Read Books Online and Download eBooks, EPub, PDF, Mobi, Kindle, Text Full Free.
Vlsi Test Symposium 12th Ieee
Download Vlsi Test Symposium 12th Ieee full books in PDF, epub, and Kindle. Read online Vlsi Test Symposium 12th Ieee ebook anywhere anytime directly on your device. Fast Download speed and no annoying ads. We cannot guarantee that every ebooks is available!
Download or read book IEEE VLSI Test Symposium written by and published by . This book was released on 2005 with total page 498 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Download or read book 16th IEEE VLSI Test Symposium written by and published by . This book was released on 1998 with total page 520 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis On-Line Testing for VLSI by : Michael Nicolaidis
Download or read book On-Line Testing for VLSI written by Michael Nicolaidis and published by Springer Science & Business Media. This book was released on 2013-03-09 with total page 152 pages. Available in PDF, EPUB and Kindle. Book excerpt: Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design of concurrent error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs. On-Line Testing for VLSI contains a selected set of articles that discuss many of the modern aspects of on-line testing as faced today. The contributions are largely derived from recent IEEE International On-Line Testing Workshops. Guest editors Michael Nicolaidis, Yervant Zorian and Dhiraj Pradhan organized the articles into six chapters. In the first chapter the editors introduce a large number of approaches with an expanded bibliography in which some references date back to the sixties. On-Line Testing for VLSI is an edited volume of original research comprising invited contributions by leading researchers.
Book Synopsis Delay Fault Testing for VLSI Circuits by : Angela Krstic
Download or read book Delay Fault Testing for VLSI Circuits written by Angela Krstic and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 201 pages. Available in PDF, EPUB and Kindle. Book excerpt: In the early days of digital design, we were concerned with the logical correctness of circuits. We knew that if we slowed down the clock signal sufficiently, the circuit would function correctly. With improvements in the semiconductor process technology, our expectations on speed have soared. A frequently asked question in the last decade has been how fast can the clock run. This puts significant demands on timing analysis and delay testing. Fueled by the above events, a tremendous growth has occurred in the research on delay testing. Recent work includes fault models, algorithms for test generation and fault simulation, and methods for design and synthesis for testability. The authors of this book, Angela Krstic and Tim Cheng, have personally contributed to this research. Now they do an even greater service to the profession by collecting the work of a large number of researchers. In addition to expounding such a great deal of information, they have delivered it with utmost clarity. To further the reader's understanding many key concepts are illustrated by simple examples. The basic ideas of delay testing have reached a level of maturity that makes them suitable for practice. In that sense, this book is the best x DELAY FAULT TESTING FOR VLSI CIRCUITS available guide for an engineer designing or testing VLSI systems. Tech niques for path delay testing and for use of slower test equipment to test high-speed circuits are of particular interest.
Book Synopsis Machine Learning Support for Fault Diagnosis of System-on-Chip by : Patrick Girard
Download or read book Machine Learning Support for Fault Diagnosis of System-on-Chip written by Patrick Girard and published by Springer Nature. This book was released on 2023-03-13 with total page 320 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides a state-of-the-art guide to Machine Learning (ML)-based techniques that have been shown to be highly efficient for diagnosis of failures in electronic circuits and systems. The methods discussed can be used for volume diagnosis after manufacturing or for diagnosis of customer returns. Readers will be enabled to deal with huge amount of insightful test data that cannot be exploited otherwise in an efficient, timely manner. After some background on fault diagnosis and machine learning, the authors explain and apply optimized techniques from the ML domain to solve the fault diagnosis problem in the realm of electronic system design and manufacturing. These techniques can be used for failure isolation in logic or analog circuits, board-level fault diagnosis, or even wafer-level failure cluster identification. Evaluation metrics as well as industrial case studies are used to emphasize the usefulness and benefits of using ML-based diagnosis techniques.
Download or read book INCREaSE 2019 written by Janio Monteiro and published by Springer Nature. This book was released on 2019-09-19 with total page 1204 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book contains the proceedings of the INternational CongRess on Engineering and Sustainability in the XXI cEntury – INCREaSE 2019, which was held in Faro, Portugal, from October 09 to 11, 2019. The book promotes a multidisciplinary approach to sustainable development, exploring a number of transversal challenges. Among other topics it discusses Climate Changes and Environmental Protection; Renewable Energy; Energy Efficiency in Buildings; Green Governance and Mobility; Water for Ecosystem and Society; Healthy Food; Sustainable Construction; and Sustainable Tourism, offering perspectives from civil, electronics, mechanical, and food engineering.
Book Synopsis Logic Functions and Equations by : Christian Posthoff
Download or read book Logic Functions and Equations written by Christian Posthoff and published by Springer Science & Business Media. This book was released on 2013-03-19 with total page 410 pages. Available in PDF, EPUB and Kindle. Book excerpt: Logic functions and equations are (some of) the most important concepts of Computer Science with many applications such as Binary Arithmetics, Coding, Complexity, Logic Design, Programming, Computer Architecture and Artificial Intelligence. They are very often studied in a minimum way prior to or together with their respective applications. Based on our long-time teaching experience, a comprehensive presentation of these concepts is given, especially emphasising a thorough understanding as well as numerical and computer-based solution methods. Any applications and examples from all the respective areas are given that can be dealt with in a unified way. They offer a broad understanding of the recent developments in Computer Science and are directly applicable in professional life. Logic Functions and Equations is highly recommended for a one- or two-semester course in many Computer Science or computer Science-oriented programmes. It allows students an easy high-level access to these methods and enables sophisticated applications in many different areas. It elegantly bridges the gap between Mathematics and the required theoretical foundations of Computer Science.
Book Synopsis Soft Errors in Modern Electronic Systems by : Michael Nicolaidis
Download or read book Soft Errors in Modern Electronic Systems written by Michael Nicolaidis and published by Springer Science & Business Media. This book was released on 2010-09-24 with total page 331 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides a comprehensive presentation of the most advanced research results and technological developments enabling understanding, qualifying and mitigating the soft errors effect in advanced electronics, including the fundamental physical mechanisms of radiation induced soft errors, the various steps that lead to a system failure, the modelling and simulation of soft error at various levels (including physical, electrical, netlist, event driven, RTL, and system level modelling and simulation), hardware fault injection, accelerated radiation testing and natural environment testing, soft error oriented test structures, process-level, device-level, cell-level, circuit-level, architectural-level, software level and system level soft error mitigation techniques. The book contains a comprehensive presentation of most recent advances on understanding, qualifying and mitigating the soft error effect in advanced electronic systems, presented by academia and industry experts in reliability, fault tolerance, EDA, processor, SoC and system design, and in particular, experts from industries that have faced the soft error impact in terms of product reliability and related business issues and were in the forefront of the countermeasures taken by these companies at multiple levels in order to mitigate the soft error effects at a cost acceptable for commercial products. In a fast moving field, where the impact on ground level electronics is very recent and its severity is steadily increasing at each new process node, impacting one after another various industry sectors (as an example, the Automotive Electronics Council comes to publish qualification requirements on soft errors), research and technology developments and industrial practices have evolve very fast, outdating the most recent books edited at 2004.
Book Synopsis Design and Test Technology for Dependable Systems-on-chip by : Raimund Ubar
Download or read book Design and Test Technology for Dependable Systems-on-chip written by Raimund Ubar and published by IGI Global. This book was released on 2011-01-01 with total page 580 pages. Available in PDF, EPUB and Kindle. Book excerpt: "This book covers aspects of system design and efficient modelling, and also introduces various fault models and fault mechanisms associated with digital circuits integrated into System on Chip (SoC), Multi-Processor System-on Chip (MPSoC) or Network on Chip (NoC)"--
Author :Svetlana N. Yanushkevich Publisher :Springer Science & Business Media ISBN 13 :9781402020520 Total Pages :348 pages Book Rating :4.0/5 (25 download)
Book Synopsis Artificial Intelligence in Logic Design by : Svetlana N. Yanushkevich
Download or read book Artificial Intelligence in Logic Design written by Svetlana N. Yanushkevich and published by Springer Science & Business Media. This book was released on 2004-07-27 with total page 348 pages. Available in PDF, EPUB and Kindle. Book excerpt: A collective point of view on the role of artificial intelligence paradigm in logic design is introduced. The book reveals new horizons of logic design tools on the technologies of the near future. The contributors of the book are twenty recognized leaders in the field from seven research centres; they are all experienced in practical electronic design and in teaching engineering courses.
Book Synopsis Hardware Security and Trust by : Nicolas Sklavos
Download or read book Hardware Security and Trust written by Nicolas Sklavos and published by Springer. This book was released on 2017-01-11 with total page 254 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book provides a comprehensive introduction to hardware security, from specification to implementation. Applications discussed include embedded systems ranging from small RFID tags to satellites orbiting the earth. The authors describe a design and synthesis flow, which will transform a given circuit into a secure design incorporating counter-measures against fault attacks. In order to address the conflict between testability and security, the authors describe innovative design-for-testability (DFT) computer-aided design (CAD) tools that support security challenges, engineered for compliance with existing, commercial tools. Secure protocols are discussed, which protect access to necessary test infrastructures and enable the design of secure access controllers.
Book Synopsis VLSI Design and Test by : S. Rajaram
Download or read book VLSI Design and Test written by S. Rajaram and published by Springer. This book was released on 2019-01-24 with total page 728 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book constitutes the refereed proceedings of the 22st International Symposium on VLSI Design and Test, VDAT 2018, held in Madurai, India, in June 2018. The 39 full papers and 11 short papers presented together with 8 poster papers were carefully reviewed and selected from 231 submissions. The papers are organized in topical sections named: digital design; analog and mixed signal design; hardware security; micro bio-fluidics; VLSI testing; analog circuits and devices; network-on-chip; memory; quantum computing and NoC; sensors and interfaces.
Book Synopsis Embedded Software and Systems by : Laurence T. Yang
Download or read book Embedded Software and Systems written by Laurence T. Yang and published by Springer. This book was released on 2005-11-30 with total page 804 pages. Available in PDF, EPUB and Kindle. Book excerpt: Welcome to the proceedings of the 2005 International Conference on Emb- ded Software and Systems (ICESS 2005) held in Xian, China, December 16-18, 2005. With the advent of VLSI system level integration and system-on-chip, the center of gravity of the computer industry is now moving from personal c- puting into embedded computing. Embedded software and systems are incre- ingly becoming a key technological component of all kinds of complex technical systems, ranging from vehicles, telephones, aircraft, toys, security systems, to medical diagnostics, weapons, pacemakers, climate control systems, etc. The ICESS 2005 conference provided a premier international forum for - searchers, developers and providers from academia and industry to address all resulting profound challenges; to present and discuss their new ideas, - search results, applications and experience; to improve international com- nication and cooperation; and to promote embedded software and system - dustrialization and wide applications on all aspects of embedded software and systems.
Book Synopsis Logic Functions and Equations by : Bernd Steinbach
Download or read book Logic Functions and Equations written by Bernd Steinbach and published by Springer Science & Business Media. This book was released on 2009-01-29 with total page 232 pages. Available in PDF, EPUB and Kindle. Book excerpt: Tsutomu Sasao – Kyushu Institute of Technology, Japan The material covered in this book is quite unique especially for p- ple who are reading English, since such material is quite hard to ?nd in the U.S. literature. German and Russian people have independently developed their theories, but such work is not well known in the U.S. societies. On the other hand, the theories developed in the U.S. are not conveyed to the other places. Thus, the same theory is re-invented or re-discovered in various places. For example, the switching theory was developed independently in the U.S., Europe, and Japan, almost at the same time [4, 18, 19]. Thus, the same notions are represented by di?- ent terminologies. For example, the Shegalkin polynomial is often called complement-free ring-sum, Reed-Muller expression [10], or Positive - larityReed-Mullerexpression [19].Anyway,itisquitedesirablethatsuch a unique book like this is written in English, and many people can read it without any di?culties. The authors have developed a logic system called XBOOLE.Itp- forms logical operations on the given functions. With XBOOLE, the readers can solve the problems given in the book. Many examples and complete solutions to the problems are shown, so the readers can study at home. I believe that the book containing many exercises and their solutions [9] is quite useful not only for the students, but also the p- fessors.
Book Synopsis Boolean Differential Equations by : Bernd Steinbach
Download or read book Boolean Differential Equations written by Bernd Steinbach and published by Springer Nature. This book was released on 2022-05-31 with total page 146 pages. Available in PDF, EPUB and Kindle. Book excerpt: The Boolean Differential Calculus (BDC) is a very powerful theory that extends the structure of a Boolean Algebra significantly. Based on a small number of definitions, many theorems have been proven. The available operations have been efficiently implemented in several software packages. There is a very wide field of applications. While a Boolean Algebra is focused on values of logic functions, the BDC allows the evaluation of changes of function values. Such changes can be explored for pairs of function values as well as for whole subspaces. Due to the same basic data structures, the BDC can be applied to any task described by logic functions and equations together with the Boolean Algebra. The BDC can be widely used for the analysis, synthesis, and testing of digital circuits. Generally speaking, a Boolean differential equation (BDE) is an equation in which elements of the BDC appear. It includes variables, functions, and derivative operations of these functions. The solution of such a BDE is a set of Boolean functions. This is a significant extension of Boolean equations, which have sets of Boolean vectors as solutions. In the simplest BDE a derivative operation of the BDC on the left-hand side is equal to a logic function on the right-hand side. The solution of such a simple BDE means to execute an operation which is inverse to the given derivative. BDEs can be applied in the same fields as the BDC, however, their possibility to express sets of Boolean functions extends the application field significantly.
Book Synopsis 10th Anniversary Compendium of Papers from Asian Test Symposium by :
Download or read book 10th Anniversary Compendium of Papers from Asian Test Symposium written by and published by . This book was released on 2001 with total page 400 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis VLSI Testing by : Stanley Leonard Hurst
Download or read book VLSI Testing written by Stanley Leonard Hurst and published by IET. This book was released on 1998 with total page 560 pages. Available in PDF, EPUB and Kindle. Book excerpt: Hurst, an editor at the Microelectronics Journal, analyzes common problems that electronics engineers and circuit designers encounter while testing integrated circuits and the systems in which they are used, and explains a variety of solutions available for overcoming them in both digital and mixed circuits. Among his topics are faults in digital circuits, generating a digital test pattern, signatures and self-tests, structured design for testability, testing structured digital circuits and microprocessors, and financial aspects of testing. The self- contained reference is also suitable as a textbook in a formal course on the subject. Annotation copyrighted by Book News, Inc., Portland, OR