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Author : A. P. Ambler
Publisher : Prentice Hall
ISBN 13 :
Total Pages : 320 pages
Book Rating : 4.F/5 ( download)
Download or read book Economics of Design and Test for Electronic Circuits and Systems written by A. P. Ambler and published by Prentice Hall. This book was released on 1992 with total page 320 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : Chryssa Dislis
Publisher : Prentice Hall
ISBN 13 : 9780131089945
Total Pages : 0 pages
Book Rating : 4.0/5 (899 download)
Download or read book Test Economics and Design for Testability for Electronic Circuits and Systems written by Chryssa Dislis and published by Prentice Hall. This book was released on 1995 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: Providing an examination of the economics of design and test of electronics circuits and systems, this book describes the overall economic effects of design and test decisions facing electronic designers, engineering managers and test engineers at device, board, system and field test stages, and includes issues such as time-to-market and product liability. It also discusses the issues and parameters that can cause variations in test-related costs, and covers cost model creation, and the use/usability of cost models for making design and test decisions.
Author : Samiha Mourad
Publisher :
ISBN 13 : 9788126523061
Total Pages : 440 pages
Book Rating : 4.5/5 (23 download)
Download or read book Principles Of Testing Electronic Systems written by Samiha Mourad and published by . This book was released on 2009-08-01 with total page 440 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : M. Bushnell
Publisher : Springer Science & Business Media
ISBN 13 : 0792379918
Total Pages : 712 pages
Book Rating : 4.7/5 (923 download)
Download or read book Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits written by M. Bushnell and published by Springer Science & Business Media. This book was released on 2004-12-15 with total page 712 pages. Available in PDF, EPUB and Kindle. Book excerpt: The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device techn- ogy, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester course and a teacher will have to select from the topics. We did not restrict such freedom because the selection may depend upon the individual expertise and interests. Besides, there is merit in having a larger book that will retain its usefulness for the owner even after the completion of the course. With equal tenacity, we address the needs of three other groups of readers.
Author : Dimitris Gizopoulos
Publisher : Springer Science & Business Media
ISBN 13 : 0387294090
Total Pages : 431 pages
Book Rating : 4.3/5 (872 download)
Download or read book Advances in Electronic Testing written by Dimitris Gizopoulos and published by Springer Science & Business Media. This book was released on 2006-01-22 with total page 431 pages. Available in PDF, EPUB and Kindle. Book excerpt: This is a new type of edited volume in the Frontiers in Electronic Testing book series devoted to recent advances in electronic circuits testing. The book is a comprehensive elaboration on important topics which capture major research and development efforts today. "Hot" topics of current interest to test technology community have been selected, and the authors are key contributors in the corresponding topics.
Author : M. Abadir
Publisher : Springer Science & Business Media
ISBN 13 : 9780792394716
Total Pages : 184 pages
Book Rating : 4.3/5 (947 download)
Download or read book Economics of Electronic Design, Manufacture and Test written by M. Abadir and published by Springer Science & Business Media. This book was released on 1994-09-30 with total page 184 pages. Available in PDF, EPUB and Kindle. Book excerpt: The general understanding of design is that it should lead to a manufacturable product. Neither the design nor the process of manufacturing is perfect. As a result, the product will be faulty, will require testing and fixing. Where does economics enter this scenario? Consider the cost of testing and fixing the product. If a manufactured product is grossly faulty, or too many of the products are faulty, the cost of testing and fixing will be high. Suppose we do not like that. We then ask what is the cause of the faulty product. There must be something wrong in the manufacturing process. We trace this cause and fix it. Suppose we fix all possible causes and have no defective products. We would have eliminated the need for testing. Unfortunately, things are not so perfect. There is a cost involved with finding and eliminating the causes of faults. We thus have two costs: the cost of testing and fixing (we will call it cost-1), and the cost of finding and eliminating causes of faults (call it cost-2). Both costs, in some way, are included in the overall cost of the product. If we try to eliminate cost-1, cost-2 goes up, and vice versa. An economic system of production will minimize the overall cost of the product. Economics of Electronic Design, Manufacture and Test is a collection of research contributions derived from the Second Workshop on Economics of Design, Manufacture and Test, written for inclusion in this book.
Author : Brendan Davis
Publisher : McGraw-Hill Companies
ISBN 13 :
Total Pages : 314 pages
Book Rating : 4.3/5 (91 download)
Download or read book The Economics of Automatic Testing written by Brendan Davis and published by McGraw-Hill Companies. This book was released on 1982 with total page 314 pages. Available in PDF, EPUB and Kindle. Book excerpt:
Author : M. Abadir
Publisher : Springer Science & Business Media
ISBN 13 : 147575048X
Total Pages : 181 pages
Book Rating : 4.4/5 (757 download)
Download or read book Economics of Electronic Design, Manufacture and Test written by M. Abadir and published by Springer Science & Business Media. This book was released on 2013-06-29 with total page 181 pages. Available in PDF, EPUB and Kindle. Book excerpt: The general understanding of design is that it should lead to a manufacturable product. Neither the design nor the process of manufacturing is perfect. As a result, the product will be faulty, will require testing and fixing. Where does economics enter this scenario? Consider the cost of testing and fixing the product. If a manufactured product is grossly faulty, or too many of the products are faulty, the cost of testing and fixing will be high. Suppose we do not like that. We then ask what is the cause of the faulty product. There must be something wrong in the manufacturing process. We trace this cause and fix it. Suppose we fix all possible causes and have no defective products. We would have eliminated the need for testing. Unfortunately, things are not so perfect. There is a cost involved with finding and eliminating the causes of faults. We thus have two costs: the cost of testing and fixing (we will call it cost-1), and the cost of finding and eliminating causes of faults (call it cost-2). Both costs, in some way, are included in the overall cost of the product. If we try to eliminate cost-1, cost-2 goes up, and vice versa. An economic system of production will minimize the overall cost of the product. Economics of Electronic Design, Manufacture and Test is a collection of research contributions derived from the Second Workshop on Economics of Design, Manufacture and Test, written for inclusion in this book.
Author : Francis C. Wang
Publisher : Academic Press
ISBN 13 : 9780127345802
Total Pages : 266 pages
Book Rating : 4.3/5 (458 download)
Download or read book Digital Circuit Testing written by Francis C. Wang and published by Academic Press. This book was released on 1991-07-28 with total page 266 pages. Available in PDF, EPUB and Kindle. Book excerpt: Recent technological advances have created a testing crisis in the electronics industry--smaller, more highly integrated electronic circuits and new packaging techniques make it increasingly difficult to physically access test nodes. New testing methods are needed for the next generation of electronic equipment and a great deal of emphasis is being placed on the development of these methods. Some of the techniques now becoming popular include design for testability (DFT), built-in self-test (BIST), and automatic test vector generation (ATVG). This book will provide a practical introduction to these and other testing techniques. For each technique introduced, the author provides real-world examples so the reader can achieve a working knowledge of how to choose and apply these increasingly important testing methods.
Author : Ian A. Grout
Publisher : Springer Science & Business Media
ISBN 13 : 1846281733
Total Pages : 380 pages
Book Rating : 4.8/5 (462 download)
Download or read book Integrated Circuit Test Engineering written by Ian A. Grout and published by Springer Science & Business Media. This book was released on 2005-12-08 with total page 380 pages. Available in PDF, EPUB and Kindle. Book excerpt: Using the book and the software provided with it, the reader can build his/her own tester arrangement to investigate key aspects of analog-, digital- and mixed system circuits Plan of attack based on traditional testing, circuit design and circuit manufacture allows the reader to appreciate a testing regime from the point of view of all the participating interests Worked examples based on theoretical bookwork, practical experimentation and simulation exercises teach the reader how to test circuits thoroughly and effectively
Author : Chryssa Dislis
Publisher : Prentice Hall
ISBN 13 : 9780131089945
Total Pages : 224 pages
Book Rating : 4.0/5 (899 download)
Download or read book Test Economics and Design for Testability for Electronic Circuits and Systems written by Chryssa Dislis and published by Prentice Hall. This book was released on 1995 with total page 224 pages. Available in PDF, EPUB and Kindle. Book excerpt: Providing an examination of the economics of design and test of electronics circuits and systems, this book describes the overall economic effects of design and test decisions facing electronic designers, engineering managers and test engineers at device, board, system and field test stages, and includes issues such as time-to-market and product liability. It also discusses the issues and parameters that can cause variations in test-related costs, and covers cost model creation, and the use/usability of cost models for making design and test decisions.
Author : Hideo Fujiwara
Publisher :
ISBN 13 : 9780262561990
Total Pages : 0 pages
Book Rating : 4.5/5 (619 download)
Download or read book Logic Testing and Design for Testability written by Hideo Fujiwara and published by . This book was released on 1985-06 with total page 0 pages. Available in PDF, EPUB and Kindle. Book excerpt: Design for testability techniques offer one approach toward alleviating this situation by adding enough extra circuitry to a circuit or chip to reduce the complexity of testing. Today's computers must perform with increasing reliability, which in turn depends on the problem of determining whether a circuit has been manufactured properly or behaves correctly. However, the greater circuit density of VLSI circuits and systems has made testing more difficult and costly. This book notes that one solution is to develop faster and more efficient algorithms to generate test patterns or use design techniques to enhance testability - that is, design for testability. Design for testability techniques offer one approach toward alleviating this situation by adding enough extra circuitry to a circuit or chip to reduce the complexity of testing. Because the cost of hardware is decreasing as the cost of testing rises, there is now a growing interest in these techniques for VLSI circuits.The first half of the book focuses on the problem of testing: test generation, fault simulation, and complexity of testing. The second half takes up the problem of design for testability: design techniques to minimize test application and/or test generation cost, scan design for sequential logic circuits, compact testing, built-in testing, and various design techniques for testable systems. Logic Testing and Design for Testability is included in the Computer Systems Series, edited by Herb Schwetman.
Author : Jose Luis Huertas Díaz
Publisher : Springer Science & Business Media
ISBN 13 : 0387235213
Total Pages : 310 pages
Book Rating : 4.3/5 (872 download)
Download or read book Test and Design-for-Testability in Mixed-Signal Integrated Circuits written by Jose Luis Huertas Díaz and published by Springer Science & Business Media. This book was released on 2010-02-23 with total page 310 pages. Available in PDF, EPUB and Kindle. Book excerpt: Test and Design-for-Testability in Mixed-Signal Integrated Circuits deals with test and design for test of analog and mixed-signal integrated circuits. Especially in System-on-Chip (SoC), where different technologies are intertwined (analog, digital, sensors, RF); test is becoming a true bottleneck of present and future IC projects. Linking design and test in these heterogeneous systems will have a tremendous impact in terms of test time, cost and proficiency. Although it is recognized as a key issue for developing complex ICs, there is still a lack of structured references presenting the major topics in this area. The aim of this book is to present basic concepts and new ideas in a manner understandable for both professionals and students. Since this is an active research field, a comprehensive state-of-the-art overview is very valuable, introducing the main problems as well as the ways of solution that seem promising, emphasizing their basis, strengths and weaknesses. In essence, several topics are presented in detail. First of all, techniques for the efficient use of DSP-based test and CAD test tools. Standardization is another topic considered in the book, with focus on the IEEE 1149.4. Also addressed in depth is the connecting design and test by means of using high-level (behavioural) description techniques, specific examples are given. Another issue is related to test techniques for well-defined classes of integrated blocks, like data converters and phase-locked-loops. Besides these specification-driven testing techniques, fault-driven approaches are described as they offer potential solutions which are more similar to digital test methods. Finally, in Design-for-Testability and Built-In-Self-Test, two other concepts that were taken from digital design, are introduced in an analog context and illustrated for the case of integrated filters. In summary, the purpose of this book is to provide a glimpse on recent research results in the area of testing mixed-signal integrated circuits, specifically in the topics mentioned above. Much of the work reported herein has been performed within cooperative European Research Projects, in which the authors of the different chapters have actively collaborated. It is a representative snapshot of the current state-of-the-art in this emergent field.
Author : Benoit Nadeau-Dostie
Publisher : Springer Science & Business Media
ISBN 13 : 0306475448
Total Pages : 251 pages
Book Rating : 4.3/5 (64 download)
Download or read book Design for AT-Speed Test, Diagnosis and Measurement written by Benoit Nadeau-Dostie and published by Springer Science & Business Media. This book was released on 2006-04-11 with total page 251 pages. Available in PDF, EPUB and Kindle. Book excerpt: Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels. Designers will see how the implementation of embedded test enables simplification of silicon debug and system bring-up. Test engineers will determine how embedded test provides a superior level of at-speed test, diagnosis and measurement without exceeding the capabilities of their equipment. Product managers will learn how the time, resources and costs associated with test development, manufacture cost and lifecycle maintenance of their products can be significantly reduced by designing embedded test in the product. A complete design flow and analysis of the impact of embedded test on a design makes this book a `must read' before any DFT is attempted.
Author : Geoffrey W. A. Dummer
Publisher : Elsevier
ISBN 13 : 1483135918
Total Pages : 473 pages
Book Rating : 4.4/5 (831 download)
Download or read book Environmental Testing Techniques for Electronics and Materials written by Geoffrey W. A. Dummer and published by Elsevier. This book was released on 2013-10-22 with total page 473 pages. Available in PDF, EPUB and Kindle. Book excerpt: Environmental Testing Techniques for Electronics and Materials reviews environmental testing techniques for evaluating the performance of electronic equipment, components, and materials. Environmental test planning, test methods, and instrumentation are described, along with the general environmental conditions under which equipment must operate. This book is comprised of 15 chapters and begins by explaining why environmental testing is necessary and describing the environment in which electronics must operate. The next chapter considers how an environmental test plan is designed; the methods for the environmental testing of components and materials; instrumentation and control of test chambers; shock and vibration test instrumentation; and requirements for specification writing. The reader is then introduced to factors that might affect the reliability of equipment, including high humidity environment; galvanic corrosion problems; high- and low-temperature environments; mechanical and associated hazards; transport hazards; and long-term storage. Problems posed by high altitude and space environments, nuclear radiation, and acoustic noise are also discussed. The final chapter is devoted to environmental protection techniques and looks at the effects of climatic environments on radio interference as well as the effects of the environment on the human operator. This monograph will be of value to materials scientists and electronics engineers as well as those engaged in the design, development, and production of professional and military equipment.
Author : Tony Ambler
Publisher : Institute of Electrical & Electronics Engineers(IEEE)
ISBN 13 :
Total Pages : 184 pages
Book Rating : 4.:/5 (318 download)
Download or read book Third International Conference on the Economics of Design, Test, and Manufacturing written by Tony Ambler and published by Institute of Electrical & Electronics Engineers(IEEE). This book was released on 1996 with total page 184 pages. Available in PDF, EPUB and Kindle. Book excerpt: Focuses on economic analysis in the decision making and application of testing electronic circuits at all levels. The 21 papers, revised for publication, consider such facets as error modeling in a board test, synthesizing testable systolic arrays, manufacturing cost analysis for electronic packing,"
Author : N. K. Jha
Publisher : Cambridge University Press
ISBN 13 : 9781139437431
Total Pages : 1022 pages
Book Rating : 4.4/5 (374 download)
Download or read book Testing of Digital Systems written by N. K. Jha and published by Cambridge University Press. This book was released on 2003-05-08 with total page 1022 pages. Available in PDF, EPUB and Kindle. Book excerpt: Device testing represents the single largest manufacturing expense in the semiconductor industry, costing over $40 billion a year. The most comprehensive and wide ranging book of its kind, Testing of Digital Systems covers everything you need to know about this vitally important subject. Starting right from the basics, the authors take the reader through automatic test pattern generation, design for testability and built-in self-test of digital circuits before moving on to more advanced topics such as IDDQ testing, functional testing, delay fault testing, memory testing, and fault diagnosis. The book includes detailed treatment of the latest techniques including test generation for various fault models, discussion of testing techniques at different levels of integrated circuit hierarchy and a chapter on system-on-a-chip test synthesis. Written for students and engineers, it is both an excellent senior/graduate level textbook and a valuable reference.
