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Use Of Monte Carlo Calculations In Electron Probe Microanalysis And Scanning Electron Microscopy
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Book Synopsis Use of Monte Carlo Calculations in Electron Probe Microanalysis and Scanning Electron Microscopy by : Kurt F. J. Heinrich
Download or read book Use of Monte Carlo Calculations in Electron Probe Microanalysis and Scanning Electron Microscopy written by Kurt F. J. Heinrich and published by . This book was released on 1976 with total page 188 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Use of Monte Carlo Calculations in Electron Probe Microanalysis and Scanning Electron Microscopy by : Kurt F. J. Heinrich
Download or read book Use of Monte Carlo Calculations in Electron Probe Microanalysis and Scanning Electron Microscopy written by Kurt F. J. Heinrich and published by . This book was released on 1977 with total page 180 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Electron Probe Quantitation by : K.F.J. Heinrich
Download or read book Electron Probe Quantitation written by K.F.J. Heinrich and published by Springer Science & Business Media. This book was released on 1991-06-30 with total page 412 pages. Available in PDF, EPUB and Kindle. Book excerpt: In 1968, the National Bureau of Standards (NBS) published Special Publication 298 "Quantitative Electron Probe Microanalysis," which contained proceedings of a seminar held on the subject at NBS in the summer of 1967. This publication received wide interest that continued through the years far beyond expectations. The present volume, also the result of a gathering of international experts, in 1988, at NBS (now the National Institute of Standards and Technology, NIST), is intended to fulfill the same purpose. After years of substantial agreement on the procedures of analysis and data evaluation, several sharply differentiated approaches have developed. These are described in this publi cation with all the details required for practical application. Neither the editors nor NIST wish to endorse any single approach. Rather, we hope that their exposition will stimulate the dialogue which is a prerequisite for technical progress. Additionally, it is expected that those active in research in electron probe microanalysis will appreciate more clearly the areas in which further investigations are warranted.
Book Synopsis Scanning Electron Microscopy by : Ludwig Reimer
Download or read book Scanning Electron Microscopy written by Ludwig Reimer and published by Springer. This book was released on 2013-11-11 with total page 538 pages. Available in PDF, EPUB and Kindle. Book excerpt: Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.
Book Synopsis Scanning Electron Microscopy and X-Ray Microanalysis by : Joseph Goldstein
Download or read book Scanning Electron Microscopy and X-Ray Microanalysis written by Joseph Goldstein and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 830 pages. Available in PDF, EPUB and Kindle. Book excerpt: In the last decade, since the publication of the first edition of Scanning Electron Microscopy and X-ray Microanalysis, there has been a great expansion in the capabilities of the basic SEM and EPMA. High resolution imaging has been developed with the aid of an extensive range of field emission gun (FEG) microscopes. The magnification ranges of these instruments now overlap those of the transmission electron microscope. Low-voltage microscopy using the FEG now allows for the observation of noncoated samples. In addition, advances in the develop ment of x-ray wavelength and energy dispersive spectrometers allow for the measurement of low-energy x-rays, particularly from the light elements (B, C, N, 0). In the area of x-ray microanalysis, great advances have been made, particularly with the "phi rho z" [Ij)(pz)] technique for solid samples, and with other quantitation methods for thin films, particles, rough surfaces, and the light elements. In addition, x-ray imaging has advanced from the conventional technique of "dot mapping" to the method of quantitative compositional imaging. Beyond this, new software has allowed the development of much more meaningful displays for both imaging and quantitative analysis results and the capability for integrating the data to obtain specific information such as precipitate size, chemical analysis in designated areas or along specific directions, and local chemical inhomogeneities.
Book Synopsis Monte Carlo Modeling for Electron Microscopy and Microanalysis by : David C. Joy
Download or read book Monte Carlo Modeling for Electron Microscopy and Microanalysis written by David C. Joy and published by Oxford University Press. This book was released on 1995-04-13 with total page 225 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book describes for the first time how Monte Carlo modeling methods can be applied to electron microscopy and microanalysis. Computer programs for two basic types of Monte Carlo simulation are developed from physical models of the electron scattering process--a single scattering program capable of high accuracy but requiring long computation times, and a plural scattering program which is less accurate but much more rapid. Optimized for use on personal computers, the programs provide a real time graphical display of the interaction. The programs are then used as the starting point for the development of programs aimed at studying particular effects in the electron microscope, including backscattering, secondary electron production, EBIC and cathodo-luminescence imaging, and X-ray microanalysis. The computer code is given in a fully annotated format so that it may be readily modified for specific problems. Throughout, the author includes numerous examples of how such applications can be used. Students and professionals using electron microscopes will want to read this important addition to the literature.
Download or read book NBS Special Publication written by and published by . This book was released on 1968 with total page 752 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Publications by : United States. National Bureau of Standards
Download or read book Publications written by United States. National Bureau of Standards and published by . This book was released on 1977 with total page 766 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Publications of the National Bureau of Standards by : United States. National Bureau of Standards
Download or read book Publications of the National Bureau of Standards written by United States. National Bureau of Standards and published by . This book was released on 1976 with total page 744 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Publications of the National Bureau of Standards ... Catalog by : United States. National Bureau of Standards
Download or read book Publications of the National Bureau of Standards ... Catalog written by United States. National Bureau of Standards and published by . This book was released on 1977 with total page 748 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Publications of the National Institute of Standards and Technology ... Catalog by : National Institute of Standards and Technology (U.S.)
Download or read book Publications of the National Institute of Standards and Technology ... Catalog written by National Institute of Standards and Technology (U.S.) and published by . This book was released on 1977 with total page 746 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Publications of the National Bureau of Standards, 1976 Catalog by : United States. National Bureau of Standards
Download or read book Publications of the National Bureau of Standards, 1976 Catalog written by United States. National Bureau of Standards and published by . This book was released on 1977 with total page 742 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author :United States. National Bureau of Standards. Technical Information and Publications Division Publisher : ISBN 13 : Total Pages :804 pages Book Rating :4.3/5 (91 download)
Book Synopsis Catalog of National Bureau of Standards Publications, 1966-1976: pt. 1 Citations and abstracts. v. 2. pt. 1. Key word index (A through L). v. 2. pt. 2. Key word index (M through Z) by : United States. National Bureau of Standards. Technical Information and Publications Division
Download or read book Catalog of National Bureau of Standards Publications, 1966-1976: pt. 1 Citations and abstracts. v. 2. pt. 1. Key word index (A through L). v. 2. pt. 2. Key word index (M through Z) written by United States. National Bureau of Standards. Technical Information and Publications Division and published by . This book was released on 1978 with total page 804 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Catalog of National Bureau of Standards Publications, 1966-1976 by : United States. National Bureau of Standards
Download or read book Catalog of National Bureau of Standards Publications, 1966-1976 written by United States. National Bureau of Standards and published by . This book was released on 1978 with total page 804 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Phase-Contrast and Dark-Field Imaging by : Simon Zabler
Download or read book Phase-Contrast and Dark-Field Imaging written by Simon Zabler and published by MDPI. This book was released on 2019-01-08 with total page 147 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book is a printed edition of the Special Issue "Phase-Contrast and Dark-Field Imaging" that was published in J. Imaging
Book Synopsis Field Emission Scanning Electron Microscopy by : Nicolas Brodusch
Download or read book Field Emission Scanning Electron Microscopy written by Nicolas Brodusch and published by Springer. This book was released on 2017-09-25 with total page 143 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution. It discusses advanced scanning electron microscopes/scanning- transmission electron microscopes (SEM/STEM), simulation and post-processing techniques at high spatial resolution in the fields of nanomaterials, metallurgy, geology, and more. These microscopes now offer improved performance at very low landing voltage and high -beam probe current stability, combined with a routine transmission mode capability that can compete with the (scanning-) transmission electron microscopes (STEM/-TEM) historically run at higher beam accelerating voltage
Book Synopsis Image Formation in Low-voltage Scanning Electron Microscopy by : Ludwig Reimer
Download or read book Image Formation in Low-voltage Scanning Electron Microscopy written by Ludwig Reimer and published by SPIE Press. This book was released on 1993 with total page 162 pages. Available in PDF, EPUB and Kindle. Book excerpt: While most textbooks about scanning electron microscopy (SEM) cover the high-voltage range from 5-50 keV, this volume considers the special problems in low-voltage SEM and summarizes the differences between LVSEM and conventional SEM. Chapters cover the influence of lens aberrations and design on electron-probe formation; the effect of elastic and inelastic scattering processes on electron diffusion and electron range; charging and radiation damage effects; the dependence of SE yield and the backscattering coefficient on electron energy, surface tilt, and material as well as the angular and energy distributions; and types of image contrast and the differences between LVSEM and conventional SEM modes due to the influence of electron-specimen interactions.
