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Author :
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ISBN 13 :
Total Pages : 1360 pages
Book Rating : 4.3/5 (243 download)
Download or read book Science Abstracts written by and published by . This book was released on 1995 with total page 1360 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Manoj Sachdev
Publisher : Springer Science & Business Media
ISBN 13 : 1475749260
Total Pages : 317 pages
Book Rating : 4.4/5 (757 download)
Download or read book Defect Oriented Testing for CMOS Analog and Digital Circuits written by Manoj Sachdev and published by Springer Science & Business Media. This book was released on 2013-06-29 with total page 317 pages. Available in PDF, EPUB and Kindle. Book excerpt: Defect oriented testing is expected to play a significant role in coming generations of technology. Smaller feature sizes and larger die sizes will make ICs more sensitive to defects that can not be modeled by traditional fault modeling approaches. Furthermore, with increased level of integration, an IC may contain diverse building blocks. Such blocks include, digital logic, PLAs, volatile and non-volatile memories, and analog interfaces. For such diverse building blocks, traditional fault modeling and test approaches will become increasingly inadequate. Defect oriented testing methods have come a long way from a mere interesting academic exercise to a hard industrial reality. Many factors have contributed to its industrial acceptance. Traditional approaches of testing modern integrated circuits (ICs) have been found to be inadequate in terms of quality and economics of test. In a globally competitive semiconductor market place, overall product quality and economics have become very important objectives. In addition, electronic systems are becoming increasingly complex and demand components of highest possible quality. Testing, in general and, defect oriented testing, in particular, help in realizing these objectives. Defect Oriented Testing for CMOS Analog and Digital Circuits is the first book to provide a complete overview of the subject. It is essential reading for all design and test professionals as well as researchers and students working in the field. `A strength of this book is its breadth. Types of designs considered include analog and digital circuits, programmable logic arrays, and memories. Having a fault model does not automatically provide a test. Sometimes, design for testability hardware is necessary. Many design for testability ideas, supported by experimental evidence, are included.' ... from the Foreword by Vishwani D. Agrawal
Author : Joonhwan Yi
Publisher :
ISBN 13 :
Total Pages : 292 pages
Book Rating : 4.3/5 (91 download)
Download or read book High-level Function and Delay Testing for Digital Circuits written by Joonhwan Yi and published by . This book was released on 2002 with total page 292 pages. Available in PDF, EPUB and Kindle. Book excerpt:
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ISBN 13 :
Total Pages : 336 pages
Book Rating : 4.3/5 (91 download)
Download or read book Asian Test Symposium written by and published by . This book was released on 1996 with total page 336 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : United States. Patent and Trademark Office
Publisher :
ISBN 13 :
Total Pages : 1360 pages
Book Rating : 4.:/5 (89 download)
Download or read book Official Gazette of the United States Patent and Trademark Office written by United States. Patent and Trademark Office and published by . This book was released on 2002 with total page 1360 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Laung-Terng Wang
Publisher : Morgan Kaufmann
ISBN 13 : 0080556809
Total Pages : 893 pages
Book Rating : 4.0/5 (85 download)
Download or read book System-on-Chip Test Architectures written by Laung-Terng Wang and published by Morgan Kaufmann. This book was released on 2010-07-28 with total page 893 pages. Available in PDF, EPUB and Kindle. Book excerpt: Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today's overall product cost. This book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers, DFT practitioners, and VLSI designers to master quickly System-on-Chip Test architectures, for test debug and diagnosis of digital, memory, and analog/mixed-signal designs. - Emphasizes VLSI Test principles and Design for Testability architectures, with numerous illustrations/examples. - Most up-to-date coverage available, including Fault Tolerance, Low-Power Testing, Defect and Error Tolerance, Network-on-Chip (NOC) Testing, Software-Based Self-Testing, FPGA Testing, MEMS Testing, and System-In-Package (SIP) Testing, which are not yet available in any testing book. - Covers the entire spectrum of VLSI testing and DFT architectures, from digital and analog, to memory circuits, and fault diagnosis and self-repair from digital to memory circuits. - Discusses future nanotechnology test trends and challenges facing the nanometer design era; promising nanotechnology test techniques, including Quantum-Dots, Cellular Automata, Carbon-Nanotubes, and Hybrid Semiconductor/Nanowire/Molecular Computing. - Practical problems at the end of each chapter for students.
Author : Bjørn Myhrhaug
Publisher : North Holland
ISBN 13 : 9780444875914
Total Pages : 356 pages
Book Rating : 4.8/5 (759 download)
Download or read book Advances in Microprocessing and Microprogramming written by Bjørn Myhrhaug and published by North Holland. This book was released on 1984 with total page 356 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Manfred Glesner
Publisher : Springer
ISBN 13 : 3540461175
Total Pages : 1209 pages
Book Rating : 4.5/5 (44 download)
Download or read book Field-Programmable Logic and Applications: Reconfigurable Computing Is Going Mainstream written by Manfred Glesner and published by Springer. This book was released on 2003-08-02 with total page 1209 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book constitutes the refereed proceedings of the 12th International Conference on Field-Programmable Logic and Applications, FPL 2002, held in Montpellier, France, in September 2002. The 104 revised regular papers and 27 poster papers presented together with three invited contributions were carefully reviewed and selected from 214 submissions. The papers are organized in topical sections on rapid prototyping, FPGA synthesis, custom computing engines, DSP applications, reconfigurable fabrics, dynamic reconfiguration, routing and placement, power estimation, synthesis issues, communication applications, new technologies, reconfigurable architectures, multimedia applications, FPGA-based arithmetic, reconfigurable processors, testing and fault-tolerance, crypto applications, multitasking, compilation techniques, etc.
Author : Laung-Terng Wang
Publisher : Morgan Kaufmann
ISBN 13 : 0080922007
Total Pages : 971 pages
Book Rating : 4.0/5 (89 download)
Download or read book Electronic Design Automation written by Laung-Terng Wang and published by Morgan Kaufmann. This book was released on 2009-03-11 with total page 971 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides broad and comprehensive coverage of the entire EDA flow. EDA/VLSI practitioners and researchers in need of fluency in an "adjacent" field will find this an invaluable reference to the basic EDA concepts, principles, data structures, algorithms, and architectures for the design, verification, and test of VLSI circuits. Anyone who needs to learn the concepts, principles, data structures, algorithms, and architectures of the EDA flow will benefit from this book. - Covers complete spectrum of the EDA flow, from ESL design modeling to logic/test synthesis, verification, physical design, and test - helps EDA newcomers to get "up-and-running" quickly - Includes comprehensive coverage of EDA concepts, principles, data structures, algorithms, and architectures - helps all readers improve their VLSI design competence - Contains latest advancements not yet available in other books, including Test compression, ESL design modeling, large-scale floorplanning, placement, routing, synthesis of clock and power/ground networks - helps readers to design/develop testable chips or products - Includes industry best-practices wherever appropriate in most chapters - helps readers avoid costly mistakes
Author :
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ISBN 13 :
Total Pages : 526 pages
Book Rating : 4.3/5 (91 download)
Download or read book IEEE VLSI Test Symposium written by and published by . This book was released on 2000 with total page 526 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Jürgen Becker
Publisher : Springer
ISBN 13 : 3540301178
Total Pages : 1226 pages
Book Rating : 4.5/5 (43 download)
Download or read book Field Programmable Logic and Application written by Jürgen Becker and published by Springer. This book was released on 2004-08-11 with total page 1226 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book contains the papers presented at the 14th International Conference on Field Programmable Logic and Applications (FPL) held during August 30th- September 1st 2004. The conference was hosted by the Interuniversity Micro- Electronics Center (IMEC) in Leuven, Belgium. The FPL series of conferences was founded in 1991 at Oxford University (UK), and has been held annually since: in Oxford (3 times), Vienna, Prague, Darmstadt, London, Tallinn, Glasgow, Villach, Belfast, Montpellier and Lisbon. It is the largest and oldest conference in reconfigurable computing and brings together academic researchers, industry experts, users and newcomers in an informal, welcoming atmosphere that encourages productive exchange of ideas and knowledge between the delegates. The fast and exciting advances in field programmable logic are increasing steadily with more and more application potential and need. New ground has been broken in architectures, design techniques, (partial) run-time reconfiguration and applications of field programmable devices in several different areas. Many of these recent innovations are reported in this volume. The size of the FPL conferences has grown significantly over the years. FPL in 2003 saw 216 papers submitted. The interest and support for FPL in the programmable logic community continued this year with 285 scientific papers submitted, demonstrating a 32% increase when compared to the year before. The technical program was assembled from 78 selected regular papers, 45 additional short papers and 29 posters, resulting in this volume of proceedings. The program also included three invited plenary keynote presentations from Xilinx, Gilder Technology Report and Altera, and three embedded tutorials from Xilinx, the Universit ̈ at Karlsruhe (TH) and the University of Oslo.
Author :
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ISBN 13 :
Total Pages : 774 pages
Book Rating : 4.F/5 ( download)
Download or read book Proceedings of MELECON ... written by and published by . This book was released on 1987 with total page 774 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : F.P.M. Beenker
Publisher : Springer Science & Business Media
ISBN 13 : 1461523656
Total Pages : 216 pages
Book Rating : 4.4/5 (615 download)
Download or read book Testability Concepts for Digital ICs written by F.P.M. Beenker and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 216 pages. Available in PDF, EPUB and Kindle. Book excerpt: Preface Testing Integrated Circuits for manufacturing defects includes four basic disciplines. First of all an understanding of the origin and behaviour of defects. Secondly, knowledge of IC design and IC design styles. Thirdly, knowledge of how to create a test program for an IC which is targeted on detecting these defects, and finally, understanding of the hardware, Automatic Test Equipment, to run the test on. All four items have to be treated, managed, and to a great extent integrated before the term 'IC quality' gets a certain meaning and a test a certain measurable value. The contents of this book reflects our activities on testability concepts for complex digital ICs as performed at Philips Research Laboratories in Eindhoven, The Netherlands. Based on the statements above, we have worked along a long term plan, which was based on four pillars. 1. The definition of a test methodology suitable for 'future' IC design styles, 2. capable of handling improved defect models, 3. supported by software tools, and 4. providing an easy link to Automatic Test Equipment. The reasoning we have followed was continuously focused on IC qUality. Quality expressed in terms of the ability of delivering a customer a device with no residual manufacturing defects. Bad devices should not escape a test. The basis of IC quality is a thorough understanding of defects and defect models.
Author : Institute of Electrical and Electronics Engineers
Publisher :
ISBN 13 :
Total Pages : 1234 pages
Book Rating : 4.3/5 (91 download)
Download or read book Index to IEEE Publications written by Institute of Electrical and Electronics Engineers and published by . This book was released on 1998 with total page 1234 pages. Available in PDF, EPUB and Kindle. Book excerpt: Issues for 1973- cover the entire IEEE technical literature.
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ISBN 13 :
Total Pages : 1000 pages
Book Rating : 4.E/5 ( download)
Download or read book Journal of Design Automation & Fault-tolerant Computing written by and published by . This book was released on 1976 with total page 1000 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Brian Holdsworth
Publisher : Elsevier
ISBN 13 : 0080477305
Total Pages : 535 pages
Book Rating : 4.0/5 (84 download)
Download or read book Digital Logic Design written by Brian Holdsworth and published by Elsevier. This book was released on 2002-11-01 with total page 535 pages. Available in PDF, EPUB and Kindle. Book excerpt: New, updated and expanded topics in the fourth edition include: EBCDIC, Grey code, practical applications of flip-flops, linear and shaft encoders, memory elements and FPGAs. The section on fault-finding has been expanded. A new chapter is dedicated to the interface between digital components and analog voltages. - A highly accessible, comprehensive and fully up to date digital systems text - A well known and respected text now revamped for current courses - Part of the Newnes suite of texts for HND/1st year modules
Author :
Publisher :
ISBN 13 :
Total Pages : 2304 pages
Book Rating : 4.3/5 (243 download)
Download or read book Electrical & Electronics Abstracts written by and published by . This book was released on 1997 with total page 2304 pages. Available in PDF, EPUB and Kindle. Book excerpt:
