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The Design Construction And Characterization Of A Low Temperature Scanning Hall Probe Microscope
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Book Synopsis The Design, Construction and Characterization of a Low Temperature Scanning Hall Probe Microscope by : Nigel David
Download or read book The Design, Construction and Characterization of a Low Temperature Scanning Hall Probe Microscope written by Nigel David and published by . This book was released on 2007 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: Scanning Hall probe microscopy, which uses a Hall-effect sensor to non-invasively image magnetic fields at the surface of samples, is a powerful tool in condensed matter physics that can be used to study magnetism on mesoscopic length scales. The work done for this thesis was in the design, construction and characterization of a low temperature scanning Hall probe microscope for our lab. We have based some parts of our design, such as the m - range piezo scanner, on other microscopes in the field. However, components such as the "double-gimbal" rotation stage for the sensor, and the sample stage with capacitive touch-down sensor and thermal control, are unique to our design. Already the first of its kind in Canada, with the intended addition of a scanning near-field optical probe to the same scanhead as the Hall probe, this microscope will have unique features not available in any other lab.
Book Synopsis Characterization of a Home-built Low Temperature Scanning Probe Microscopy System by : Quang Thanh Thai
Download or read book Characterization of a Home-built Low Temperature Scanning Probe Microscopy System written by Quang Thanh Thai and published by . This book was released on 2011 with total page 157 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Scanning Probe Microscopy¿in Industrial Applications by : Dalia G. Yablon
Download or read book Scanning Probe Microscopy¿in Industrial Applications written by Dalia G. Yablon and published by John Wiley & Sons. This book was released on 2013-10-24 with total page 337 pages. Available in PDF, EPUB and Kindle. Book excerpt: Describes new state-of-the-science tools and their contribution to industrial R&D With contributions from leading international experts in the field, this book explains how scanning probe microscopy is used in industry, resulting in improved product formulation, enhanced processes, better quality control and assurance, and new business opportunities. Readers will learn about the use of scanning probe microscopy to support R&D efforts in the semiconductor, chemical, personal care product, biomaterial, pharmaceutical, and food science industries, among others. Scanning Probe Microscopy in Industrial Applications emphasizes nanomechanical characterization using scanning probe microscopy. The first half of the book is dedicated to a general overview of nanomechanical characterization methods, offering a complete practical tutorial for readers who are new to the topic. Several chapters include worked examples of useful calculations such as using Hertz mechanics with and without adhesion to model a contact, step-by-step instructions for simulations to guide cantilever selection for an experiment, and data analysis procedures for dynamic contact experiments. The second half of the book describes applications of nanomechanical characterization in industry, including: New formulation development for pharmaceuticals Measurement of critical dimensions and thin dielectric films in the semiconductor industry Effect of humidity and temperature on biomaterials Characterization of polymer blends to guide product formulation in the chemicals sector Unraveling links between food structure and function in the food industry Contributions are based on the authors' thorough review of the current literature as well as their own firsthand experience applying scanning probe microscopy to solve industrial R&D problems. By explaining the fundamentals before advancing to applications, Scanning Probe Microscopy in Industrial Applications offers a complete treatise that is accessible to both novices and professionals. All readers will discover how to apply scanning probe microscopy to build and enhance their R&D efforts.
Book Synopsis Scanning Probe Microscopy by : Vijay Nalladega
Download or read book Scanning Probe Microscopy written by Vijay Nalladega and published by BoD – Books on Demand. This book was released on 2012-04-27 with total page 258 pages. Available in PDF, EPUB and Kindle. Book excerpt: Scanning probe microscopy (SPM) is one of the key enabling tools for the advancement for nanotechnology with applications in many interdisciplinary research areas. This book presents selected original research works on the application of scanning probe microscopy techniques for the characterization of physical properties of different materials at the nanoscale. The topics in the book range from surface morphology analysis of thin film structures, oxide thin layers and superconducting structures, novel scanning probe microscopy techniques for characterization of mechanical and electrical properties, evaluation of mechanical and tribological properties of hybrid coatings and thin films. The variety of topics chosen for the book underlines the strong interdisciplinary nature of the research work in the field of scanning probe microscopy.
Book Synopsis Low-Temperature Microscopy and Analysis by : Patrick Echlin
Download or read book Low-Temperature Microscopy and Analysis written by Patrick Echlin and published by Springer Science & Business Media. This book was released on 1992-03-31 with total page 576 pages. Available in PDF, EPUB and Kindle. Book excerpt: This comprehensive volume explores the preparation, examination, and analysis of organic, hydrated, and biological specimens using cryomicroscopic techniques. More than 200 illustrations supplement the text.
Book Synopsis Design and Construction of a Low Temperature Scanning Tunneling Microscope by : Chi Chen
Download or read book Design and Construction of a Low Temperature Scanning Tunneling Microscope written by Chi Chen and published by . This book was released on 2010 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Design and Construction of a Low Temperature Ion Microscope by : Clarence Hinrichs
Download or read book Design and Construction of a Low Temperature Ion Microscope written by Clarence Hinrichs and published by . This book was released on 1957 with total page 28 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Multi-mode Low Temperature Scanning Probe Microscopy by : Yu, Xi
Download or read book Multi-mode Low Temperature Scanning Probe Microscopy written by Yu, Xi and published by . This book was released on 2004 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis The Design, Construction and Use of a Low-temperature, Ultra High Vacuum Scanning Tunneling Microscope for Reaction Studies by : Ashley R. Gans-Forrest
Download or read book The Design, Construction and Use of a Low-temperature, Ultra High Vacuum Scanning Tunneling Microscope for Reaction Studies written by Ashley R. Gans-Forrest and published by . This book was released on 2017 with total page 61 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Low Temperature Force Microscopy on a Deeply Embedded Two Dimensional Electron Gas by : James Augustin Hedberg
Download or read book Low Temperature Force Microscopy on a Deeply Embedded Two Dimensional Electron Gas written by James Augustin Hedberg and published by . This book was released on 2010 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Design and Construction of Low Temperature Scanning Tunnelling Microscope for Spectroscopy by : Joakim Lindahl
Download or read book Design and Construction of Low Temperature Scanning Tunnelling Microscope for Spectroscopy written by Joakim Lindahl and published by . This book was released on 1998 with total page 126 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Design and Construction of a Low Temperature Scanning Tunneling Microscope for Studying High Temperature Superconductivity by : Dilushan R. Jayasundara
Download or read book Design and Construction of a Low Temperature Scanning Tunneling Microscope for Studying High Temperature Superconductivity written by Dilushan R. Jayasundara and published by . This book was released on 2008 with total page 184 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Combined Low-temperature Scanning Tunneling by :
Download or read book Combined Low-temperature Scanning Tunneling written by and published by . This book was released on 2008 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: The authors present the design and first results of a low-temperature, ultrahigh vacuum scanning probe microscope enabling atomic resolution imaging in both scanning tunneling microscopy (STM) and noncontact atomic force microscopy (NC-AFM) modes. A tuning-fork-based sensor provides flexibility in selecting probe tip materials, which can be either metallic or nonmetallic. When choosing a conducting tip and sample, simultaneous STM/NC-AFM data acquisition is possible. Noticeable characteristics that distinguish this setup from similar systems providing simultaneous STM/NC-AFM capabilities are its combination of relative compactness (on-top bath cryostat needs no pit), in situ exchange of tip and sample at low temperatures, short turnaround times, modest helium consumption, and unrestricted access from dedicated flanges. The latter permits not only the optical surveillance of the tip during approach but also the direct deposition of molecules or atoms on either tip or sample while they remain cold. Atomic corrugations as low as 1 pm could successfully be resolved. In addition, lateral drifts rates of below 15 pm/h allow long-term data acquisition series and the recording of site-specific spectroscopy maps. Results obtained on Cu(111) and graphite illustrate the microscope's performance.
Book Synopsis Applied Scanning Probe Methods XII by : Bharat Bhushan
Download or read book Applied Scanning Probe Methods XII written by Bharat Bhushan and published by Springer. This book was released on 2009-08-29 with total page 224 pages. Available in PDF, EPUB and Kindle. Book excerpt: Crack initiation and growth are key issues when it comes to the mechanical reliab- ity of microelectronic devices and microelectromechanical systems (MEMS). Es- cially in organic electronics where exible substrates will play a major role these issues will become of utmost importance. It is therefore necessary to develop me- ods which in situ allow the experimental investigation of surface deformation and fracture processes in thin layers at a micro and nanometer scale. While scanning electron microscopy (SEM) might be used it is also associated with some major experimental drawbacks. First of all if polymers are investigated they usually have to be coated with a metal layer due to their commonly non-conductive nature. Additi- ally they might be damaged by the electron beam of the microscope or the vacuum might cause outgasing of solvents or evaporation of water and thus change material properties. Furthermore, for all kinds of materials a considerable amount of expe- mental effort is necessary to build a tensile testing machine that ts into the chamber. Therefore, a very promising alternative to SEM is based on the use of an atomic force microscope (AFM) to observe in situ surface deformation processes during straining of a specimen. First steps towards this goal were shown in the 1990s in [1–4] but none of these approaches truly was a microtensile test with sample thicknesses in the range of micrometers. To the authors’ knowledge, this was shown for the rst time by Hild et al. in [5]. 16.
Book Synopsis Control-systems Based Analysis and Design Methods for Scanning Probe Microscopy by : Chi Bum Lee
Download or read book Control-systems Based Analysis and Design Methods for Scanning Probe Microscopy written by Chi Bum Lee and published by . This book was released on 2010 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: Recent demonstrations of nanoscience provide ample evidence indicating the feasibility of rational control, manipulation and interrogation of matter at the atomic scale. A class of devices, with micro-sized sensor probes, called Scanning Probe Microscopes (SPMs) are in the forefront of the technology that have demonstrated imaging and manipulation of sample properties. However, this technology is still far from realizing the promise of routinely tailoring matter at the atomic scale. Such an ability, once realized, will have far reaching impact and revolutionize every area of science and technology, especially the areas of material science, biology, medicine, and manufacturing. This thesis presents control systems theoretic analysis and synthesis of new modes of operations that significantly expand the range of performance specifications and capabilities of SPMs. In particular, the focus of this thesis is on the two main requirements of SPMs, the precision positioning of the matter with respect to the probe and the obtaining of the surface topography from the probe data. A characterization of the inherent fundamental trade-offs between resolution, tracking-bandwidth, and reliability specifications on the positioning capability of these devices. A series of control designs which exploit these trade-offs appropriately to achieve pre-specified feasible performance objectives is discussed. These designs have two degrees of freedom (2DOF), that is, have the feedforward and the feedback components, and are obtained using the optimal control framework. Implementations and experimental results on the application of these designs show over 100-300% improvement over competing existing designs. For imaging, control systems tools have been used to model and analyze probe-sample (matter) interactions and design signals that estimate the sample topography. The central concept in this design is to view sample-topography signals as disturbance signals and use system theoretic tools to estimate them. Experiments using these estimate signals show substantial improvements in imaging and detection bandwidths, and fewer artifacts and misinterpretations in SPM imaging.
Book Synopsis Design and Construction of a Low-temperature Scanning Tunneling Microscope for Spectroscopic Applications on Model Catalysts by :
Download or read book Design and Construction of a Low-temperature Scanning Tunneling Microscope for Spectroscopic Applications on Model Catalysts written by and published by . This book was released on 2013 with total page 129 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Low Temperature Scanning Electron Microscope for Fabrication and Characterization of High-Tc Josephson Junctions and Circuits by :
Download or read book Low Temperature Scanning Electron Microscope for Fabrication and Characterization of High-Tc Josephson Junctions and Circuits written by and published by . This book was released on 2000 with total page 4 pages. Available in PDF, EPUB and Kindle. Book excerpt: Liquid helium cooled TEM/STEM sample holder with electrical access to thin film samples is developed. The cryogenic sample holder was used together with a Nabity Nanometer Pattern Generation System to investigate important issues, such as the threshold energy and amount of exposure, in the fabrication of electron beam modified planar Hg-1212 Josephson junctions. The results indicate that for beam energy less than about 80 keV the changes in the superconducting properties of Hg-1212 thin films are temporary. In addition, the amount of exposure required to make junctions with stable properties makes the technique useful only for circuits of a few junctions.
