X Ray Optics And Microanalysis

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X-Ray Optics and Microanalysis 1992, Proceedings of the 13th INT Conference, 31 August-4 September 1992, Manchester, UK

Author : P.B. Kenway
Publisher : CRC Press
ISBN 13 : 9780750302555
Total Pages : 690 pages
Book Rating : 4.3/5 (25 download)

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Book Synopsis X-Ray Optics and Microanalysis 1992, Proceedings of the 13th INT Conference, 31 August-4 September 1992, Manchester, UK by : P.B. Kenway

Download or read book X-Ray Optics and Microanalysis 1992, Proceedings of the 13th INT Conference, 31 August-4 September 1992, Manchester, UK written by P.B. Kenway and published by CRC Press. This book was released on 1993-03-01 with total page 690 pages. Available in PDF, EPUB and Kindle. Book excerpt: The first ICXOM congress held in Cambridge was the brain-child of Dr. Ellis Cosslett, founder of the Electron Optics Section of the Cavendish Laboratory. Dr. Cosslett pioneered research in x-ray optics and microanalysis and retained a close interest in all subject applications for this area of research, including physics, materials science, chemistry, and biology. X-Ray Optics and Microanalysis 1992 was held in his memory. At a special symposium, friends and colleagues reviewed the present status of research in x-ray optics and microanalysis. S.J. Pennycook of Oak Ridge National Laboratory, D.B. Williams of Lehigh University, J.A. Venables et al. of Arizona State University and Sussex University, and C. Jacobsen et al. of SUNY, Stony Brook are among the researchers whose papers are included in this volume.

Scanning Electron Microscopy and X-Ray Microanalysis

Author : Joseph Goldstein
Publisher : Springer Science & Business Media
ISBN 13 : 1461332737
Total Pages : 679 pages
Book Rating : 4.4/5 (613 download)

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Book Synopsis Scanning Electron Microscopy and X-Ray Microanalysis by : Joseph Goldstein

Download or read book Scanning Electron Microscopy and X-Ray Microanalysis written by Joseph Goldstein and published by Springer Science & Business Media. This book was released on 2013-11-11 with total page 679 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book has evolved by processes of selection and expansion from its predecessor, Practical Scanning Electron Microscopy (PSEM), published by Plenum Press in 1975. The interaction of the authors with students at the Short Course on Scanning Electron Microscopy and X-Ray Microanalysis held annually at Lehigh University has helped greatly in developing this textbook. The material has been chosen to provide a student with a general introduction to the techniques of scanning electron microscopy and x-ray microanalysis suitable for application in such fields as biology, geology, solid state physics, and materials science. Following the format of PSEM, this book gives the student a basic knowledge of (1) the user-controlled functions of the electron optics of the scanning electron microscope and electron microprobe, (2) the characteristics of electron-beam-sample inter actions, (3) image formation and interpretation, (4) x-ray spectrometry, and (5) quantitative x-ray microanalysis. Each of these topics has been updated and in most cases expanded over the material presented in PSEM in order to give the reader sufficient coverage to understand these topics and apply the information in the laboratory. Throughout the text, we have attempted to emphasize practical aspects of the techniques, describing those instru ment parameters which the microscopist can and must manipulate to obtain optimum information from the specimen. Certain areas in particular have been expanded in response to their increasing importance in the SEM field. Thus energy-dispersive x-ray spectrometry, which has undergone a tremendous surge in growth, is treated in substantial detail.

X-Ray Microscopy

Author : Chris Jacobsen
Publisher : Cambridge University Press
ISBN 13 : 1107076579
Total Pages : 594 pages
Book Rating : 4.1/5 (7 download)

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Book Synopsis X-Ray Microscopy by : Chris Jacobsen

Download or read book X-Ray Microscopy written by Chris Jacobsen and published by Cambridge University Press. This book was released on 2019-12-19 with total page 594 pages. Available in PDF, EPUB and Kindle. Book excerpt: A complete introduction to x-ray microscopy, covering optics, 3D and chemical imaging, lensless imaging, radiation damage, and applications.

X-Ray Optics and X-Ray Microanalysis

Author : H. H. Pattee
Publisher : Elsevier
ISBN 13 : 1483277038
Total Pages : 641 pages
Book Rating : 4.4/5 (832 download)

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Book Synopsis X-Ray Optics and X-Ray Microanalysis by : H. H. Pattee

Download or read book X-Ray Optics and X-Ray Microanalysis written by H. H. Pattee and published by Elsevier. This book was released on 2013-10-22 with total page 641 pages. Available in PDF, EPUB and Kindle. Book excerpt: X-ray Optics and X-ray Microanalysis covers the proceedings of the Symposium on X-ray Optics and X-ray Microanalysis, held at Stanford University on August 22-24, 1962. The book focuses on X-ray microscopy, microradiography, radiation and irradiation, and X-ray microanalysis. The selection first offers information on the methods of X-ray microscopy and X-ray absorption microanalysis. Discussions focus on X-ray scanning microscopy, contact microradiography, point projection microscopy, and total dry-weight determinations. The text then takes a look at X-ray microanalysis in biology and medicine; electron microscopic enlargements of X-ray absorption micrographs; and automation in microradiography. The publication examines the production of Fresnel zone plates for extreme ultraviolet and soft X radiation; quantitative microradiographic studies of human epidermis; and irradiation effect on total organic nerve-cell material determined by integrating X-ray absorption. The manuscript then reviews the calculation of fluorescence excited by characteristic radiation in the X-ray microanalyzer and the method for calculating the absorption correction in electron-probe microanalysis. The selection is a valuable reference for readers interested in X-ray technology.

Electron Probe Microanalysis

Author : A. J. Tousimis
Publisher :
ISBN 13 :
Total Pages : 472 pages
Book Rating : 4.X/5 (1 download)

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Book Synopsis Electron Probe Microanalysis by : A. J. Tousimis

Download or read book Electron Probe Microanalysis written by A. J. Tousimis and published by . This book was released on 1969 with total page 472 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Advanced Scanning Electron Microscopy and X-Ray Microanalysis

Author : Patrick Echlin
Publisher : Springer Science & Business Media
ISBN 13 : 1475790279
Total Pages : 463 pages
Book Rating : 4.4/5 (757 download)

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Book Synopsis Advanced Scanning Electron Microscopy and X-Ray Microanalysis by : Patrick Echlin

Download or read book Advanced Scanning Electron Microscopy and X-Ray Microanalysis written by Patrick Echlin and published by Springer Science & Business Media. This book was released on 2013-06-29 with total page 463 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book has its origins in the intensive short courses on scanning elec tron microscopy and x-ray microanalysis which have been taught annually at Lehigh University since 1972. In order to provide a textbook containing the materials presented in the original course, the lecturers collaborated to write the book Practical Scanning Electron Microscopy (PSEM), which was published by Plenum Press in 1975. The course con tinued to evolve and expand in the ensuing years, until the volume of material to be covered necessitated the development of separate intro ductory and advanced courses. In 1981 the lecturers undertook the project of rewriting the original textbook, producing the volume Scan ning Electron Microscopy and X-Ray Microanalysis (SEMXM). This vol ume contained substantial expansions of the treatment of such basic material as electron optics, image formation, energy-dispersive x-ray spectrometry, and qualitative and quantitative analysis. At the same time, a number of chapters, which had been included in the PSEM vol ume, including those on magnetic contrast and electron channeling con trast, had to be dropped for reasons of space. Moreover, these topics had naturally evolved into the basis of the advanced course. In addition, the evolution of the SEM and microanalysis fields had resulted in the devel opment of new topics, such as digital image processing, which by their nature became topics in the advanced course.

X-Ray Optics and Microanalysis 1992, Proceedings of the 13th INT Conference, 31 August-4 September 1992, Manchester, UK

Author : P.B. Kenway
Publisher : CRC Press
ISBN 13 : 1000112276
Total Pages : 679 pages
Book Rating : 4.0/5 (1 download)

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Book Synopsis X-Ray Optics and Microanalysis 1992, Proceedings of the 13th INT Conference, 31 August-4 September 1992, Manchester, UK by : P.B. Kenway

Download or read book X-Ray Optics and Microanalysis 1992, Proceedings of the 13th INT Conference, 31 August-4 September 1992, Manchester, UK written by P.B. Kenway and published by CRC Press. This book was released on 2020-10-07 with total page 679 pages. Available in PDF, EPUB and Kindle. Book excerpt: The first ICXOM congress held in Cambridge was the brain-child of Dr. Ellis Cosslett, founder of the Electron Optics Section of the Cavendish Laboratory. Dr. Cosslett pioneered research in x-ray optics and microanalysis and retained a close interest in all subject applications for this area of research, including physics, materials science, chemistry, and biology. X-Ray Optics and Microanalysis 1992 was held in his memory. At a special symposium, friends and colleagues reviewed the present status of research in x-ray optics and microanalysis. S.J. Pennycook of Oak Ridge National Laboratory, D.B. Williams of Lehigh University, J.A. Venables et al. of Arizona State University and Sussex University, and C. Jacobsen et al. of SUNY, Stony Brook are among the researchers whose papers are included in this volume.

Vth International Congress on X-Ray Optics and Microanalysis / V. Internationaler Kongreß für Röntgenoptik und Mikroanalyse / Ve Congrès International sur l’Optique des Rayons X et la Microanalyse

Download Vth International Congress on X-Ray Optics and Microanalysis / V. Internationaler Kongreß für Röntgenoptik und Mikroanalyse / Ve Congrès International sur l’Optique des Rayons X et la Microanalyse PDF Online Free

Author : Gottfried Möllenstedt
Publisher : Springer Science & Business Media
ISBN 13 : 3662121085
Total Pages : 624 pages
Book Rating : 4.6/5 (621 download)

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Book Synopsis Vth International Congress on X-Ray Optics and Microanalysis / V. Internationaler Kongreß für Röntgenoptik und Mikroanalyse / Ve Congrès International sur l’Optique des Rayons X et la Microanalyse by : Gottfried Möllenstedt

Download or read book Vth International Congress on X-Ray Optics and Microanalysis / V. Internationaler Kongreß für Röntgenoptik und Mikroanalyse / Ve Congrès International sur l’Optique des Rayons X et la Microanalyse written by Gottfried Möllenstedt and published by Springer Science & Business Media. This book was released on 2013-06-29 with total page 624 pages. Available in PDF, EPUB and Kindle. Book excerpt: The Fifth International Congress on X-Ray Optics and Microanalysis was organized by the Institute of Applied Physics at Tübingen University in Western Germany from September 9th through 14th, 1968. Since 1956, when the First Conference was arranged in Cambridge, England by one of the pioneers in this field, V. E. CossLETT, the experts in the fields of X-Ray Optics and Microanalysis have met every third year to exchange their scientific experiences. Later meetings were held at Uppsala, Sweden in 1959, at Stanford, California in 1962, and at Orsay, Francein 1965. The participants in the 1968 Conference came from the following countries: Germany 140, France 60, Great Britain 55, USA 20, Netherlands 16, Switzerland 12, Austria 9, Sweden 7, Belgium 6, Japan 5, Italy 4, two each from Israel, Yugoslavia, Canada, Norway, Hungary and one each from Argentine, Poland, South Africa. As at the latest congress in Paris the following central topics were treated: General problems of X-ray optics, physical bases of electron beam microanalysis, quantitative problems of X-ray microanalysis, instrumentation, microdiffraction, applications to metal lurgy, mineralogy, and biology. An exhibition showing some of the most modern instruments formed an important part of the conference. The Springer-Verlag, Heidelberg, deserves thanks for the careful and speedy work they have performed in printing these conference proceedings. We are further indebted to all contributors of this volume for their kind cooperation. Tübingen, August 1969 G. MöLLENSTEDT and K. H.

X-Ray Optics and Microanalysis

Author : Melissa A. Denecke
Publisher : American Institute of Physics
ISBN 13 : 9780735407640
Total Pages : 0 pages
Book Rating : 4.4/5 (76 download)

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Book Synopsis X-Ray Optics and Microanalysis by : Melissa A. Denecke

Download or read book X-Ray Optics and Microanalysis written by Melissa A. Denecke and published by American Institute of Physics. This book was released on 2010-05-12 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: ICXOM Series is a platform dedicated for reporting progress in fundamental and applied research in x-ray optics and micro- and nano-analysis by means of x-ray beams (with an ICXOM20 emphasis on synchrotron sources), electrons or other energetic particles, including application examples, as well as methodological and instrumental developments.

Energy Dispersive X-ray Analysis in the Electron Microscope

Author : DC Bell
Publisher : Garland Science
ISBN 13 : 1135331391
Total Pages : 270 pages
Book Rating : 4.1/5 (353 download)

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Book Synopsis Energy Dispersive X-ray Analysis in the Electron Microscope by : DC Bell

Download or read book Energy Dispersive X-ray Analysis in the Electron Microscope written by DC Bell and published by Garland Science. This book was released on 2003-07-10 with total page 270 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides an in-depth description of x-ray microanalysis in the electron microscope. It is sufficiently detailed to ensure that novices will understand the nuances of high-quality EDX analysis. Includes information about hardware design as well as the physics of x-ray generation, absorption and detection, and most post-detection data processing. Details on electron optics and electron probe formation allow the novice to make sensible adjustments to the electron microscope in order to set up a system which optimises analysis. It also helps the reader determine which microanalytical method is more suitable for their planned application.

Electron Probe Quantitation

Author : K.F.J. Heinrich
Publisher : Springer Science & Business Media
ISBN 13 : 1489926178
Total Pages : 397 pages
Book Rating : 4.4/5 (899 download)

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Book Synopsis Electron Probe Quantitation by : K.F.J. Heinrich

Download or read book Electron Probe Quantitation written by K.F.J. Heinrich and published by Springer Science & Business Media. This book was released on 2013-06-29 with total page 397 pages. Available in PDF, EPUB and Kindle. Book excerpt: In 1968, the National Bureau of Standards (NBS) published Special Publication 298 "Quantitative Electron Probe Microanalysis," which contained proceedings of a seminar held on the subject at NBS in the summer of 1967. This publication received wide interest that continued through the years far beyond expectations. The present volume, also the result of a gathering of international experts, in 1988, at NBS (now the National Institute of Standards and Technology, NIST), is intended to fulfill the same purpose. After years of substantial agreement on the procedures of analysis and data evaluation, several sharply differentiated approaches have developed. These are described in this publi cation with all the details required for practical application. Neither the editors nor NIST wish to endorse any single approach. Rather, we hope that their exposition will stimulate the dialogue which is a prerequisite for technical progress. Additionally, it is expected that those active in research in electron probe microanalysis will appreciate more clearly the areas in which further investigations are warranted.

Scanning Electron Microscopy

Author : Ludwig Reimer
Publisher : Springer
ISBN 13 : 3540389679
Total Pages : 538 pages
Book Rating : 4.5/5 (43 download)

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Book Synopsis Scanning Electron Microscopy by : Ludwig Reimer

Download or read book Scanning Electron Microscopy written by Ludwig Reimer and published by Springer. This book was released on 2013-11-11 with total page 538 pages. Available in PDF, EPUB and Kindle. Book excerpt: Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.

Principles of Analytical Electron Microscopy

Author : Joseph Goldstein
Publisher : Springer Science & Business Media
ISBN 13 : 1489920374
Total Pages : 458 pages
Book Rating : 4.4/5 (899 download)

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Book Synopsis Principles of Analytical Electron Microscopy by : Joseph Goldstein

Download or read book Principles of Analytical Electron Microscopy written by Joseph Goldstein and published by Springer Science & Business Media. This book was released on 2013-11-11 with total page 458 pages. Available in PDF, EPUB and Kindle. Book excerpt: Since the publication in 1979 of Introduction to Analytical Electron Microscopy (ed. J. J. Hren, J. I. Goldstein, and D. C. Joy; Plenum Press), analytical electron microscopy has continued to evolve and mature both as a topic for fundamental scientific investigation and as a tool for inorganic and organic materials characterization. Significant strides have been made in our understanding of image formation, electron diffraction, and beam/specimen interactions, both in terms of the "physics of the processes" and their practical implementation in modern instruments. It is the intent of the editors and authors of the current text, Principles of Analytical Electron Microscopy, to bring together, in one concise and readily accessible volume, these recent advances in the subject. The text begins with a thorough discussion of fundamentals to lay a foundation for today's state-of-the-art microscopy. All currently important areas in analytical electron microscopy-including electron optics, electron beam/specimen interactions, image formation, x-ray microanalysis, energy-loss spectroscopy, electron diffraction and specimen effects-have been given thorough attention. To increase the utility of the volume to a broader cross section of the scientific community, the book's approach is, in general, more descriptive than mathematical. In some areas, however, mathematical concepts are dealt with in depth, increasing the appeal to those seeking a more rigorous treatment of the subject.

Practical Scanning Electron Microscopy

Author : Joseph Goldstein
Publisher : Springer Science & Business Media
ISBN 13 : 1461344220
Total Pages : 598 pages
Book Rating : 4.4/5 (613 download)

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Book Synopsis Practical Scanning Electron Microscopy by : Joseph Goldstein

Download or read book Practical Scanning Electron Microscopy written by Joseph Goldstein and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 598 pages. Available in PDF, EPUB and Kindle. Book excerpt: In the spring of 1963, a well-known research institute made a market survey to assess how many scanning electron microscopes might be sold in the United States. They predicted that three to five might be sold in the first year a commercial SEM was available, and that ten instruments would saturate the marketplace. In 1964, the Cambridge Instruments Stereoscan was introduced into the United States and, in the following decade, over 1200 scanning electron microscopes were sold in the U. S. alone, representing an investment conservatively estimated at $50,000- $100,000 each. Why were the market surveyers wrongil Perhaps because they asked the wrong persons, such as electron microscopists who were using the highly developed transmission electron microscopes of the day, with resolutions from 5-10 A. These scientists could see little application for a microscope that was useful for looking at surfaces with a resolution of only (then) about 200 A. Since that time, many scientists have learned to appreciate that information content in an image may be of more importance than resolution per se. The SEM, with its large depth of field and easily that often require little or no sample prepara interpreted images of samples tion for viewing, is capable of providing significant information about rough samples at magnifications ranging from 50 X to 100,000 X. This range overlaps considerably with the light microscope at the low end, and with the electron microscope at the high end.

X-Ray Optics and X-Ray Microanalysis

Author :
Publisher :
ISBN 13 :
Total Pages : 622 pages
Book Rating : 4.:/5 (63 download)

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Book Synopsis X-Ray Optics and X-Ray Microanalysis by :

Download or read book X-Ray Optics and X-Ray Microanalysis written by and published by . This book was released on 1963 with total page 622 pages. Available in PDF, EPUB and Kindle. Book excerpt:

Science of Microscopy

Author : P.W. Hawkes
Publisher : Springer Science & Business Media
ISBN 13 : 0387497625
Total Pages : 1336 pages
Book Rating : 4.3/5 (874 download)

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Book Synopsis Science of Microscopy by : P.W. Hawkes

Download or read book Science of Microscopy written by P.W. Hawkes and published by Springer Science & Business Media. This book was released on 2008-08-29 with total page 1336 pages. Available in PDF, EPUB and Kindle. Book excerpt: This fully corrected second impression of the classic 2006 text on microscopy runs to more than 1,000 pages and covers up-to-the-minute developments in the field. The two-volume work brings together a slew of experts who present comprehensive reviews of all the latest instruments and new versions of the older ones, as well as their associated operational techniques. The chapters draw attention to their principal areas of application. A huge range of subjects are benefiting from these new tools, including semiconductor physics, medicine, molecular biology, the nanoworld in general, magnetism, and ferroelectricity. This fascinating book will be an indispensable guide for a wide range of scientists in university laboratories as well as engineers and scientists in industrial R&D departments.

Electron Probe Quantitation

Author : K.F.J. Heinrich
Publisher : Springer Science & Business Media
ISBN 13 : 0306438240
Total Pages : 412 pages
Book Rating : 4.3/5 (64 download)

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Book Synopsis Electron Probe Quantitation by : K.F.J. Heinrich

Download or read book Electron Probe Quantitation written by K.F.J. Heinrich and published by Springer Science & Business Media. This book was released on 1991-06-30 with total page 412 pages. Available in PDF, EPUB and Kindle. Book excerpt: In 1968, the National Bureau of Standards (NBS) published Special Publication 298 "Quantitative Electron Probe Microanalysis," which contained proceedings of a seminar held on the subject at NBS in the summer of 1967. This publication received wide interest that continued through the years far beyond expectations. The present volume, also the result of a gathering of international experts, in 1988, at NBS (now the National Institute of Standards and Technology, NIST), is intended to fulfill the same purpose. After years of substantial agreement on the procedures of analysis and data evaluation, several sharply differentiated approaches have developed. These are described in this publi cation with all the details required for practical application. Neither the editors nor NIST wish to endorse any single approach. Rather, we hope that their exposition will stimulate the dialogue which is a prerequisite for technical progress. Additionally, it is expected that those active in research in electron probe microanalysis will appreciate more clearly the areas in which further investigations are warranted.