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Author : Elias Vlieg
Publisher :
ISBN 13 :
Total Pages : 141 pages
Book Rating : 4.:/5 (246 download)
Download or read book X-ray scattering from semiconductor surfaces and interfaces written by Elias Vlieg and published by . This book was released on 1988 with total page 141 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Elias Vlieg
Publisher :
ISBN 13 :
Total Pages : 141 pages
Book Rating : 4.:/5 (758 download)
Download or read book X-Ray Scattering from Semiconductor Surfaces and Interfaces written by Elias Vlieg and published by . This book was released on 1961 with total page 141 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Paul F Fewster
Publisher : World Scientific
ISBN 13 : 178326098X
Total Pages : 315 pages
Book Rating : 4.7/5 (832 download)
Download or read book X-ray Scattering From Semiconductors (2nd Edition) written by Paul F Fewster and published by World Scientific. This book was released on 2003-07-07 with total page 315 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents a practical guide to the analysis of materials and includes a thorough description of the underlying theories and instrumental aberrations caused by real experiments. The main emphasis concerns the analysis of thin films and multilayers, primarily semiconductors, although the techniques are very general. Semiconductors can be very perfect composite crystals and therefore their study can lead to the largest volume of information, since X-ray scattering can assess the deviation from perfection.The description is intentionally conceptual so that the reader can grasp the real processes involved. In this way the analysis becomes significantly easier, making the reader aware of misleading artifacts and assisting in the determination of a more complete and reliable analysis. The theory of scattering is very important and is covered in such a way that the assumptions are clear. Greatest emphasis is placed on the dynamical diffraction theory including new developments extending its applicability to reciprocal space mapping and modelling samples with relaxed and distorted interfaces.A practical guide to the measurement of diffraction patterns, including the smearing effects introduced to the measurement, is also presented.
Author : Winfried Mönch
Publisher : Springer Science & Business Media
ISBN 13 : 3662031345
Total Pages : 455 pages
Book Rating : 4.6/5 (62 download)
Download or read book Semiconductor Surfaces and Interfaces written by Winfried Mönch and published by Springer Science & Business Media. This book was released on 2013-04-17 with total page 455 pages. Available in PDF, EPUB and Kindle. Book excerpt: Semiconductor Surfaces and Interfaces deals with structural and electronic properties of semiconductor surfaces and interfaces. The first part introduces the general aspects of space-charge layers, of clean-surface and adatom-included surfaces states, and of interface states. It is followed by a presentation of experimental results on clean and adatom-covered surfaces which are explained in terms of simple physical and chemical concepts and models. Where available, results of more refined calculations are considered. A final chapter is devoted to the band lineup at semiconductor interfaces.
Author : Peter S. Pershan
Publisher : Cambridge University Press
ISBN 13 : 0521814014
Total Pages : 335 pages
Book Rating : 4.5/5 (218 download)
Download or read book Liquid Surfaces and Interfaces written by Peter S. Pershan and published by Cambridge University Press. This book was released on 2012-08-02 with total page 335 pages. Available in PDF, EPUB and Kindle. Book excerpt: A practical guide for graduate students and researchers on all aspects of x-ray scattering experiments on liquid surfaces and interfaces.
Author : Paul F Fewster
Publisher : World Scientific
ISBN 13 : 1783262079
Total Pages : 303 pages
Book Rating : 4.7/5 (832 download)
Download or read book X-ray Scattering From Semiconductors written by Paul F Fewster and published by World Scientific. This book was released on 2000-10-27 with total page 303 pages. Available in PDF, EPUB and Kindle. Book excerpt: X-ray scattering is used extensively to provide detailed structural information about materials. Semiconductors have benefited from X-ray scattering techniques as an essential feedback method for crystal growth, including compositional and thickness determination of thin layers. The methods have been developed to reveal very detailed structural information concerning material quality, interface structure, relaxation, defects, surface damage, etc.This book provides a thorough description of the techniques involved in obtaining that information, including X-ray diffractometers and their associated instrument functions, data collection methods, and the simulation of the diffraction patterns observed. Also presented are examples and procedures for interpreting the data to build a picture of the sample, much of which will be common to materials other than semiconductors./a
Author : Guy LeLay
Publisher : Springer Science & Business Media
ISBN 13 : 3642729673
Total Pages : 399 pages
Book Rating : 4.6/5 (427 download)
Download or read book Semiconductor Interfaces: Formation and Properties written by Guy LeLay and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 399 pages. Available in PDF, EPUB and Kindle. Book excerpt: The trend towards miniaturisation of microelectronic devices and the search for exotic new optoelectronic devices based on multilayers confer a crucial role on semiconductor interfaces. Great advances have recently been achieved in the elaboration of new thin film materials and in the characterization of their interfacial properties, down to the atomic scale, thanks to the development of sophisticated new techniques. This book is a collection of lectures that were given at the International Winter School on Semiconductor Interfaces: Formation and Properties held at the Centre de Physique des Rouches from 24 February to 6 March, 1987. The aim of this Winter School was to present a comprehensive review of this field, in particular of the materials and methods, and to formulate recom mendations for future research. The following topics are treated: (i) Interface formation. The key aspects of molecular beam epitaxy are emphasized, as well as the fabrication of artificially layered structures, strained layer superlattices and the tailoring of abrupt doping profiles. (ii) Fine characterization down to the atomic scale using recently devel oped, powerful techniques such as scanning tunneling microscopy, high reso lution transmission electron microscopy, glancing incidence x-ray diffraction, x-ray standing waves, surface extended x-ray absorption fine structure and surface extended energy-loss fine structure. (iii) Specific physical properties of the interfaces and their prospective applications in devices. We wish to thank warmly all the lecturers and participants, as well as the organizing committee, who made this Winter School a success.
Author : Bhupendra N Dev
Publisher : World Scientific
ISBN 13 : 9814485217
Total Pages : 199 pages
Book Rating : 4.8/5 (144 download)
Download or read book Physics At Surfaces And Interfaces, Proceedings Of The International Conference written by Bhupendra N Dev and published by World Scientific. This book was released on 2003-08-05 with total page 199 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book contains articles in several areas involving a dominant role of surfaces and interfaces. It is divided into four sections. The first section deals with theoretical and experimental aspects of the structure and morphology of clean surfaces and adsorbed layers on surfaces. The next section concerns growth on surfaces leading to semiconductor devices with quantum well, quantum wire and quantum dot structures; also deals with spin transport in 2DEG. Section 3 is on layered synthetic microstructures (LSMs). Analysis of interface roughness and layer composition of LSMs by X-ray techniques, fabrication of hard X-ray telescopes with LSMs, and diffusion across interfaces of LSMs are discussed here. The last section contains articles dealing with semiconductor surfaces exposed to ion beams and ion-irradiated semiconductor multilayers.
Author : G.J. Davies
Publisher : Springer
ISBN 13 :
Total Pages : 184 pages
Book Rating : 4.3/5 (91 download)
Download or read book Semiconductor Growth, Surfaces and Interfaces written by G.J. Davies and published by Springer. This book was released on 1994-03-31 with total page 184 pages. Available in PDF, EPUB and Kindle. Book excerpt: Several diverse but related topics concerned with semiconductor growth are brought together here, for the first time in a single text. Those studying semiconductor growth from any perspective will find this book invaluable and it will be essential reading for all in the semiconductor industry, whether in applications or in manufacturing.
Author :
Publisher :
ISBN 13 :
Total Pages : 9 pages
Book Rating : 4.:/5 (727 download)
Download or read book X-ray Studies of Microstructures in Semiconductor and Superconducting Materials . Performance Report written by and published by . This book was released on 1993 with total page 9 pages. Available in PDF, EPUB and Kindle. Book excerpt: A summary of research work performed from 11/1/86 to 4/10/93 is presented. Synchrotron x rays were used to probe the short-range-order (SRO) structures in these materials, especially layered semiconductors and high-{Tc} oxide superconductors. X-ray absorption fine structure spectroscopy, grazing incidence x-ray scattering and fluorescence, and total electron yield as probe for surfaces and interfaces were used. A new soft x-ray detector was developed.
Author : Paul F. Fewster
Publisher : World Scientific
ISBN 13 : 9814436933
Total Pages : 510 pages
Book Rating : 4.8/5 (144 download)
Download or read book X-Ray Scattering from Semiconductors and Other Materials written by Paul F. Fewster and published by World Scientific. This book was released on 2015 with total page 510 pages. Available in PDF, EPUB and Kindle. Book excerpt: This third edition has been extended considerably to incorporate more information on instrument influences on the interpretation of X-ray scattering profiles and reciprocal space maps. Another significant inclusion is on the scattering from powder samples, covering a new theoretical approach that explains features that conventional theory cannot. The new edition includes some of the latest methodologies and theoretical treatments, including the latest thinking on dynamical theory and diffuse scattering. Recent advances in detectors also present new opportunities for rapid data collection and some very different approaches in data collection techniques; the possibilities associated with these advances will be included. This edition should be of interest to those who use X-ray scattering to understand more about their samples, so that they can make a better judgment of the parameter and confidence levels in their analyses, and how the combination of instrument, sample and detection should be considered as a whole to ensure this.
Author : Zhe Chuan Feng
Publisher : CRC Press
ISBN 13 : 9780750301800
Total Pages : 318 pages
Book Rating : 4.3/5 (18 download)
Download or read book Semiconductor Interfaces, Microstructures and Devices written by Zhe Chuan Feng and published by CRC Press. This book was released on 1993-01-01 with total page 318 pages. Available in PDF, EPUB and Kindle. Book excerpt: A semiconductor interface is the contact between the semiconductor itself and a metal. The interface is a site of change, and it is imperative to ensure that the semiconducting material is sealed at this point to maintain its reliability. This book examines various aspects of interfaces, showing how they can affect microstructures and devices such as infrared photodetectors (as used in nightsights) and blue diode lasers. It presents various techniques for examining different types of semiconductor material and suggests future potential commercial applications for different semiconductor devices. Written by experts in their fields and focusing on metallic semiconductors (Cadmium Telluride and related compounds), this comprehensive overview of recent developments is an essential reference for those working in the semiconductor industry and provides a concise and comprehensive introduction to those new to the field.
Author : Ullrich Pietsch
Publisher : Springer Science & Business Media
ISBN 13 : 9780387400921
Total Pages : 432 pages
Book Rating : 4.4/5 (9 download)
Download or read book High-Resolution X-Ray Scattering written by Ullrich Pietsch and published by Springer Science & Business Media. This book was released on 2004-08-27 with total page 432 pages. Available in PDF, EPUB and Kindle. Book excerpt: During the last 20 years interest in high-resolution x-ray diffractometry and reflectivity has grown as a result of the development of the semiconductor industry and the increasing interest in material research of thin layers of magnetic, organic, and other materials. For example, optoelectronics requires a subsequent epitaxy of thin layers of different semiconductor materials. Here, the individuallayer thicknesses are scaled down to a few atomic layers in order to exploit quantum effects. For reasons of electronic and optical confinement, these thin layers are embedded within much thicker cladding layers or stacks of multilayers of slightly different chemical composition. It is evident that the interface quality of those quantum weHs is quite important for the function of devices. Thin metallic layers often show magnetic properties which do not ap pear for thick layers or in bulk material. The investigation of the mutual interaction of magnetic and non-magnetic layers leads to the discovery of colossal magnetoresistance, for example. This property is strongly related to the thickness and interface roughness of covered layers.
Author : Brian Ray McClain
Publisher :
ISBN 13 :
Total Pages : 276 pages
Book Rating : 4.:/5 (285 download)
Download or read book X-ray Scattering from Liquid Free Surfaces and Interfaces written by Brian Ray McClain and published by . This book was released on 1993 with total page 276 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Paul F. Fewster
Publisher : Imperial College Pr
ISBN 13 : 9781860943607
Total Pages : 299 pages
Book Rating : 4.9/5 (436 download)
Download or read book X-Ray Scattering from Semiconductors (2n written by Paul F. Fewster and published by Imperial College Pr. This book was released on 2003 with total page 299 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents a practical guide to the analysis of materials and includes a thorough description of the underlying theories and instrumental aberrations caused by real experiments. The main emphasis concerns the analysis of thin films and multilayers, primarily semiconductors, although the techniques are very general. Semiconductors can be very perfect composite crystals and therefore their study can lead to the largest volume of information, since X-ray scattering can assess the deviation from perfection.The description is intentionally conceptual so that the reader can grasp the real processes involved. In this way the analysis becomes significantly easier, making the reader aware of misleading artifacts and assisting in the determination of a more complete and reliable analysis. The theory of scattering is very important and is covered in such a way that the assumptions are clear. Greatest emphasis is placed on the dynamical diffraction theory including new developments extending its applicability to reciprocal space mapping and modelling samples with relaxed and distorted interfaces.A practical guide to the measurement of diffraction patterns, including the smearing effects introduced to the measurement, is also presented.
Author :
Publisher :
ISBN 13 :
Total Pages : 4 pages
Book Rating : 4.:/5 (727 download)
Download or read book Specular and Diffuse X-ray Scattering from Surfaces and Interfaces written by and published by . This book was released on 1991 with total page 4 pages. Available in PDF, EPUB and Kindle. Book excerpt: X-ray and neutron scattering studies of surfaces and interfaces have become increasingly popular over that last few year due to the recent developments in both scattering techniques and high intensity sources, particularly synchrotron x-ray sources. Although detailed characterization of any interface requires understanding of scattering both at small angles and in the (wide angle) Bragg reflection regime, as shall restrict ourselves here to discussing only the small angle region. Despite fundamental differences in the basic interactions between x-rays (or neutrons) with atoms, most of the analysis of our x-ray scattering results presented here can be used for neutron studies, with minor modifications. Although it should be mentioned here that current synchrotron x-ray sources are several orders of magnitude more intense than neutron sources and as a result for relatively smooth solid surface specular reflectivity can be measured down to 10−9 with x-rays where as for neutrons this value is (approximately) 10−6 before the measured intensity is buried with diffuse scattering and other background. As we shall discuss, this reduces the resolution with which one can determine density profile at an interface. The plan of this talk is as follows. After giving a brief outline of this method, we shall discuss out results on liquid surfaces first, and then we shall analyze specular and diffuse scattering data of multilayer interfaces. Finally we demonstrate a new method of anomalous reflectivity to determine electron density profiles of thin films in a model independent way.
Author : Mirang Yoon
Publisher :
ISBN 13 :
Total Pages : 118 pages
Book Rating : 4.:/5 (39 download)
Download or read book X-ray Scattering Studies of Self-organized Nanoscale-structures on Semiconductor Surfaces written by Mirang Yoon and published by . This book was released on 1998 with total page 118 pages. Available in PDF, EPUB and Kindle. Book excerpt:
