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Author :
Publisher :
ISBN 13 :
Total Pages : 209 pages
Book Rating : 4.:/5 (935 download)
Download or read book X-ray Diffraction from Soft-matter Thin Films written by and published by . This book was released on 1998 with total page 209 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Metin Tolan
Publisher : Springer
ISBN 13 :
Total Pages : 216 pages
Book Rating : 4.3/5 (121 download)
Download or read book X-Ray Scattering from Soft-Matter Thin Films written by Metin Tolan and published by Springer. This book was released on 1999 with total page 216 pages. Available in PDF, EPUB and Kindle. Book excerpt: The properties of soft-matter thin films (e.g. liquid films, polymer coatings, Langmuir-Blodgett multilayers) nowadays play an important role in materials science.They are also very exciting with respect to fundamental questions: When liquids and polymers form thin films, they may be considered as trapped in a quasi-two-dimensional geometry. This confined geometry is expected to alter the properties and structures of these materials considerably. This volume is dedicated to the scattering of x-rays by soft-matter interfaces. X-ray scattering under grazing angles is the only tool for investigating these materials on atomic and mesoscopic length scales. A review of the field is presented with many examples.
Author : Wim H. de Jeu
Publisher : Oxford University Press
ISBN 13 : 0191044415
Total Pages : 149 pages
Book Rating : 4.1/5 (91 download)
Download or read book Basic X-Ray Scattering for Soft Matter written by Wim H. de Jeu and published by Oxford University Press. This book was released on 2016-04-15 with total page 149 pages. Available in PDF, EPUB and Kindle. Book excerpt: X-ray scattering is a well-established technique in materials science. Several excellent textbooks exist in this field, but these texts are typically written by physicists who use mathematics to make things clear. Consequently these books appeal less to students and scientists in the field of soft matter (polymers, liquid crystals, colloids, self-assembled organic systems) who usually have a more chemical-oriented background with limited mathematics. Moreover, they need to know about the technique of x-ray scattering, but do not intend to become an expert. The aim of this book is to explain basic principles and applications of x-ray scattering in a simple way using many practical examples followed by more elaborate case studies. The book contains a separate chapter on the different types of order/disorder in soft matter that play such an important role in modern self-assembling systems. Finally the last chapter treats soft matter surfaces and thin film that are increasingly used in coatings and in many technological applications, such as liquid crystal displays and nanostructured block copolymer films. This book has been written for the large community of soft matter students and scientists.
Author : Mario Birkholz
Publisher : John Wiley & Sons
ISBN 13 : 3527607048
Total Pages : 378 pages
Book Rating : 4.5/5 (276 download)
Download or read book Thin Film Analysis by X-Ray Scattering written by Mario Birkholz and published by John Wiley & Sons. This book was released on 2006-05-12 with total page 378 pages. Available in PDF, EPUB and Kindle. Book excerpt: With contributions by Paul F. Fewster and Christoph Genzel While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the 21st century are driven by the materials science of thin films. Very much an interdisciplinary field, chemists, biochemists, materials scientists, physicists and engineers all have a common interest in thin films and their manifold uses and applications. Grain size, porosity, density, preferred orientation and other properties are important to know: whether thin films fulfill their intended function depends crucially on their structure and morphology once a chemical composition has been chosen. Although their backgrounds differ greatly, all the involved specialists a profound understanding of how structural properties may be determined in order to perform their respective tasks in search of new and modern materials, coatings and functions. The author undertakes this in-depth introduction to the field of thin film X-ray characterization in a clear and precise manner.
Author : Wilhelmus Hendrikus Jeu
Publisher :
ISBN 13 : 9780191795442
Total Pages : pages
Book Rating : 4.7/5 (954 download)
Download or read book Basic X-ray Scattering for Soft Matter written by Wilhelmus Hendrikus Jeu and published by . This book was released on 2016 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: X-ray scattering is a well-established technique in materials science. The aim of this text is to explain basic principles and applications of x-ray scattering in a simple way using many practical examples followed by more elaborate case studies. It contains a separate chapter on the different types of order/disorder in soft matter that play such an important role in modern self-assembling systems. Finally the last chapter treats soft matter surfaces and thin film that are increasingly used in coatings and in many technological applications, such as liquid crystal displays and nanostructured block copolymer films.
Author : T.A. Ezquerra
Publisher : Springer
ISBN 13 : 3540959688
Total Pages : 331 pages
Book Rating : 4.5/5 (49 download)
Download or read book Applications of Synchrotron Light to Scattering and Diffraction in Materials and Life Sciences written by T.A. Ezquerra and published by Springer. This book was released on 2009-06-12 with total page 331 pages. Available in PDF, EPUB and Kindle. Book excerpt: In a ?rst approximation, certainly rough, one can de?ne as non-crystalline materials those which are neither single-crystals nor poly-crystals. Within this category, we canincludedisorderedsolids,softcondensed matter,andlivesystemsamong others. Contrary to crystals, non-crystalline materials have in common that their intrinsic structures cannot be exclusively described by a discrete and periodical function but by a continuous function with short range of order. Structurally these systems have in common the relevance of length scales between those de?ned by the atomic and the macroscopic scale. In a simple ?uid, for example, mobile molecules may freely exchange their positions, so that their new positions are permutations of their old ones. By contrast, in a complex ?uid large groups of molecules may be interc- nected so that the permutation freedom within the group is lost, while the p- mutation between the groups is possible. In this case, the dominant characteristic length, which may de?ne the properties of the system, is not the molecular size but that of the groups. A central aspect of some non-crystalline materials is that they may self-organize. This is of particular importance for Soft-matter materials. Self-organization is characterized by the spontaneous creation of regular structures at different length scales which may exhibit a certain hierarchy that controls the properties of the system. X-ray scattering and diffraction have been for more than a hundred years an essential technique to characterize the structure of materials. Quite often scattering anddiffractionphenomenaexhibitedbynon-crystallinematerialshavebeenreferred to as non-crystalline diffraction.
Author : Mario Birkholz
Publisher : Wiley-VCH
ISBN 13 : 9783527310524
Total Pages : 378 pages
Book Rating : 4.3/5 (15 download)
Download or read book Thin Film Analysis by X-Ray Scattering written by Mario Birkholz and published by Wiley-VCH. This book was released on 2005-12-23 with total page 378 pages. Available in PDF, EPUB and Kindle. Book excerpt: With contributions by Paul F. Fewster and Christoph Genzel While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the 21st century are driven by the materials science of thin films. Very much an interdisciplinary field, chemists, biochemists, materials scientists, physicists and engineers all have a common interest in thin films and their manifold uses and applications. Grain size, porosity, density, preferred orientation and other properties are important to know: whether thin films fulfill their intended function depends crucially on their structure and morphology once a chemical composition has been chosen. Although their backgrounds differ greatly, all the involved specialists a profound understanding of how structural properties may be determined in order to perform their respective tasks in search of new and modern materials, coatings and functions. The author undertakes this in-depth introduction to the field of thin film X-ray characterization in a clear and precise manner.
Author : Jean Daillant
Publisher : Springer Science & Business Media
ISBN 13 : 3540486968
Total Pages : 347 pages
Book Rating : 4.5/5 (44 download)
Download or read book X-Ray and Neutron Reflectivity: Principles and Applications written by Jean Daillant and published by Springer Science & Business Media. This book was released on 2003-07-01 with total page 347 pages. Available in PDF, EPUB and Kindle. Book excerpt: The reflection of and neutrons from surfaces has existed as an x-rays exp- imental for almost it is in the last technique fifty Nevertheless, only years. decade that these methods have become as of enormously popular probes This the surfaces and interfaces. to be due to of several appears convergence of intense different circumstances. These include the more n- availability be measured orders tron and sources that can over (so reflectivity x-ray many of and the much weaker surface diffuse can now also be magnitude scattering of thin films and studied in some the detail); growing importance multil- basic the realization of the ers in both and technology research; important which in the of surfaces and and role roughness plays properties interfaces; the of statistical models to characterize the of finally development topology its and its characterization from on roughness, dependence growth processes The of and to surface scattering experiments. ability x-rays neutro4s study four five orders of in scale of surfaces over to magnitude length regardless their and also their to ability probe environment, temperature, pressure, etc. , makes these the choice for buried interfaces often probes preferred obtaining information about the microstructure of often in statistical a global surfaces, the local This is manner to complementary imaging microscopy techniques, of such studies in the literature witnessed the veritable by explosion published the last few Thus these lectures will useful for over a resource years.
Author : Alicia Esther Ares
Publisher : BoD – Books on Demand
ISBN 13 : 9535128876
Total Pages : 230 pages
Book Rating : 4.5/5 (351 download)
Download or read book X-ray Scattering written by Alicia Esther Ares and published by BoD – Books on Demand. This book was released on 2017-01-25 with total page 230 pages. Available in PDF, EPUB and Kindle. Book excerpt: X-ray scattering techniques are a family of nondestructive analytical techniques. Using these techniques, scientists obtain information about the crystal structure and chemical and physical properties of materials. Nowadays, different techniques are based on observing the scattered intensity of an X-ray beam hitting a sample as a function of incident and scattered angle, polarization, and wavelength. This book is intended to give overviews of the relevant X-ray scattering techniques, particularly about inelastic X-ray scattering, elastic scattering, grazing-incidence small-angle X-ray scattering, small-angle X-ray scattering, and high-resolution X-ray diffraction, and, finally, applications of X-ray spectroscopy to study different biological systems.
Author : Shih-Lin Chang
Publisher : Springer Science & Business Media
ISBN 13 : 3662109840
Total Pages : 443 pages
Book Rating : 4.6/5 (621 download)
Download or read book X-Ray Multiple-Wave Diffraction written by Shih-Lin Chang and published by Springer Science & Business Media. This book was released on 2013-04-17 with total page 443 pages. Available in PDF, EPUB and Kindle. Book excerpt: X-ray multiple-wave diffraction, sometimes called multiple diffraction or N-beam diffraction, results from the scattering of X-rays from periodic two or higher-dimensional structures, like 2-d and 3-d crystals and even quasi crystals. The interaction of the X-rays with the periodic arrangement of atoms usually provides structural information about the scatterer. Unlike the usual Bragg reflection, the so-called two-wave diffraction, the multiply diffracted intensities are sensitive to the phases of the structure factors in volved. This gives X-ray multiple-wave diffraction the chance to solve the X-ray phase problem. On the other hand, the condition for generating an X ray multiple-wave diffraction is much more strict than in two-wave cases. This makes X-ray multiple-wave diffraction a useful technique for precise measure ments of crystal lattice constants and the wavelength of radiation sources. Recent progress in the application of this particular diffraction technique to surfaces, thin films, and less ordered systems has demonstrated the diver sity and practicability of the technique for structural research in condensed matter physics, materials sciences, crystallography, and X-ray optics. The first book on this subject, Multiple Diffraction of X-Rays in Crystals, was published in 1984, and intended to give a contemporary review on the fundamental and application aspects of this diffraction.
Author : Wilhelmus Hendrikus Jeu
Publisher : Oxford University Press
ISBN 13 : 0198728662
Total Pages : 149 pages
Book Rating : 4.1/5 (987 download)
Download or read book Basic X-ray Scattering for Soft Matter written by Wilhelmus Hendrikus Jeu and published by Oxford University Press. This book was released on 2016 with total page 149 pages. Available in PDF, EPUB and Kindle. Book excerpt: X-ray scattering is a well-established technique in materials science. The aim of this text is to explain basic principles and applications of x-ray scattering in a simple way using many practical examples followed by more elaborate case studies. It contains a separate chapter on the different types of order/disorder in soft matter that play such an important role in modern self-assembling systems. Finally the last chapter treats soft matter surfaces and thin film that are increasingly used in coatings and in many technological applications, such as liquid crystal displays and nanostructured block copolymer films
Author : S. Kalliadasis
Publisher : Springer Science & Business Media
ISBN 13 : 3211698078
Total Pages : 211 pages
Book Rating : 4.2/5 (116 download)
Download or read book Thin Films of Soft Matter written by S. Kalliadasis and published by Springer Science & Business Media. This book was released on 2007-05-21 with total page 211 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides a detailed overview and comprehensive analysis of the main theoretical and experimental advances on free surface thin film and jet flows of soft matter. The book outlines the basic equations and boundary conditions and the derivation of low-dimensional models for the evolution of the free surface. At the experimental front, a variety of recent experimental developments is outlined and the link between theory and experiments is illustrated.
Author : Oliver H. Seeck
Publisher : CRC Press
ISBN 13 : 9814303607
Total Pages : 438 pages
Book Rating : 4.8/5 (143 download)
Download or read book X-Ray Diffraction written by Oliver H. Seeck and published by CRC Press. This book was released on 2015-02-10 with total page 438 pages. Available in PDF, EPUB and Kindle. Book excerpt: High-resolution x-ray diffraction and scattering is a key tool for structure analysis not only in bulk materials but also at surfaces and buried interfaces from the sub-nanometer range to micrometers. This book offers an overview of diffraction and scattering methods currently available at modern synchrotron sources and illustrates bulk and interface investigations of solid and liquid matter with up-to-date research examples. It presents important characteristics of the sources, experimental set-up, and new detector developments. The book also considers future exploitation of x-ray free electron lasers for diffraction applications.
Author : Paul F Fewster
Publisher : World Scientific
ISBN 13 : 178326098X
Total Pages : 315 pages
Book Rating : 4.7/5 (832 download)
Download or read book X-ray Scattering From Semiconductors (2nd Edition) written by Paul F Fewster and published by World Scientific. This book was released on 2003-07-07 with total page 315 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents a practical guide to the analysis of materials and includes a thorough description of the underlying theories and instrumental aberrations caused by real experiments. The main emphasis concerns the analysis of thin films and multilayers, primarily semiconductors, although the techniques are very general. Semiconductors can be very perfect composite crystals and therefore their study can lead to the largest volume of information, since X-ray scattering can assess the deviation from perfection.The description is intentionally conceptual so that the reader can grasp the real processes involved. In this way the analysis becomes significantly easier, making the reader aware of misleading artifacts and assisting in the determination of a more complete and reliable analysis. The theory of scattering is very important and is covered in such a way that the assumptions are clear. Greatest emphasis is placed on the dynamical diffraction theory including new developments extending its applicability to reciprocal space mapping and modelling samples with relaxed and distorted interfaces.A practical guide to the measurement of diffraction patterns, including the smearing effects introduced to the measurement, is also presented.
Author : Emil Zolotoyabko
Publisher : John Wiley & Sons
ISBN 13 : 3527681183
Total Pages : 299 pages
Book Rating : 4.5/5 (276 download)
Download or read book Basic Concepts of X-Ray Diffraction written by Emil Zolotoyabko and published by John Wiley & Sons. This book was released on 2014-02-10 with total page 299 pages. Available in PDF, EPUB and Kindle. Book excerpt: Authored by a university professor deeply involved in X-ray diffraction-related research, this textbook is based on his lectures given to graduate students for more than 20 years. It adopts a well-balanced approach, describing basic concepts and experimental techniques, which make X-ray diffraction an unsurpassed method for studying the structure of materials. Both dynamical and kinematic X-ray diffraction is considered from a unified viewpoint, in which the dynamical diffraction in single-scattering approximation serves as a bridge between these two parts. The text emphasizes the fundamental laws that govern the interaction of X-rays with matter, but also covers in detail classical and modern applications, e.g., line broadening, texture and strain/stress analyses, X-ray mapping in reciprocal space, high-resolution X-ray diffraction in the spatial and wave vector domains, X-ray focusing, inelastic and time-resolved X-ray scattering. This unique scope, in combination with otherwise hard-to-find information on analytic expressions for simulating X-ray diffraction profiles in thin-film heterostructures, X-ray interaction with phonons, coherent scattering of Mossbauer radiation, and energy-variable X-ray diffraction, makes the book indispensable for any serious user of X-ray diffraction techniques. Compact and self-contained, this textbook is suitable for students taking X-ray diffraction courses towards specialization in materials science, physics, chemistry, or biology. Numerous clear-cut illustrations, an easy-to-read style of writing, as well as rather short, easily digestible chapters all facilitate comprehension.
Author : Ge Liu
Publisher :
ISBN 13 :
Total Pages : 133 pages
Book Rating : 4.:/5 (183 download)
Download or read book X-ray Diffraction from Thin Film Structures written by Ge Liu and published by . This book was released on 2007 with total page 133 pages. Available in PDF, EPUB and Kindle. Book excerpt: InAs/GaSb superlattices grown via molecular beam epitaxy, and containing InSb-like interfacial layers, were analyzed with a combination of x-ray diffraction (XRD) and structural refinement techniques. The superlattice refinement from x-rays (SUPREX) method determines with high accuracy the average thicknesses and d-spacings of the individual InAs and GaSb layers in addition to standard structural parameters usually obtained by XRD, such as the modulation length (periodicity), average out-of-plane interplanar spacings, and total thickness. The combined SUPREX/XRD experiments show that the absence of certain odd order satellite features in the x-ray data is due to asymmetric and inhomogeneous lattice strain. \textit{Ex situ}-annealed InAs/GaSb superlattices were studied using atomic force microscopy (AFM) and XRD methods. Results show that annealing at temperatures between 200 °C and 300 °C for 1 hour in HVAC improves the structural quality of these superlattices. Strain relaxation occurs during the annealing process indicating that there are chemical intermixing and anion segregation in the superlattices. The effect of the inner-molecular electron density on the x-ray diffraction profile of a layer-stacked thin film is studied. Important phase information contained in the x-ray diffraction profile of highly anisotropic molecular-based thin films is charaterized. The experimental and calculated results show that the intensity distribution of the diffraction peaks belonging to the same lattice orientation provides important structural information. For example, tilt angle and core electron density of a molecule can be determined from the intensity distribution. The out-of-plane tilt angle relaxation is studied numerically. The results show that the relaxation can only occur at the first phthalocyanine monolayer above the substrate. The lateral grain size effect and the polar angle anisotropy are studied using a three-dimensional model. The FWHM of the center peak in associated rocking curves gives lateral coherence length or lateral grain size, and the ratio of the intensities from the diffraction peaks in normal diffraction curves shows the uniaxial angular anisotropy of the phthalocyanine thin films.
Author : Linda S. Hirst
Publisher : CRC Press
ISBN 13 : 1351754912
Total Pages : 266 pages
Book Rating : 4.3/5 (517 download)
Download or read book Fundamentals of Soft Matter Science written by Linda S. Hirst and published by CRC Press. This book was released on 2019-08-09 with total page 266 pages. Available in PDF, EPUB and Kindle. Book excerpt: This revised edition continues to provide the most approachable introduction to the structure, characteristics, and everyday applications of soft matter. It begins with a substantially revised overview of the underlying physics and chemistry common to soft materials. Subsequent chapters comprehensively address the different classes of soft materials, from liquid crystals to surfactants, polymers, colloids, and biomaterials, with vivid, full-color illustrations throughout. There are new worked examples throughout, new problems, some deeper mathematical treatment, and new sections on key topics such as diffusion, active matter, liquid crystal defects, surfactant phases and more. • Introduces the science of soft materials, experimental methods used in their study, and wide-ranging applications in everyday life. • Provides brand new worked examples throughout, in addition to expanded chapter problem sets and an updated glossary. • Includes expanded mathematical content and substantially revised introductory chapters. This book will provide a comprehensive introductory resource to both undergraduate and graduate students discovering soft materials for the first time and is aimed at students with an introductory college background in physics, chemistry or materials science.
