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Author : Andrew Roderick Moores
Publisher :
ISBN 13 :
Total Pages : 284 pages
Book Rating : 4.:/5 (433 download)
Download or read book The Scanning Tunneling Microscope and Associated Image Analysis written by Andrew Roderick Moores and published by . This book was released on 1997 with total page 284 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Roland Wiesendanger
Publisher : Springer Science & Business Media
ISBN 13 : 3642793665
Total Pages : 359 pages
Book Rating : 4.6/5 (427 download)
Download or read book Scanning Tunneling Microscopy II written by Roland Wiesendanger and published by Springer Science & Business Media. This book was released on 2013-03-08 with total page 359 pages. Available in PDF, EPUB and Kindle. Book excerpt: Scanning Tunneling Microscopy II, like its predecessor, presents detailed and comprehensive accounts of the basic principles and the broad range of applications of STM and related scanning probe techniques. The applications discussed in this volume come predominantly from the fields of electrochemistry and biology. In contrast to those in STM I, these studies may be performed in air and in liquids. The extensions of the basic technique to map other interactions are described in chapters on scanning force microscopy, magnetic force microscopy, and scanning near-field optical microscopy, together with a survey of other related techniques. Also discussed here is the use of a scanning proximal probe for surface modification. Together, the two volumes give a comprehensive account of experimental aspects of STM and provide essential reading and reference material. In this second edition the text has been updated and new methods are discussed.
Author : Roland Wiesendanger
Publisher : Springer Science & Business Media
ISBN 13 : 3642973639
Total Pages : 316 pages
Book Rating : 4.6/5 (429 download)
Download or read book Scanning Tunneling Microscopy II written by Roland Wiesendanger and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 316 pages. Available in PDF, EPUB and Kindle. Book excerpt: Scanning Tunneling Microscopy II, like its predecessor, presents detailed and comprehensive accounts of the basic principles and broad range of applications of STM and related scanning probe techniques. The applications discussed in this volume come predominantly from the fields of electrochemistry and biology. In contrast to those described in Vol. I, these sudies may be performed in air and in liquids. The extensions of the basic technique to map other interactions are described inchapters on scanning force microscopy, magnetic force microscopy, scanning near-field optical microscopy, together with a survey of other related techniques. Also described here is the use of a scanning proximal probe for surface modification. Togehter, the two volumes give a comprehensive account of experimental aspcets of STM. They provide essentialreading and reference material for all students and researchers involvedin this field.
Author : Sergei N. Magonov
Publisher : John Wiley & Sons
ISBN 13 : 3527615105
Total Pages : 335 pages
Book Rating : 4.5/5 (276 download)
Download or read book Surface Analysis with STM and AFM written by Sergei N. Magonov and published by John Wiley & Sons. This book was released on 2008-09-26 with total page 335 pages. Available in PDF, EPUB and Kindle. Book excerpt: Scanning tunneling microscopy (STM) and atomic force microscopy (AFM) are powerful tools for surface examination. In the past, many STM and AFM studies led to erroneous conclusions due to lack of proper theoretical considerations and of an understanding of how image patterns are affected by measurement conditions. For this book, two world experts, one on theoretical analysis and the other on experimental characterization, have joined forces to bring together essential components of STM and AFM studies: The practical aspects of STM, the image simulation by surface electron density plot calculations, and the qualitative evaluation of tip-force induced surface corrugations. Practical examples are taken from: * inorganic layered materials * organic conductors * organic adsorbates at liquid-solid interfaces * self-assembled amphiphiles * polymers This book will be an invaluable reference work for researchers active in STM and AMF as well as for newcomers to the field.
Author : Samuel H. Cohen
Publisher : Springer Science & Business Media
ISBN 13 : 1475793251
Total Pages : 243 pages
Book Rating : 4.4/5 (757 download)
Download or read book Atomic Force Microscopy/Scanning Tunneling Microscopy 2 written by Samuel H. Cohen and published by Springer Science & Business Media. This book was released on 2013-06-29 with total page 243 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book represents the compilation of papers presented at the second Atomic Force Microscopy/Scanning Tunneling Microscopy (AFM/STM) Symposium, held June 7 to 9, 1994, in Natick, Massachusetts, at Natick Research, Development and Engineering Center, now part ofU.S. Army Soldier Systems Command. As with the 1993 symposium, the 1994 symposium provided a forum where scientists with a common interest in AFM, STM, and other probe microscopies could interact with one another, exchange ideas and explore the possibilities for future collaborations and working relationships. In addition to the scheduled talks and poster sessions, there was an equipment exhibit featuring the newest state-of-the-art AFM/STM microscopes, other probe microscopes, imaging hardware and software, as well as the latest microscope-related and sample preparation accessories. These were all very favorably received by the meeting's attendees. Following opening remarks by Natick's Commander, Colonel Morris E. Price, Jr., and the Technical Director, Dr. Robert W. Lewis, the symposium began with the Keynote Address given by Dr. Michael F. Crommie from Boston University. The agenda was divided into four major sessions. The papers (and posters) presented at the symposium represented a broad spectrum of topics in atomic force microscopy, scanning tunneling microscopy, and other probe microscopies.
Author : H. Neddermeyer
Publisher : Springer Science & Business Media
ISBN 13 : 9401118124
Total Pages : 275 pages
Book Rating : 4.4/5 (11 download)
Download or read book Scanning Tunneling Microscopy written by H. Neddermeyer and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 275 pages. Available in PDF, EPUB and Kindle. Book excerpt: The publication entitled "Surface Studies by Scanning Tunneling Mi Rl croscopy" by Binnig, Rohrer, Gerber and Weibel of the IBM Research Lab oratory in Riischlikon in 1982 immediately raised considerable interest in the sur face science community. It was demonstrated in Reference R1 that images from atomic structures of surfaces like individual steps could be obtained simply by scanning the surface with a sharp metal tip, which was kept in a constant distance of approximately 10 A from the sample surface. The distance control in scanning tunneling microscopy (STM) was realized by a feedback circuit, where the electri cal tunneling current through the potential barrier between tip and sample is used for regulating the tip position with a piezoelectric xyz-system. A similar experi mental approach has already been described by Young et al. for the determination l of the macroscopic roughness of a surface. A number of experimental difficulties had to be solved by the IBM group until this conceptual simple microscopic method could be applied successfully with atomic resolution. Firstly, distance and scanning control of the tip have to be operated with sufficient precision to be sensitive to atomic structures. Secondly, sample holder and tunneling unit have to be designed in such a way that external vibrations do not influence the sample-tip distance and that thermal or other drift effects become small enough during measurement of one image.
Author : Suchit Sharma
Publisher : GRIN Verlag
ISBN 13 : 3668588252
Total Pages : 21 pages
Book Rating : 4.6/5 (685 download)
Download or read book Scanning Tunneling Microscope and Atomic Force Microscopy written by Suchit Sharma and published by GRIN Verlag. This book was released on 2017-12-05 with total page 21 pages. Available in PDF, EPUB and Kindle. Book excerpt: Literature Review from the year 2015 in the subject Engineering - General, Indian Institute of Technology, Delhi, course: Mineral Engineering, language: English, abstract: Atomic-scale resolution is needed to study the arrangement of atoms in materials and advancing their understanding. Since the seventeenth-century optical microscopes using visible light as illumination source have led our quest to observe microscopic species but the resolution attainable reached physical limits due to the much longer wavelength of visible light. After the discovery of wave nature associated with particle bodies, a new channel of thought opened considering much shorter wavelength of particles and their special properties when interacting with the sample under observation. These particles i.e. electrons, neutrons and ions were developed in different techniques and were used as illumination sources. Herein, the development of scanning tunneling microscopy which used electrons to uncover irregularities in the arrangement of atoms in thin materials via the quantum mechanical phenomenon of electron tunneling became a sensational invention. Atomic Force Microscopy (AFM) is a development over STM which relied on measuring the forces of contact between the sample and a scanning probe which overcame the earlier technique only allowing conductors or pretreated surfaces for conducting to be observed. Since measuring contact forces between materials is a more fundamental approach that is equally but more sensitive than measuring tunneling current flowing between them, atomic force microscopy has been able to image insulators as well as semiconductors and conductors with atomic resolution by substituting tunneling current with an atomic contact force sensing arrangement, a delicate cantilever, which can image conductors and insulators alike via mechanical "touch" while running over surface atoms of the sample. AFM has seen a massive proliferation in hobbyistâs lab in form of ambient-condition scanning environment as opposed to an ultra-high vacuum of sophisticated labs and self-assembled instrumentations. The success of ATM as a cost-effective imaging tool with dramatically increased ease of conceptual understanding and use particularly with the assistance of significant computing power in the form of personal computers which offsets the computational difficulty of resolving experimental information which makes up for physical simplicity of instrument design has seen its proliferation to numerous labs in universities and technology companies worldwide.
Author : C. Julian Chen
Publisher : Oxford University Press
ISBN 13 : 0198023561
Total Pages : 472 pages
Book Rating : 4.1/5 (98 download)
Download or read book Introduction to Scanning Tunneling Microscopy written by C. Julian Chen and published by Oxford University Press. This book was released on 1993-05-20 with total page 472 pages. Available in PDF, EPUB and Kindle. Book excerpt: Due to its nondestructive imaging power, scanning tunneling microscopy has found major applications in the fields of physics, chemistry, engineering, and materials science. This book provides a comprehensive treatment of scanning tunneling and atomic force microscopy, with full coverage of the imaging mechanism, instrumentation, and sample applications. The work is the first single-author reference on STM and presents much valuable information previously available only as proceedings or collections of review articles. It contains a 32-page section of remarkable STM images, and is organized as a self-contained work, with all mathematical derivations fully detailed. As a source of background material and current data, the book will be an invaluable resource for all scientists, engineers, and technicians using the imaging abilities of STM and AFM. It may also be used as a textbook in senior-year and graduate level STM courses, and as a supplementary text in surface science, solid-state physics, materials science, microscopy, and quantum mechanics.
Author : M.T. Bray
Publisher : Springer Science & Business Media
ISBN 13 : 1475793227
Total Pages : 431 pages
Book Rating : 4.4/5 (757 download)
Download or read book Atomic Force Microscopy/Scanning Tunneling Microscopy written by M.T. Bray and published by Springer Science & Business Media. This book was released on 2013-11-11 with total page 431 pages. Available in PDF, EPUB and Kindle. Book excerpt: The first U. S. Army Natick Research, Development and Engineering Center Atomic Force/Scanning Tunneling Microscopy (AFM/STM) Symposium was held on lune 8-10, 1993 in Natick, Massachusetts. This book represents the compilation of the papers presented at the meeting. The purpose ofthis symposium was to provide a forum where scientists from a number of diverse fields could interact with one another and exchange ideas. The various topics inc1uded application of AFM/STM in material sciences, polymers, physics, biology and biotechnology, along with recent developments inc1uding new probe microscopies and frontiers in this exciting area. The meeting's format was designed to encourage communication between members of the general scientific community and those individuals who are at the cutting edge of AFM, STM and other probe microscopies. It immediately became clear that this conference enabled interdisciplinary interactions among researchers from academia, industry and government, and set the tone for future collaborations. Expert scientists from diverse scientific areas including physics, chemistry, biology, materials science and electronics were invited to participate in the symposium. The agenda of the meeting was divided into three major sessions. In the first session, Biological Nanostructure, topics ranged from AFM ofDNA to STM imagmg ofthe biomoleeule tubulin and bacterialluciferase to the AFM of starch polymer double helices to AFM imaging of food surfaces.
Author : T. Sakurai
Publisher : Springer Science & Business Media
ISBN 13 : 3642569498
Total Pages : 352 pages
Book Rating : 4.6/5 (425 download)
Download or read book Advances in Scanning Probe Microscopy written by T. Sakurai and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 352 pages. Available in PDF, EPUB and Kindle. Book excerpt: There have been many books published on scanning tunneling microscopy (STM), atomic force microscopy (AFM) and related subjects since Dr. Cerd Binnig and Dr. Heinrich Rohrer invented STM in 1982 and AFM in 1986 at IBM Research Center in Zurich, Switzerland. These two techniques, STM and AFM, now form the core of what has come to be called the 'scanning probe microscopy (SPM)' family. SPM is not just the most powerful microscope for scientists to image atoms on surfaces, but is also becoming an indispensable tool for manipulating atoms and molecules to construct man-made materials and devices. Its impact has been felt in various fields, from surface physics and chemistry to nano-mechanics, nano-electronics and medical science. Its influence will surely extend further as the years go by, beyond the reach of our present imagination, and new research applications will continue to emerge. This book, therefore, is not intended to be a comprehensive review or textbook on SPM. Its aim is to cover only a selected part of the active re search fields of SPM and related topics in which I have been directly involved over the years. These include the basic principles of STM and AFM, and their applications to fullerene film growth, SiC surface reconstructions, MBE (molecular beam epitaxy) growth of CaAs, atomic scale manipulation of Si surfaces and meso scopic work function.
Author : Roland Wiesendanger
Publisher : Springer Science & Business Media
ISBN 13 : 3642801188
Total Pages : 415 pages
Book Rating : 4.6/5 (428 download)
Download or read book Scanning Tunneling Microscopy III written by Roland Wiesendanger and published by Springer Science & Business Media. This book was released on 2013-03-07 with total page 415 pages. Available in PDF, EPUB and Kindle. Book excerpt: Scanning Tunneling Microscopy III provides a unique introduction to the theoretical foundations of scanning tunneling microscopy and related scanning probe methods. The different theoretical concepts developed in the past are outlined, and the implications of the theoretical results for the interpretation of experimental data are discussed in detail. Therefore, this book serves as a most useful guide for experimentalists as well as for theoreticians working in the field of local probe methods. In this second edition the text has been updated and new methods are discussed.
Author : Alberto Moel Modiano
Publisher :
ISBN 13 :
Total Pages : 138 pages
Book Rating : 4.:/5 (184 download)
Download or read book Real Time Control, Acquisition, and Image Processing for the Scanning Tunneling Microscope written by Alberto Moel Modiano and published by . This book was released on 1987 with total page 138 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : R.J. Behm
Publisher : Springer Science & Business Media
ISBN 13 : 9401578710
Total Pages : 516 pages
Book Rating : 4.4/5 (15 download)
Download or read book Scanning Tunneling Microscopy and Related Methods written by R.J. Behm and published by Springer Science & Business Media. This book was released on 2013-03-09 with total page 516 pages. Available in PDF, EPUB and Kindle. Book excerpt: Proceedings of the NATO Advanced Study Institute on Basic Concepts and Applications of Scanning Tunneling Microscopy, Erice, Italy, April 17-29, 1989
Author : C. Julian Chen
Publisher : Oxford University Press
ISBN 13 : 0192598562
Total Pages : 523 pages
Book Rating : 4.1/5 (925 download)
Download or read book Introduction to Scanning Tunneling Microscopy Third Edition written by C. Julian Chen and published by Oxford University Press. This book was released on 2021-03-04 with total page 523 pages. Available in PDF, EPUB and Kindle. Book excerpt: The scanning tunnelling microscope (STM) was invented by Binnig and Rohrer and received a Nobel Prize of Physics in 1986. Together with the atomic force microscope (AFM), it provides non-destructive atomic and subatomic resolution on surfaces. Especially, in recent years, internal details of atomic and molecular wavefunctions are observed and mapped with negligible disturbance. Since the publication of its first edition, this book has been the standard reference book and a graduate-level textbook educating several generations of nano-scientists. In Aug. 1992, the co-inventor of STM, Nobelist Heinrich Rohrer recommended: "The Introduction to Scanning tunnelling Microscopy by C.J. Chen provides a good introduction to the field for newcomers and it also contains valuable material and hints for the experts". For the second edition, a 2017 book review published in the Journal of Applied Crystallography said "Introduction to Scanning tunnelling Microscopy is an excellent book that can serve as a standard introduction for everyone that starts working with scanning probe microscopes, and a useful reference book for those more advanced in the field". The third edition is a thoroughly updated and improved version of the recognized "Bible" of the field. Additions to the third edition include: theory, method, results, and interpretations of the non-destructive observation and mapping of atomic and molecular wavefunctions; elementary theory and new verifications of equivalence of chemical bond interaction and tunnelling; scanning tunnelling spectroscopy of high Tc superconductors; imaging of self-assembled organic molecules on the solid-liquid interfaces. Some key derivations are rewritten using mathematics at an undergraduate level to make it pedagogically sound.
Author : Chunli Bai
Publisher : Springer Science & Business Media
ISBN 13 : 9783540657156
Total Pages : 392 pages
Book Rating : 4.6/5 (571 download)
Download or read book Scanning Tunneling Microscopy and Its Application written by Chunli Bai and published by Springer Science & Business Media. This book was released on 2000-08-10 with total page 392 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents a unified view of the rapidly growing field of scanning tunneling microscopy and its many derivatives. After examining novel scanning-probe techniques and the instrumentation and methods, the book provides detailed accounts of STM applications. It examines limitations of the present-day investigations and provides insight into further trends. "I strongly recommend that Professor Bai's book be a part of any library that serves surface scientists, biochemists, biophysicists, material scientists, and students of any science or engineering field...There is no doubt that this is one of the better (most thoughtful) texts." Journal of the American Chemical Society (Review of 1/e)
Author : David J. Diaz
Publisher : ASM International(OH)
ISBN 13 :
Total Pages : 148 pages
Book Rating : 4.3/5 (91 download)
Download or read book Quantitative Microscopy and Image Analysis written by David J. Diaz and published by ASM International(OH). This book was released on 1994 with total page 148 pages. Available in PDF, EPUB and Kindle. Book excerpt: Sponsored by Materials Characterization Committee of Materials Testing and Quality Control Division ASM Publication More precise data for quality control Accurate analysis of complex images Relationship between ultrasonic and metallographic measurements Correlation between 2- and 3- dimensional distributions. Sixteen selected papers examine theories, concepts and recent advances which will help you fill the need for more precise quality control and microstructure evaluation data through automatic image analysis. Computer-aided techniques now allow you to make fast, accurate quantification of morphological features recorded through optical metallography and scanning electron/transmission electron microscopy. Learn how accurate, reproducible measurements are being made from complex images which were previously difficult to analyze. Visual assessment of global properties and correlation with ultrasonic measurements are discussed. Subjects include: Mathematical Morphology Processing, Scanning Probe Microscopy, Infrared Sensing of Weld Penetration, Stereology of Anisotropic Microstructures Digital X-Ray Mapping.
Author : Roland Wiesendanger
Publisher : Cambridge University Press
ISBN 13 : 9780521428477
Total Pages : 664 pages
Book Rating : 4.4/5 (284 download)
Download or read book Scanning Probe Microscopy and Spectroscopy written by Roland Wiesendanger and published by Cambridge University Press. This book was released on 1994-09-29 with total page 664 pages. Available in PDF, EPUB and Kindle. Book excerpt: The investigation and manipulation of matter on the atomic scale have been revolutionised by scanning tunnelling microscopy and related scanning probe techniques. This book is the first to provide a clear and comprehensive introduction to this subject. Beginning with the theoretical background of scanning tunnelling microscopy, the design and instrumentation of practical STM and associated systems are described in detail, as are the applications of these techniques in fields such as condensed matter physics, chemistry, biology, and nanotechnology. Containing 350 illustrations, and over 1200 references, this unique book represents an ideal introduction to the subject for final-year undergraduates in physics or materials science. It will also be invaluable to graduate students and researchers in any branch of science where scanning probe techniques are used.
