detailed discussion of higher order (multipole) aberrations and their effect on high resolution imaging, new imaging modes such as ABF (annular bright field), and the latest developments in parallel processing using GPUs (graphic processing units), as well as updated references. Beginning and experienced users at the advanced undergraduate or graduate level will find the book to be a unique and essential guide to the theory and methods of computation in electron microscopy.

Transmission Electron Microscopy

Author : David B. Williams
Publisher : Springer Science & Business Media
ISBN 13 : 1475725191
Total Pages : 708 pages
Book Rating : 4.4/5 (757 download)

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Book Synopsis Transmission Electron Microscopy by : David B. Williams

Download or read book Transmission Electron Microscopy written by David B. Williams and published by Springer Science & Business Media. This book was released on 2013-03-09 with total page 708 pages. Available in PDF, EPUB and Kindle. Book excerpt: Electron microscopy has revolutionized our understanding the extraordinary intellectual demands required of the mi of materials by completing the processing-structure-prop croscopist in order to do the job properly: crystallography, erties links down to atomistic levels. It now is even possible diffraction, image contrast, inelastic scattering events, and to tailor the microstructure (and meso structure ) of materials spectroscopy. Remember, these used to be fields in them to achieve specific sets of properties; the extraordinary abili selves. Today, one has to understand the fundamentals ties of modem transmission electron microscopy-TEM of all of these areas before one can hope to tackle signifi instruments to provide almost all of the structural, phase, cant problems in materials science. TEM is a technique of and crystallographic data allow us to accomplish this feat. characterizing materials down to the atomic limits. It must Therefore, it is obvious that any curriculum in modem mate be used with care and attention, in many cases involving rials education must include suitable courses in electron mi teams of experts from different venues. The fundamentals croscopy. It is also essential that suitable texts be available are, of course, based in physics, so aspiring materials sci for the preparation of the students and researchers who must entists would be well advised to have prior exposure to, for carry out electron microscopy properly and quantitatively.

Exploring Nanomaterial Synthesis, Characterization, and Applications

Author : Ramaswamy, Krishnaraj
Publisher : IGI Global
ISBN 13 :
Total Pages : 654 pages
Book Rating : 4.3/5 (693 download)

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Book Synopsis Exploring Nanomaterial Synthesis, Characterization, and Applications by : Ramaswamy, Krishnaraj

Download or read book Exploring Nanomaterial Synthesis, Characterization, and Applications written by Ramaswamy, Krishnaraj and published by IGI Global. This book was released on 2024-10-22 with total page 654 pages. Available in PDF, EPUB and Kindle. Book excerpt: Nanomaterials, due to their tiny size and exceptional characteristics, are leading the way in scientific innovation, marking the beginning of a new era of technological progress and offering solutions to critical challenges faced by humanity. From their origin and theoretical foundations to their combination and extensive practical uses, the exploration of nanomaterials encompasses a wide range of knowledge and profound understanding, providing valuable perspectives on their revolutionary influence on different sectors of the economy. Nanomaterials possess distinctive characteristics, including enhanced strength, chemical reactivity, and electrical conductivity, distinguishing them from their larger counterparts. These characteristics stimulate innovative uses and improve current technologies, making them crucial in advancing engineering, medicine, energy solutions, and environmental sustainability. Exploring Nanomaterial Synthesis, Characterization, and Applications focuses on the interdisciplinary aspects of nanomaterials research and highlights their contributions to the advancement of medical science. This book offers a comprehensive overview of the present state of nanomaterial science and provide a glimpse into its promising future. Covering topics such as biosensing, energy storage, and pharmaceutical technology, this book is an excellent resource for academicians, researchers, graduate and postgraduate students, industry professionals, engineers, product developers, medical practitioners, policymakers, and more.

Principles of Electron Optics, Volume 3

Author : Peter W. Hawkes
Publisher : Academic Press
ISBN 13 : 0128189800
Total Pages : 562 pages
Book Rating : 4.1/5 (281 download)

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Book Synopsis Principles of Electron Optics, Volume 3 by : Peter W. Hawkes

Download or read book Principles of Electron Optics, Volume 3 written by Peter W. Hawkes and published by Academic Press. This book was released on 2022-02-21 with total page 562 pages. Available in PDF, EPUB and Kindle. Book excerpt: Principles of Electron Optic: Volume Three: Wave Optics, discusses this essential topic in microscopy to help readers understand the propagation of electrons from the source to the specimen, and through the latter (and from it) to the image plane of the instrument. In addition, it also explains interference phenomena, notably holography, and informal coherence theory. This third volume accompanies volumes one and two that cover new content on holography and interference, improved and new modes of image formation, aberration corrected imaging, simulation, and measurement, 3D-reconstruction, and more. The study of such beams forms the subject of electron optics, which divides naturally into geometrical optics where effects due to wavelength are neglected, with wave optics considered. - Includes authoritative coverage of the fundamental theory behind electron beams - Describes the interaction of electrons with solids and the information that can be obtained from electron-beam techniques - Addresses recent, relevant research topics, including new content on holography and interference, new modes of image formation, 3D reconstruction and aberration corrected imaging, simulation and measurement

Materials Characterization Using Nondestructive Evaluation (NDE) Methods

Author : Gerhard Huebschen
Publisher : Woodhead Publishing
ISBN 13 : 008100057X
Total Pages : 322 pages
Book Rating : 4.0/5 (81 download)

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Book Synopsis Materials Characterization Using Nondestructive Evaluation (NDE) Methods by : Gerhard Huebschen

Download or read book Materials Characterization Using Nondestructive Evaluation (NDE) Methods written by Gerhard Huebschen and published by Woodhead Publishing. This book was released on 2016-03-23 with total page 322 pages. Available in PDF, EPUB and Kindle. Book excerpt: Materials Characterization Using Nondestructive Evaluation (NDE) Methods discusses NDT methods and how they are highly desirable for both long-term monitoring and short-term assessment of materials, providing crucial early warning that the fatigue life of a material has elapsed, thus helping to prevent service failures. Materials Characterization Using Nondestructive Evaluation (NDE) Methods gives an overview of established and new NDT techniques for the characterization of materials, with a focus on materials used in the automotive, aerospace, power plants, and infrastructure construction industries. Each chapter focuses on a different NDT technique and indicates the potential of the method by selected examples of applications. Methods covered include scanning and transmission electron microscopy, X-ray microtomography and diffraction, ultrasonic, electromagnetic, microwave, and hybrid techniques. The authors review both the determination of microstructure properties, including phase content and grain size, and the determination of mechanical properties, such as hardness, toughness, yield strength, texture, and residual stress. - Gives an overview of established and new NDT techniques, including scanning and transmission electron microscopy, X-ray microtomography and diffraction, ultrasonic, electromagnetic, microwave, and hybrid techniques - Reviews the determination of microstructural and mechanical properties - Focuses on materials used in the automotive, aerospace, power plants, and infrastructure construction industries - Serves as a highly desirable resource for both long-term monitoring and short-term assessment of materials

Handbook of Charged Particle Optics

Author : Jon Orloff
Publisher : CRC Press
ISBN 13 : 1351835777
Total Pages : 938 pages
Book Rating : 4.3/5 (518 download)

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Book Synopsis Handbook of Charged Particle Optics by : Jon Orloff

Download or read book Handbook of Charged Particle Optics written by Jon Orloff and published by CRC Press. This book was released on 2017-12-19 with total page 938 pages. Available in PDF, EPUB and Kindle. Book excerpt: With the growing proliferation of nanotechnologies, powerful imaging technologies are being developed to operate at the sub-nanometer scale. The newest edition of a bestseller, the Handbook of Charged Particle Optics, Second Edition provides essential background information for the design and operation of high resolution focused probe instruments. The book’s unique approach covers both the theoretical and practical knowledge of high resolution probe forming instruments. The second edition features new chapters on aberration correction and applications of gas phase field ionization sources. With the inclusion of additional references to past and present work in the field, this second edition offers perfectly calibrated coverage of the field’s cutting-edge technologies with added insight into how they work. Written by the leading research scientists, the second edition of the Handbook of Charged Particle Optics is a complete guide to understanding, designing, and using high resolution probe instrumentation.

Physical Principles of Electron Microscopy

Author : Ray Egerton
Publisher : Springer Science & Business Media
ISBN 13 : 9780387258003
Total Pages : 224 pages
Book Rating : 4.2/5 (58 download)

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Book Synopsis Physical Principles of Electron Microscopy by : Ray Egerton

Download or read book Physical Principles of Electron Microscopy written by Ray Egerton and published by Springer Science & Business Media. This book was released on 2011-02-11 with total page 224 pages. Available in PDF, EPUB and Kindle. Book excerpt: Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences. This book introduces current theory and practice of electron microscopy, primarily for undergraduates who need to understand how the principles of physics apply in an area of technology that has contributed greatly to our understanding of life processes and "inner space." Physical Principles of Electron Microscopy will appeal to technologists who use electron microscopes and to graduate students, university teachers and researchers who need a concise reference on the basic principles of microscopy.

Springer Handbook of Microscopy

Author : Peter W. Hawkes
Publisher : Springer Nature
ISBN 13 : 3030000699
Total Pages : 1561 pages
Book Rating : 4.0/5 (3 download)

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Book Synopsis Springer Handbook of Microscopy by : Peter W. Hawkes

Download or read book Springer Handbook of Microscopy written by Peter W. Hawkes and published by Springer Nature. This book was released on 2019-11-02 with total page 1561 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book features reviews by leading experts on the methods and applications of modern forms of microscopy. The recent awards of Nobel Prizes awarded for super-resolution optical microscopy and cryo-electron microscopy have demonstrated the rich scientific opportunities for research in novel microscopies. Earlier Nobel Prizes for electron microscopy (the instrument itself and applications to biology), scanning probe microscopy and holography are a reminder of the central role of microscopy in modern science, from the study of nanostructures in materials science, physics and chemistry to structural biology. Separate chapters are devoted to confocal, fluorescent and related novel optical microscopies, coherent diffractive imaging, scanning probe microscopy, transmission electron microscopy in all its modes from aberration corrected and analytical to in-situ and time-resolved, low energy electron microscopy, photoelectron microscopy, cryo-electron microscopy in biology, and also ion microscopy. In addition to serving as an essential reference for researchers and teachers in the fields such as materials science, condensed matter physics, solid-state chemistry, structural biology and the molecular sciences generally, the Springer Handbook of Microscopy is a unified, coherent and pedagogically attractive text for advanced students who need an authoritative yet accessible guide to the science and practice of microscopy.

Aberration-Corrected Analytical Transmission Electron Microscopy

Author : Rik Brydson
Publisher : John Wiley & Sons
ISBN 13 : 1119979900
Total Pages : 235 pages
Book Rating : 4.1/5 (199 download)

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Book Synopsis Aberration-Corrected Analytical Transmission Electron Microscopy by : Rik Brydson

Download or read book Aberration-Corrected Analytical Transmission Electron Microscopy written by Rik Brydson and published by John Wiley & Sons. This book was released on 2011-08-02 with total page 235 pages. Available in PDF, EPUB and Kindle. Book excerpt: The book is concerned with the theory, background, and practical use of transmission electron microscopes with lens correctors that can correct the effects of spherical aberration. The book also covers a comparison with aberration correction in the TEM and applications of analytical aberration corrected STEM in materials science and biology. This book is essential for microscopists involved in nanoscale and materials microanalysis especially those using scanning transmission electron microscopy, and related analytical techniques such as electron diffraction x-ray spectrometry (EDXS) and electron energy loss spectroscopy (EELS).

Drug Delivery Nanoparticles Formulation and Characterization

Author : Yashwant Pathak
Publisher : CRC Press
ISBN 13 : 1420078054
Total Pages : 418 pages
Book Rating : 4.4/5 (2 download)

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Book Synopsis Drug Delivery Nanoparticles Formulation and Characterization by : Yashwant Pathak

Download or read book Drug Delivery Nanoparticles Formulation and Characterization written by Yashwant Pathak and published by CRC Press. This book was released on 2016-04-19 with total page 418 pages. Available in PDF, EPUB and Kindle. Book excerpt: Exploring fundamental concepts, Drug Delivery Nanoparticles Formulation and Characterization presents key aspects of nanoparticulate system development for various therapeutic applications and provides advanced methods used to file for regulatory approval.This comprehensive guide features:Process Analytical Techniques (PAT) used in manufacturing Na