2011 IEEE Radiation Effects Data Workshop

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Publisher :
ISBN 13 : 9781457712814
Total Pages : 217 pages
Book Rating : 4.7/5 (128 download)

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Book Synopsis 2011 IEEE Radiation Effects Data Workshop by : Craig Hafer

Download or read book 2011 IEEE Radiation Effects Data Workshop written by Craig Hafer and published by . This book was released on 2011-07-25 with total page 217 pages. Available in PDF, EPUB and Kindle. Book excerpt:

2011 IEEE Radiation Effects Data Workshop

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Publisher :
ISBN 13 :
Total Pages : pages
Book Rating : 4.:/5 (812 download)

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Book Synopsis 2011 IEEE Radiation Effects Data Workshop by :

Download or read book 2011 IEEE Radiation Effects Data Workshop written by and published by . This book was released on 2011 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:

2011 IEEE Radiation Effects Data Workshop

Download 2011 IEEE Radiation Effects Data Workshop PDF Online Free

Author :
Publisher :
ISBN 13 : 9781457712821
Total Pages : 217 pages
Book Rating : 4.7/5 (128 download)

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Book Synopsis 2011 IEEE Radiation Effects Data Workshop by :

Download or read book 2011 IEEE Radiation Effects Data Workshop written by and published by . This book was released on 2011 with total page 217 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Ionizing Radiation Effects in Electronics

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Publisher : CRC Press
ISBN 13 : 1498722636
Total Pages : 394 pages
Book Rating : 4.4/5 (987 download)

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Book Synopsis Ionizing Radiation Effects in Electronics by : Marta Bagatin

Download or read book Ionizing Radiation Effects in Electronics written by Marta Bagatin and published by CRC Press. This book was released on 2018-09-03 with total page 394 pages. Available in PDF, EPUB and Kindle. Book excerpt: Ionizing Radiation Effects in Electronics: From Memories to Imagers delivers comprehensive coverage of the effects of ionizing radiation on state-of-the-art semiconductor devices. The book also offers valuable insight into modern radiation-hardening techniques. The text begins by providing important background information on radiation effects, their underlying mechanisms, and the use of Monte Carlo techniques to simulate radiation transport and the effects of radiation on electronics. The book then: Explains the effects of radiation on digital commercial devices, including microprocessors and volatile and nonvolatile memories—static random-access memories (SRAMs), dynamic random-access memories (DRAMs), and Flash memories Examines issues like soft errors, total dose, and displacement damage, together with hardening-by-design solutions for digital circuits, field-programmable gate arrays (FPGAs), and mixed-analog circuits Explores the effects of radiation on fiber optics and imager devices such as complementary metal-oxide-semiconductor (CMOS) sensors and charge-coupled devices (CCDs) Featuring real-world examples, case studies, extensive references, and contributions from leading experts in industry and academia, Ionizing Radiation Effects in Electronics: From Memories to Imagers is suitable both for newcomers who want to become familiar with radiation effects and for radiation experts who are looking for more advanced material or to make effective use of beam time.

Terrestrial Radiation Effects in ULSI Devices and Electronic Systems

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Author :
Publisher : John Wiley & Sons
ISBN 13 : 1118479297
Total Pages : 292 pages
Book Rating : 4.1/5 (184 download)

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Book Synopsis Terrestrial Radiation Effects in ULSI Devices and Electronic Systems by : Eishi H. Ibe

Download or read book Terrestrial Radiation Effects in ULSI Devices and Electronic Systems written by Eishi H. Ibe and published by John Wiley & Sons. This book was released on 2015-03-02 with total page 292 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides the reader with knowledge on a wide variety of radiation fields and their effects on the electronic devices and systems. The author covers faults and failures in ULSI devices induced by a wide variety of radiation fields, including electrons, alpha-rays, muons, gamma rays, neutrons and heavy ions. Readers will learn how to make numerical models from physical insights, to determine the kind of mathematical approaches that should be implemented to analyze radiation effects. A wide variety of prediction, detection, characterization and mitigation techniques against soft-errors are reviewed and discussed. The author shows how to model sophisticated radiation effects in condensed matter in order to quantify and control them, and explains how electronic systems including servers and routers are shut down due to environmental radiation. Provides an understanding of how electronic systems are shut down due to environmental radiation by constructing physical models and numerical algorithms Covers both terrestrial and avionic-level conditions Logically presented with each chapter explaining the background physics to the topic followed by various modelling techniques, and chapter summary Written by a widely-recognized authority in soft-errors in electronic devices Code samples available for download from the Companion Website This book is targeted at researchers and graduate students in nuclear and space radiation, semiconductor physics and electron devices, as well as other areas of applied physics modelling. Researchers and students interested in how a variety of physical phenomena can be modelled and numerically treated will also find this book to present helpful methods.

Research on the Radiation Effects and Compact Model of SiGe HBT

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Author :
Publisher : Springer
ISBN 13 : 9811046123
Total Pages : 187 pages
Book Rating : 4.8/5 (11 download)

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Book Synopsis Research on the Radiation Effects and Compact Model of SiGe HBT by : Yabin Sun

Download or read book Research on the Radiation Effects and Compact Model of SiGe HBT written by Yabin Sun and published by Springer. This book was released on 2017-10-24 with total page 187 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book primarily focuses on the radiation effects and compact model of silicon-germanium (SiGe) heterojunction bipolar transistors (HBTs). It introduces the small-signal equivalent circuit of SiGe HBTs including the distributed effects, and proposes a novel direct analytical extraction technique based on non-linear rational function fitting. It also presents the total dose effects irradiated by gamma rays and heavy ions, as well as the single-event transient induced by pulse laser microbeams. It offers readers essential information on the irradiation effects technique and the SiGe HBTs model using that technique.

Semiconductor Devices in Harsh Conditions

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Publisher : CRC Press
ISBN 13 : 149874382X
Total Pages : 257 pages
Book Rating : 4.4/5 (987 download)

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Book Synopsis Semiconductor Devices in Harsh Conditions by : Kirsten Weide-Zaage

Download or read book Semiconductor Devices in Harsh Conditions written by Kirsten Weide-Zaage and published by CRC Press. This book was released on 2016-11-25 with total page 257 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book introduces the reader to a number of challenges for the operation of electronic devices in various harsh environmental conditions. While some chapters focus on measuring and understanding the effects of these environments on electronic components, many also propose design solutions, whether in choice of material, innovative structures, or strategies for amelioration and repair. Many applications need electronics designed to operate in harsh environments. Readers will find, in this collection of topics, tools and ideas useful in their own pursuits and of interest to their intellectual curiosity. With a focus on radiation, operating conditions, sensor systems, package, and system design, the book is divided into three parts. The first part deals with sensing devices designed for operating in the presence of radiation, commercials of the shelf (COTS) products for space computing, and influences of single event upset. The second covers system and package design for harsh operating conditions. The third presents devices for biomedical applications under moisture and temperature loads in the frame of sensor systems and operating conditions.

Single Event Effects in Aerospace

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Publisher : John Wiley & Sons
ISBN 13 : 1118084314
Total Pages : 518 pages
Book Rating : 4.1/5 (18 download)

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Book Synopsis Single Event Effects in Aerospace by : Edward Petersen

Download or read book Single Event Effects in Aerospace written by Edward Petersen and published by John Wiley & Sons. This book was released on 2011-11-16 with total page 518 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book introduces the basic concepts necessary to understand Single Event phenomena which could cause random performance errors and catastrophic failures to electronics devices. As miniaturization of electronics components advances, electronics components are more susceptible in the radiation environment. The book includes a discussion of the radiation environments in space and in the atmosphere, radiation rate prediction depending on the orbit to allow electronics engineers to design and select radiation tolerant components and systems, and single event prediction.

FPGAs and Parallel Architectures for Aerospace Applications

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Publisher : Springer
ISBN 13 : 3319143522
Total Pages : 319 pages
Book Rating : 4.3/5 (191 download)

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Book Synopsis FPGAs and Parallel Architectures for Aerospace Applications by : Fernanda Kastensmidt

Download or read book FPGAs and Parallel Architectures for Aerospace Applications written by Fernanda Kastensmidt and published by Springer. This book was released on 2015-12-07 with total page 319 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book introduces the concepts of soft errors in FPGAs, as well as the motivation for using commercial, off-the-shelf (COTS) FPGAs in mission-critical and remote applications, such as aerospace. The authors describe the effects of radiation in FPGAs, present a large set of soft-error mitigation techniques that can be applied in these circuits, as well as methods for qualifying these circuits under radiation. Coverage includes radiation effects in FPGAs, fault-tolerant techniques for FPGAs, use of COTS FPGAs in aerospace applications, experimental data of FPGAs under radiation, FPGA embedded processors under radiation and fault injection in FPGAs. Since dedicated parallel processing architectures such as GPUs have become more desirable in aerospace applications due to high computational power, GPU analysis under radiation is also discussed.

Radiation Tolerant Electronics

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Publisher : MDPI
ISBN 13 : 3039212796
Total Pages : 210 pages
Book Rating : 4.0/5 (392 download)

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Book Synopsis Radiation Tolerant Electronics by : Paul Leroux

Download or read book Radiation Tolerant Electronics written by Paul Leroux and published by MDPI. This book was released on 2019-08-26 with total page 210 pages. Available in PDF, EPUB and Kindle. Book excerpt: Research on radiation-tolerant electronics has increased rapidly over the past few years, resulting in many interesting approaches to modeling radiation effects and designing radiation-hardened integrated circuits and embedded systems. This research is strongly driven by the growing need for radiation-hardened electronics for space applications, high-energy physics experiments such as those on the Large Hadron Collider at CERN, and many terrestrial nuclear applications including nuclear energy and nuclear safety. With the progressive scaling of integrated circuit technologies and the growing complexity of electronic systems, their susceptibility to ionizing radiation has raised many exciting challenges, which are expected to drive research in the coming decade. In this book we highlight recent breakthroughs in the study of radiation effects in advanced semiconductor devices, as well as in high-performance analog, mixed signal, RF, and digital integrated circuits. We also focus on advances in embedded radiation hardening in both FPGA and microcontroller systems and apply radiation-hardened embedded systems for cryptography and image processing, targeting space applications.

Testing at the Speed of Light

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Publisher : National Academies Press
ISBN 13 : 030947079X
Total Pages : 89 pages
Book Rating : 4.3/5 (94 download)

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Book Synopsis Testing at the Speed of Light by : National Academies of Sciences, Engineering, and Medicine

Download or read book Testing at the Speed of Light written by National Academies of Sciences, Engineering, and Medicine and published by National Academies Press. This book was released on 2018-07-08 with total page 89 pages. Available in PDF, EPUB and Kindle. Book excerpt: Spacecraft depend on electronic components that must perform reliably over missions measured in years and decades. Space radiation is a primary source of degradation, reliability issues, and potentially failure for these electronic components. Although simulation and modeling are valuable for understanding the radiation risk to microelectronics, there is no substitute for testing, and an increased use of commercial-off-the- shelf parts in spacecraft may actually increase requirements for testing, as opposed to simulation and modeling. Testing at the Speed of Light evaluates the nation's current capabilities and future needs for testing the effects of space radiation on microelectronics to ensure mission success and makes recommendations on how to provide effective stewardship of the necessary radiation test infrastructure for the foreseeable future.

Energy Efficient Computing & Electronics

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Publisher : CRC Press
ISBN 13 : 1351779850
Total Pages : 437 pages
Book Rating : 4.3/5 (517 download)

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Book Synopsis Energy Efficient Computing & Electronics by : Santosh K. Kurinec

Download or read book Energy Efficient Computing & Electronics written by Santosh K. Kurinec and published by CRC Press. This book was released on 2019-01-31 with total page 437 pages. Available in PDF, EPUB and Kindle. Book excerpt: In our abundant computing infrastructure, performance improvements across most all application spaces are now severely limited by the energy dissipation involved in processing, storing, and moving data. The exponential increase in the volume of data to be handled by our computational infrastructure is driven in large part by unstructured data from countless sources. This book explores revolutionary device concepts, associated circuits, and architectures that will greatly extend the practical engineering limits of energy-efficient computation from device to circuit to system level. With chapters written by international experts in their corresponding field, the text investigates new approaches to lower energy requirements in computing. Features • Has a comprehensive coverage of various technologies • Written by international experts in their corresponding field • Covers revolutionary concepts at the device, circuit, and system levels

Advances in Automation, Signal Processing, Instrumentation, and Control

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Publisher : Springer Nature
ISBN 13 : 9811582211
Total Pages : 3212 pages
Book Rating : 4.8/5 (115 download)

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Book Synopsis Advances in Automation, Signal Processing, Instrumentation, and Control by : Venkata Lakshmi Narayana Komanapalli

Download or read book Advances in Automation, Signal Processing, Instrumentation, and Control written by Venkata Lakshmi Narayana Komanapalli and published by Springer Nature. This book was released on 2021-03-04 with total page 3212 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents the select proceedings of the International Conference on Automation, Signal Processing, Instrumentation and Control (i-CASIC) 2020. The book mainly focuses on emerging technologies in electrical systems, IoT-based instrumentation, advanced industrial automation, and advanced image and signal processing. It also includes studies on the analysis, design and implementation of instrumentation systems, and high-accuracy and energy-efficient controllers. The contents of this book will be useful for beginners, researchers as well as professionals interested in instrumentation and control, and other allied fields.

Resilient Computer System Design

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Publisher : Springer
ISBN 13 : 3319150693
Total Pages : 271 pages
Book Rating : 4.3/5 (191 download)

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Book Synopsis Resilient Computer System Design by : Victor Castano

Download or read book Resilient Computer System Design written by Victor Castano and published by Springer. This book was released on 2015-04-15 with total page 271 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents a paradigm for designing new generation resilient and evolving computer systems, including their key concepts, elements of supportive theory, methods of analysis and synthesis of ICT with new properties of evolving functioning, as well as implementation schemes and their prototyping. The book explains why new ICT applications require a complete redesign of computer systems to address challenges of extreme reliability, high performance, and power efficiency. The authors present a comprehensive treatment for designing the next generation of computers, especially addressing safety critical, autonomous, real time, military, banking, and wearable health care systems.

Physical Model and Applications of High-Efficiency Electro-Optical Conversion Devices - Volume II

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Publisher : Frontiers Media SA
ISBN 13 : 2832519679
Total Pages : 97 pages
Book Rating : 4.8/5 (325 download)

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Book Synopsis Physical Model and Applications of High-Efficiency Electro-Optical Conversion Devices - Volume II by : Feng Chi

Download or read book Physical Model and Applications of High-Efficiency Electro-Optical Conversion Devices - Volume II written by Feng Chi and published by Frontiers Media SA. This book was released on 2023-03-31 with total page 97 pages. Available in PDF, EPUB and Kindle. Book excerpt:

VLSI

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Publisher : CRC Press
ISBN 13 : 1351831437
Total Pages : 490 pages
Book Rating : 4.3/5 (518 download)

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Book Synopsis VLSI by : Tomasz Wojcicki

Download or read book VLSI written by Tomasz Wojcicki and published by CRC Press. This book was released on 2017-12-19 with total page 490 pages. Available in PDF, EPUB and Kindle. Book excerpt: Recently the world celebrated the 60th anniversary of the invention of the first transistor. The first integrated circuit (IC) was built a decade later, with the first microprocessor designed in the early 1970s. Today, ICs are a part of nearly every aspect of our daily lives. They help us live longer and more comfortably, and do more, faster. All this is possible because of the relentless search for new materials, circuit designs, and ideas happening on a daily basis at industrial and academic institutions around the globe. Showcasing the latest advances in very-large-scale integrated (VLSI) circuits, VLSI: Circuits for Emerging Applications provides a balanced view of industrial and academic developments beyond silicon and complementary metal–oxide–semiconductor (CMOS) technology. From quantum-dot cellular automata (QCA) to chips for cochlear implants, this must-have resource: Investigates the trend of combining multiple cores in a single chip to boost performance of the overall system Describes a novel approach to enable physically unclonable functions (PUFs) using intrinsic features of a VLSI chip Examines the VLSI implementations of major symmetric and asymmetric key cryptographic algorithms, hash functions, and digital signatures Discusses nonvolatile memories such as resistive random-access memory (Re-RAM), magneto-resistive RAM (MRAM), and floating-body RAM (FB-RAM) Explores organic transistors, soft errors, photonics, nanoelectromechanical (NEM) relays, reversible computation, bioinformatics, asynchronous logic, and more VLSI: Circuits for Emerging Applications presents cutting-edge research, design architectures, materials, and uses for VLSI circuits, offering valuable insight into the current state of the art of micro- and nanoelectronics.

ISTFA 2017: Proceedings from the 43rd International Symposium for Testing and Failure Analysis

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Author :
Publisher : ASM International
ISBN 13 : 1627081518
Total Pages : 666 pages
Book Rating : 4.6/5 (27 download)

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Book Synopsis ISTFA 2017: Proceedings from the 43rd International Symposium for Testing and Failure Analysis by : ASM International

Download or read book ISTFA 2017: Proceedings from the 43rd International Symposium for Testing and Failure Analysis written by ASM International and published by ASM International. This book was released on 2017-12-01 with total page 666 pages. Available in PDF, EPUB and Kindle. Book excerpt: The theme for the November 2017 conference was Striving for 100% Success Rate. Papers focus on the tools and techniques needed for maximizing the success rate in every aspect of the electronic device failure analysis process.