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2016 Ieee International Reliability Physics Symposium Irps
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Book Synopsis ISTFA 2017: Proceedings from the 43rd International Symposium for Testing and Failure Analysis by : ASM International
Download or read book ISTFA 2017: Proceedings from the 43rd International Symposium for Testing and Failure Analysis written by ASM International and published by ASM International. This book was released on 2017-12-01 with total page 666 pages. Available in PDF, EPUB and Kindle. Book excerpt: The theme for the November 2017 conference was Striving for 100% Success Rate. Papers focus on the tools and techniques needed for maximizing the success rate in every aspect of the electronic device failure analysis process.
Book Synopsis Handbook of Emerging Materials for Semiconductor Industry by : Young Suh Song
Download or read book Handbook of Emerging Materials for Semiconductor Industry written by Young Suh Song and published by Springer Nature. This book was released on with total page 930 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Power Electronics Device Applications of Diamond Semiconductors by : Satoshi Koizumi
Download or read book Power Electronics Device Applications of Diamond Semiconductors written by Satoshi Koizumi and published by Woodhead Publishing. This book was released on 2018-06-29 with total page 468 pages. Available in PDF, EPUB and Kindle. Book excerpt: Power Electronics Device Applications of Diamond Semiconductors presents state-of-the-art research on diamond growth, doping, device processing, theoretical modeling and device performance. The book begins with a comprehensive and close examination of diamond crystal growth from the vapor phase for epitaxial diamond and wafer preparation. It looks at single crystal vapor deposition (CVD) growth sectors and defect control, ultra high purity SC-CVD, SC diamond wafer CVD, heteroepitaxy on Ir/MqO and needle-induced large area growth, also discussing the latest doping and semiconductor characterization methods, fundamental material properties and device physics. The book concludes with a discussion of circuits and applications, featuring the switching behavior of diamond devices and applications, high frequency and high temperature operation, and potential applications of diamond semiconductors for high voltage devices. - Includes contributions from today's most respected researchers who present the latest results for diamond growth, doping, device fabrication, theoretical modeling and device performance - Examines why diamond semiconductors could lead to superior power electronics - Discusses the main challenges to device realization and the best opportunities for the next generation of power electronics
Book Synopsis Noise in Nanoscale Semiconductor Devices by : Tibor Grasser
Download or read book Noise in Nanoscale Semiconductor Devices written by Tibor Grasser and published by Springer Nature. This book was released on 2020-04-26 with total page 724 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book summarizes the state-of-the-art, regarding noise in nanometer semiconductor devices. Readers will benefit from this leading-edge research, aimed at increasing reliability based on physical microscopic models. Authors discuss the most recent developments in the understanding of point defects, e.g. via ab initio calculations or intricate measurements, which have paved the way to more physics-based noise models which are applicable to a wider range of materials and features, e.g. III-V materials, 2D materials, and multi-state defects. Describes the state-of-the-art, regarding noise in nanometer semiconductor devices; Enables readers to design more reliable semiconductor devices; Offers the most up-to-date information on point defects, based on physical microscopic models.
Book Synopsis Springer Handbook of Semiconductor Devices by : Massimo Rudan
Download or read book Springer Handbook of Semiconductor Devices written by Massimo Rudan and published by Springer Nature. This book was released on 2022-11-10 with total page 1680 pages. Available in PDF, EPUB and Kindle. Book excerpt: This Springer Handbook comprehensively covers the topic of semiconductor devices, embracing all aspects from theoretical background to fabrication, modeling, and applications. Nearly 100 leading scientists from industry and academia were selected to write the handbook's chapters, which were conceived for professionals and practitioners, material scientists, physicists and electrical engineers working at universities, industrial R&D, and manufacturers. Starting from the description of the relevant technological aspects and fabrication steps, the handbook proceeds with a section fully devoted to the main conventional semiconductor devices like, e.g., bipolar transistors and MOS capacitors and transistors, used in the production of the standard integrated circuits, and the corresponding physical models. In the subsequent chapters, the scaling issues of the semiconductor-device technology are addressed, followed by the description of novel concept-based semiconductor devices. The last section illustrates the numerical simulation methods ranging from the fabrication processes to the device performances. Each chapter is self-contained, and refers to related topics treated in other chapters when necessary, so that the reader interested in a specific subject can easily identify a personal reading path through the vast contents of the handbook.
Book Synopsis Materials for Electronics Security and Assurance by : Navid Asadizanjani
Download or read book Materials for Electronics Security and Assurance written by Navid Asadizanjani and published by Elsevier. This book was released on 2024-01-15 with total page 224 pages. Available in PDF, EPUB and Kindle. Book excerpt: Materials for Electronics Security and Assurance reviews the properties of materials that could enable devices that are resistant to tampering and manipulation. The book discusses recent advances in materials synthesis and characterization techniques for security applications. Topics addressed include anti-reverse engineering, detection, prevention, track and trace, fingerprinting, obfuscation, and how materials could enable these security solutions. The book introduces opportunities and challenges and provides a clear direction of the requirements for material-based solutions to address electronics security challenges. It is suitable for materials scientists and engineers who seek to enable future research directions, current computer and hardware security engineers who want to enable materials selection, and as a way to inspire cross-collaboration between both communities. - Discusses materials as enablers to provide electronics assurance, counterfeit detection/protection, and fingerprinting - Provides an overview of benefits and challenges of materials-based security solutions to inspire future materials research directions - Includes an introduction to material perspectives on hardware security to enable cross collaboration between materials, design, and testing
Book Synopsis Long-Term Reliability of Nanometer VLSI Systems by : Sheldon Tan
Download or read book Long-Term Reliability of Nanometer VLSI Systems written by Sheldon Tan and published by Springer Nature. This book was released on 2019-09-12 with total page 487 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides readers with a detailed reference regarding two of the most important long-term reliability and aging effects on nanometer integrated systems, electromigrations (EM) for interconnect and biased temperature instability (BTI) for CMOS devices. The authors discuss in detail recent developments in the modeling, analysis and optimization of the reliability effects from EM and BTI induced failures at the circuit, architecture and system levels of abstraction. Readers will benefit from a focus on topics such as recently developed, physics-based EM modeling, EM modeling for multi-segment wires, new EM-aware power grid analysis, and system level EM-induced reliability optimization and management techniques. Reviews classic Electromigration (EM) models, as well as existing EM failure models and discusses the limitations of those models; Introduces a dynamic EM model to address transient stress evolution, in which wires are stressed under time-varying current flows, and the EM recovery effects. Also includes new, parameterized equivalent DC current based EM models to address the recovery and transient effects; Presents a cross-layer approach to transistor aging modeling, analysis and mitigation, spanning multiple abstraction levels; Equips readers for EM-induced dynamic reliability management and energy or lifetime optimization techniques, for many-core dark silicon microprocessors, embedded systems, lower power many-core processors and datacenters.
Book Synopsis Harnessing Performance Variability in Embedded and High-performance Many/Multi-core Platforms by : William Fornaciari
Download or read book Harnessing Performance Variability in Embedded and High-performance Many/Multi-core Platforms written by William Fornaciari and published by Springer. This book was released on 2018-10-23 with total page 320 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book describes the state-of-the art of industrial and academic research in the architectural design of heterogeneous, multi/many-core processors. The authors describe methods and tools to enable next-generation embedded and high-performance heterogeneous processors to confront cost-effectively the inevitable variations by providing Dependable-Performance: correct functionality and timing guarantees throughout the expected lifetime of a platform under thermal, power, and energy constraints. Various aspects of the reliability problem are discussed, at both the circuit and architecture level, the intelligent selection of knobs and monitors in multicore platforms, and systematic design methodologies. The authors demonstrate how new techniques have been applied in real case studies from different applications domain and report on results and conclusions of those experiments. Enables readers to develop performance-dependable heterogeneous multi/many-core architectures Describes system software designs that support high performance dependability requirements Discusses and analyzes low level methodologies to tradeoff conflicting metrics, i.e. power, performance, reliability and thermal management Includes new application design guidelines to improve performance dependability
Book Synopsis Advances in Non-volatile Memory and Storage Technology by : Yoshio Nishi
Download or read book Advances in Non-volatile Memory and Storage Technology written by Yoshio Nishi and published by Woodhead Publishing. This book was released on 2019-06-15 with total page 664 pages. Available in PDF, EPUB and Kindle. Book excerpt: Advances in Nonvolatile Memory and Storage Technology, Second Edition, addresses recent developments in the non-volatile memory spectrum, from fundamental understanding, to technological aspects. The book provides up-to-date information on the current memory technologies as related by leading experts in both academia and industry. To reflect the rapidly changing field, many new chapters have been included to feature the latest in RRAM technology, STT-RAM, memristors and more. The new edition describes the emerging technologies including oxide-based ferroelectric memories, MRAM technologies, and 3D memory. Finally, to further widen the discussion on the applications space, neuromorphic computing aspects have been included. This book is a key resource for postgraduate students and academic researchers in physics, materials science and electrical engineering. In addition, it will be a valuable tool for research and development managers concerned with electronics, semiconductors, nanotechnology, solid-state memories, magnetic materials, organic materials and portable electronic devices. - Discusses emerging devices and research trends, such as neuromorphic computing and oxide-based ferroelectric memories - Provides an overview on developing nonvolatile memory and storage technologies and explores their strengths and weaknesses - Examines improvements to flash technology, charge trapping and resistive random access memory
Book Synopsis Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETs by : Alexandra Zimpeck
Download or read book Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETs written by Alexandra Zimpeck and published by Springer Nature. This book was released on 2021-03-10 with total page 131 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book evaluates the influence of process variations (e.g. work-function fluctuations) and radiation-induced soft errors in a set of logic cells using FinFET technology, considering the 7nm technological node as a case study. Moreover, for accurate soft error estimation, the authors adopt a radiation event generator tool (MUSCA SEP3), which deals both with layout features and electrical properties of devices. The authors also explore four circuit-level techniques (e.g. transistor reordering, decoupling cells, Schmitt Trigger, and sleep transistor) as alternatives to attenuate the unwanted effects on FinFET logic cells. This book also evaluates the mitigation tendency when different levels of process variation, transistor sizing, and radiation particle characteristics are applied in the design. An overall comparison of all methods addressed by this work is provided allowing to trace a trade-off between the reliability gains and the design penalties of each approach regarding the area, performance, power consumption, single event transient (SET) pulse width, and SET cross-section.
Book Synopsis VLSI-SoC: System-on-Chip in the Nanoscale Era – Design, Verification and Reliability by : Thomas Hollstein
Download or read book VLSI-SoC: System-on-Chip in the Nanoscale Era – Design, Verification and Reliability written by Thomas Hollstein and published by Springer. This book was released on 2017-08-31 with total page 247 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book contains extended and revised versions of the best papers presented at the 24th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2016, held in Tallinn, Estonia, in September 2016. The 11 papers included in the book were carefully reviewed and selected from the 36 full papers presented at the conference. The papers cover a wide range of topics in VLSI technology and advanced research. They address the latest scientific and industrial results and developments as well as future trends in the field of System-on-Chip (SoC) Design.
Book Synopsis Processing-in-Memory for AI by : Joo-Young Kim
Download or read book Processing-in-Memory for AI written by Joo-Young Kim and published by Springer Nature. This book was released on 2022-07-09 with total page 168 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides a comprehensive introduction to processing-in-memory (PIM) technology, from its architectures to circuits implementations on multiple memory types and describes how it can be a viable computer architecture in the era of AI and big data. The authors summarize the challenges of AI hardware systems, processing-in-memory (PIM) constraints and approaches to derive system-level requirements for a practical and feasible PIM solution. The presentation focuses on feasible PIM solutions that can be implemented and used in real systems, including architectures, circuits, and implementation cases for each major memory type (SRAM, DRAM, and ReRAM).
Book Synopsis Memristive Devices for Brain-Inspired Computing by : Sabina Spiga
Download or read book Memristive Devices for Brain-Inspired Computing written by Sabina Spiga and published by Woodhead Publishing. This book was released on 2020-06-12 with total page 569 pages. Available in PDF, EPUB and Kindle. Book excerpt: Memristive Devices for Brain-Inspired Computing: From Materials, Devices, and Circuits to Applications—Computational Memory, Deep Learning, and Spiking Neural Networks reviews the latest in material and devices engineering for optimizing memristive devices beyond storage applications and toward brain-inspired computing. The book provides readers with an understanding of four key concepts, including materials and device aspects with a view of current materials systems and their remaining barriers, algorithmic aspects comprising basic concepts of neuroscience as well as various computing concepts, the circuits and architectures implementing those algorithms based on memristive technologies, and target applications, including brain-inspired computing, computational memory, and deep learning. This comprehensive book is suitable for an interdisciplinary audience, including materials scientists, physicists, electrical engineers, and computer scientists. - Provides readers an overview of four key concepts in this emerging research topic including materials and device aspects, algorithmic aspects, circuits and architectures and target applications - Covers a broad range of applications, including brain-inspired computing, computational memory, deep learning and spiking neural networks - Includes perspectives from a wide range of disciplines, including materials science, electrical engineering and computing, providing a unique interdisciplinary look at the field
Book Synopsis Reliability of Organic Compounds in Microelectronics and Optoelectronics by : Willem Dirk van Driel
Download or read book Reliability of Organic Compounds in Microelectronics and Optoelectronics written by Willem Dirk van Driel and published by Springer Nature. This book was released on 2022-01-31 with total page 552 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book aims to provide a comprehensive reference into the critical subject of failure and degradation in organic materials, used in optoelectronics and microelectronics systems and devices. Readers in different industrial sectors, including microelectronics, automotive, lighting, oil/gas, and petrochemical will benefit from this book. Several case studies and examples are discussed, which readers will find useful to assess and mitigate similar failure cases. More importantly, this book presents methodologies and useful approaches in analyzing a failure and in relating a failure to the reliability of materials and systems.
Book Synopsis Durability and Reliability of Polymers and Other Materials in Photovoltaic Modules by : Hsinjin Edwin Yang
Download or read book Durability and Reliability of Polymers and Other Materials in Photovoltaic Modules written by Hsinjin Edwin Yang and published by William Andrew. This book was released on 2019-06-13 with total page 358 pages. Available in PDF, EPUB and Kindle. Book excerpt: Durability and Reliability of Polymers and Other Materials in Photovoltaic Modules describes the durability and reliability behavior of polymers used in Si-photovoltaic modules and systems, particularly in terms of physical aging and degradation process/mechanisms, characterization methods, accelerated exposure chamber and testing, module level testing, and service life prediction. The book compares polymeric materials to traditional materials used in solar applications, explaining the degradation pathways of the different elements of a photovoltaic module, including encapsulant, front sheet, back sheet, wires and connectors, adhesives, sealants, and more. In addition, users will find sections on the tests needed for the evaluation of polymer degradation and aging, as well as accelerated tests to aid in materials selection. As demand for photovoltaics continues to grow globally, with polymer photovoltaics offering significantly lower production costs compared to earlier approaches, this book will serve as a welcome resource on new avenues. - Provides comprehensive coverage of photovoltaic polymers, from fundamental degradation mechanisms, to specific case studies of durability and materials failure - Offers practical, actionable information in relation to service life prediction of photovoltaic modules and accelerated testing for materials selection - Includes up-to-date information and interpretation of safety regulations and testing of photovoltaic modules and materials
Book Synopsis Artificial Intelligence Applications and Reconfigurable Architectures by : Anuradha D. Thakare
Download or read book Artificial Intelligence Applications and Reconfigurable Architectures written by Anuradha D. Thakare and published by John Wiley & Sons. This book was released on 2023-02-14 with total page 245 pages. Available in PDF, EPUB and Kindle. Book excerpt: ARTIFICIAL INTELLIGENCE APPLICATIONS and RECONFIGURABLE ARCHITECTURES The primary goal of this book is to present the design, implementation, and performance issues of AI applications and the suitability of the FPGA platform. This book covers the features of modern Field Programmable Gate Arrays (FPGA) devices, design techniques, and successful implementations pertaining to AI applications. It describes various hardware options available for AI applications, key advantages of FPGAs, and contemporary FPGA ICs with software support. The focus is on exploiting parallelism offered by FPGA to meet heavy computation requirements of AI as complete hardware implementation or customized hardware accelerators. This is a comprehensive textbook on the subject covering a broad array of topics like technological platforms for the implementation of AI, capabilities of FPGA, suppliers’ software tools and hardware boards, and discussion of implementations done by researchers to encourage the AI community to use and experiment with FPGA. Readers will benefit from reading this book because It serves all levels of students and researcher’s as it deals with the basics and minute details of Ecosystem Development Requirements for Intelligent applications with reconfigurable architectures whereas current competitors’ books are more suitable for understanding only reconfigurable architectures. It focuses on all aspects of machine learning accelerators for the design and development of intelligent applications and not on a single perspective such as only on reconfigurable architectures for IoT applications. It is the best solution for researchers to understand how to design and develop various AI, deep learning, and machine learning applications on the FPGA platform. It is the best solution for all types of learners to get complete knowledge of why reconfigurable architectures are important for implementing AI-ML applications with heavy computations. Audience Researchers, industrial experts, scientists, and postgraduate students who are working in the fields of computer engineering, electronics, and electrical engineering, especially those specializing in VLSI and embedded systems, FPGA, artificial intelligence, Internet of Things, and related multidisciplinary projects.
Book Synopsis Security Opportunities in Nano Devices and Emerging Technologies by : Mark Tehranipoor
Download or read book Security Opportunities in Nano Devices and Emerging Technologies written by Mark Tehranipoor and published by CRC Press. This book was released on 2017-11-22 with total page 401 pages. Available in PDF, EPUB and Kindle. Book excerpt: The research community lacks both the capability to explain the effectiveness of existing techniques and the metrics to predict the security properties and vulnerabilities of the next generation of nano-devices and systems. This book provides in-depth viewpoints on security issues and explains how nano devices and their unique properties can address the opportunities and challenges of the security community, manufacturers, system integrators, and end users. This book elevates security as a fundamental design parameter, transforming the way new nano-devices are developed. Part 1 focuses on nano devices and building security primitives. Part 2 focuses on emerging technologies and integrations.
