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The Analysis Of Optical Surface Scattering From Epitaxial Films
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Book Synopsis The Analysis of Optical Surface Scattering from Epitaxial Films by : Richard N. Brown
Download or read book The Analysis of Optical Surface Scattering from Epitaxial Films written by Richard N. Brown and published by . This book was released on 1973 with total page 14 pages. Available in PDF, EPUB and Kindle. Book excerpt: An expression has been derived for the transmission of infrared radiation through epitaxial films having a mat surface, which takes into account the scattering at the surface. This has been applied to the analysis of measurements of the fundamental absorption edge of epitaxial films of InAs. The results of this application include the evaluation of the intensity of the scattered light for several InAs films, and good agreement with published values of the absorption coefficient. (Author).
Book Synopsis The Analysis of Optical Surface Scattering from Epitaxial Films by : Richard N. Brown
Download or read book The Analysis of Optical Surface Scattering from Epitaxial Films written by Richard N. Brown and published by . This book was released on 1973 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: An expression has been derived for the transmission of infrared radiation through epitaxial films having a mat surface, which takes into account the scattering at the surface. This has been applied to the analysis of measurements of the fundamental absorption edge of epitaxial films of InAs. The results of this application include the evaluation of the intensity of the scattered light for several InAs films, and good agreement with published values of the absorption coefficient. (Author)
Book Synopsis Preparation and Optical Energy Gap of Epitaxial Films of InAs1-xPx Alloys by : Richard N. Brown
Download or read book Preparation and Optical Energy Gap of Epitaxial Films of InAs1-xPx Alloys written by Richard N. Brown and published by . This book was released on 1974 with total page 44 pages. Available in PDF, EPUB and Kindle. Book excerpt: Fast, sensitive infrared detectors operating in the visible to 3 micrometers range are required by the Air Force for use in ranging, communication, illumination, and target designation systems. The InAs(1-x)P(x) alloy system is an attractive candidate for fulfilling these needs, since it has the potential for use in the preparation of intrinsic infrared detectors with precisely determined peak response wavelengths over the entire range from 0.92 to 3.5 micrometers. This is accomplished by variation of the composition of the alloy, which is accompanied by a corresponding variation in the optical energy gap. Films of InAs, InP and several alloys, InAs(1-x)P(x), where x ranged from 0.034 to 0.774, were deposited by vapor phase epitaxy onto GaAs substrates. The fundamental absorption edge of each compound was measured. The temperature coefficient of the energy gap was also evaluated as a function of composition. (Modified author abstract).
Book Synopsis Scientific and Technical Aerospace Reports by :
Download or read book Scientific and Technical Aerospace Reports written by and published by . This book was released on 1994 with total page 804 pages. Available in PDF, EPUB and Kindle. Book excerpt: Lists citations with abstracts for aerospace related reports obtained from world wide sources and announces documents that have recently been entered into the NASA Scientific and Technical Information Database.
Author :John C. Stover Publisher :SPIE-International Society for Optical Engineering ISBN 13 :9780819492517 Total Pages :0 pages Book Rating :4.4/5 (925 download)
Book Synopsis Optical Scattering by : John C. Stover
Download or read book Optical Scattering written by John C. Stover and published by SPIE-International Society for Optical Engineering. This book was released on 2012 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: The first edition of this book concentrated on relating scatter from optically smooth surfaces to the microroughness on those surfaces. After spending six years in the semiconductor industry, Dr. Stover has updated and expanded the third edition. Newly included are scatter models for pits and particles as well as the use of wafer scanners to locate and size isolated surface features. New sections cover the multimillion-dollar wafer scanner business, establishing that microroughness is the noise, not the signal, in these systems. Scatter measurements, now routinely used to determine whether small-surface features are pits or particles and inspiring new technology that provides information on particle material, are also discussed. These new capabilities are now supported by a series of international standards, and a new chapter reviews those documents. New information on scatter from optically rough surfaces has also been added. Once the critical limit is exceeded, scatter cannot be used to determine surface-roughness statistics, but considerable information can still be obtained - especially when measurements are made on mass-produced products. Changes in measurement are covered, and the reader will find examples of scatter measurements made using a camera for a fraction of the cost and in a fraction of the time previously possible. The idea of relating scatter to surface appearance is also discussed, and appearance has its own short chapter. After all, beauty is in the eye of the beholder, and what we see is scattered light.
Book Synopsis Optical Characterization of Epitaxial Semiconductor Layers by : Günther Bauer
Download or read book Optical Characterization of Epitaxial Semiconductor Layers written by Günther Bauer and published by Springer Science & Business Media. This book was released on 2012-12-06 with total page 446 pages. Available in PDF, EPUB and Kindle. Book excerpt: The characterization of epitaxial layers and their surfaces has benefitted a lot from the enormous progress of optical analysis techniques during the last decade. In particular, the dramatic improvement of the structural quality of semiconductor epilayers and heterostructures results to a great deal from the level of sophistication achieved with such analysis techniques. First of all, optical techniques are nondestructive and their sensitivity has been improved to such an extent that nowadays the epilayer analysis can be performed on layers with thicknesses on the atomic scale. Furthermore, the spatial and temporal resolution have been pushed to such limits that real time observation of surface processes during epitaxial growth is possible with techniques like reflectance difference spectroscopy. Of course, optical spectroscopies complement techniques based on the inter action of electrons with matter, but whereas the latter usually require high or ultrahigh vacuum conditions, the former ones can be applied in different environments as well. This advantage could turn out extremely important for a rather technological point of view, i.e. for the surveillance of modern semiconductor processes. Despite the large potential of techniques based on the interaction of electromagnetic waves with surfaces and epilayers, optical techniques are apparently moving only slowly into this area of technology. One reason for this might be that some prejudices still exist regarding their sensitivity.
Book Synopsis Report on Research at AFCRL. by : Air Force Cambridge Research Laboratories (U.S.)
Download or read book Report on Research at AFCRL. written by Air Force Cambridge Research Laboratories (U.S.) and published by . This book was released on 1972 with total page 336 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Light Scattering and Roughness Analysis of Optical Surfaces and Thin Films by : Tobias Herffurth
Download or read book Light Scattering and Roughness Analysis of Optical Surfaces and Thin Films written by Tobias Herffurth and published by . This book was released on 2015 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: Die in-line Charakterisierung optischer Oberächen erfordert robuste, berührungslose und schnelle Verfahren mit hoher Sensitivität. Zur Erfüllung dieser Anforderungen bei der Bewertung von Oberächenrauheit und Defekten waren die Entwicklung einer Streulichtsensorik sowie angepasster Analysemethoden notwendig. Diese Kombination ermöglicht einerseits die Bewertung des durch Oberächenunvollkommenheiten hervorgerufenen Störlichts. Andererseits können durch modelltheoretische Zusammenhänge Information über die das Streulicht verursachenden Strukturen selbst gewonnen werden. Das realisierte Sensorkonzept für 3D winkelaufgelöste Streulichtmessungen ermöglicht Rauheitsmessungen an optischen Oberächen glatter als 0.3 nm in weniger als einer Sekunde. Dabei reicht der erfasste Streuwinkelbereich von weniger als 10° um den spekularen Reex aus, um Rauheitsspektren in einem Ortsfrequenzbereich von eineinhalb Dekaden zu analysieren Die aus Sensormessungen gewonnenen Informationen ermöglichen insbesondere eine zeiteziente Charakterisierung anisotroper Oberächenstrukturen. Darauf aufbauend konnten die charakteristischen Strukturen von Fertigungsverfahren wie Diamantdrehen oder magnetorheologischem Polieren untersucht werden. Durch die Implementierung von zwei Beleuchtungskanälen sowie die Anwendung von Rauheitsmodellen, konnte die Rauheitsentwicklung von Titanschichten untersucht werden. Dabei wurde sogar eine höhere Datengüte erzielt als mit konventionellen topographiebasierten Verfahren. Ein Streulichtmodell für ein Notchlter-Schichtsystem wurde durch Messung und Modellierung von Rauheit und Streulicht erarbeitet. Auf dieser Basis wurden zusätzliche Anwendungsszenarien für die sensorbasierte in-line Charakterisierung des Filters erarbeitet und erprobt. Die Klassizierung von Oberächendefekten mittels Streulichtsensor konnte erfolgreich demonstriert werden. Die Zuverlässigkeit dieser Prozedur wurde zusätzlich in experimentellen und modelltheoretischen Untersuchungen ermittelt.
Book Synopsis A Study of Optical Scattering in Multilayer Thin Films by : Samuel James Gourley
Download or read book A Study of Optical Scattering in Multilayer Thin Films written by Samuel James Gourley and published by . This book was released on 1980 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Silicon Molecular Beam Epitaxy by : E. Kasper
Download or read book Silicon Molecular Beam Epitaxy written by E. Kasper and published by CRC Press. This book was released on 2018-05-04 with total page 306 pages. Available in PDF, EPUB and Kindle. Book excerpt: This subject is divided into two volumes. Volume I is on homoepitaxy with the necessary systems, techniques, and models for growth and dopant incorporation. Three chapters on homoepitaxy are followed by two chapters describing the different ways in which MBE may be applied to create insulator/Si stackings which may be used for three-dimensional circuits. The two remaining chapters in Volume I are devoted to device applications. The first three chapters of Volume II treat all aspects of heteroepitaxy with the exception of the epitaxial insulator/Si structures already treated in volume I.
Book Synopsis SiGe, Ge, and Related Compounds 6: Materials, Processing, and Devices by : D. Harame
Download or read book SiGe, Ge, and Related Compounds 6: Materials, Processing, and Devices written by D. Harame and published by The Electrochemical Society. This book was released on with total page 1042 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Handbook of Transparent Conductors by : David S. Ginley
Download or read book Handbook of Transparent Conductors written by David S. Ginley and published by Springer Science & Business Media. This book was released on 2010-09-11 with total page 537 pages. Available in PDF, EPUB and Kindle. Book excerpt: Transparent conducting materials are key elements in a wide variety of current technologies including flat panel displays, photovoltaics, organic, low-e windows and electrochromics. The needs for new and improved materials is pressing, because the existing materials do not have the performance levels to meet the ever- increasing demand, and because some of the current materials used may not be viable in the future. In addition, the field of transparent conductors has gone through dramatic changes in the last 5-7 years with new materials being identified, new applications and new people in the field. “Handbook of Transparent Conductors” presents transparent conductors in a historical perspective, provides current applications as well as insights into the future of the devices. It is a comprehensive reference, and represents the most current resource on the subject.
Book Synopsis Heteroepitaxial Semiconductors for Electronic Devices by : G.W. Cullen
Download or read book Heteroepitaxial Semiconductors for Electronic Devices written by G.W. Cullen and published by Springer Science & Business Media. This book was released on 2013-11-11 with total page 306 pages. Available in PDF, EPUB and Kindle. Book excerpt: Some years ago it was not uncommon for materials scientists, even within the electronics industry, to work relatively independently of device engi neers. Neither group had a means to determine whether or not the materials had been optimized for application in specific device structures. This mode of operation is no longer desirable or possible. The introduction of a new material, or a new form of a well known material, now requires a close collaborative effort between individuals who represent the disciplines of materials preparation, materials characterization, device design and pro cessing, and the analysis of the device operation to establish relationships between device performance and the materials properties. The develop ment of devices in heteroepitaxial thin films has advanced to the present state specifically through the unusually close and active interchange among individuals with the appropriate backgrounds. We find no book available which brings together a description of these diverse disciplines needed for the development of such a materials-device technology. Therefore, the authors of this book, who have worked in close collaboration for a number of years, were motivated to collect their experiences in this volume. Over the years there has been a logical flow of activity beginning with heteroepi taxial silicon and progressing through the III-V and II-VI compounds. For each material the early emphasis on material preparation and characteriza tion later shifted to an emphasis on the analysis of the device characteristics specific to the materials involved.
Book Synopsis In Situ Real-Time Characterization of Thin Films by : Orlando Auciello
Download or read book In Situ Real-Time Characterization of Thin Films written by Orlando Auciello and published by John Wiley & Sons. This book was released on 2001 with total page 282 pages. Available in PDF, EPUB and Kindle. Book excerpt: An in-depth look at the state of the art of in situ real-time monitoring and analysis of thin films With thin film deposition becoming increasingly critical in the production of advanced electronic and optical devices, scientists and engineers working in this area are looking for in situ, real-time, structure-specific analytical tools for characterizing phenomena occurring at surfaces and interfaces during thin film growth. This volume brings together contributed chapters from experts in the field, covering proven methods for in situ real-time analysis of technologically important materials such as multicomponent oxides in different environments. Background information and extensive references to the current literature are also provided. Readers will gain a thorough understanding of the growth processes and become acquainted with both emerging and more established methods that can be adapted for in situ characterization. Methods and their most useful applications include: * Low-energy time-of-flight ion scattering and direct recoil spectroscopy (TOF-ISRAS) for studying multicomponent oxide film growth processes * Reflection high-energy electron diffraction (RHEED) for determining the nature of chemical reactions at film surfaces * Spectrometric ellipsometry (SE) for use in the analysis of semiconductors and other multicomponent materials * Reflectance spectroscopy and transmission electron microscopy for monitoring epitaxial growth processes * X-ray fluorescence spectroscopy for studying surface and interface structures * And other cost-effective techniques for industrial application
Download or read book Metals Abstracts written by and published by . This book was released on 1988 with total page 1244 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Book Synopsis Fullerene Research 1994-1996, A Computer-generated Cross-indexed Bibiliography Of Journal Literature by : Tibor Braun
Download or read book Fullerene Research 1994-1996, A Computer-generated Cross-indexed Bibiliography Of Journal Literature written by Tibor Braun and published by World Scientific. This book was released on 1997-12-18 with total page 528 pages. Available in PDF, EPUB and Kindle. Book excerpt: The book is a follow-up to the computerized fullerene bibliography related to the 1985-1993 period. It is a well-indexed overview of the journal literature on a topic for which the 1996 Nobel Prize in Chemistry was awarded. It is an indispensable tool for any specialist interested in the literature of one of the most researched interdisciplinary topics in the sciences.
Book Synopsis Report of NRL Progress by : Naval Research Laboratory (U.S.)
Download or read book Report of NRL Progress written by Naval Research Laboratory (U.S.) and published by . This book was released on 1977 with total page 338 pages. Available in PDF, EPUB and Kindle. Book excerpt:
