A High Resolution X-ray Diffraction Study of Ultrathin Multilayer Films

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ISBN 13 :
Total Pages : 118 pages
Book Rating : 4.:/5 (244 download)

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Book Synopsis A High Resolution X-ray Diffraction Study of Ultrathin Multilayer Films by : Wendy A. Richardson

Download or read book A High Resolution X-ray Diffraction Study of Ultrathin Multilayer Films written by Wendy A. Richardson and published by . This book was released on 1989 with total page 118 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Profile Structures of Ultrathin Periodic and Nonperiodic Multilayer Films Containing a Disubstituted (poly)diacetylene by High Resolution X-ray Diffraction

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ISBN 13 :
Total Pages : 276 pages
Book Rating : 4.:/5 (244 download)

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Book Synopsis Profile Structures of Ultrathin Periodic and Nonperiodic Multilayer Films Containing a Disubstituted (poly)diacetylene by High Resolution X-ray Diffraction by : Robert Francis Fischetti

Download or read book Profile Structures of Ultrathin Periodic and Nonperiodic Multilayer Films Containing a Disubstituted (poly)diacetylene by High Resolution X-ray Diffraction written by Robert Francis Fischetti and published by . This book was released on 1987 with total page 276 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Study of Ultra-Thin Films in Multilayer Structures by Standing-Waves and Small-Angle X-Ray Scattering Techniques

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ISBN 13 :
Total Pages : 4 pages
Book Rating : 4.:/5 (228 download)

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Book Synopsis Study of Ultra-Thin Films in Multilayer Structures by Standing-Waves and Small-Angle X-Ray Scattering Techniques by : S. I. Zheludeva

Download or read book Study of Ultra-Thin Films in Multilayer Structures by Standing-Waves and Small-Angle X-Ray Scattering Techniques written by S. I. Zheludeva and published by . This book was released on 1992 with total page 4 pages. Available in PDF, EPUB and Kindle. Book excerpt: The traditional method for LSM parameters investigation uses small angle x-ray diffraction at Lambda = 0.lnm. The parameters of interest have been determined by comparing the theoretical angular dependencies of reflectivity as a function of these parameters with the experimental curves. In this paper we discuss the possibilities of solving the inverse problem, i.e. the electron density or permittivity distribution have been determined directly from the small angle x-ray diffraction spectra. Also new possibilities of ultrathin film thickness and density determination are demonstrated by means of x-ray method in form of x-ray standing wave technique (XSW) and total external fluorescence study (NTEF).

An Introduction to Ultrathin Organic Films

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Publisher : Academic Press
ISBN 13 : 0080926312
Total Pages : 468 pages
Book Rating : 4.0/5 (89 download)

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Book Synopsis An Introduction to Ultrathin Organic Films by : Abraham Ulman

Download or read book An Introduction to Ultrathin Organic Films written by Abraham Ulman and published by Academic Press. This book was released on 2013-10-22 with total page 468 pages. Available in PDF, EPUB and Kindle. Book excerpt: The development of oriented organic monomolecular layers by the Langmuir-Blodgett (LB) and self-assembly (SA) techniques has led researchers toward their goal of assembling individual molecules into highly ordered architectures. Thus the continually growing contribution of LB and SA systems to the chemistry and physics of thin organic films is widely recognized. Equally well-known is the difficulty in keeping up to date with the burgeoning multidisciplinary research in this area. Dr. Ulman provides a massive survey of the available literature. The book begins with a section on analytical tools to broaden the understanding of the structure and properties of monolayers and films. Following sections discuss LB films, the preparation and properties of SA monolayers and films, the modeling of LB and SA monolayers, and the application of LB and SA films.

High Resolution X-Ray Diffractometry And Topography

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Publisher : CRC Press
ISBN 13 : 0203979192
Total Pages : 263 pages
Book Rating : 4.2/5 (39 download)

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Book Synopsis High Resolution X-Ray Diffractometry And Topography by : D.K. Bowen

Download or read book High Resolution X-Ray Diffractometry And Topography written by D.K. Bowen and published by CRC Press. This book was released on 1998-02-05 with total page 263 pages. Available in PDF, EPUB and Kindle. Book excerpt: The rapid growth in the applications of electronic materials has created an increasing demand for reliable techniques for examining and characterizing these materials. This book explores the area of x-ray diffraction and the techniques available for deployment in research, development, and production. It maps the theoretical and practical background necessary to study single crystal materials using high resolution x-ray diffraction and topography. It combines mathematical formalism with graphical explanations and hands-on advice for interpreting data, thus providing the theoretical and practical background for applying these techniques in scientific and industrial materials characterization

X-ray Diffraction Studies of Interfacial Roughness in Multilayer Thin Films

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ISBN 13 :
Total Pages : 366 pages
Book Rating : 4.:/5 (89 download)

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Book Synopsis X-ray Diffraction Studies of Interfacial Roughness in Multilayer Thin Films by : Phang Yew Hoong

Download or read book X-ray Diffraction Studies of Interfacial Roughness in Multilayer Thin Films written by Phang Yew Hoong and published by . This book was released on 1995 with total page 366 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Basic Concepts of X-Ray Diffraction

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Publisher : John Wiley & Sons
ISBN 13 : 3527681183
Total Pages : 299 pages
Book Rating : 4.5/5 (276 download)

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Book Synopsis Basic Concepts of X-Ray Diffraction by : Emil Zolotoyabko

Download or read book Basic Concepts of X-Ray Diffraction written by Emil Zolotoyabko and published by John Wiley & Sons. This book was released on 2014-02-10 with total page 299 pages. Available in PDF, EPUB and Kindle. Book excerpt: Authored by a university professor deeply involved in X-ray diffraction-related research, this textbook is based on his lectures given to graduate students for more than 20 years. It adopts a well-balanced approach, describing basic concepts and experimental techniques, which make X-ray diffraction an unsurpassed method for studying the structure of materials. Both dynamical and kinematic X-ray diffraction is considered from a unified viewpoint, in which the dynamical diffraction in single-scattering approximation serves as a bridge between these two parts. The text emphasizes the fundamental laws that govern the interaction of X-rays with matter, but also covers in detail classical and modern applications, e.g., line broadening, texture and strain/stress analyses, X-ray mapping in reciprocal space, high-resolution X-ray diffraction in the spatial and wave vector domains, X-ray focusing, inelastic and time-resolved X-ray scattering. This unique scope, in combination with otherwise hard-to-find information on analytic expressions for simulating X-ray diffraction profiles in thin-film heterostructures, X-ray interaction with phonons, coherent scattering of Mossbauer radiation, and energy-variable X-ray diffraction, makes the book indispensable for any serious user of X-ray diffraction techniques. Compact and self-contained, this textbook is suitable for students taking X-ray diffraction courses towards specialization in materials science, physics, chemistry, or biology. Numerous clear-cut illustrations, an easy-to-read style of writing, as well as rather short, easily digestible chapters all facilitate comprehension.

Magnetic Ultrathin Films, Multilayers, and Surfaces-1997: Volume 475

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ISBN 13 :
Total Pages : 664 pages
Book Rating : 4.3/5 (91 download)

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Book Synopsis Magnetic Ultrathin Films, Multilayers, and Surfaces-1997: Volume 475 by : James Tobin

Download or read book Magnetic Ultrathin Films, Multilayers, and Surfaces-1997: Volume 475 written by James Tobin and published by . This book was released on 1997-11-24 with total page 664 pages. Available in PDF, EPUB and Kindle. Book excerpt: Proceedings of the March 1997 symposium, the central thrust being the relationship of magnetic properties and device performance to structure at the atomic, nanometer, and submicron length scales in these systems of reduced dimensionality. The 89 contributions cover the following topics: synthesis, processing, and characterization; novel applications and approaches for magnetism; nano-microstructure and magnetic properties; structure and properties--mixing, strain, and steps; nanoscale magnetic confinement, particles, and arrays; magnetization reversal and domain structure; synthesis and characterization; synchrotron radiation studies of magnetic materials; magneto-optical properties, effects, and measurements; magnetic phenomena; CMR and tunneling; and interlayer coupling and spin polarization. Annotation copyrighted by Book News, Inc., Portland, OR

Profile Structures of Ultrathin Organic Films on Germanium/silicon Multilayer Substrates by X-ray Interferometry/holography

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Publisher :
ISBN 13 :
Total Pages : 276 pages
Book Rating : 4.:/5 (778 download)

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Book Synopsis Profile Structures of Ultrathin Organic Films on Germanium/silicon Multilayer Substrates by X-ray Interferometry/holography by : Songtao Xu

Download or read book Profile Structures of Ultrathin Organic Films on Germanium/silicon Multilayer Substrates by X-ray Interferometry/holography written by Songtao Xu and published by . This book was released on 1993 with total page 276 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Magnetic X-ray Dichroism in Ultrathin Epitaxial Films

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ISBN 13 :
Total Pages : 137 pages
Book Rating : 4.:/5 (925 download)

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Book Synopsis Magnetic X-ray Dichroism in Ultrathin Epitaxial Films by :

Download or read book Magnetic X-ray Dichroism in Ultrathin Epitaxial Films written by and published by . This book was released on 1997 with total page 137 pages. Available in PDF, EPUB and Kindle. Book excerpt: The authors have used Magnetic X-ray Linear Dichroism (MXLD) and Magnetic X-ray Circular Dichroism (MXCD) to study the magnetic properties of epitaxial overlayers in an elementally specific fashion. Both MXLD and MXCD Photoelectron Spectroscopy were performed in a high resolution mode at the Spectromicroscopy Facility of the ALS. Circular Polarization was obtained via the utilization of a novel phase retarder (soft x-ray quarter wave plate) based upon transmission through a multilayer film. The samples were low temperature Fe overlayers, magnetic alloy films of NiFe and CoNi, and Gd grown on Y. The authors results include a direct comparison of high resolution angle resolved Photoelectron Spectroscopy performed in MXLD and MXCD modes as well as structural studies with photoelectron diffraction.

X-Ray Diffraction for Materials Research

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Publisher : CRC Press
ISBN 13 : 1315361973
Total Pages : 302 pages
Book Rating : 4.3/5 (153 download)

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Book Synopsis X-Ray Diffraction for Materials Research by : Myeongkyu Lee

Download or read book X-Ray Diffraction for Materials Research written by Myeongkyu Lee and published by CRC Press. This book was released on 2017-03-16 with total page 302 pages. Available in PDF, EPUB and Kindle. Book excerpt: X-ray diffraction is a useful and powerful analysis technique for characterizing crystalline materials commonly employed in MSE, physics, and chemistry. This informative new book describes the principles of X-ray diffraction and its applications to materials characterization. It consists of three parts. The first deals with elementary crystallography and optics, which is essential for understanding the theory of X-ray diffraction discussed in the second section of the book. Part 2 describes how the X-ray diffraction can be applied for characterizing such various forms of materials as thin films, single crystals, and powders. The third section of the book covers applications of X-ray diffraction. The book presents a number of examples to help readers better comprehend the subject. X-Ray Diffraction for Materials Research: From Fundamentals to Applications also • provides background knowledge of diffraction to enable nonspecialists to become familiar with the topics • covers the practical applications as well as the underlying principle of X-ray diffraction • presents appropriate examples with answers to help readers understand the contents more easily • includes thin film characterization by X-ray diffraction with relevant experimental techniques • presents a huge number of elaborately drawn graphics to help illustrate the content The book will help readers (students and researchers in materials science, physics, and chemistry) understand crystallography and crystal structures, interference and diffraction, structural analysis of bulk materials, characterization of thin films, and nondestructive measurement of internal stress and phase transition. Diffraction is an optical phenomenon and thus can be better understood when it is explained with an optical approach, which has been neglected in other books. This book helps to fill that gap, providing information to convey the concept of X-ray diffraction and how it can be applied to the materials analysis. This book will be a valuable reference book for researchers in the field and will work well as a good introductory book of X-ray diffraction for students in materials science, physics, and chemistry.

X-Ray Diffraction

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Publisher : CRC Press
ISBN 13 : 9814303607
Total Pages : 438 pages
Book Rating : 4.8/5 (143 download)

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Book Synopsis X-Ray Diffraction by : Oliver H. Seeck

Download or read book X-Ray Diffraction written by Oliver H. Seeck and published by CRC Press. This book was released on 2015-02-10 with total page 438 pages. Available in PDF, EPUB and Kindle. Book excerpt: High-resolution x-ray diffraction and scattering is a key tool for structure analysis not only in bulk materials but also at surfaces and buried interfaces from the sub-nanometer range to micrometers. This book offers an overview of diffraction and scattering methods currently available at modern synchrotron sources and illustrates bulk and interface investigations of solid and liquid matter with up-to-date research examples. It presents important characteristics of the sources, experimental set-up, and new detector developments. The book also considers future exploitation of x-ray free electron lasers for diffraction applications.

X-Ray and Neutron Dynamical Diffraction

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Publisher : Springer Science & Business Media
ISBN 13 : 1461558794
Total Pages : 419 pages
Book Rating : 4.4/5 (615 download)

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Book Synopsis X-Ray and Neutron Dynamical Diffraction by : André Authier

Download or read book X-Ray and Neutron Dynamical Diffraction written by André Authier and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 419 pages. Available in PDF, EPUB and Kindle. Book excerpt: This volume collects the proceedings of the 23rd International Course of Crystallography, entitled "X-ray and Neutron Dynamical Diffraction, Theory and Applications," which took place in the fascinating setting of Erice in Sicily, Italy. It was run as a NATO Advanced Studies Institute with A. Authier (France) and S. Lagomarsino (Italy) as codirectors, and L. Riva di Sanseverino and P. Spadon (Italy) as local organizers, R. Colella (USA) and B. K. Tanner (UK) being the two other members of the organizing committee. It was attended by about one hundred participants from twenty four different countries. Two basic theories may be used to describe the diffraction of radiation by crystalline matter. The first one, the so-called geometrical, or kinematical theory, is approximate and is applicable to small, highly imperfect crystals. It is used for the determination of crystal structures and describes the diffraction of powders and polycrystalline materials. The other one, the so-called dynamical theory, is applicable to perfect or nearly perfect crystals. For that reason, dynamical diffraction of X-rays and neutrons constitutes the theoretical basis of a great variety of applications such as: • the techniques used for the characterization of nearly perfect high technology materials, semiconductors, piezoelectric, electrooptic, ferroelectric, magnetic crystals, • the X-ray optical devices used in all modem applications of Synchrotron Radiation (EXAFS, High Resolution X-ray Diffractometry, magnetic and nuclear resonant scattering, topography, etc. ), and • X-ray and neutron interferometry.

High Resolution X-ray Diffraction Studies of Multilayers

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Publisher :
ISBN 13 :
Total Pages : 7 pages
Book Rating : 4.:/5 (246 download)

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Book Synopsis High Resolution X-ray Diffraction Studies of Multilayers by : Finn E. Christensen

Download or read book High Resolution X-ray Diffraction Studies of Multilayers written by Finn E. Christensen and published by . This book was released on 1987 with total page 7 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Elastic Properties of Supported Polycrystalline Thin Films and Multilayers

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ISBN 13 :
Total Pages : 6 pages
Book Rating : 4.:/5 (684 download)

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Book Synopsis Elastic Properties of Supported Polycrystalline Thin Films and Multilayers by :

Download or read book Elastic Properties of Supported Polycrystalline Thin Films and Multilayers written by and published by . This book was released on 2003 with total page 6 pages. Available in PDF, EPUB and Kindle. Book excerpt: Numerous experimental and theoretical studies have shown that thin film elastic behavior may be different from the bulk one due to size effects related to grain boundaries, free surfaces and interfaces. In addition, thin films often present high compressive residual stresses which may be responsible of thin film buckling. These two features will be discussed in this communication through recent x-ray diffraction experiments: in situ tensile testing for elastic constant analysis and scanning x-ray micro diffraction for stress relaxation measurements associated with film buckling.

Physics Briefs

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ISBN 13 :
Total Pages : 1118 pages
Book Rating : 4.3/5 (91 download)

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Book Synopsis Physics Briefs by :

Download or read book Physics Briefs written by and published by . This book was released on 1994 with total page 1118 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Magnetic Ultrathin Films

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ISBN 13 :
Total Pages : 866 pages
Book Rating : 4.3/5 (91 download)

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Book Synopsis Magnetic Ultrathin Films by : Materials Research Society

Download or read book Magnetic Ultrathin Films written by Materials Research Society and published by . This book was released on 1993 with total page 866 pages. Available in PDF, EPUB and Kindle. Book excerpt: